Circuits therefor

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CPC
G01R31/2607

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2607Circuits therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 12,196,801
- Issue date Jan 14, 2025
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and inspection method
- Patent number 12,169,216
- Issue date Dec 17, 2024
- Rohm Co., Ltd.
- Tsuyoshi Tachi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and test system
- Patent number 12,140,624
- Issue date Nov 12, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Keita Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing array substrate, and computer readabl...
- Patent number 12,107,020
- Issue date Oct 1, 2024
- HKC CORPORATION LIMITED
- Peixin Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noise monitoring apparatus, noise monitoring system and a noise mon...
- Patent number 12,085,603
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chin Yin
- G01 - MEASURING TESTING
Information Patent Grant
Method for reduction of SIC MOSFET gate voltage glitches
- Patent number 12,050,244
- Issue date Jul 30, 2024
- Teradyne, Inc.
- Martin Hollander
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Hybrid harmonic source pull tuner system
- Patent number 12,052,008
- Issue date Jul 30, 2024
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive device for voltage-controlled semiconductor element
- Patent number 12,047,060
- Issue date Jul 23, 2024
- Fuji Electric Co., Ltd.
- Hiroaki Ichikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit die test architecture
- Patent number 12,025,649
- Issue date Jul 2, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including temperature sensing circuit
- Patent number 11,860,045
- Issue date Jan 2, 2024
- SK Hynix Inc.
- Dahoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Micro device arrangement in donor substrate
- Patent number 11,854,783
- Issue date Dec 26, 2023
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical characteristic inspection device for semiconductor devic...
- Patent number 11,828,786
- Issue date Nov 28, 2023
- Mitsubishi Electric Corporation
- Sumito Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection structures, semiconductor devices including the sa...
- Patent number 11,796,587
- Issue date Oct 24, 2023
- Samsung Electronics Co., Ltd.
- Junghyun Roh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling BTI and HCI mechanism in ring oscillator
- Patent number 11,789,064
- Issue date Oct 17, 2023
- International Business Machines Corporation
- Huimei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit die test architecture
- Patent number 11,726,135
- Issue date Aug 15, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 11,719,738
- Issue date Aug 8, 2023
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Universal switching platform and method for testing dynamic charact...
- Patent number 11,698,404
- Issue date Jul 11, 2023
- Device Dynamics Lab Co., Ltd.
- Ming-Cheng Lin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical probe, optical probe array, test system and test method
- Patent number 11,624,679
- Issue date Apr 11, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Gate-driving circuit and device
- Patent number 11,522,540
- Issue date Dec 6, 2022
- Device Dynamics Lab Co., Ltd.
- Ming-Cheng Lin
- G01 - MEASURING TESTING
Information Patent Grant
Prognostic health management for power devices
- Patent number 11,443,990
- Issue date Sep 13, 2022
- Infineon Technologies AG
- Sergio De Gasperi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices including through electrodes
- Patent number 11,422,181
- Issue date Aug 23, 2022
- SK hynix Inc.
- Chang Hyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heterodyne active electronic load pull tuner
- Patent number 11,391,770
- Issue date Jul 19, 2022
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit die test architecture
- Patent number 11,391,769
- Issue date Jul 19, 2022
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test system and the method for testing a semiconductor device
- Patent number 11,385,276
- Issue date Jul 12, 2022
- Kioxia Corporation
- Kunihiko Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus of semiconductor device and method for inspect...
- Patent number 11,333,700
- Issue date May 17, 2022
- Kabushiki Kaisha Toshiba
- Jumpei Tajima
- G01 - MEASURING TESTING
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Current detection circuit
- Patent number 11,262,388
- Issue date Mar 1, 2022
- Kabushiki Kaisha Toshiba
- Terumitsu Komatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for monitoring a semiconductor switch for failure and invert...
- Publication number 20250020711
- Publication date Jan 16, 2025
- SEG Automotive Germany GmbH
- Nima SAADAT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...
- Publication number 20240410931
- Publication date Dec 12, 2024
- AMCAD Engineering
- Christophe CHARBONNIAUD
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD FOR IMPROVING IO DEVICE YIELD
- Publication number 20240353468
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiacheng Wen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
- Publication number 20240345154
- Publication date Oct 17, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240310427
- Publication date Sep 19, 2024
- RENESAS ELECTRONICS CORPORATION
- Kouhei MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...
- Publication number 20240219427
- Publication date Jul 4, 2024
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE
- Publication number 20240153830
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Gyosoo CHOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALCULATION METHOD AND CALCULATION DEVICE
- Publication number 20240142504
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Takeshi Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
- Publication number 20240125841
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Cheongwon Lee
- G01 - MEASURING TESTING
Information Patent Application
MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
- Publication number 20240096684
- Publication date Mar 21, 2024
- VueReal Inc.
- Gholamreza Chaji
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME
- Publication number 20240085469
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Seong Kwan LEE
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITRY AND METHODS FOR MONITORING POWER CONVERSION CIRCUITRY
- Publication number 20240069089
- Publication date Feb 29, 2024
- Rolls-Royce plc
- Prasanth SUNDARARAJAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
NOISE MONITORING APPARATUS, NOISE MONITORING SYSTEM AND A NOISE MON...
- Publication number 20240044969
- Publication date Feb 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin Yin
- G01 - MEASURING TESTING
Information Patent Application
MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC P...
- Publication number 20240027512
- Publication date Jan 25, 2024
- Innolux Corporation
- Ker-Yih Kao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCTION OF SIC MOSFET GATE VOLTAGE GLITCHES
- Publication number 20230408571
- Publication date Dec 21, 2023
- Teradyne, Inc.
- Martin Hollander
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
- Publication number 20230366920
- Publication date Nov 16, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL LOOP DUAL-STAGE SOURCE MEASURE UNIT
- Publication number 20230296660
- Publication date Sep 21, 2023
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
GATE VOLTAGE DETERMINATION APPARATUS, GATE VOLTAGE DETERMINATION ME...
- Publication number 20230236239
- Publication date Jul 27, 2023
- Fuji Electric Co., Ltd.
- Naoki KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
TEST VEHICLE AND TEST METHOD FOR MICROELECTRONIC DEVICES
- Publication number 20230230888
- Publication date Jul 20, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- René ESCOFFIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS
- Publication number 20230152363
- Publication date May 18, 2023
- SAMSUNG DISPLAY CO., LTD.
- Ali Fazli Yeknami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MAN...
- Publication number 20230141552
- Publication date May 11, 2023
- MITSUBISHI ELECTRIC CORPORATION
- Gaku NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
DRIVE DEVICE FOR VOLTAGE-CONTROLLED SEMICONDUCTOR ELEMENT
- Publication number 20230088396
- Publication date Mar 23, 2023
- Fuji Electric Co., Ltd.
- Hiroaki ICHIKAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND TEST SYSTEM
- Publication number 20230082419
- Publication date Mar 16, 2023
- Sony Semiconductor Solutions Corporation
- KEITA TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining Material Parameters of a Multilayer Test Sample
- Publication number 20230078663
- Publication date Mar 16, 2023
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING PARAMETERS OF A JUNCTION OF A POWER SEMI-COND...
- Publication number 20230003586
- Publication date Jan 5, 2023
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
- Publication number 20220341985
- Publication date Oct 27, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
MODEL PARAMETER TEST STRUCTURES FOR TRANSISTORS AND PREPARATION MET...
- Publication number 20220319936
- Publication date Oct 6, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Guochao LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A CET MAP, METHOD FOR DETERMINING THE ACTIVA...
- Publication number 20220299559
- Publication date Sep 22, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Abygael VIEY
- G01 - MEASURING TESTING
Information Patent Application
EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF
- Publication number 20220283217
- Publication date Sep 8, 2022
- United Microelectronics Corp.
- Ji-Fu KUNG
- G01 - MEASURING TESTING

Circuits therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Two-domain two-stage sensing front-end circuits and systems

Methods and apparatus for testing inaccessible interface circuits i...

Semiconductor device and inspection method

Semiconductor device and test system

Method for determining material parameters of a multilayer test sample

Method and device for testing array substrate, and computer readabl...

Noise monitoring apparatus, noise monitoring system and a noise mon...

Method for reduction of SIC MOSFET gate voltage glitches

Hybrid harmonic source pull tuner system

Drive device for voltage-controlled semiconductor element

Integrated circuit die test architecture

Semiconductor device including temperature sensing circuit

Micro device arrangement in donor substrate

Electrical characteristic inspection device for semiconductor devic...

Defect detection structures, semiconductor devices including the sa...

Decoupling BTI and HCI mechanism in ring oscillator

Integrated circuit die test architecture

Two-domain two-stage sensing front-end circuits and systems

Universal switching platform and method for testing dynamic charact...

Optical probe, optical probe array, test system and test method

Memory controller with integrated test circuitry

Gate-driving circuit and device

Prognostic health management for power devices

Semiconductor devices including through electrodes

Heterodyne active electronic load pull tuner

Integrated circuit die test architecture

Test system and the method for testing a semiconductor device

Inspection apparatus of semiconductor device and method for inspect...

Memory controller with integrated test circuitry

Current detection circuit

Patents Applicationslast 30 patents

Method for monitoring a semiconductor switch for failure and invert...

METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...

TEST METHOD FOR IMPROVING IO DEVICE YIELD

INTEGRATED CIRCUIT DIE TEST ARCHITECTURE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...

SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE

CALCULATION METHOD AND CALCULATION DEVICE

TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT

MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE

TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME

CIRCUITRY AND METHODS FOR MONITORING POWER CONVERSION CIRCUITRY

NOISE MONITORING APPARATUS, NOISE MONITORING SYSTEM AND A NOISE MON...

MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC P...

METHOD FOR REDUCTION OF SIC MOSFET GATE VOLTAGE GLITCHES

INTEGRATED CIRCUIT DIE TEST ARCHITECTURE

DIGITAL LOOP DUAL-STAGE SOURCE MEASURE UNIT

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

GATE VOLTAGE DETERMINATION APPARATUS, GATE VOLTAGE DETERMINATION ME...

TEST VEHICLE AND TEST METHOD FOR MICROELECTRONIC DEVICES

TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS

SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MAN...

DRIVE DEVICE FOR VOLTAGE-CONTROLLED SEMICONDUCTOR ELEMENT

SEMICONDUCTOR DEVICE AND TEST SYSTEM

Method for Determining Material Parameters of a Multilayer Test Sample

METHOD FOR ESTIMATING PARAMETERS OF A JUNCTION OF A POWER SEMI-COND...

INTEGRATED CIRCUIT DIE TEST ARCHITECTURE

MODEL PARAMETER TEST STRUCTURES FOR TRANSISTORS AND PREPARATION MET...

METHOD FOR DETERMINING A CET MAP, METHOD FOR DETERMINING THE ACTIVA...

EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF