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G01R31/2607
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2607
Circuits therefor
Industries
Overview
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People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device including temperature sensing circuit
Patent number
11,860,045
Issue date
Jan 2, 2024
SK Hynix Inc.
Dahoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Micro device arrangement in donor substrate
Patent number
11,854,783
Issue date
Dec 26, 2023
VueReal Inc.
Gholamreza Chaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical characteristic inspection device for semiconductor devic...
Patent number
11,828,786
Issue date
Nov 28, 2023
Mitsubishi Electric Corporation
Sumito Ogata
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection structures, semiconductor devices including the sa...
Patent number
11,796,587
Issue date
Oct 24, 2023
Samsung Electronics Co., Ltd.
Junghyun Roh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Decoupling BTI and HCI mechanism in ring oscillator
Patent number
11,789,064
Issue date
Oct 17, 2023
International Business Machines Corporation
Huimei Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit die test architecture
Patent number
11,726,135
Issue date
Aug 15, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Two-domain two-stage sensing front-end circuits and systems
Patent number
11,719,738
Issue date
Aug 8, 2023
Samsung Display Co., Ltd.
Ali Fazli Yeknami
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Universal switching platform and method for testing dynamic charact...
Patent number
11,698,404
Issue date
Jul 11, 2023
Device Dynamics Lab Co., Ltd.
Ming-Cheng Lin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Optical probe, optical probe array, test system and test method
Patent number
11,624,679
Issue date
Apr 11, 2023
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Memory controller with integrated test circuitry
Patent number
11,567,120
Issue date
Jan 31, 2023
RAMBUS INC.
Frederick A. Ware
G01 - MEASURING TESTING
Information
Patent Grant
Gate-driving circuit and device
Patent number
11,522,540
Issue date
Dec 6, 2022
Device Dynamics Lab Co., Ltd.
Ming-Cheng Lin
G01 - MEASURING TESTING
Information
Patent Grant
Prognostic health management for power devices
Patent number
11,443,990
Issue date
Sep 13, 2022
Infineon Technologies AG
Sergio De Gasperi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor devices including through electrodes
Patent number
11,422,181
Issue date
Aug 23, 2022
SK hynix Inc.
Chang Hyun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Heterodyne active electronic load pull tuner
Patent number
11,391,770
Issue date
Jul 19, 2022
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit die test architecture
Patent number
11,391,769
Issue date
Jul 19, 2022
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Test system and the method for testing a semiconductor device
Patent number
11,385,276
Issue date
Jul 12, 2022
Kioxia Corporation
Kunihiko Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus of semiconductor device and method for inspect...
Patent number
11,333,700
Issue date
May 17, 2022
Kabushiki Kaisha Toshiba
Jumpei Tajima
G01 - MEASURING TESTING
Information
Patent Grant
Memory controller with integrated test circuitry
Patent number
11,307,243
Issue date
Apr 19, 2022
RAMBUS INC.
Frederick A. Ware
G11 - INFORMATION STORAGE
Information
Patent Grant
Current detection circuit
Patent number
11,262,388
Issue date
Mar 1, 2022
Kabushiki Kaisha Toshiba
Terumitsu Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Drive device, power supply system, and method of testing drive device
Patent number
11,217,989
Issue date
Jan 4, 2022
Renesas Electronics Corporation
Shunichi Kaeriyama
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial socket of impedance matching structure for semiconductor ch...
Patent number
11,199,571
Issue date
Dec 14, 2021
Yuanjun Shi
G01 - MEASURING TESTING
Information
Patent Grant
Micro device arrangement in donor substrate
Patent number
11,195,741
Issue date
Dec 7, 2021
VueReal Inc.
Gholamreza Chaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for the characterization and monitoring of integrated circuits
Patent number
11,169,200
Issue date
Nov 9, 2021
International Business Machines Corporation
Raphael P. Robertazzi
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and test method for display panels
Patent number
11,158,222
Issue date
Oct 26, 2021
HKC CORPORATION LIMITED
Yu-Jen Chen
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Semiconductor device inspection apparatus, semiconductor device ins...
Patent number
11,156,654
Issue date
Oct 26, 2021
Kabushiki Kaisha Toshiba
Akihiro Goryu
G01 - MEASURING TESTING
Information
Patent Grant
Voltage spike detector and system for detecting voltage spikes in s...
Patent number
11,150,292
Issue date
Oct 19, 2021
Anora, LLC
Pramodchandran Variyam
G01 - MEASURING TESTING
Information
Patent Grant
Testing structure and testing method
Patent number
11,143,690
Issue date
Oct 12, 2021
NANYA TECHNOLOGY CORPORATION
Hsueh-Han Lu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Performance-screen ring oscillator with switchable features
Patent number
11,146,251
Issue date
Oct 12, 2021
International Business Machines Corporation
John B. DeForge
G01 - MEASURING TESTING
Information
Patent Grant
Failure positioning method
Patent number
11,125,804
Issue date
Sep 21, 2021
Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
Lingye Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device, inspection system, intelligent power module, ins...
Patent number
11,079,427
Issue date
Aug 3, 2021
Kabushiki Kaisha Toshiba
Mitsuaki Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE
Publication number
20240153830
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Gyosoo CHOO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALCULATION METHOD AND CALCULATION DEVICE
Publication number
20240142504
Publication date
May 2, 2024
Sumitomo Electric Industries, Ltd.
Takeshi Kawasaki
G01 - MEASURING TESTING
Information
Patent Application
TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
Publication number
20240125841
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Cheongwon Lee
G01 - MEASURING TESTING
Information
Patent Application
MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
Publication number
20240096684
Publication date
Mar 21, 2024
VueReal Inc.
Gholamreza Chaji
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME
Publication number
20240085469
Publication date
Mar 14, 2024
Samsung Electronics Co., Ltd.
Seong Kwan LEE
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITRY AND METHODS FOR MONITORING POWER CONVERSION CIRCUITRY
Publication number
20240069089
Publication date
Feb 29, 2024
Rolls-Royce plc
Prasanth SUNDARARAJAN
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
NOISE MONITORING APPARATUS, NOISE MONITORING SYSTEM AND A NOISE MON...
Publication number
20240044969
Publication date
Feb 8, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chin Yin
G01 - MEASURING TESTING
Information
Patent Application
MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC P...
Publication number
20240027512
Publication date
Jan 25, 2024
Innolux Corporation
Ker-Yih Kao
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCTION OF SIC MOSFET GATE VOLTAGE GLITCHES
Publication number
20230408571
Publication date
Dec 21, 2023
Teradyne, Inc.
Martin Hollander
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20230366920
Publication date
Nov 16, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL LOOP DUAL-STAGE SOURCE MEASURE UNIT
Publication number
20230296660
Publication date
Sep 21, 2023
KEITHLEY INSTRUMENTS, LLC
Wayne C. Goeke
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
Publication number
20230266385
Publication date
Aug 24, 2023
Rambus Inc.
Frederick A. Ware
G11 - INFORMATION STORAGE
Information
Patent Application
GATE VOLTAGE DETERMINATION APPARATUS, GATE VOLTAGE DETERMINATION ME...
Publication number
20230236239
Publication date
Jul 27, 2023
Fuji Electric Co., Ltd.
Naoki KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
TEST VEHICLE AND TEST METHOD FOR MICROELECTRONIC DEVICES
Publication number
20230230888
Publication date
Jul 20, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
René ESCOFFIER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS
Publication number
20230152363
Publication date
May 18, 2023
SAMSUNG DISPLAY CO., LTD.
Ali Fazli Yeknami
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MAN...
Publication number
20230141552
Publication date
May 11, 2023
MITSUBISHI ELECTRIC CORPORATION
Gaku NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
DRIVE DEVICE FOR VOLTAGE-CONTROLLED SEMICONDUCTOR ELEMENT
Publication number
20230088396
Publication date
Mar 23, 2023
Fuji Electric Co., Ltd.
Hiroaki ICHIKAWA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SEMICONDUCTOR DEVICE AND TEST SYSTEM
Publication number
20230082419
Publication date
Mar 16, 2023
Sony Semiconductor Solutions Corporation
KEITA TAKEUCHI
G01 - MEASURING TESTING
Information
Patent Application
Method for Determining Material Parameters of a Multilayer Test Sample
Publication number
20230078663
Publication date
Mar 16, 2023
KLA Corporation
Alberto Cagliani
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ESTIMATING PARAMETERS OF A JUNCTION OF A POWER SEMI-COND...
Publication number
20230003586
Publication date
Jan 5, 2023
Mitsubishi Electric Corporation
Nicolas DEGRENNE
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20220341985
Publication date
Oct 27, 2022
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
MODEL PARAMETER TEST STRUCTURES FOR TRANSISTORS AND PREPARATION MET...
Publication number
20220319936
Publication date
Oct 6, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC.
Guochao LI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETERMINING A CET MAP, METHOD FOR DETERMINING THE ACTIVA...
Publication number
20220299559
Publication date
Sep 22, 2022
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Abygael VIEY
G01 - MEASURING TESTING
Information
Patent Application
EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF
Publication number
20220283217
Publication date
Sep 8, 2022
United Microelectronics Corp.
Ji-Fu KUNG
G01 - MEASURING TESTING
Information
Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
Publication number
20220283219
Publication date
Sep 8, 2022
Rambus Inc.
Frederick A. Ware
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION METHOD
Publication number
20220244305
Publication date
Aug 4, 2022
Rohm Co., Ltd.
Tsuyoshi TACHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVIC...
Publication number
20220229103
Publication date
Jul 21, 2022
Mitsubishi Electric Corporation
Sumito OGATA
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL SWITCHING PLATFORM AND METHOD FOR TESTING DYNAMIC CHARACT...
Publication number
20220221503
Publication date
Jul 14, 2022
Device Dynamics Lab Co., Ltd.
Ming-Cheng LIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
GATE-DRIVING CIRCUIT AND DEVICE
Publication number
20220224329
Publication date
Jul 14, 2022
DEVICE DYNAMICS LAB CO., LTD.
Ming-Cheng LIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS
Publication number
20220120805
Publication date
Apr 21, 2022
SAMSUNG DISPLAY CO., LTD.
Ali Fazli Yeknami
H03 - BASIC ELECTRONIC CIRCUITRY