computer control

Industry

CPC
G01N2223/306

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/306computer control

Industries

Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Radiation imaging system including a radiation imaging apparatus, a...
- Patent number 11,974,871
- Issue date May 7, 2024
- Canon Kabushiki Kaisha
- Shimpei Tezuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Radiographic imaging apparatus, method of controlling the same, rad...
- Patent number 11,969,284
- Issue date Apr 30, 2024
- Canon Kabushiki Kaisha
- Tadahiko Iijima
- G01 - MEASURING TESTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Inspection apparatus and non-transitory recording medium storing in...
- Patent number 11,933,745
- Issue date Mar 19, 2024
- Kabushiki Kaisha Toshiba
- Yuka Watanabe
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising data obtaining unit and image processing unit...
- Patent number 11,690,587
- Issue date Jul 4, 2023
- Electronics and Telecommunications Research Institute
- Jin-Woo Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection device
- Patent number 11,598,729
- Issue date Mar 7, 2023
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real time measurement control
- Patent number 11,519,869
- Issue date Dec 6, 2022
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,513,086
- Issue date Nov 29, 2022
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Radiation image imaging apparatus, electronic device, wireless comm...
- Patent number 11,484,281
- Issue date Nov 1, 2022
- Konica Minolta, Inc.
- Kentaro Hara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
- Patent number 11,391,680
- Issue date Jul 19, 2022
- Shimadzu Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring fiber orientation degree, fiber orientation de...
- Patent number 11,360,035
- Issue date Jun 14, 2022
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Atsuhiko Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for determining an improved mineralogical c...
- Patent number 11,340,207
- Issue date May 24, 2022
- Schlumberger Technology Corporation
- Yohann Rocher
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining rotation angles
- Patent number 11,337,667
- Issue date May 24, 2022
- Shanghai United Imaging Healthcare Co., Ltd.
- Jingbo Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray single-pixel camera based on x-ray computational correlated i...
- Patent number 11,255,800
- Issue date Feb 22, 2022
- Institute of Physics, Chinese Academy of Sciences
- Aixin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating measurement plan for measuring...
- Patent number 11,037,337
- Issue date Jun 15, 2021
- Mitutoyo Corporation
- Kozo Ariga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, measurement processing method, measu...
- Patent number 11,016,039
- Issue date May 25, 2021
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20250020604
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...
- Publication number 20240272094
- Publication date Aug 15, 2024
- Anastasiia Mishchenko
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM
- Publication number 20240192152
- Publication date Jun 13, 2024
- Hitachi, Ltd
- Toshiaki TANIGAKI
- G01 - MEASURING TESTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
- Publication number 20240077434
- Publication date Mar 7, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240068961
- Publication date Feb 29, 2024
- Anritsu Corporation
- Takeshi YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...
- Publication number 20230400422
- Publication date Dec 14, 2023
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20230349840
- Publication date Nov 2, 2023
- Direct Conversion AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INTERPRETING HIGH ENERGY INTERACTIONS
- Publication number 20230204527
- Publication date Jun 29, 2023
- DECISION TREE, LLC
- Brandon Lee Goodchild Drake
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING SYSTEM, RADIATION IMAGING APPARATUS, CONTROL METH...
- Publication number 20230119623
- Publication date Apr 20, 2023
- Canon Kabushiki Kaisha
- Yutaka Ishinari
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE HANDLING SYSTEM
- Publication number 20230066062
- Publication date Mar 2, 2023
- ISHIDA CO., LTD.
- Kosuke FUCHUYA
- G01 - MEASURING TESTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MEASUREMENT APPARATUS AND CONTROL METHOD OF CHARGE...
- Publication number 20230026295
- Publication date Jan 26, 2023
- Kabushiki Kaisha Toshiba
- Naoto KUME
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...
- Publication number 20220390394
- Publication date Dec 8, 2022
- Rigaku Corporation
- Takahiro KUZUMAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20220349848
- Publication date Nov 3, 2022
- KEYENCE CORPORATION
- Hayato OHBA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...
- Publication number 20220196576
- Publication date Jun 23, 2022
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION W...
- Publication number 20220187226
- Publication date Jun 16, 2022
- Bruker AXS, LLC
- Luc BOURHIS
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...
- Publication number 20220167939
- Publication date Jun 2, 2022
- Canon Kabushiki Kaisha
- Shimpei Tezuka
- G01 - MEASURING TESTING

computer control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantitative analysis apparatus, method and program and manufacturi...

X-ray weld inspection

Scan procedure generation systems and methods to generate scan proc...

Monitoring properties of X-ray beam during X-ray analysis

Rotational X-ray inspection system and method

X-ray automated calibration and monitoring

Methods and systems for compact, small spot size soft x-ray scatter...

X-ray baggage and parcel inspection system with efficient third-par...

X-ray beam shaping apparatus and method

Radiation imaging system including a radiation imaging apparatus, a...

Radiographic imaging apparatus, method of controlling the same, rad...

System and method for in-situ X-ray diffraction-based real-time mon...

Inspection apparatus and non-transitory recording medium storing in...

Lateral recess measurement in a semiconductor specimen

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Apparatus comprising data obtaining unit and image processing unit...

X-ray inspection device

Loosely-coupled inspection and metrology system for high-volume pro...

Method acquiring projection image, control apparatus, control progr...

Methods and systems for real time measurement control

X-ray fluorescence spectrometer

Radiation image imaging apparatus, electronic device, wireless comm...

X-ray fluorescence analyzer and X-ray fluorescence analysis method

Method for measuring fiber orientation degree, fiber orientation de...

Method and installation for determining an improved mineralogical c...

Systems and methods for determining rotation angles

X-ray single-pixel camera based on x-ray computational correlated i...

Method and apparatus for generating measurement plan for measuring...

Measurement processing device, measurement processing method, measu...

Patents Applicationslast 30 patents

PHOTOELECTRON EMISSION MICROSCOPE

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

PIPELINE INSPECTION APPARATUS

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...

TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...

INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM

Laue Measurement System With Turntable And Method Of Operating The...

Systems and Methods for Generating High-Energy Three-Dimensional Co...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...

X-RAY INSPECTION APPARATUS

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...

Pattern Measurement Device

X-RAY WELD INSPECTION

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

SYSTEMS AND METHODS FOR INTERPRETING HIGH ENERGY INTERACTIONS

RADIATION IMAGING SYSTEM, RADIATION IMAGING APPARATUS, CONTROL METH...

ARTICLE HANDLING SYSTEM

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

CHARGED-PARTICLE MEASUREMENT APPARATUS AND CONTROL METHOD OF CHARGE...

QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...

ANALYSIS DEVICE AND ANALYSIS METHOD

Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...

A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION W...

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...