contacting different points on same face of object

Industry

CPC
G01B9/02019

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02019contacting different points on same face of object

Industries

Patents Grantslast 30 patents

Information Patent Grant
Multiple beam range measurement process
- Patent number 11,719,819
- Issue date Aug 8, 2023
- DSCG Solutions, Inc.
- Richard Sebastian
- G01 - MEASURING TESTING
Information Patent Grant
Registration mark, positional deviation detection method and device...
- Patent number 11,646,239
- Issue date May 9, 2023
- Kioxia Corporation
- Sho Kawadahara
- G01 - MEASURING TESTING
Information Patent Grant
Scanning self-mixing interferometry system and sensor
- Patent number 11,536,555
- Issue date Dec 27, 2022
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Grant
Laser interference device
- Patent number 11,378,386
- Issue date Jul 5, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring assembly for the frequency-based determination of the pos...
- Patent number 11,274,914
- Issue date Mar 15, 2022
- Carl Zeiss SMT GmbH
- Matthias Manger
- G01 - MEASURING TESTING
Information Patent Grant
Optical distance measurement device and processing device
- Patent number 11,248,902
- Issue date Feb 15, 2022
- Mitsubishi Electric Corporation
- Hiroki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
- Patent number 11,236,985
- Issue date Feb 1, 2022
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry systems and methods
- Patent number 11,162,781
- Issue date Nov 2, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated secondary beam...
- Patent number 11,150,077
- Issue date Oct 19, 2021
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
Space division multiplexing optical coherence tomography using an i...
- Patent number 11,079,214
- Issue date Aug 3, 2021
- Lehigh University
- Chao Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring the depth of the vapor capillary du...
- Patent number 11,027,364
- Issue date Jun 8, 2021
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Angular separation of scan channels
- Patent number 11,006,824
- Issue date May 18, 2021
- CELLVIEW IMAGING INC.
- Mark Hathaway
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Position finder apparatus and method using optically projected refe...
- Patent number 10,989,518
- Issue date Apr 27, 2021
- LUMINCODE AS
- Gudmund Slettemoen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric position sensor
- Patent number 10,928,192
- Issue date Feb 23, 2021
- MBDA UK Limited
- Ross Matthew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and method
- Patent number 10,921,719
- Issue date Feb 16, 2021
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Zhiyong Yang
- G01 - MEASURING TESTING
Information Patent Grant
OCT system
- Patent number 10,863,905
- Issue date Dec 15, 2020
- OptoMedical Technologies GmbH
- Marc Krug
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for measuring etch depth by differential pola...
- Patent number 10,859,366
- Issue date Dec 8, 2020
- HORIBA FRANCE SAS
- Simon Richard
- G01 - MEASURING TESTING
Information Patent Grant
Wear amount measuring apparatus and method, temperature measuring a...
- Patent number 10,746,531
- Issue date Aug 18, 2020
- Tokyo Electron Limited
- Tatsuo Matsudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-refractive element stabilized resonators, lasers and multiple...
- Patent number 10,720,747
- Issue date Jul 21, 2020
- The Board of Trustees of the University of Illinois
- Jose A. Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system and associated methods
- Patent number 10,514,250
- Issue date Dec 24, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam range measurement process
- Patent number 10,502,833
- Issue date Dec 10, 2019
- DSCG Solutions, Inc.
- Richard Sebastian
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device with controlled heat generation
- Patent number 10,451,401
- Issue date Oct 22, 2019
- DMG MORI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Laser multibeam differential interferometric sensor and methods for...
- Patent number 10,429,171
- Issue date Oct 1, 2019
- The University of Mississippi
- Aranchuk Vyacheslav
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing optical properties of an object
- Patent number 10,330,462
- Issue date Jun 25, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system, interferometer and lithographic apparatus
- Patent number 10,289,011
- Issue date May 14, 2019
- ASML Netherlands B.V.
- Engelbertus Antonius Fransiscus Van Der Pasch
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Rotation angle measuring system and machining system comprising the...
- Patent number 10,215,558
- Issue date Feb 26, 2019
- NOPORVIS CO., LTD.
- Wei-Hung Su
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wear amount measuring apparatus and method, temperature measuring a...
- Patent number 10,184,786
- Issue date Jan 22, 2019
- Tokyo Electron Limited
- Tatsuo Matsudo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for space-division multiplexing optical cohere...
- Patent number 10,107,616
- Issue date Oct 23, 2018
- Lehigh University
- Chao Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement apparatus, lithography apparatus, and method of manufac...
- Patent number 10,095,125
- Issue date Oct 9, 2018
- Canon Kabushiki Kaisha
- Hiroshi Okuda
- G02 - OPTICS
Information Patent Grant
Phasing an optical interferometer using the radio emission from the...
- Patent number 10,082,382
- Issue date Sep 25, 2018
- The United States of America, as represented by the Secretary of the Navy
- Henrique Schmitt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE
- Publication number 20230064721
- Publication date Mar 2, 2023
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20220003540
- Publication date Jan 6, 2022
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20210148691
- Publication date May 20, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ASSEMBLY FOR THE FREQUENCY-BASED DETERMINATION OF THE POS...
- Publication number 20210080244
- Publication date Mar 18, 2021
- Carl Zeiss SMT GMBH
- Matthias MANGER
- G01 - MEASURING TESTING
Information Patent Application
SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...
- Publication number 20200166328
- Publication date May 28, 2020
- LEHIGH UNIVERSITY
- Chao Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OCT System
- Publication number 20200129067
- Publication date Apr 30, 2020
- OptoMedical Technologies GmbH
- Marc Krug
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...
- Publication number 20200103214
- Publication date Apr 2, 2020
- HORIBA FRANCE SAS
- Simon RICHARD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20200096320
- Publication date Mar 26, 2020
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
POSITION FINDER APPARATUS AND METHOD USING OPTICALLY PROJECTED REFE...
- Publication number 20200033113
- Publication date Jan 30, 2020
- Lumincode AS
- Gudmund SLETTEMOEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING
- Publication number 20200011652
- Publication date Jan 9, 2020
- Applied Materials, Inc.
- Benjamin M. JOHNSTON
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC POSITION SENSOR
- Publication number 20190257645
- Publication date Aug 22, 2019
- MBDA UK LIMITED
- Ross Matthew WILLIAMS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND METHOD
- Publication number 20190235396
- Publication date Aug 1, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Zhiyong YANG
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190162526
- Publication date May 30, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
WEAR AMOUNT MEASURING APPARATUS AND METHOD, TEMPERATURE MEASURING A...
- Publication number 20190137260
- Publication date May 9, 2019
- TOKYO ELECTRON LIMITED
- Tatsuo MATSUDO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20190113329
- Publication date Apr 18, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE DEPTH OF THE VAPOR CAPILLARY DU...
- Publication number 20190091798
- Publication date Mar 28, 2019
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT
- Publication number 20180299252
- Publication date Oct 18, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
LASER MULTIBEAM DIFFERENTIAL INTERFEROMETRIC SENSOR AND METHODS FOR...
- Publication number 20180216927
- Publication date Aug 2, 2018
- The University of Mississippi
- Aranchuk VYACHESLAV
- G01 - MEASURING TESTING
Information Patent Application
ROTATION ANGLE MEASURING SYSTEM AND MACHINING SYSTEM COMPRISING THE...
- Publication number 20180143010
- Publication date May 24, 2018
- NOPORVIS CO., LTD.
- Wei-Hung Su
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THIC...
- Publication number 20170370703
- Publication date Dec 28, 2017
- National Tsing-Hua University
- Wei-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
Phasing an Optical Interferometer Using the Radio Emission from the...
- Publication number 20170307351
- Publication date Oct 26, 2017
- The Government of the United States of America, as represented by the Secreta...
- Henrique Schmitt
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20140376002
- Publication date Dec 25, 2014
- Markus Meissner
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL FREQUENCY REPRODUCING APPARATUS AND OPTICAL DISTANCE MEASUR...
- Publication number 20140374575
- Publication date Dec 25, 2014
- ASTRODESIGN, Inc.
- Toshiharu TAKESUE
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR SPACE-DIVISION MULTIPLEXING OPTICAL COHERE...
- Publication number 20140160488
- Publication date Jun 12, 2014
- LEHIGH UNIVERSITY
- Chao Zhou
- G01 - MEASURING TESTING
Information Patent Application
STAGE APPARATUS AND ADJUSTMENT METHOD THEREOF, EXPOSURE APPARATUS,...
- Publication number 20140125962
- Publication date May 8, 2014
- Canon Kabushiki Kaisha
- Zenichi Hamaya
- G01 - MEASURING TESTING
Information Patent Application
SCANNING DEVICE FOR LOW COHERENCE INTERFEROMETRY
- Publication number 20140078510
- Publication date Mar 20, 2014
- MEDLUMICS S.L
- José Luis Rubio Guivernau
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, OCT IMAGING APPARATUS, TOMOGRAPHIC IMAG...
- Publication number 20130002711
- Publication date Jan 3, 2013
- Canon Kabushiki Kaisha
- Yukio Sakagawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY APPARATUS
- Publication number 20120327423
- Publication date Dec 27, 2012
- NIDEK CO., LTD.
- Masaaki Hanebuchi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A DISTANCE
- Publication number 20120170047
- Publication date Jul 5, 2012
- QUALCOMM MEMS TECHNOLOGIES, INC.
- John H. Hong
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
STAGE APPARATUS, EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD
- Publication number 20120147352
- Publication date Jun 14, 2012
- Canon Kabushiki Kaisha
- Atsushi Ito
- G01 - MEASURING TESTING

contacting different points on same face of object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiple beam range measurement process

Registration mark, positional deviation detection method and device...

Scanning self-mixing interferometry system and sensor

Laser interference device

Measuring assembly for the frequency-based determination of the pos...

Optical distance measurement device and processing device

Systems and methods for cyclic error correction in a heterodyne int...

Interferometry systems and methods

Heterodyne laser interferometer based on integrated secondary beam...

Space division multiplexing optical coherence tomography using an i...

Method and device for measuring the depth of the vapor capillary du...

Angular separation of scan channels

Position finder apparatus and method using optically projected refe...

Interferometric position sensor

Optical measurement device and method

OCT system

Method and instrument for measuring etch depth by differential pola...

Wear amount measuring apparatus and method, temperature measuring a...

Micro-refractive element stabilized resonators, lasers and multiple...

Interferometry system and associated methods

Multiple beam range measurement process

Displacement detecting device with controlled heat generation

Laser multibeam differential interferometric sensor and methods for...

System for analyzing optical properties of an object

Position measurement system, interferometer and lithographic apparatus

Rotation angle measuring system and machining system comprising the...

Wear amount measuring apparatus and method, temperature measuring a...

Apparatus and method for space-division multiplexing optical cohere...

Measurement apparatus, lithography apparatus, and method of manufac...

Phasing an optical interferometer using the radio emission from the...

Patents Applicationslast 30 patents

SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE

INTERFEROMETRY SYSTEMS AND METHODS

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

MEASURING ASSEMBLY FOR THE FREQUENCY-BASED DETERMINATION OF THE POS...

SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...

OCT System

METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...

INTERFEROMETRY SYSTEMS AND METHODS

POSITION FINDER APPARATUS AND METHOD USING OPTICALLY PROJECTED REFE...

INTERFEROMETRY SYSTEM AND METHODS FOR SUBSTRATE PROCESSING

INTERFEROMETRIC POSITION SENSOR

OPTICAL MEASUREMENT DEVICE AND METHOD

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

WEAR AMOUNT MEASURING APPARATUS AND METHOD, TEMPERATURE MEASURING A...

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

METHOD AND DEVICE FOR MEASURING THE DEPTH OF THE VAPOR CAPILLARY DU...

SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

LASER MULTIBEAM DIFFERENTIAL INTERFEROMETRIC SENSOR AND METHODS FOR...

ROTATION ANGLE MEASURING SYSTEM AND MACHINING SYSTEM COMPRISING THE...

OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THIC...

Phasing an Optical Interferometer Using the Radio Emission from the...

Interferometer

SPATIAL FREQUENCY REPRODUCING APPARATUS AND OPTICAL DISTANCE MEASUR...

APPARATUS AND METHOD FOR SPACE-DIVISION MULTIPLEXING OPTICAL COHERE...

STAGE APPARATUS AND ADJUSTMENT METHOD THEREOF, EXPOSURE APPARATUS,...

SCANNING DEVICE FOR LOW COHERENCE INTERFEROMETRY

IMAGE PROCESSING APPARATUS, OCT IMAGING APPARATUS, TOMOGRAPHIC IMAG...

OPTICAL COHERENCE TOMOGRAPHY APPARATUS

SYSTEM AND METHOD FOR MEASURING A DISTANCE

STAGE APPARATUS, EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD