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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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Photometry
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G01J1/0252
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last 30 patents
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Patent Grant
Circuits and methods for wavelength locking of optical receiver WDM...
Patent number
12,072,239
Issue date
Aug 27, 2024
Xilinx, Inc.
Zhaowen Wang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Power meter systems for additive manufacturing machines
Patent number
12,066,325
Issue date
Aug 20, 2024
Collins Engine Nozzles, Inc.
Matthew Donovan
B22 - CASTING POWDER METALLURGY
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Patent Grant
Emitter module for an LED illumination device
Patent number
12,050,126
Issue date
Jul 30, 2024
Lutron Technology Company LLC
Kuo-Lih Chang
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Illumination device and method for calibrating an illumination devi...
Patent number
12,052,807
Issue date
Jul 30, 2024
Lutron Technology Company LLC
Horace C. Ho
G01 - MEASURING TESTING
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Patent Grant
Thermoelectric conversion material, thermoelectric conversion eleme...
Patent number
12,029,127
Issue date
Jul 2, 2024
Sumitomo Electric Industries, Ltd.
Masahiro Adachi
G01 - MEASURING TESTING
Information
Patent Grant
Pyranometer
Patent number
12,013,283
Issue date
Jun 18, 2024
OTT HydroMet B.V.
Joop Mes
G01 - MEASURING TESTING
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Patent Grant
Triangulation sensor comprising a first optical communication devic...
Patent number
11,982,763
Issue date
May 14, 2024
Banner Engineering Corp.
Timothy S. Gardner
G01 - MEASURING TESTING
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Patent Grant
In-line compact measuring device
Patent number
11,965,825
Issue date
Apr 23, 2024
Endress + Hauser Conducta GmbH + Co. KG
Hongshuo Domnick
G01 - MEASURING TESTING
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Patent Grant
Foreign object detecting system and method
Patent number
11,958,413
Issue date
Apr 16, 2024
Anpec Electronics Corporation
Yi-Chuan Lu
B60 - VEHICLES IN GENERAL
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Patent Grant
Electromagnetic wave module and electromagnetic wave camera system...
Patent number
11,940,323
Issue date
Mar 26, 2024
Canon Kabushiki Kaisha
Takeaki Itsuji
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Optical sensor
Patent number
11,898,903
Issue date
Feb 13, 2024
Sumitomo Electric Industries, Ltd.
Kotaro Hirose
G01 - MEASURING TESTING
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Patent Grant
Techniques for laser beam sensing and profiling using temperature-s...
Patent number
11,892,347
Issue date
Feb 6, 2024
RAM Photonics Industrial, LLC
Per Adamson
G01 - MEASURING TESTING
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Patent Grant
Pyranometer and method of assembling a pyranometer
Patent number
11,879,773
Issue date
Jan 23, 2024
OTT HydroMet B.V.
Robertus Dennis Nieuwveen
G01 - MEASURING TESTING
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Patent Grant
Defense circuit of semiconductor device and semiconductor device in...
Patent number
11,852,527
Issue date
Dec 26, 2023
Samsung Electronics Co., Ltd.
Cheolhwan Lim
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Handheld electronic device
Patent number
11,835,382
Issue date
Dec 5, 2023
Apple Inc.
Jason B. Neevel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Electro-optical infrared window for hypersonic applications
Patent number
11,808,623
Issue date
Nov 7, 2023
Raytheon Company
Charles Edward Fleder
F41 - WEAPONS
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Patent Grant
Apparatus for measuring optical characteristics of a test optical e...
Patent number
11,808,938
Issue date
Nov 7, 2023
Young Optics Inc.
Wei-Ting Chiu
G01 - MEASURING TESTING
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Patent Grant
Emitter module for an LED illumination device
Patent number
11,740,123
Issue date
Aug 29, 2023
Lutron Technology Company LLC
Kuo-Lih Chang
G01 - MEASURING TESTING
Information
Patent Grant
Illumination device and method for calibrating an illumination devi...
Patent number
11,723,134
Issue date
Aug 8, 2023
Lutron Technology Company LLC
Horace C. Ho
G01 - MEASURING TESTING
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Patent Grant
Connected epitaxial optical sensing system comprising a trench deep...
Patent number
11,713,999
Issue date
Aug 1, 2023
Apple Inc.
Alfredo Bismuto
G01 - MEASURING TESTING
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Patent Grant
System and method for disposable imaging system
Patent number
11,692,871
Issue date
Jul 4, 2023
General Electric Company
Guanghua Wang
G01 - MEASURING TESTING
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Patent Grant
System for testing under controlled emulated atmospheric conditions
Patent number
11,662,249
Issue date
May 30, 2023
The United States of America, as represented by the Secretary of the Navy
Subrata Sanyal
G01 - MEASURING TESTING
Information
Patent Grant
Light detection device having temperature compensated gain in avala...
Patent number
11,513,002
Issue date
Nov 29, 2022
Hamamatsu Photonics K.K.
Hironori Sonobe
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Optical measurement stability control system
Patent number
11,454,537
Issue date
Sep 27, 2022
Industrial Technology Research Institute
Wen-Hsien Su
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Triangulation sensor with a first metal lens barrel disposed in a f...
Patent number
11,448,731
Issue date
Sep 20, 2022
Banner Engineering Corp.
Timothy S. Gardner
G02 - OPTICS
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Patent Grant
Systems and methods for superconducting quantum refrigeration
Patent number
11,448,549
Issue date
Sep 20, 2022
University of Rochester
Andrew N. Jordan
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Cooled single-photon detector apparatus and methods
Patent number
11,313,222
Issue date
Apr 26, 2022
Halliburton Energy Services, Inc.
Daniel Joshua Stark
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Illumination device and method for calibrating an illumination devi...
Patent number
11,252,805
Issue date
Feb 15, 2022
Lutron Technology Company LLC
Horace C. Ho
G01 - MEASURING TESTING
Information
Patent Grant
Emitter module for an LED illumination device
Patent number
11,243,112
Issue date
Feb 8, 2022
Lutron Technology Company LLC
Kuo-Lih Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for disposable infrared imaging system
Patent number
11,193,820
Issue date
Dec 7, 2021
General Electric Company
Guanghua Wang
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Patents Applications
last 30 patents
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Patent Application
THERMALLY COUPLED IMAGER FOR PERFORMING TIME AND POSITION SENSITIVE...
Publication number
20240402007
Publication date
Dec 5, 2024
Government of the United States of America, as Represented by the Secretary o...
Adam Nykoruk McCaughan
G01 - MEASURING TESTING
Information
Patent Application
SUPERCONDUCTING SINGLE PHOTON DETECTOR WITH PHOTON NUMBER RESOLUTION
Publication number
20240361181
Publication date
Oct 31, 2024
PHOTONIC INC.
Mohsen KESHAVARZ AKHLAGHI
G01 - MEASURING TESTING
Information
Patent Application
-SIllumination Device and Method for Calibrating an Illumination De...
Publication number
20240341019
Publication date
Oct 10, 2024
Lutron Technology Company LLC
Horace C. Ho
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Emitter Module for an LED Illumination Device
Publication number
20240337527
Publication date
Oct 10, 2024
Lutron Technology Company LLC
Kuo-Lih Chang
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TRIANGULATION SENSOR
Publication number
20240280671
Publication date
Aug 22, 2024
Banner Engineering Corp.
Timothy S. Gardner
G02 - OPTICS
Information
Patent Application
TECHNIQUES FOR LASER BEAM SENSING AND PROFILING USING TEMPERATURE-S...
Publication number
20240159584
Publication date
May 16, 2024
RAM Photonics Industrial, LLC
Per Adamson
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR DETECTING ELECTROMAGNETIC RADIATION AND COOLING METHOD
Publication number
20240118132
Publication date
Apr 11, 2024
LYNRED
Pierre CASSAIGNE
G01 - MEASURING TESTING
Information
Patent Application
Illumination Device and Method for Calibrating an Illumination Devi...
Publication number
20230422376
Publication date
Dec 28, 2023
Lutron Technology Company LLC
Horace C. Ho
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC DETECTION DEVICE WITH SEALED DESIGN AND UNDISTORTED P...
Publication number
20230392982
Publication date
Dec 7, 2023
Institute of Microelectronics, Chinese Academy of Sciences
Jing LI
G01 - MEASURING TESTING
Information
Patent Application
Emitter Module for an LED Illumination Device
Publication number
20230349753
Publication date
Nov 2, 2023
Lutron Technology Company LLC
Kuo-Lih Chang
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Connected Epitaxial Optical Sensing Systems
Publication number
20230314210
Publication date
Oct 5, 2023
Alfredo Bismuto
G01 - MEASURING TESTING
Information
Patent Application
System For Testing Under Controlled Emulated Atmospheric Conditions
Publication number
20230258495
Publication date
Aug 17, 2023
The United States of America, as represented by the Secretary of the Navy
Subrata Sanyal
G01 - MEASURING TESTING
Information
Patent Application
LASER LIGHT PROFILE MEASURING DEVICE AND LASER LIGHT PROFILE MEASUR...
Publication number
20230251128
Publication date
Aug 10, 2023
Mitsubishi Heavy Industries, Ltd.
Ryuichi Narita
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL LENS ASSEMBLY AND OPTICAL MEASUREMENT METHOD
Publication number
20230124939
Publication date
Apr 20, 2023
CHROMA ATE INC.
Kuo-Wei HUANG
G02 - OPTICS
Information
Patent Application
COVER FOR INFRARED SENSOR AND METHOD OF MANUFACTURING COVER FOR INF...
Publication number
20230104850
Publication date
Apr 6, 2023
TOYODA GOSEI CO., LTD.
Kinji FURUKAWA
G01 - MEASURING TESTING
Information
Patent Application
TRIANGULATION SENSOR
Publication number
20230082922
Publication date
Mar 16, 2023
Banner Engineering Corp.
Timothy S. Gardner
G02 - OPTICS
Information
Patent Application
ELECTRO-OPTICAL INFRARED WINDOW FOR HYPERSONIC APPLICATIONS
Publication number
20230070657
Publication date
Mar 9, 2023
Raytheon Company
Charles Edward Fleder
F41 - WEAPONS
Information
Patent Application
THERMOELECTRIC CONVERSION MATERIAL, THERMOELECTRIC CONVERSION ELEME...
Publication number
20220416143
Publication date
Dec 29, 2022
Sumitomo Electric Industries, Ltd.
Masahiro ADACHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR LASER BEAM SENSING AND PROFILING
Publication number
20220326072
Publication date
Oct 13, 2022
RAM Photonics, LLC
Per Adamson
G01 - MEASURING TESTING
Information
Patent Application
PYRANOMETER AND METHOD OF ASSEMBLING A PYRANOMETER
Publication number
20220196467
Publication date
Jun 23, 2022
OTT HydroMet B.V.
Robertus Dennis Nieuwveen
G01 - MEASURING TESTING
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Patent Application
PYRANOMETER
Publication number
20220196466
Publication date
Jun 23, 2022
OTT HydroMet B.V.
Joop Mes
G01 - MEASURING TESTING
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Patent Application
ELECTROMAGNETIC WAVE MODULE AND ELECTROMAGNETIC WAVE CAMERA SYSTEM...
Publication number
20220170785
Publication date
Jun 2, 2022
Canon Kabushiki Kaisha
Takeaki Itsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Illumination Device and Method for Calibrating an Illumination Devi...
Publication number
20220167479
Publication date
May 26, 2022
Lutron Technology Company LLC
Horace C. Ho
G01 - MEASURING TESTING
Information
Patent Application
Emitter Module for an LED Illumination Device
Publication number
20220155142
Publication date
May 19, 2022
Lutron Technology Company LLC
Kuo-Lih Chang
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL SENSOR
Publication number
20220155141
Publication date
May 19, 2022
Sumitomo Electric Industries, Ltd.
Kotaro HIROSE
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SYSTEM AND METHOD FOR DISPOSABLE IMAGING SYSTEM
Publication number
20220074790
Publication date
Mar 10, 2022
GENERAL ELECTRIC COMPANY
Guanghua Wang
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
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Patent Application
METHOD OF CHARACTERIZING AN OPTICAL SENSOR CHIP, METHOD OF CALIBRAT...
Publication number
20220065695
Publication date
Mar 3, 2022
ams Sensors Germany GmbH
Gunter SIESS
G01 - MEASURING TESTING
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Patent Application
Connected Epitaxial Optical Sensing Systems
Publication number
20220011157
Publication date
Jan 13, 2022
Apple Inc.
Alfredo Bismuto
G01 - MEASURING TESTING
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Patent Application
OPTICAL MEASUREMENT APPARATUS
Publication number
20210382301
Publication date
Dec 9, 2021
YOUNG OPTICS INC.
Wei-Ting CHIU
G01 - MEASURING TESTING
Information
Patent Application
Cooled Single-Photon Detector Apparatus And Methods
Publication number
20210222549
Publication date
Jul 22, 2021
Halliburton Energy Services, Inc.
Daniel J. Stark
E21 - EARTH DRILLING MINING