Characterising or performance testing

Industry

CPC
G01R31/2837

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2837Characterising or performance testing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Power efficiency and power performance embedded recognition
- Patent number 11,929,675
- Issue date Mar 12, 2024
- Cisco Technology, Inc.
- Spencer A. Beery
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 11,908,811
- Issue date Feb 20, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,837,308
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lifetime estimating system and method for heating source, and inspe...
- Patent number 11,796,400
- Issue date Oct 24, 2023
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing crosstalk of a quantum computing system based on spa...
- Patent number 11,775,854
- Issue date Oct 3, 2023
- International Business Machines Corporation
- Prakash Murali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ground monitor with smart frequency selection
- Patent number 11,662,394
- Issue date May 30, 2023
- Intermountain Electronics, Inc.
- Dale V. Curtis
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Display device and inspecting method thereof
- Patent number 11,645,959
- Issue date May 9, 2023
- Samsung Display Co., Ltd.
- Kwang Sae Lee
- G01 - MEASURING TESTING
Information Patent Grant
Runtime measurement of process variations and supply voltage charac...
- Patent number 11,585,854
- Issue date Feb 21, 2023
- Xilinx, Inc.
- Da Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for non-invasive root phenotyping
- Patent number 11,555,809
- Issue date Jan 17, 2023
- HI FIDELITY GENETICS, INC.
- Philip Benfey
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Testing electrode quality
- Patent number 11,555,846
- Issue date Jan 17, 2023
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit, display device including the sensor unit and method fo...
- Patent number 11,499,936
- Issue date Nov 15, 2022
- Samsung Display Co., Ltd.
- Il Hun Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protection adapter for oscilloscope probes
- Patent number 11,486,921
- Issue date Nov 1, 2022
- International Business Machines Corporation
- Felipe Ferraz Telles
- G01 - MEASURING TESTING
Information Patent Grant
Secondary monitoring system for a machine under test
- Patent number 11,480,603
- Issue date Oct 25, 2022
- The Boeing Company
- Steven F Griffin
- G01 - MEASURING TESTING
Information Patent Grant
Signal injection technique for measurement and control of source re...
- Patent number 11,467,209
- Issue date Oct 11, 2022
- Anteverta-mw B.V.
- Mauro Marchetti
- G01 - MEASURING TESTING
Information Patent Grant
RDSON/dRON measurement method and circuit for high voltage HEMTs
- Patent number 11,448,686
- Issue date Sep 20, 2022
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 11,450,625
- Issue date Sep 20, 2022
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and methods of failure prediction and prevention for rotatin...
- Patent number 11,378,947
- Issue date Jul 5, 2022
- AB Cognitive Systems Inc.
- Amir Badkoubeh
- G01 - MEASURING TESTING
Information Patent Grant
Phase frequency response measurement method
- Patent number 11,372,041
- Issue date Jun 28, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency-based built-in-test for discrete outputs
- Patent number 11,353,496
- Issue date Jun 7, 2022
- Hamilton Sundstrand Corporation
- Kevin C. Peterson
- G01 - MEASURING TESTING
Information Patent Grant
In-situ bias voltage measurement of VCSELs
- Patent number 11,349,277
- Issue date May 31, 2022
- Lumentum Operations LLC
- Kevin M. Kupcho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for diagnosing watchdog timer
- Patent number 11,340,285
- Issue date May 24, 2022
- LG Energy Solution, Ltd.
- Yeo-Bong Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device with a data-recording mechanism
- Patent number 11,320,479
- Issue date May 3, 2022
- Micron Technology, Inc.
- Todd J. Plum
- G11 - INFORMATION STORAGE
Information Patent Grant
Frequency response diagnostics for characterizing servo controlled...
- Patent number 11,314,232
- Issue date Apr 26, 2022
- Applied Materials, Inc.
- Adam Christopher Cranmer
- G01 - MEASURING TESTING
Information Patent Grant
Segmented pin driver system
- Patent number 11,300,608
- Issue date Apr 12, 2022
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,295,831
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for non-invasive root phenotyping
- Patent number 11,293,910
- Issue date Apr 5, 2022
- HI FIDELITY GENETICS, INC.
- Philip Benfey
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Advanced in-line part average testing
- Patent number 11,293,970
- Issue date Apr 5, 2022
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Display device and inspecting method thereof
- Patent number 11,250,745
- Issue date Feb 15, 2022
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Gate driver with VGTH and VCESAT measurement capability for the sta...
- Patent number 11,239,839
- Issue date Feb 1, 2022
- Texas Instruments Incorporated
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method using iterative trace-based s...
- Patent number 11,187,744
- Issue date Nov 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Andreas Laika
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPEED DETECTION CIRCUIT AND ASSOCIATED CHIP
- Publication number 20230384362
- Publication date Nov 30, 2023
- Realtek Semiconductor Corp.
- Chih-Chiang Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic Control Device and Method for Diagnosing Wake-up Circuit
- Publication number 20230288975
- Publication date Sep 14, 2023
- Hitachi Astemo, Ltd.
- Kenho KO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COUPLER SENSING BASED VOLTAGE-STANDING-WAVE-RATIO IMPEDANCE AND POW...
- Publication number 20230280395
- Publication date Sep 7, 2023
- Georgia Tech Research Corporation
- David J. Munzer
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20230252923
- Publication date Aug 10, 2023
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae LEE
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184827
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
AUTHENTICATING ELECTRONIC DEVICES VIA MULTI TONE ANALYSIS
- Publication number 20230176119
- Publication date Jun 8, 2023
- Government of the United States as Represented by the Secretary of the Air Force
- Carl Bohman
- G01 - MEASURING TESTING
Information Patent Application
POWER EFFICIENCY AND POWER PERFORMANCE EMBEDDED RECOGNITION
- Publication number 20230170797
- Publication date Jun 1, 2023
- Cisco Technology, Inc.
- Spencer A. Beery
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...
- Publication number 20230160950
- Publication date May 25, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-BASED CONSTRAINED RANDOM VERIFICATION METHO...
- Publication number 20230144389
- Publication date May 11, 2023
- MEDIATEK INC.
- Chung-An Wang
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...
- Publication number 20230136914
- Publication date May 4, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND SYSTEM
- Publication number 20230135496
- Publication date May 4, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- CHIA HAN LIN
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOF
- Publication number 20230123922
- Publication date Apr 20, 2023
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INPUT SENSOR SHORT-CIRCUIT INSPECTION MODULE AND INPUT SENSOR SHORT...
- Publication number 20230064190
- Publication date Mar 2, 2023
- SAMSUNG DISPLAY CO., LTD.
- Min-Hong Kim
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MULTIPARAMETER NONINVASIVE ARCHING DISCHARGE ANOMALY MONITORING DEV...
- Publication number 20220413064
- Publication date Dec 29, 2022
- Eaton Intelligent Power Limited
- Maebh Larkin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PHYSICALLY DETECTING COUNTERFEIT ELECTRONICS
- Publication number 20220352100
- Publication date Nov 3, 2022
- NOKOMIS, INC.
- WALTER J. KELLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRIC CHARACTERISATION OF A MATRIX ADDRESSING CIRCUIT
- Publication number 20220299562
- Publication date Sep 22, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Aurélien SUHM
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PHASE FREQUENCY RESPONSE MEASUREMENT METHOD
- Publication number 20220170979
- Publication date Jun 2, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND DEVICES FOR NON-INVASIVE ROOT PHENOTYPING
- Publication number 20220146483
- Publication date May 12, 2022
- Hi Fidelity Genetics, Inc.
- Philip BENFEY
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20220130302
- Publication date Apr 28, 2022
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae LEE
- G01 - MEASURING TESTING
Information Patent Application
Method for Monitoring the Vitality of Devices of a Distributed System
- Publication number 20220019208
- Publication date Jan 20, 2022
- Pilz GmbH & Co. KG
- Christoph WEISHAAR
- G01 - MEASURING TESTING
Information Patent Application
System and Methods of Failure Prediction and Prevention for Rotatin...
- Publication number 20220004179
- Publication date Jan 6, 2022
- AB Cognitive Systems Inc.
- Amir Badkoubeh
- G05 - CONTROLLING REGULATING
Information Patent Application
MULTIPURPOSE FRONT-END BOARD TO CHARACTERIZE SOLID-STATE SENSORS FO...
- Publication number 20210373183
- Publication date Dec 2, 2021
- University of Kansas
- Christophe Royon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING ELECTRODE QUALITY
- Publication number 20210356513
- Publication date Nov 18, 2021
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DETECTING ASYMMETRY IN A BIDIRECTIONAL SEMICONDUCTOR DEVICE
- Publication number 20210356512
- Publication date Nov 18, 2021
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Button Module
- Publication number 20210333317
- Publication date Oct 28, 2021
- Traitel Technologies Corporation
- Eli M. Traitel
- G01 - MEASURING TESTING
Information Patent Application
PROTECTION ADAPTER FOR OSCILLOSCOPE PROBES
- Publication number 20210311108
- Publication date Oct 7, 2021
- International Business Machines Corporation
- Felipe Ferraz Telles
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST
- Publication number 20210293875
- Publication date Sep 23, 2021
- The Boeing Company
- Steven F. Griffin
- G01 - MEASURING TESTING
Information Patent Application
ADVANCED IN-LINE PART AVERAGE TESTING
- Publication number 20210215753
- Publication date Jul 15, 2021
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR NON-INVASIVE ROOT PHENOTYPING
- Publication number 20210172922
- Publication date Jun 10, 2021
- Hi Fidelity Genetics, Inc.
- Philip BENFEY
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING CROSSTALK OF A QUANTUM COMPUTING SYSTEM BASED ON SPA...
- Publication number 20210142202
- Publication date May 13, 2021
- International Business Machines Corporation
- Prakash Murali
- G06 - COMPUTING CALCULATING COUNTING

Characterising or performance testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Power efficiency and power performance embedded recognition

System and method for physically detecting counterfeit electronics

Systems and methods to detect cell-internal defects

Lifetime estimating system and method for heating source, and inspe...

Characterizing crosstalk of a quantum computing system based on spa...

Ground monitor with smart frequency selection

Display device and inspecting method thereof

Runtime measurement of process variations and supply voltage charac...

Methods and devices for non-invasive root phenotyping

Testing electrode quality

Sensor unit, display device including the sensor unit and method fo...

Protection adapter for oscilloscope probes

Secondary monitoring system for a machine under test

Signal injection technique for measurement and control of source re...

RDSON/dRON measurement method and circuit for high voltage HEMTs

System and method for physically detecting counterfeit electronics

System and methods of failure prediction and prevention for rotatin...

Phase frequency response measurement method

Frequency-based built-in-test for discrete outputs

In-situ bias voltage measurement of VCSELs

Apparatus and method for diagnosing watchdog timer

Semiconductor device with a data-recording mechanism

Frequency response diagnostics for characterizing servo controlled...

Segmented pin driver system

Systems and methods to detect cell-internal defects

Methods and devices for non-invasive root phenotyping

Advanced in-line part average testing

Display device and inspecting method thereof

Gate driver with VGTH and VCESAT measurement capability for the sta...

Measuring device and measuring method using iterative trace-based s...

Patents Applicationslast 30 patents

SPEED DETECTION CIRCUIT AND ASSOCIATED CHIP

Electronic Control Device and Method for Diagnosing Wake-up Circuit

COUPLER SENSING BASED VOLTAGE-STANDING-WAVE-RATIO IMPEDANCE AND POW...

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

AUTHENTICATING ELECTRONIC DEVICES VIA MULTI TONE ANALYSIS

POWER EFFICIENCY AND POWER PERFORMANCE EMBEDDED RECOGNITION

SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRO...

ARTIFICIAL INTELLIGENCE-BASED CONSTRAINED RANDOM VERIFICATION METHO...

SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...

TEST METHOD AND SYSTEM

PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOF

INPUT SENSOR SHORT-CIRCUIT INSPECTION MODULE AND INPUT SENSOR SHORT...

MULTIPARAMETER NONINVASIVE ARCHING DISCHARGE ANOMALY MONITORING DEV...

SYSTEM AND METHOD FOR PHYSICALLY DETECTING COUNTERFEIT ELECTRONICS

ELECTRIC CHARACTERISATION OF A MATRIX ADDRESSING CIRCUIT

PHASE FREQUENCY RESPONSE MEASUREMENT METHOD

METHODS AND DEVICES FOR NON-INVASIVE ROOT PHENOTYPING

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

Method for Monitoring the Vitality of Devices of a Distributed System

System and Methods of Failure Prediction and Prevention for Rotatin...

MULTIPURPOSE FRONT-END BOARD TO CHARACTERIZE SOLID-STATE SENSORS FO...

TESTING ELECTRODE QUALITY

DETECTING ASYMMETRY IN A BIDIRECTIONAL SEMICONDUCTOR DEVICE

Button Module

PROTECTION ADAPTER FOR OSCILLOSCOPE PROBES

SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST

ADVANCED IN-LINE PART AVERAGE TESTING

METHODS AND DEVICES FOR NON-INVASIVE ROOT PHENOTYPING

CHARACTERIZING CROSSTALK OF A QUANTUM COMPUTING SYSTEM BASED ON SPA...