Contactless testing

Industry

CPC
G01R31/265

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/265Contactless testing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for sensitive parts of ionization damage in bipola...
- Patent number 12,153,082
- Issue date Nov 26, 2024
- Harbin Institute of Technology
- Xingji Li
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,153,021
- Issue date Nov 26, 2024
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis device and semiconductor failure ana...
- Patent number 12,117,480
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,066,764
- Issue date Aug 20, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Vertical convolute metal bellows for rotary motion, vacuum sealing,...
- Patent number 12,044,701
- Issue date Jul 23, 2024
- KLA Corporation
- Bruce Borchers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 12,038,476
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device and substrate inspection method
- Patent number 12,032,013
- Issue date Jul 9, 2024
- Jusung Engineering Co., Ltd.
- Gu Hyun Jung
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 12,020,897
- Issue date Jun 25, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing semiconductor structure
- Patent number 11,959,958
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yi Min Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,539
- Issue date Mar 12, 2024
- Tokyo Electron Limited
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and test method for online detection of metal via op...
- Patent number 11,906,572
- Issue date Feb 20, 2024
- Shanghai Huali Integrated Circuit Corporation
- Shumiao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer evaluation apparatus and semiconductor wafer ma...
- Patent number 11,906,569
- Issue date Feb 20, 2024
- Showa Denko K.K.
- Koichi Murata
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Optical inspection apparatus
- Patent number 11,867,612
- Issue date Jan 9, 2024
- Samsung Display Co., Ltd.
- Je Won Yoo
- G02 - OPTICS
Information Patent Grant
Test circuit and method
- Patent number 11,852,672
- Issue date Dec 26, 2023
- TAIWAN SEMICONDUCTORMANUFACTURING COMPANY LIMITED
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave photoconductance spectrometer and methods of using the same
- Patent number 11,824,497
- Issue date Nov 21, 2023
- Alliance for Sustainable Energy, LLC
- Bryon William Larson
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive imaging techniques for integrated circuits and othe...
- Patent number 11,798,157
- Issue date Oct 24, 2023
- The Regents of the University of Michigan
- Parag Deotare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient laser-induced single-event latchup and methods of operation
- Patent number 11,774,494
- Issue date Oct 3, 2023
- Vanderbilt University
- Andrew L. Sternberg
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device and substrate inspection method
- Patent number 11,726,134
- Issue date Aug 15, 2023
- JUSUNG ENGINEERING CO., LTD.
- Gu Hyun Jung
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device
- Patent number 11,714,120
- Issue date Aug 1, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,709,436
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,680,870
- Issue date Jun 20, 2023
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 11,675,002
- Issue date Jun 13, 2023
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 11,668,746
- Issue date Jun 6, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Group III nitride semiconductor substrate
- Patent number 11,662,374
- Issue date May 30, 2023
- Furukawa Co., Ltd.
- Hiroki Goto
- C30 - CRYSTAL GROWTH
Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
- Patent number 11,605,526
- Issue date Mar 14, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method, analysis device, analysis program, and recording m...
- Patent number 11,579,184
- Issue date Feb 14, 2023
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME
- Publication number 20240402238
- Publication date Dec 5, 2024
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20240393384
- Publication date Nov 28, 2024
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20240304414
- Publication date Sep 12, 2024
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMAL DETERMINATION OF AN OVERLAY TARGET
- Publication number 20240288488
- Publication date Aug 29, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Tal ITZKOVICH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Failure Analysis and Location Method for Short Circuit Structure
- Publication number 20240282648
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lingye Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL
- Publication number 20240230403
- Publication date Jul 11, 2024
- BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Yifan SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE
- Publication number 20240192262
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- Yi Min LIU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TESTING
- Publication number 20240142512
- Publication date May 2, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zhi Peng Feng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20240102921
- Publication date Mar 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPO...
- Publication number 20240094278
- Publication date Mar 21, 2024
- FemtoMetrix, Inc.
- Anatoly A. Shtykov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...
- Publication number 20240085470
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240027514
- Publication date Jan 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Hong Lin
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20230393195
- Publication date Dec 7, 2023
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20230358804
- Publication date Nov 9, 2023
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD
- Publication number 20230341454
- Publication date Oct 26, 2023
- JUSUNG ENGINEERING CO., LTD.
- Gu Hyun JUNG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
- Publication number 20230282444
- Publication date Sep 7, 2023
- PDF Solutions, Inc.
- Indranil DE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20230273255
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...
- Publication number 20230273253
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro SHIRASAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED PROBE LANDING
- Publication number 20230258707
- Publication date Aug 17, 2023
- Innovatum Instruments Inc.
- Richard E Stallcup
- G01 - MEASURING TESTING
Information Patent Application
COUPLING PROBE FOR MICRO DEVICE INSPECTION
- Publication number 20230152349
- Publication date May 18, 2023
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD, STORAGE MEDIUM, AND MANUFACTURING METHOD OF SEMICO...
- Publication number 20230118297
- Publication date Apr 20, 2023
- Fuji Electric Co., Ltd.
- Yusuke SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE PHOTOCONDUCTANCE SPECTROMETER AND METHODS OF USING THE SAME
- Publication number 20230070273
- Publication date Mar 9, 2023
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Bryon William LARSON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20230061399
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
Test Structure and Test Method for Online Detection of Metal Via Op...
- Publication number 20230069433
- Publication date Mar 2, 2023
- Shanghai Huali Integrated Circuit Corporation
- Shumiao Sun
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE DEVICE ELECTRICAL PROPERTY ESTIMATING METHOD AND TEST STRUC...
- Publication number 20230043999
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chen-Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING OF MICROELECTRONIC DEVICES
- Publication number 20220392016
- Publication date Dec 8, 2022
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING

Contactless testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for determining characteristics of semiconducto...

Detection method for sensitive parts of ionization damage in bipola...

Ultrasonic testing device and ultrasonic testing method

Semiconductor failure analysis device and semiconductor failure ana...

Metrology apparatus and method for determining a characteristic of...

Vertical convolute metal bellows for rotary motion, vacuum sealing,...

Systems, devices, and methods for performing a non-contact electric...

Substrate inspection device and substrate inspection method

Systems, devices, and methods for aligning a particle beam and perf...

Method of analyzing semiconductor structure

Inspection apparatus and inspection method

Test structure and test method for online detection of metal via op...

Semiconductor wafer evaluation apparatus and semiconductor wafer ma...

Optical inspection apparatus

Test circuit and method

Pump and probe type second harmonic generation metrology

Microwave photoconductance spectrometer and methods of using the same

Optical systems and methods of characterizing high-k dielectrics

Non-destructive imaging techniques for integrated circuits and othe...

Efficient laser-induced single-event latchup and methods of operation

Substrate inspection device and substrate inspection method

Semiconductor inspection device

Metrology apparatus and method for determining a characteristic of...

Opto electrical test measurement system for integrated photonic dev...

Terahertz plasmonics for testing very large-scale integrated circui...

Systems, devices, and methods for performing a non-contact electric...

Group III nitride semiconductor substrate

System and method of preparing integrated circuits for backside pro...

Systems, devices, and methods for aligning a particle beam and perf...

Analysis method, analysis device, analysis program, and recording m...

Patents Applicationslast 30 patents

TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

OPTIMAL DETERMINATION OF AN OVERLAY TARGET

Failure Analysis and Location Method for Short Circuit Structure

LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL

METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE TESTING

OPTICAL INSPECTION APPARATUS

APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPO...

METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...

INSPECTION APPARATUS AND METHOD

TERAHERTZ PROBE

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD

SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...

Inspection Method

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...

AUTOMATED PROBE LANDING

COUPLING PROBE FOR MICRO DEVICE INSPECTION

ANALYSIS METHOD, STORAGE MEDIUM, AND MANUFACTURING METHOD OF SEMICO...

MICROWAVE PHOTOCONDUCTANCE SPECTROMETER AND METHODS OF USING THE SAME

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

Test Structure and Test Method for Online Detection of Metal Via Op...

IN-LINE DEVICE ELECTRICAL PROPERTY ESTIMATING METHOD AND TEST STRUC...

WAFER METROLOGY TECHNOLOGIES

HIGH RESOLUTION IMAGING OF MICROELECTRONIC DEVICES