containing ionised gas

Industry

CPC
G01R1/072

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/072containing ionised gas

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electrical inspection of electronic devices using electron-beam ind...
- Patent number 9,523,714
- Issue date Dec 20, 2016
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for non-contact electrical probe
- Patent number 7,196,536
- Issue date Mar 27, 2007
- Agilent Technologies, Inc.
- Michael J. Nystrom
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact plasma probe for testing electrical continuity of print...
- Patent number 6,118,285
- Issue date Sep 12, 2000
- Probot, Inc.
- Ronald W. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the electrical function testing of wiring matrices, p...
- Patent number 5,148,102
- Issue date Sep 15, 1992
- Siemens Aktiengesellschaft
- Thomas Rose
- G01 - MEASURING TESTING
Information Patent Grant
Drive device for an apparatus for electrical function testing of wi...
- Patent number 4,967,149
- Issue date Oct 30, 1990
- Siemens Aktiengesellschaft
- Guenter Doemens
- G01 - MEASURING TESTING
Information Patent Grant
Device for the electrical function testing of wiring matrices, part...
- Patent number 4,891,578
- Issue date Jan 2, 1990
- Siemens Aktiengesellschaft
- Guenter Doemens
- G01 - MEASURING TESTING
Information Patent Grant
Device for electrically checking printed circuit boards
- Patent number 4,777,432
- Issue date Oct 11, 1988
- Siemens Aktiengesellschaft
- Guenter Doemens
- G01 - MEASURING TESTING
Information Patent Grant
Electro-luminescent method and testing system for unpopulated print...
- Patent number 4,771,230
- Issue date Sep 13, 1988
- Testamatic Corporation
- Robert M. Zeh
- G01 - MEASURING TESTING
Information Patent Grant
Electro-luminescent automatic testing apparatus and method for cera...
- Patent number 4,764,719
- Issue date Aug 16, 1988
- Testamatic Corporation
- Robert M. Zeh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for electrical function checking of wiring matrices
- Patent number 4,705,329
- Issue date Nov 10, 1987
- Siemens Aktiengesellschaft
- Gunter Doemens
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electrical microprinted circuits utilizing io...
- Patent number 4,600,878
- Issue date Jul 15, 1986
- Siemens Aktiengesellschaft
- Guenter Doemens
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electrical Inspection of Electronic Devices Using Electron-Beam Ind...
- Publication number 20140132299
- Publication date May 15, 2014
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR PERFORMING A TEST OF SEMICONDUCTOR DEVICES WI...
- Publication number 20080204056
- Publication date Aug 28, 2008
- QIMONDA AG
- Wolfgang Spirkl
- G01 - MEASURING TESTING
Information Patent Application
Photoionization probe with injection of ionizing vapor
- Publication number 20080084224
- Publication date Apr 10, 2008
- Michael Nystrom
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for a contactless electrical probe
- Publication number 20060139039
- Publication date Jun 29, 2006
- David T. Dutton
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Method and apparatus for non-contact electrical probe
- Publication number 20060022696
- Publication date Feb 2, 2006
- Michael J. Nystrom
- G01 - MEASURING TESTING

containing ionised gas

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrical inspection of electronic devices using electron-beam ind...

Method and apparatus for non-contact electrical probe

Non-contact plasma probe for testing electrical continuity of print...

Apparatus for the electrical function testing of wiring matrices, p...

Drive device for an apparatus for electrical function testing of wi...

Device for the electrical function testing of wiring matrices, part...

Device for electrically checking printed circuit boards

Electro-luminescent method and testing system for unpopulated print...

Electro-luminescent automatic testing apparatus and method for cera...

Apparatus for electrical function checking of wiring matrices

Apparatus for testing electrical microprinted circuits utilizing io...

Patents Applicationslast 30 patents

Electrical Inspection of Electronic Devices Using Electron-Beam Ind...

DEVICE AND METHOD FOR PERFORMING A TEST OF SEMICONDUCTOR DEVICES WI...

Photoionization probe with injection of ionizing vapor

Systems and methods for a contactless electrical probe

Method and apparatus for non-contact electrical probe