Checking for open circuits or shorts

Industry

CPC
G01R31/2812

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2812Checking for open circuits or shorts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Display device and bonding detection method of display device
- Patent number 12,224,215
- Issue date Feb 11, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Chienpang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting defective back-drills in printed ci...
- Patent number 12,153,084
- Issue date Nov 26, 2024
- R & D Circuits, Inc.
- Donald Eric Thompson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for detecting and adjusting poor back drills in printed circ...
- Patent number 12,135,347
- Issue date Nov 5, 2024
- R&D Circuits
- Michael Caprio
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic device and operation method of electronic device for det...
- Patent number 12,130,325
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Myeongjae Hong
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a via stripping issue in a printed circuit board
- Patent number 12,123,907
- Issue date Oct 22, 2024
- Dell Products L.P.
- Ching-Huei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for real-time fault detection
- Patent number 12,099,084
- Issue date Sep 24, 2024
- Maxim Integrated Products, Inc.
- Daniel James Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and process for real-time detection of high-impedance fau...
- Patent number 12,032,037
- Issue date Jul 9, 2024
- Newsouth Innovations Pty Limited
- Sirojan Tharmakulasingam
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Trace level voltage sensor for multi-layer printed circuit boards
- Patent number 11,988,706
- Issue date May 21, 2024
- Quanta Computer Inc.
- Yangtzu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 11,982,704
- Issue date May 14, 2024
- E Ink Holdings Inc.
- Ruei-Huan Rao
- G01 - MEASURING TESTING
Information Patent Grant
Integrity monitoring for flexible material
- Patent number 11,969,030
- Issue date Apr 30, 2024
- ARM Limited
- Emre Ozer
- A41 - WEARING APPAREL
Information Patent Grant
Integrity verification system for testing high channel count neurom...
- Patent number 11,896,378
- Issue date Feb 13, 2024
- Ethan Rhodes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System, apparatus, and method for testing of an electrical system
- Patent number 11,874,335
- Issue date Jan 16, 2024
- OneStep Power Solutions Inc.
- Mark Craig
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrochemical lipidomics for cancer diagnosis
- Patent number 11,867,649
- Issue date Jan 9, 2024
- NANO HESGARSAZAN SALAMAT ARYA INCUBATION CENTER FOR MEDICALEQUIPMENT AND DEVICES
- Mohammad Abdolahad
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fault location system
- Patent number 11,815,541
- Issue date Nov 14, 2023
- POMA
- Christian Paul Mathieu
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for detecting physical short-circuit defect be...
- Patent number 11,764,116
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Shuhua Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring temperature-modulated properties of a test sample
- Patent number 11,740,279
- Issue date Aug 29, 2023
- KLA Corporation
- Dirch Hjorth Petersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical apparatus having tin whisker sensing and prevention
- Patent number 11,619,665
- Issue date Apr 4, 2023
- International Business Machines Corporation
- Jeffrey N. Judd
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Crack detection integrity check
- Patent number 11,585,847
- Issue date Feb 21, 2023
- STMicroelectronics Pte Ltd
- Pedro Jr Santos Peralta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ solder joint crack detection
- Patent number 11,513,150
- Issue date Nov 29, 2022
- Dell Products L.P.
- Bhyrav Mutnury
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board assembly for aircraft engine, and method moni...
- Patent number 11,500,011
- Issue date Nov 15, 2022
- Pratt & Whitney Canada Corp.
- Reza Pedrami
- G01 - MEASURING TESTING
Information Patent Grant
Short-circuit determining apparatus, switch apparatus and short-cir...
- Patent number 11,500,015
- Issue date Nov 15, 2022
- Fuji Electric Co., Ltd.
- Ryoga Kiguchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing loopback test on PCIe interface
- Patent number 11,493,549
- Issue date Nov 8, 2022
- Hewlett Packard Enterprise Development LP
- Min-Huang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrity verification system for testing high channel count neurom...
- Patent number 11,471,087
- Issue date Oct 18, 2022
- Ethan Rhodes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for estimating degradation of a wire-bonded power semi-condu...
- Patent number 11,474,146
- Issue date Oct 18, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe device for impedance testing for circuit board
- Patent number 11,460,498
- Issue date Oct 4, 2022
- MPI Corporation
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Information processing system and information processing method
- Patent number 11,402,427
- Issue date Aug 2, 2022
- Kabushiki Kaisha Toshiba
- Michinobu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crack detection integrity check
- Patent number 11,366,156
- Issue date Jun 21, 2022
- STMicroelectronics Pte Ltd
- Pedro Jr Santos Peralta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for electrical testing of an electrical assembly...
- Patent number 11,320,477
- Issue date May 3, 2022
- ATEIP GMBH
- Ulrich Pohl
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity sensor and method for producing a conductivity sensor
- Patent number 11,293,967
- Issue date Apr 5, 2022
- KROHNE MESSTECHNIKGMBH
- Mark Jakoby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing circuit board included in battery...
- Patent number 11,262,417
- Issue date Mar 1, 2022
- LG Energy Solution, Ltd.
- Won-Jae Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF...
- Publication number 20240385236
- Publication date Nov 21, 2024
- ROBERT BOSCH GmbH
- Steffen Michelberger
- G01 - MEASURING TESTING
Information Patent Application
Integrity Verification System for Testing High Channel Count Neurom...
- Publication number 20240206793
- Publication date Jun 27, 2024
- Cadwell Laboratories, Inc.
- Ethan Rhodes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
- Publication number 20240027516
- Publication date Jan 25, 2024
- Sreejit Chakravarty
- G01 - MEASURING TESTING
Information Patent Application
DETECTING A VIA STRIPPING ISSUE IN A PRINTED CIRCUIT BOARD
- Publication number 20230341458
- Publication date Oct 26, 2023
- Dell Products L.P.
- Ching-Huei Chen
- G01 - MEASURING TESTING
Information Patent Application
TRACE LEVEL VOLTAGE SENSOR FOR MULTI-LAYER PRINTED CIRCUIT BOARDS
- Publication number 20230204652
- Publication date Jun 29, 2023
- QUANTA COMPUTER INC.
- Yangtzu LEE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Integrity Verification System for Testing High Channel Count Neurom...
- Publication number 20230071187
- Publication date Mar 9, 2023
- Cadwell Laboratories, Inc.
- Ethan Rhodes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETECTING AND ADJUSTING POOR BACK DRILLS IN PRINTED CIRC...
- Publication number 20230026067
- Publication date Jan 26, 2023
- R&D Circuits
- Michael Caprio
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC DEVICE AND OPERATION METHOD OF ELECTRONIC DEVICE FOR DET...
- Publication number 20230008917
- Publication date Jan 12, 2023
- Samsung Electronics Co., Ltd.
- Myeongjae HONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMPEDANCE MATCHING, ELECTRONIC DEVICE AND COMPUTER-READAB...
- Publication number 20220416753
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- SU MIN KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND PROCESS FOR REAL-TIME DETECTION OF HIGH-IMPEDANCE FAU...
- Publication number 20220373612
- Publication date Nov 24, 2022
- NewSouth Innovations Pty Limited
- Sirojan THARMAKULASINGAM
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CRACK DETECTION INTEGRITY CHECK
- Publication number 20220291277
- Publication date Sep 15, 2022
- STMicroelectronics Pte Ltd
- Pedro Jr Santos PERALTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT LOCATION SYSTEM
- Publication number 20220252656
- Publication date Aug 11, 2022
- POMA
- Christian Paul MATHIEU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CI...
- Publication number 20220252660
- Publication date Aug 11, 2022
- R&D Circuits, Inc.
- Donald Eric Thompson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM, APPARATUS, AND METHOD FOR TESTING OF AN ELECTRICAL SYSTEM
- Publication number 20220163599
- Publication date May 26, 2022
- OneStep Power Solutions Inc.
- Mark Craig
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND BONDING DETECTION METHOD OF DISPLAY DEVICE
- Publication number 20220084894
- Publication date Mar 17, 2022
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Chienpang HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETERMINING APPARATUS, SWITCH APPARATUS AND SHORT-CIR...
- Publication number 20220003816
- Publication date Jan 6, 2022
- Fuji Electric Co., Ltd.
- Ryoga KIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR DETECTING PHYSICAL SHORT-CIRCUIT DEFECT BE...
- Publication number 20210407871
- Publication date Dec 30, 2021
- Shanghai Huali Integrated Circuit Corporation
- Shuhua Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING LOOPBACK TEST ON PCIe INTERFACE
- Publication number 20210389367
- Publication date Dec 16, 2021
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Min-Huang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRINTED CIRCUIT BOARD ASSEMBLY FOR AIRCRAFT ENGINE, AND METHOD OF M...
- Publication number 20210341530
- Publication date Nov 4, 2021
- Pratt & Whitney Canada Corp.
- Reza PEDRAMI
- G01 - MEASURING TESTING
Information Patent Application
Measuring Temperature-Modulated Properties of a Test Sample
- Publication number 20210333316
- Publication date Oct 28, 2021
- KLA Corporation
- Dirch Hjorth Petersen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20210318374
- Publication date Oct 14, 2021
- E Ink Holdings Inc.
- Ruei-Huan RAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DEVICE MONITORING
- Publication number 20210234355
- Publication date Jul 29, 2021
- DELL PRODUCTS L.P.
- Isaac Q. Wang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL APPARATUS HAVING TIN WHISKER SENSING AND PREVENTION
- Publication number 20210208190
- Publication date Jul 8, 2021
- International Business Machines Corporation
- Jeffrey N. JUDD
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY
- Publication number 20210181248
- Publication date Jun 17, 2021
- ATEIP GMBH
- Ulrich POHL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING DESIGN FAULTS OR SEMICONDUCTOR MO...
- Publication number 20210181250
- Publication date Jun 17, 2021
- Bayes Electronics Technology Co., Ltd
- Gang Peter Fang
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Testing Circuit Board Included in Battery...
- Publication number 20210156929
- Publication date May 27, 2021
- LG CHEM, LTD.
- Won-Jae Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTABLE PROBE DEVICE FOR IMPEDANCE TESTING FOR CIRCUIT BOARD
- Publication number 20210102992
- Publication date Apr 8, 2021
- MPI Corporation
- YANG-HUNG CHENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING DEGRADATION
- Publication number 20200408830
- Publication date Dec 31, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING BRIDGING IN ADJACENT SEMICONDUCTOR DEVICES AND T...
- Publication number 20200365471
- Publication date Nov 19, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE MATRIX FOR HIGH-POTENTIAL TESTING
- Publication number 20200326367
- Publication date Oct 15, 2020
- Arista Networks, Inc.
- David A. Cananzi
- G01 - MEASURING TESTING

Checking for open circuits or shorts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Display device and bonding detection method of display device

System and method for detecting defective back-drills in printed ci...

Method for detecting and adjusting poor back drills in printed circ...

Electronic device and operation method of electronic device for det...

Detecting a via stripping issue in a printed circuit board

Systems and methods for real-time fault detection

Apparatus and process for real-time detection of high-impedance fau...

Trace level voltage sensor for multi-layer printed circuit boards

Electronic device

Integrity monitoring for flexible material

Integrity verification system for testing high channel count neurom...

System, apparatus, and method for testing of an electrical system

Electrochemical lipidomics for cancer diagnosis

Fault location system

Method and structure for detecting physical short-circuit defect be...

Measuring temperature-modulated properties of a test sample

Electrical apparatus having tin whisker sensing and prevention

Crack detection integrity check

In-situ solder joint crack detection

Printed circuit board assembly for aircraft engine, and method moni...

Short-circuit determining apparatus, switch apparatus and short-cir...

System and method for performing loopback test on PCIe interface

Integrity verification system for testing high channel count neurom...

Method for estimating degradation of a wire-bonded power semi-condu...

Adjustable probe device for impedance testing for circuit board

Information processing system and information processing method

Crack detection integrity check

Method and device for electrical testing of an electrical assembly...

Conductivity sensor and method for producing a conductivity sensor

Apparatus and method for testing circuit board included in battery...

Patents Applicationslast 30 patents

ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF...

Integrity Verification System for Testing High Channel Count Neurom...

TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS

DETECTING A VIA STRIPPING ISSUE IN A PRINTED CIRCUIT BOARD

TRACE LEVEL VOLTAGE SENSOR FOR MULTI-LAYER PRINTED CIRCUIT BOARDS

Integrity Verification System for Testing High Channel Count Neurom...

METHOD FOR DETECTING AND ADJUSTING POOR BACK DRILLS IN PRINTED CIRC...

ELECTRONIC DEVICE AND OPERATION METHOD OF ELECTRONIC DEVICE FOR DET...

METHOD OF IMPEDANCE MATCHING, ELECTRONIC DEVICE AND COMPUTER-READAB...

APPARATUS AND PROCESS FOR REAL-TIME DETECTION OF HIGH-IMPEDANCE FAU...

CRACK DETECTION INTEGRITY CHECK

FAULT LOCATION SYSTEM

SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CI...

SYSTEM, APPARATUS, AND METHOD FOR TESTING OF AN ELECTRICAL SYSTEM

DISPLAY DEVICE AND BONDING DETECTION METHOD OF DISPLAY DEVICE

SHORT-CIRCUIT DETERMINING APPARATUS, SWITCH APPARATUS AND SHORT-CIR...

METHOD AND STRUCTURE FOR DETECTING PHYSICAL SHORT-CIRCUIT DEFECT BE...

SYSTEM AND METHOD FOR PERFORMING LOOPBACK TEST ON PCIe INTERFACE

PRINTED CIRCUIT BOARD ASSEMBLY FOR AIRCRAFT ENGINE, AND METHOD OF M...

Measuring Temperature-Modulated Properties of a Test Sample

ELECTRONIC DEVICE

SYSTEM AND METHOD FOR DEVICE MONITORING

ELECTRICAL APPARATUS HAVING TIN WHISKER SENSING AND PREVENTION

METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY

SYSTEM AND METHOD FOR IDENTIFYING DESIGN FAULTS OR SEMICONDUCTOR MO...

Apparatus and Method for Testing Circuit Board Included in Battery...

ADJUSTABLE PROBE DEVICE FOR IMPEDANCE TESTING FOR CIRCUIT BOARD

METHOD FOR ESTIMATING DEGRADATION

METHOD FOR TESTING BRIDGING IN ADJACENT SEMICONDUCTOR DEVICES AND T...

SELECTIVE MATRIX FOR HIGH-POTENTIAL TESTING