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G01R31/31727
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/31727
Clock circuits aspects
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automatic fault injection in a clock monitor unit
Patent number
11,971,447
Issue date
Apr 30, 2024
NXP USA, INC.
Praveen Durga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for power measurement in electronic circuit de...
Patent number
11,959,950
Issue date
Apr 16, 2024
ARM Limited
Xiaoqing Xu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuit using clock gating scheme to hold capture procedure an...
Patent number
11,959,965
Issue date
Apr 16, 2024
Samsung Electronics Co., Ltd.
Giha Nam
G01 - MEASURING TESTING
Information
Patent Grant
Multi-die debug stop clock trigger
Patent number
11,946,969
Issue date
Apr 2, 2024
Apple Inc.
Charles J. Fleckenstein
G01 - MEASURING TESTING
Information
Patent Grant
System on chip for performing scan test and method of designing the...
Patent number
11,940,494
Issue date
Mar 26, 2024
Samsung Electronics Co., Ltd.
Woohyun Son
G01 - MEASURING TESTING
Information
Patent Grant
Flexible one-hot decoding logic for clock controls
Patent number
11,940,493
Issue date
Mar 26, 2024
NVIDIA Corp.
Mahmut Yilmaz
G01 - MEASURING TESTING
Information
Patent Grant
Calibration circuit, memory and calibration method
Patent number
11,935,621
Issue date
Mar 19, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Kai Tian
G11 - INFORMATION STORAGE
Information
Patent Grant
Integrated functional and design for testability (DFT) clock delive...
Patent number
11,934,219
Issue date
Mar 19, 2024
QUALCOMM Incorporated
Arvind Jain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determining charge pump efficiency using clock edge counting
Patent number
11,927,635
Issue date
Mar 12, 2024
SanDisk Technologies LLC
Keyur Payak
G01 - MEASURING TESTING
Information
Patent Grant
Baseboard management controller (BMC) test system and method
Patent number
11,907,384
Issue date
Feb 20, 2024
Dell Products, L.P.
Timothy M. Lambert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
Patent number
11,899,063
Issue date
Feb 13, 2024
Texas Instruments Incorporated
Mudasir Shafat Kawoosa
G01 - MEASURING TESTING
Information
Patent Grant
Configuration of configurable test logic
Patent number
11,899,066
Issue date
Feb 13, 2024
Hewlett Packard Enterprise Development LP
Naysen J. Robertson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for debugging metastability in digital circuits
Patent number
11,892,504
Issue date
Feb 6, 2024
Cadence Design Systems, Inc.
Alberto Arias Drake
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing clocking systems in integrated circuits
Patent number
11,879,939
Issue date
Jan 23, 2024
NXP B.V.
Nikila Krishnamoorthy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,879,941
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Reduced signaling interface method and apparatus
Patent number
11,867,756
Issue date
Jan 9, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit chip testing interface with reduced signal wires
Patent number
11,860,228
Issue date
Jan 2, 2024
Xilinx, Inc.
Albert Shih-Huai Lin
G01 - MEASURING TESTING
Information
Patent Grant
Time offset method and device for test signal
Patent number
11,860,226
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Liang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Spur cancellation for spur measurement
Patent number
11,855,649
Issue date
Dec 26, 2023
Skyworks Solutions, Inc.
Timothy A. Monk
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Selectable JTAG or trace access with data store and output
Patent number
11,835,578
Issue date
Dec 5, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built in self test (BIST) for clock generation circuitry
Patent number
11,821,946
Issue date
Nov 21, 2023
NXP USA, INC.
Jorge Arturo Corso Sarmiento
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Duty cycle detector self-testing
Patent number
11,815,553
Issue date
Nov 14, 2023
NXP USA, INC.
Cristian Pavao Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
AT-speed test access port operations
Patent number
11,808,810
Issue date
Nov 7, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for managing transactions burstiness and generati...
Patent number
11,797,409
Issue date
Oct 24, 2023
HCL America Inc.
Manickam Muthiah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High speed integrated circuit testing
Patent number
11,789,071
Issue date
Oct 17, 2023
Texas Instruments Incorporated
Devraj Matharampallil Rajagopal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Clock monitor circuit and microcontroller and control method thereof
Patent number
11,789,072
Issue date
Oct 17, 2023
Nuvoton Technology Corporation
Wei-Ling Lin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Split-scan sense amplifier flip-flop
Patent number
11,789,075
Issue date
Oct 17, 2023
Advanced Micro Devices, Inc.
Nur Mohammad Baksh
G01 - MEASURING TESTING
Information
Patent Grant
Scan test device and scan test method
Patent number
11,789,073
Issue date
Oct 17, 2023
Realtek Semiconductor Corporation
Po-Lin Chen
G01 - MEASURING TESTING
Information
Patent Grant
Wafer scale testing using a 2 signal JTAG interface
Patent number
11,782,091
Issue date
Oct 10, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit with reduced signaling interface
Patent number
11,768,238
Issue date
Sep 26, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF SCAN TEST FOR THEREOF
Publication number
20240142519
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Kazushi NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Test device for testing on-chip clock controller having debug function
Publication number
20240133950
Publication date
Apr 25, 2024
REALTEK SEMICONDUCTOR CORPORATION
SHENG-PING YUNG
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
Publication number
20240133953
Publication date
Apr 25, 2024
KIOXIA Corporation
Mikio SHIRAISHI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR PERFORMING CLOCK GATING IN ELECTRO...
Publication number
20240110976
Publication date
Apr 4, 2024
Realtek Semiconductor Corp.
Ching-Feng Huang
G01 - MEASURING TESTING
Information
Patent Application
SENSOR MODULE
Publication number
20240110960
Publication date
Apr 4, 2024
SEIKO EPSON CORPORATION
Kenta Sato
G01 - MEASURING TESTING
Information
Patent Application
MEMORY, MEMORY SYSTEM AND METHOD OF CONTROLLING STORAGE DEVICE
Publication number
20240094286
Publication date
Mar 21, 2024
KIOXIA Corporation
Atsushi YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS
Publication number
20240094291
Publication date
Mar 21, 2024
NVIDIA Corp.
Mahmut Yilmaz
G01 - MEASURING TESTING
Information
Patent Application
ANALOG PHASE SELECTION TEST SYSTEM
Publication number
20240085476
Publication date
Mar 14, 2024
NXP B.V.
Andreas Johannes Köllmann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTRONIC DEVICE FOR SELF-TESTING PERIOD OF CLOCK SIGNAL AND MONIT...
Publication number
20240069097
Publication date
Feb 29, 2024
RICHTEK TECHNOLOGY CORPORATION
Fu-Shiang LAI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND TECHNIQUES FOR TIMING MISMATCH REDUCTION
Publication number
20240072774
Publication date
Feb 29, 2024
Micron Technology, Inc.
Yoshihito Morishita
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20240061038
Publication date
Feb 22, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRONIC DEVICE AND PHASE DETECTOR
Publication number
20240044977
Publication date
Feb 8, 2024
NANYA TECHNOLOGY CORPORATION
Wu-Der YANG
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE IN...
Publication number
20240044978
Publication date
Feb 8, 2024
Samsung Electronics Co., Ltd.
Gunjan Mandal
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND PHASE DETECTOR
Publication number
20240044976
Publication date
Feb 8, 2024
NANYA TECHNOLOGY CORPORATION
Wu-Der YANG
G01 - MEASURING TESTING
Information
Patent Application
TEST CIRCUIT, TEST METHOD, AND COMPUTING SYSTEM COMPRISING TEST CIR...
Publication number
20240036113
Publication date
Feb 1, 2024
SHENZHEN MICROBT ELECTRONICS TECHNOLOGY CO., LTD.
Mo CHEN
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURATION OF CONFIGURABLE TEST LOGIC
Publication number
20240019490
Publication date
Jan 18, 2024
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Naysen J. Robertson
G01 - MEASURING TESTING
Information
Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
Publication number
20240019489
Publication date
Jan 18, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SIGNAL GENERATION DEVICE, MEASUREMENT DEVICE, AND METHOD
Publication number
20240012049
Publication date
Jan 11, 2024
Rohde& Schwarz GmbH & Co. KG
Benjamin SCHNEIDER
G01 - MEASURING TESTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20240012050
Publication date
Jan 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN CIRCUIT AND METHOD
Publication number
20240012051
Publication date
Jan 11, 2024
STMicroelectronics International N.V.
Venkata Narayanan Srinivasan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230417831
Publication date
Dec 28, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for Measuring a Duty Cycle of a Clock Signal
Publication number
20230408580
Publication date
Dec 21, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Eric SOENEN
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
ADDRESSABLE TEST ACCESS PORT
Publication number
20230400513
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY-DETECTING CIRCUIT, DUTY-CYCLE CORRECTOR, AND ELECTRONIC D...
Publication number
20230387890
Publication date
Nov 30, 2023
GigaDevice Semiconductor Inc.
Menghai WANG
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND CIRCUIT FOR PERFORMING ERROR DETECTION ON A CLOCK GATED...
Publication number
20230384374
Publication date
Nov 30, 2023
Imagination Technologies Limited
Faizan Nazar
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND CIRCUIT FOR PERFORMING ERROR DETECTION ON A CLOCK GATED...
Publication number
20230384375
Publication date
Nov 30, 2023
Imagination Technologies Limited
Faizan Nazar
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC CIRCUIT AND METHOD OF ERROR CORRECTION
Publication number
20230384373
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing company Ltd.
CHIA-CHUN LIAO
G01 - MEASURING TESTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20230384376
Publication date
Nov 30, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT CHIP TESTING INTERFACE WITH REDUCED SIGNAL WIRES
Publication number
20230366929
Publication date
Nov 16, 2023
Xilinx, Inc.
Albert Shih-Huai LIN
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING
Publication number
20230349972
Publication date
Nov 2, 2023
KEYUR PAYAK
G01 - MEASURING TESTING