comprising both N- and P- wells in the substrate

Industry

CPC
H01L27/0928

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Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L27/00Devices consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate

Current Industry

H01L27/0928comprising both N- and P- wells in the substrate

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device comprising separate different well regions wit...
- Patent number 11,967,644
- Issue date Apr 23, 2024
- Silergy Semiconductor Technology (Hangzhou) Ltd.
- Meng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming integrated circuit structure
- Patent number 11,948,935
- Issue date Apr 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yung-Feng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure and formation method of semiconductor device with fin str...
- Patent number 11,942,375
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsing-Hui Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 11,942,540
- Issue date Mar 26, 2024
- Silergy Semiconductor Technology (Hangzhou) Ltd.
- Meng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin loss prevention
- Patent number 11,923,250
- Issue date Mar 5, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Ju Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical device having a protrusion source
- Patent number 11,916,131
- Issue date Feb 27, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- De-Fang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices and a semiconductor d...
- Patent number 11,908,864
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chun-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and static random access memory thereof
- Patent number 11,910,586
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jhon-Jhy Liaw
- G11 - INFORMATION STORAGE
Information Patent Grant
Implantations for forming source/drain regions of different transis...
- Patent number 11,895,819
- Issue date Feb 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Dian-Sheg Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shared well structure, layout, and method
- Patent number 11,876,088
- Issue date Jan 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yang Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 11,876,097
- Issue date Jan 16, 2024
- Samsung Electronics Co., Ltd.
- Krishna Kumar Bhuwalka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static random access memory cell
- Patent number 11,864,368
- Issue date Jan 2, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jordan Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuit to isolate body capacitance in semiconductor dev...
- Patent number 11,855,590
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Garming Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout of static random access memory periphery circuit
- Patent number 11,856,747
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yangsyu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Different isolation liners for different type FinFETs and associate...
- Patent number 11,848,230
- Issue date Dec 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzung-Yi Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor circuits including fringeless transistors and method of...
- Patent number 11,837,601
- Issue date Dec 5, 2023
- SanDisk Technologies LLC
- Jun Akaiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with fin-type field effect transistor
- Patent number 11,824,057
- Issue date Nov 21, 2023
- Sony Corporation
- Koichi Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for finFET SRAM
- Patent number 11,818,874
- Issue date Nov 14, 2023
- Semiconductor Manufacturing International (Shanghai) Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device with different liners for PFET and NFET and method of...
- Patent number 11,810,827
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Lung Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device layout
- Patent number 11,784,180
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor gate-all-around device having an anti-punch-through (...
- Patent number 11,784,226
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Floating body memory cell having gates favoring different conductiv...
- Patent number 11,785,759
- Issue date Oct 10, 2023
- Intel Corporation
- Peter L. D. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having multiple wells and method of making
- Patent number 11,769,812
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih-Chang Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit device, light source device, and electronic apparatus
- Patent number 11,749,684
- Issue date Sep 5, 2023
- Seiko Epson Corporation
- Kei Ishimaru
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Vertical semiconductor device with steep subthreshold slope
- Patent number 11,742,352
- Issue date Aug 29, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Li Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked gate spacers
- Patent number 11,728,411
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation with multi-step structure
- Patent number 11,728,206
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ta-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having well contact diffusion region supplying...
- Patent number 11,715,732
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Moe Ishimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin loss prevention
- Patent number 11,705,372
- Issue date Jul 18, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Ju Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage extended drain MOSFET (EDMOS) devices in a high-k meta...
- Patent number 11,705,455
- Issue date Jul 18, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Thorsten E. Kammler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Different Isolation Liners for Different Type FinFETs and Associate...
- Publication number 20240136222
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Tzung-Yi Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240128268
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Krishna Kumar BHUWALKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240113121
- Publication date Apr 4, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Heng TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT INCLUDING STANDARD CELLS AND METHOD OF DESIGNING...
- Publication number 20240105710
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Hyeongyu You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fin Loss Prevention
- Publication number 20240087961
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hung-Ju CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHARED WELL STRUCTURE MANUFACTURING METHOD
- Publication number 20240088128
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yang ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND CIRCUIT TO ISOLATE BODY CAPACITANCE IN SEMICONDUCTOR DEV...
- Publication number 20240088842
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Garming LIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240088152
- Publication date Mar 14, 2024
- KIOXIA Corporation
- Tomoaki SHINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Well Modulation for Defect Inspection
- Publication number 20240079278
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jhih-Yong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS INCLUDING ADJUSTED WELLS AND METHODS OF MANUFACTURING THE...
- Publication number 20240072057
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Michael A. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT OF STATIC RANDOM ACCESS MEMORY PERIPHERY CIRCUIT
- Publication number 20240074136
- Publication date Feb 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yangsyu LIN
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20240063065
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Bo-Rong LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH FIN TRANSISTORS AND MANUFACTURING METHOD...
- Publication number 20240047461
- Publication date Feb 8, 2024
- SONY CORPORATION
- Koichi Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE LAYOUT
- Publication number 20240047452
- Publication date Feb 8, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH LOW LEAKAGE CURRENT AND METHODS OF FABRI...
- Publication number 20230395436
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE OF THE SILICON ON INSULATOR TYPE AND CORRESPON...
- Publication number 20230387119
- Publication date Nov 30, 2023
- STMicroelectronics (Crolles 2) SAS
- Olivier Weber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Gate-All-Around Device
- Publication number 20230387212
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED GATE SPACERS
- Publication number 20230369459
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Jhon Jhy Liaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION WITH MULTI-STEP STRUCTURE
- Publication number 20230360961
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ta-Chun LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20230361107
- Publication date Nov 9, 2023
- Semiconductor Components Industries, LLC
- Derrick JOHNSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230335492
- Publication date Oct 19, 2023
- Samsung Electronics Co., Ltd.
- Jung Ho Do
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
- Publication number 20230326982
- Publication date Oct 12, 2023
- ARK SEMICONDUCTOR CORP. LTD.
- Chin-Fu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING FULLY STRAINED CHANNELS
- Publication number 20230317795
- Publication date Oct 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shahaji B. More
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY BIAS VOLTAGE GENERATOR AND SEMICONDUCTOR DEVICE INCLUDING THE...
- Publication number 20230317710
- Publication date Oct 5, 2023
- Samsung Electronics Co., Ltd.
- Youngjae KIM
- G05 - CONTROLLING REGULATING
Information Patent Application
BUFFER CIRCUITS AND SEMICONDUCTOR STRUCTURES THEREOF
- Publication number 20230308099
- Publication date Sep 28, 2023
- MEDIATEK INC.
- Hao-Hsiang YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR CELL AND STRUCTURE THEREOF
- Publication number 20230299088
- Publication date Sep 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Yao Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS CIRCUIT
- Publication number 20230253265
- Publication date Aug 10, 2023
- JAPAN AEROSPACE EXPLORATION AGENCY
- Kozo TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230246072
- Publication date Aug 3, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jhon-Jhy LIAW
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESILIENT STORAGE CIRCUITS
- Publication number 20230231544
- Publication date Jul 20, 2023
- Microsoft Technology Licensing, LLC
- Yanzhong Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE AND METHOD FOR FORMING THE SAME
- Publication number 20230200041
- Publication date Jun 22, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsin-Wen SU
- H01 - BASIC ELECTRIC ELEMENTS

comprising both N- and P- wells in the substrate

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device comprising separate different well regions wit...

Method of forming integrated circuit structure

Structure and formation method of semiconductor device with fin str...

Semiconductor device and method for manufacturing the same

Fin loss prevention

Vertical device having a protrusion source

Method of manufacturing semiconductor devices and a semiconductor d...

Integrated circuit and static random access memory thereof

Implantations for forming source/drain regions of different transis...

Shared well structure, layout, and method

Semiconductor device

Static random access memory cell

Method and circuit to isolate body capacitance in semiconductor dev...

Layout of static random access memory periphery circuit

Different isolation liners for different type FinFETs and associate...

Transistor circuits including fringeless transistors and method of...

Semiconductor device with fin-type field effect transistor

Method and device for finFET SRAM

FinFET device with different liners for PFET and NFET and method of...

Semiconductor device layout

Semiconductor gate-all-around device having an anti-punch-through (...

Floating body memory cell having gates favoring different conductiv...

Semiconductor device having multiple wells and method of making

Circuit device, light source device, and electronic apparatus

Vertical semiconductor device with steep subthreshold slope

Stacked gate spacers

Isolation with multi-step structure

Semiconductor device having well contact diffusion region supplying...

Fin loss prevention

High voltage extended drain MOSFET (EDMOS) devices in a high-k meta...

Patents Applicationslast 30 patents

Different Isolation Liners for Different Type FinFETs and Associate...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT INCLUDING STANDARD CELLS AND METHOD OF DESIGNING...

Fin Loss Prevention

SHARED WELL STRUCTURE MANUFACTURING METHOD

METHOD AND CIRCUIT TO ISOLATE BODY CAPACITANCE IN SEMICONDUCTOR DEV...

SEMICONDUCTOR DEVICE

Well Modulation for Defect Inspection

APPARATUS INCLUDING ADJUSTED WELLS AND METHODS OF MANUFACTURING THE...

LAYOUT OF STATIC RANDOM ACCESS MEMORY PERIPHERY CIRCUIT

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR DEVICE WITH FIN TRANSISTORS AND MANUFACTURING METHOD...

SEMICONDUCTOR DEVICE LAYOUT

SEMICONDUCTOR DEVICES WITH LOW LEAKAGE CURRENT AND METHODS OF FABRI...

SEMICONDUCTOR DEVICE OF THE SILICON ON INSULATOR TYPE AND CORRESPON...

Semiconductor Gate-All-Around Device

STACKED GATE SPACERS

ISOLATION WITH MULTI-STEP STRUCTURE

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DE...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF

METHOD OF FORMING FULLY STRAINED CHANNELS

BODY BIAS VOLTAGE GENERATOR AND SEMICONDUCTOR DEVICE INCLUDING THE...

BUFFER CIRCUITS AND SEMICONDUCTOR STRUCTURES THEREOF

CAPACITOR CELL AND STRUCTURE THEREOF

CMOS CIRCUIT

INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREOF

RESILIENT STORAGE CIRCUITS

MEMORY DEVICE AND METHOD FOR FORMING THE SAME