Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

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H01J37/24

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/24Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device for detecting therapeutic radiation based on optical disk wi...
- Patent number 12,366,670
- Issue date Jul 22, 2025
- National Cancer Center
- Dongho Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for automatic zone axis alignment
- Patent number 12,362,135
- Issue date Jul 15, 2025
- FEI Company
- John J. Flanagan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image adjustment method
- Patent number 12,362,134
- Issue date Jul 15, 2025
- Jeol Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam column
- Patent number 12,362,129
- Issue date Jul 15, 2025
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating scanning electron microscope (SEM) and method o...
- Patent number 12,362,138
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Jaehyung Ahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection apparatus and semiconductor inspection met...
- Patent number 12,362,139
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Yujin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring pedestal voltage uniformity in p...
- Patent number 12,362,136
- Issue date Jul 15, 2025
- Stephen Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay measurement system and overlay measurement device for overl...
- Patent number 12,354,829
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Masaki Sugie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage plasma control
- Patent number 12,354,832
- Issue date Jul 8, 2025
- Eagle Harbor Technologies, Inc.
- Timothy Ziemba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor analysis system
- Patent number 12,347,707
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yudai Kubo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scanning electron microscope
- Patent number 12,347,642
- Issue date Jul 1, 2025
- TASMIT, INC.
- Naoya Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a particle beam microscope, particle beam micr...
- Patent number 12,340,972
- Issue date Jun 24, 2025
- Carl Zeiss Microscopy GmbH
- Martin Ross-Messemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection and location of anomalous plasma events in fabrication ch...
- Patent number 12,340,992
- Issue date Jun 24, 2025
- Lam Research Corporation
- Yukinori Sakiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor detector and method of fabricating same
- Patent number 12,342,635
- Issue date Jun 24, 2025
- ASML Netherlands B.V.
- Gianpaolo Lorito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system including a multi-beam deflection device and a...
- Patent number 12,340,973
- Issue date Jun 24, 2025
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and aberration correction method
- Patent number 12,327,708
- Issue date Jun 10, 2025
- HITACHI HIGH-TECH CORPORATION
- Shingo Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-focus sensor implementation for multi-column microscopes
- Patent number 12,322,568
- Issue date Jun 3, 2025
- KLA Corporation
- Nicholas Petrone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for observing permeation and diffusion path of observation t...
- Patent number 12,315,696
- Issue date May 27, 2025
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system
- Patent number 12,315,694
- Issue date May 27, 2025
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam inspection apparatus, multipole array control m...
- Patent number 12,308,202
- Issue date May 20, 2025
- NuFlare Technology, Inc.
- Yuichi Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of determining aberrations of a charged particle beam, and...
- Patent number 12,308,203
- Issue date May 20, 2025
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dominik Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam current adjustment for charged-particle inspection system
- Patent number 12,308,205
- Issue date May 20, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power adjustment method of upper electrode power supply and semicon...
- Patent number 12,300,460
- Issue date May 13, 2025
- BEIJING NAURA MICROELECTRONICS EQUIPMENT CO., LTD.
- Jing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time dosimetry
- Patent number 12,298,447
- Issue date May 13, 2025
- Reveam, Inc.
- Chip Starns
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for positioning objects in a particle beam microscope with t...
- Patent number 12,300,459
- Issue date May 13, 2025
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device, method for operating the particle beam device...
- Patent number 12,300,461
- Issue date May 13, 2025
- Carl Zeiss Microscopy GmbH
- Björn Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device having a deflection unit
- Patent number 12,288,664
- Issue date Apr 29, 2025
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle source module
- Patent number 12,288,663
- Issue date Apr 29, 2025
- ASML Netherlands B.V.
- Laura Dinu-Gurtler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM PROCESSING SYSTEM
- Publication number 20250239432
- Publication date Jul 24, 2025
- Samsung Electronics Co., Ltd.
- Backkyu Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILT...
- Publication number 20250239429
- Publication date Jul 24, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk ZEIDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250239430
- Publication date Jul 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS
- Publication number 20250239431
- Publication date Jul 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jian-Ming Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADC CALIBRATION FOR MICROSCOPY
- Publication number 20250233597
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Hindrik Willem MOOK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND MEASUREMENT METHOD
- Publication number 20250232946
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Minami UCHIHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM REFLECTOR, SUBSTRATE PROCESSING APPARATUS INCLUDING THE SA...
- Publication number 20250232948
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Hoonseop KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME
- Publication number 20250231130
- Publication date Jul 17, 2025
- FEI Company
- Jan Trojek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE
- Publication number 20250226173
- Publication date Jul 10, 2025
- DELONG INSTRUMENTS A.S.
- Tomas Bejdak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DEFECT INSPECTION USING VOLTAGE CONTRAST IN A...
- Publication number 20250226174
- Publication date Jul 10, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED BEAM TUBE
- Publication number 20250218719
- Publication date Jul 3, 2025
- Carl Zeiss MultiSEM GmbH
- Michael Kelp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE
- Publication number 20250218721
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING CHARGED PARTICLE B...
- Publication number 20250201511
- Publication date Jun 19, 2025
- FEI Company
- Branislav STRAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20250201512
- Publication date Jun 19, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
- Publication number 20250189469
- Publication date Jun 12, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CHARACTERIZING A FAULT IN A SCANNING ELECTRON MICROSCOPE
- Publication number 20250183000
- Publication date Jun 5, 2025
- Carl Zeiss SMT GMBH
- David Laemmle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY
- Publication number 20250182999
- Publication date Jun 5, 2025
- ASML NETHERLANDS B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS
- Publication number 20250183002
- Publication date Jun 5, 2025
- FEI Company
- Gert-Jan de Vos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS COVER AND CHARGED PARTICLE BEAM APPARATUS INCLUDING...
- Publication number 20250174426
- Publication date May 29, 2025
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Imaging a Sample
- Publication number 20250166963
- Publication date May 22, 2025
- Milos Malínský
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-BEAM EXPOSURE METHOD AND MASK MANUFACTURING METHOD COMPRISING THE...
- Publication number 20250157789
- Publication date May 15, 2025
- Samsung Electronics Co., Ltd.
- Jungwook SHON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...
- Publication number 20250157780
- Publication date May 15, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...
- Publication number 20250157782
- Publication date May 15, 2025
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROCESSING APPARATUS AND END POINT DETECTION METHOD
- Publication number 20250157787
- Publication date May 15, 2025
- TOKYO ELECTRON LIMITED
- Masakazu HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...
- Publication number 20250157788
- Publication date May 15, 2025
- Applied Materials, Inc.
- Arvind Shankar Raman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...
- Publication number 20250149290
- Publication date May 8, 2025
- NuFlare Technology, Inc.
- Koichi ISHII
- H01 - BASIC ELECTRIC ELEMENTS

Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device for detecting therapeutic radiation based on optical disk wi...

Method and system for automatic zone axis alignment

Charged particle beam apparatus and image adjustment method

Particle beam column

Method of operating scanning electron microscope (SEM) and method o...

Semiconductor inspection apparatus and semiconductor inspection met...

Apparatus and method for measuring pedestal voltage uniformity in p...

Overlay measurement system and overlay measurement device for overl...

High voltage plasma control

Semiconductor analysis system

Scanning electron microscope

Method for operating a particle beam microscope, particle beam micr...

Detection and location of anomalous plasma events in fabrication ch...

Semiconductor detector and method of fabricating same

Particle beam system including a multi-beam deflection device and a...

Charged particle beam device and aberration correction method

Auto-focus sensor implementation for multi-column microscopes

Device for observing permeation and diffusion path of observation t...

Electron beam system

Multi-electron beam inspection apparatus, multipole array control m...

Methods of determining aberrations of a charged particle beam, and...

Beam current adjustment for charged-particle inspection system

Power adjustment method of upper electrode power supply and semicon...

Real-time dosimetry

Method for positioning objects in a particle beam microscope with t...

Particle beam device, method for operating the particle beam device...

Particle beam device having a deflection unit

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

Charged particle source module

Patents Applicationslast 30 patents

ION BEAM PROCESSING SYSTEM

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILT...

CHARGED PARTICLE BEAM DEVICE

ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS

ADC CALIBRATION FOR MICROSCOPY

CHARGED PARTICLE BEAM DEVICE, AND MEASUREMENT METHOD

ION BEAM REFLECTOR, SUBSTRATE PROCESSING APPARATUS INCLUDING THE SA...

IMPROVED SCANNING ELECTRON MICROSCOPE AND METHOD OF USING THE SAME

A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE

SYSTEM AND METHOD FOR DEFECT INSPECTION USING VOLTAGE CONTRAST IN A...

MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED BEAM TUBE

SCANNING ELECTRON MICROSCOPE DEVICE

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

SYSTEMS AND METHODS FOR ANALYZING A SAMPLE USING CHARGED PARTICLE B...

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

METHOD OF CHARACTERIZING A FAULT IN A SCANNING ELECTRON MICROSCOPE

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

OBJECTIVE LENS COVER AND CHARGED PARTICLE BEAM APPARATUS INCLUDING...

Method and System for Imaging a Sample

E-BEAM EXPOSURE METHOD AND MASK MANUFACTURING METHOD COMPRISING THE...

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...

METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...

PLASMA PROCESSING APPARATUS AND END POINT DETECTION METHOD

RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...

Ion Milling Device, and Inspection System

MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...