Charged particle holography

Industry

CPC
H01J2237/228

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/228Charged particle holography

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for carrying out a time-resolved interferometr...
- Patent number 11,293,747
- Issue date Apr 5, 2022
- Technische Universitaet Berlin
- Michael Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam device
- Patent number 7,923,685
- Issue date Apr 12, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer
- Patent number 7,872,755
- Issue date Jan 18, 2011
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer having three electron biprisms
- Patent number 7,750,298
- Issue date Jul 6, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and combined illumination lens
- Patent number 7,601,957
- Issue date Oct 13, 2009
- National University Corporation Kyoto Institute of Technology
- Hisamitsu Endoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning interference electron microscope
- Patent number 7,417,227
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron/ion microscope with improved resolution
- Patent number 5,500,527
- Issue date Mar 19, 1996
- Alexander Zarubin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for image reconstruction in a high-resolution electron micro...
- Patent number 5,432,347
- Issue date Jul 11, 1995
- U.S. Philips Corporation
- Willem M. J. M. Coene
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for imaging of an atomic environment
- Patent number 5,227,630
- Issue date Jul 13, 1993
- Board of Regents of the University of Wisconsin System
- Dilano K. Saldin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron optical measurement apparatus
- Patent number 5,192,867
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of three-dimensional atomic imaging
- Patent number 5,095,207
- Issue date Mar 10, 1992
- University of Wisconsin-Milwaukee
- David S. Y. Tong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron holography apparatus
- Patent number 4,935,625
- Issue date Jun 19, 1990
- Hitachi, Ltd.
- Shuji Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron holography microscope
- Patent number 4,532,422
- Issue date Jul 30, 1985
- Hitachi, Ltd.
- Setsuo Nomura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETR...
- Publication number 20200103213
- Publication date Apr 2, 2020
- Technische Universitaet Berlin
- Michael LEHMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20090273789
- Publication date Nov 5, 2009
- Riken
- Ken Harada
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20090206256
- Publication date Aug 20, 2009
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20080258058
- Publication date Oct 23, 2008
- Ken Harada
- G02 - OPTICS
Information Patent Application
Electron Microscope and Combined Illumination Lens
- Publication number 20080149833
- Publication date Jun 26, 2008
- Hisamitsu Endoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scanning interference electron microscope
- Publication number 20060124850
- Publication date Jun 15, 2006
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Charged particle holography

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for carrying out a time-resolved interferometr...

System and method for performing nano beam diffraction analysis

Electron beam device

Interferometer

Interferometer having three electron biprisms

Electron microscope and combined illumination lens

Scanning interference electron microscope

Electron/ion microscope with improved resolution

Method for image reconstruction in a high-resolution electron micro...

Method and apparatus for imaging of an atomic environment

Electron optical measurement apparatus

Method of three-dimensional atomic imaging

Electron holography apparatus

Electron holography microscope

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR CARRYING OUT A TIME-RESOLVED INTERFEROMETR...

Interferometer

ELECTRON BEAM DEVICE

Interferometer

Electron Microscope and Combined Illumination Lens

Scanning interference electron microscope