collimators

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CPC
G01N2223/316

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/316collimators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive inspecting device, and nondestructive inspecting method
- Patent number 12,259,340
- Issue date Mar 25, 2025
- Riken
- Kunihiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
- Patent number 11,796,491
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Shinji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Re-entrant cones for moderator chamber of a neutron imaging system
- Patent number 11,774,375
- Issue date Oct 3, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
- Patent number 11,754,516
- Issue date Sep 12, 2023
- Topcon Corporation
- Hisashi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Defining parameters for scan of single crystal structure
- Patent number 11,740,189
- Issue date Aug 29, 2023
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Method for optimizing radiation beam intensity profile shape using...
- Patent number 11,724,129
- Issue date Aug 15, 2023
- The Johns Hopkins University
- Joseph Webster Stayman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scatter correction for computed tomography imaging
- Patent number 11,698,349
- Issue date Jul 11, 2023
- Baker Hughes Oilfield Operations LLC
- Nils Rothe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray imaging apparatus and method
- Patent number 11,681,068
- Issue date Jun 20, 2023
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluoresence apparatus for a measurement of mineral slurries
- Patent number 11,644,431
- Issue date May 9, 2023
- Microtrace Pty Limited
- Gregory John Roach
- G01 - MEASURING TESTING
Information Patent Grant
Serial Moire scanning phase contrast x-ray imaging
- Patent number 11,639,903
- Issue date May 2, 2023
- Battelle Memorial Institute
- Erin A. Miller
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample inspection system
- Patent number 11,624,717
- Issue date Apr 11, 2023
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic imaging apparatus
- Patent number 11,567,016
- Issue date Jan 31, 2023
- FUJIFILM HEALTHCARE CORPORATION
- Masafumi Onouchi
- G01 - MEASURING TESTING
Information Patent Grant
Mini C-arm imaging system with stepless collimation
- Patent number 11,530,995
- Issue date Dec 20, 2022
- OrthoScan, Inc.
- Andy Webster Green
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Imaging system and method with scatter correction
- Patent number 11,493,458
- Issue date Nov 8, 2022
- GE Sensing & Inspection Technologies GmbH
- Alexander Suppes
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scanning x-ray generator, composite inspection apparatus,...
- Patent number 11,467,105
- Issue date Oct 11, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus and x-ray generation unit
- Patent number 11,467,107
- Issue date Oct 11, 2022
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE
- Publication number 20240379258
- Publication date Nov 14, 2024
- Nuctech Company Limited
- Yaohong LIU
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240167967
- Publication date May 23, 2024
- Woorien Co., Ltd.
- Taehee HAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...
- Publication number 20240068966
- Publication date Feb 29, 2024
- Danmarks Tekniske Universitet
- Henning Friis Poulsen
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Tomographic Imaging of Core Samples
- Publication number 20240053284
- Publication date Feb 15, 2024
- Orimtech Ltd.
- Boris S. Goldberg
- G01 - MEASURING TESTING
Information Patent Application
COMBINED XRF ANALYSIS DEVICE
- Publication number 20240044821
- Publication date Feb 8, 2024
- Shenzhen Angstrom Excellence Technology Co. Ltd
- Xuena ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230408425
- Publication date Dec 21, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20230393082
- Publication date Dec 7, 2023
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
Methods and Means for the Measurement of Tubing, Casing, Perforatio...
- Publication number 20230392491
- Publication date Dec 7, 2023
- Philip Teague
- E21 - EARTH DRILLING MINING
Information Patent Application
COLLIMATOR
- Publication number 20230358692
- Publication date Nov 9, 2023
- ISTITUTO NAZIONALE DI FISICA NUCLEARE
- Roberto BEDOGNI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
- Publication number 20230349842
- Publication date Nov 2, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230333029
- Publication date Oct 19, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
A DEVICE FOR TESTING A FLAT PLATE-SHAPED MATERIAL
- Publication number 20230314346
- Publication date Oct 5, 2023
- FORCE TECHNOLOGY
- Finn Falentin Olesen
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
- Publication number 20230296536
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
- Publication number 20230288350
- Publication date Sep 14, 2023
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
- Publication number 20230273134
- Publication date Aug 31, 2023
- PROTO PATENTS LTD.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING
Information Patent Application
A Detection System and Method for Investigating a Content of an Item
- Publication number 20230266257
- Publication date Aug 24, 2023
- Dynaxion B.V.
- Emma Wooldridge
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR
- Publication number 20230076183
- Publication date Mar 9, 2023
- FUJIFILM Healthcare Corporation
- Masafumi Onouchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MEASURING ANGLES OF ORIENTATION OF AN X-RAY I...
- Publication number 20230003673
- Publication date Jan 5, 2023
- SAFRAN
- Edward ROMERO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD
- Publication number 20220390391
- Publication date Dec 8, 2022
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
A SAMPLE INSPECTION SYSTEM
- Publication number 20220381710
- Publication date Dec 1, 2022
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING SYSTEM
- Publication number 20220357289
- Publication date Nov 10, 2022
- VAREX IMAGING CORPORATION
- Daniel Shedlock
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING THE PROCESS PARAMETERS BY MEANS OF RADIOGRAPHIC ONLINE...
- Publication number 20220357290
- Publication date Nov 10, 2022
- SMS group GMBH
- Christian KLINKENBERG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SYSTEM AND METHOD FOR SCANNING VESSELS
- Publication number 20220334037
- Publication date Oct 20, 2022
- JOHNSON MATTHEY PUBLIC LIMITED COMPANY
- Owen John Lloyd JONES
- G05 - CONTROLLING REGULATING
Information Patent Application
X-RAY AUTOMATED CALIBRATION AND MONITORING
- Publication number 20220291148
- Publication date Sep 15, 2022
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING

collimators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nondestructive inspecting device, and nondestructive inspecting method

Method and apparatus of stationary-source nonplanar-trajectory narr...

X-ray system

System, method, and apparatus for x-ray backscatter inspection of p...

Device and method for measuring short-wavelength characteristic X-r...

X-ray automated calibration and monitoring

X-ray beam shaping apparatus and method

Sample inspection system comprising a beam former to project a poly...

Screening system

Controlling process parameters by means of radiographic online dete...

X-ray sequential array wavelength dispersive spectrometer

X-ray collimator and related X-ray inspection apparatus

X-ray spectroscopic analysis apparatus and elemental analysis method

System and method for material characterization

Diffraction analysis device and method for full-field x-ray fluores...

Re-entrant cones for moderator chamber of a neutron imaging system

Nondestructive test system comprising a neutron emission unit for e...

Defining parameters for scan of single crystal structure

Method for optimizing radiation beam intensity profile shape using...

Scatter correction for computed tomography imaging

X-ray imaging apparatus and method

X-ray fluoresence apparatus for a measurement of mineral slurries

Serial Moire scanning phase contrast x-ray imaging

Sample inspection system

Radiographic imaging apparatus

Mini C-arm imaging system with stepless collimation

Imaging system and method with scatter correction

X-ray analyzer

Combined scanning x-ray generator, composite inspection apparatus,...

X-ray analysis apparatus and x-ray generation unit

Patents Applicationslast 30 patents

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

AN X-RAY SYSTEM

RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

Systems and Methods for Monitoring Output Energy of a High-Energy X...

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

X-RAY IMAGING APPARATUS

X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...

System and Method for Tomographic Imaging of Core Samples

COMBINED XRF ANALYSIS DEVICE

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD

Methods and Means for the Measurement of Tubing, Casing, Perforatio...

COLLIMATOR

X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

A DEVICE FOR TESTING A FLAT PLATE-SHAPED MATERIAL

PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...

BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM

TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD

A Detection System and Method for Investigating a Content of an Item

RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR

DEVICE AND METHOD FOR MEASURING ANGLES OF ORIENTATION OF AN X-RAY I...

DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...

BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD

A SAMPLE INSPECTION SYSTEM

BACKSCATTER IMAGING SYSTEM

CONTROLLING THE PROCESS PARAMETERS BY MEANS OF RADIOGRAPHIC ONLINE...

SCANNING SYSTEM AND METHOD FOR SCANNING VESSELS

X-RAY AUTOMATED CALIBRATION AND MONITORING