Delay or race condition test

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CPC
G01R31/3016

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/3016Delay or race condition test

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method, arrangement, and computer program product for organizing th...
- Patent number 12,182,612
- Issue date Dec 31, 2024
- Minima Processor Oy
- Lauri Koskinen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive body biasing or voltage regulation using slack sensors
- Patent number 12,169,221
- Issue date Dec 17, 2024
- Dolphin Design
- Sebastien Genevey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test circuit, test assembly and method for testing an in...
- Patent number 12,055,587
- Issue date Aug 6, 2024
- Infineon Technologies AG
- Tobias Kilian
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit structure to measure outliers of process variation effects
- Patent number 12,025,658
- Issue date Jul 2, 2024
- Bitmain Development Inc.
- Christos Vezyrtzis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit including test circuit and method of manufacturi...
- Patent number 12,000,888
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Changho Han
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 11,835,580
- Issue date Dec 5, 2023
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic voltage scaling in hierarchical multitier regulator supply
- Patent number 11,803,230
- Issue date Oct 31, 2023
- KANDOU LABS, S.A.
- Armin Tajalli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Jitter self-test using timestamps
- Patent number 11,764,913
- Issue date Sep 19, 2023
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Temporal resolution control for temporal point spread function gene...
- Patent number 11,607,132
- Issue date Mar 21, 2023
- HI LLC
- Bruno Do Valle
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic voltage scaling in hierarchical multi-tier regulator supply
- Patent number 11,392,193
- Issue date Jul 19, 2022
- KANDOU LABS, S.A.
- Armin Tajalli
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for prediction of failure of a functional circuit
- Patent number 11,378,617
- Issue date Jul 5, 2022
- NXP B.V.
- Michael Doescher
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 11,293,977
- Issue date Apr 5, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of the dispersion of an electronic component
- Patent number 11,249,133
- Issue date Feb 15, 2022
- STMicroelectronics (Crolles 2) SAS
- Yann Carminati
- G05 - CONTROLLING REGULATING
Information Patent Grant
Jitter self-test using timestamps
- Patent number 11,228,403
- Issue date Jan 18, 2022
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Minimizing phase mismatch and offset sensitivity in a dual-path system
- Patent number 11,047,890
- Issue date Jun 29, 2021
- Cirrus Logic, Inc.
- Gautham S. Sivasankar
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic voltage scaling in hierarchical multi-tier regulator supply
- Patent number 10,983,587
- Issue date Apr 20, 2021
- KANDOU LABS, S.A.
- Armin Tajalli
- G05 - CONTROLLING REGULATING
Information Patent Grant
Aging-sensitive recycling sensors for chip authentication
- Patent number 10,976,360
- Issue date Apr 13, 2021
- University of South Florida
- Swaroop Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Self-tuning digital clock generator
- Patent number 10,790,837
- Issue date Sep 29, 2020
- QUALCOMM Incorporated
- Touqeer Azam
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,663,513
- Issue date May 26, 2020
- Micron Technology, Inc.
- Kevin G. Werhane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for calibrating a digital sensor
- Patent number 10,571,313
- Issue date Feb 25, 2020
- SECURE-IC SAS
- Sylvain Guilley
- G01 - MEASURING TESTING
Information Patent Grant
Time-aligning communication channels
- Patent number 10,564,219
- Issue date Feb 18, 2020
- Teradyne, Inc.
- Tushar K. Gohel
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for monitoring a critical path of an integrated c...
- Patent number 10,451,670
- Issue date Oct 22, 2019
- STMicroelectronics (Crolles 2) SAS
- Sylvain Clerc
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,445,206
- Issue date Oct 15, 2019
- Renesas Electronics Corporation
- Mitsuhiko Igarashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,330,726
- Issue date Jun 25, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor devices and system for testing semi...
- Patent number 10,324,128
- Issue date Jun 18, 2019
- Samsung Electronics Co., Ltd.
- Oh Song Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Scan speed optimization of input and output paths
- Patent number 9,977,081
- Issue date May 22, 2018
- Advantest Corporation
- Jurgen Serrer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL INTEGRITY MONITORING SYSTEM
- Publication number 20240410943
- Publication date Dec 12, 2024
- Synopsys, Inc.
- Firooz MASSOUDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240085475
- Publication date Mar 14, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240077533
- Publication date Mar 7, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY
- Publication number 20230010756
- Publication date Jan 12, 2023
- Kandou Labs, SA
- Armin Tajalli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, ARRANGEMENT, AND COMPUTER PROGRAM PRODUCT FOR ORGANIZING TH...
- Publication number 20220382581
- Publication date Dec 1, 2022
- Minima Processor Oy
- Lauri Koskinen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT STRUCTURE TO MEASURE OUTLIERS OF PROCESS VARIATION EFFECTS
- Publication number 20220349938
- Publication date Nov 3, 2022
- Bitmain Development Inc.
- Christos Vezyrtzis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20220229107
- Publication date Jul 21, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20220170986
- Publication date Jun 2, 2022
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
JITTER SELF-TEST USING TIMESTAMPS
- Publication number 20220123877
- Publication date Apr 21, 2022
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ADAPTIVE BODY BIASING OR VOLTAGE REGULATION USING SLACK SENSORS
- Publication number 20220082615
- Publication date Mar 17, 2022
- Dolphin Design
- Sebastien GENEVEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20210325455
- Publication date Oct 21, 2021
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY
- Publication number 20210240253
- Publication date Aug 5, 2021
- Kandou Labs SA
- Armin Tajalli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JITTER SELF-TEST USING TIMESTAMPS
- Publication number 20210176020
- Publication date Jun 10, 2021
- Silicon Laboratories Inc.
- Raghunandan K. Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...
- Publication number 20190271739
- Publication date Sep 5, 2019
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...
- Publication number 20180364303
- Publication date Dec 20, 2018
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
Signal Compensation Method and Device
- Publication number 20170286250
- Publication date Oct 5, 2017
- Huawei Technologies Co., Ltd
- Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
TIME DELAY ESTIMATION APPARATUS AND TIME DELAY ESTIMATION METHOD TH...
- Publication number 20170192080
- Publication date Jul 6, 2017
- Korea Research Institute of Standards and Science
- Hyu-Sang KWON
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING THE OPERATION OF A DIGITAL ELECTRONIC CIR...
- Publication number 20160349316
- Publication date Dec 1, 2016
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Ivan MIRO PANADES
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND TESTING ME...
- Publication number 20160282409
- Publication date Sep 29, 2016
- MegaChips Corporation
- Hiroyuki Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CIRCUIT APPARATUS AND ELECTRONIC APPARATUS
- Publication number 20140365809
- Publication date Dec 11, 2014
- Fujitsu Limited
- Masanori Higeta
- G01 - MEASURING TESTING
Information Patent Application
INPUT/OUTPUT DELAY TESTING FOR DEVICES UTILIZING ON-CHIP DELAY GENE...
- Publication number 20140189457
- Publication date Jul 3, 2014
- Tak M. Mak
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Controlling the Latency of Electronic Circuits
- Publication number 20140145748
- Publication date May 29, 2014
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Valentin Gherman
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH DEGRADATION MONITORING
- Publication number 20140132315
- Publication date May 15, 2014
- Puneet Sharma
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20140070863
- Publication date Mar 13, 2014
- Hitachi, Ltd
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Application
POWER AND TIMING OPTIMIZATION FOR AN INTEGRATED CIRCUIT BY VOLTAGE...
- Publication number 20130326460
- Publication date Dec 5, 2013
- Jeanne P. Bickford
- G01 - MEASURING TESTING

Delay or race condition test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method, arrangement, and computer program product for organizing th...

Adaptive body biasing or voltage regulation using slack sensors

Die-to-die connectivity monitoring

Integrated test circuit, test assembly and method for testing an in...

Circuit structure to measure outliers of process variation effects

Integrated circuit including test circuit and method of manufacturi...

Integrated circuit margin measurement and failure prediction device

Circuit and method to measure simulation to silicon timing correlation

Dynamic voltage scaling in hierarchical multitier regulator supply

Jitter self-test using timestamps

Temporal resolution control for temporal point spread function gene...

On-die aging measurements for dynamic timing modeling

Dynamic voltage scaling in hierarchical multi-tier regulator supply

Integrated circuit margin measurement and failure prediction device

Apparatus for prediction of failure of a functional circuit

Die-to-die connectivity monitoring

Determination of the dispersion of an electronic component

Jitter self-test using timestamps

Minimizing phase mismatch and offset sensitivity in a dual-path system

Dynamic voltage scaling in hierarchical multi-tier regulator supply

Aging-sensitive recycling sensors for chip authentication

Self-tuning digital clock generator

Apparatuses including test segment circuits having latch circuits f...

Device and method for calibrating a digital sensor

Time-aligning communication channels

Method and device for monitoring a critical path of an integrated c...

Semiconductor device

Apparatuses including test segment circuits having latch circuits f...

Method of testing semiconductor devices and system for testing semi...

Scan speed optimization of input and output paths

Patents Applicationslast 30 patents

SIGNAL INTEGRITY MONITORING SYSTEM

DIE-TO-DIE CONNECTIVITY MONITORING

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

On-Die Aging Measurements for Dynamic Timing Modeling

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY

METHOD, ARRANGEMENT, AND COMPUTER PROGRAM PRODUCT FOR ORGANIZING TH...

CIRCUIT STRUCTURE TO MEASURE OUTLIERS OF PROCESS VARIATION EFFECTS

DIE-TO-DIE CONNECTIVITY MONITORING

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

JITTER SELF-TEST USING TIMESTAMPS

ADAPTIVE BODY BIASING OR VOLTAGE REGULATION USING SLACK SENSORS

DIE-TO-DIE CONNECTIVITY MONITORING

DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY

JITTER SELF-TEST USING TIMESTAMPS

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...

Signal Compensation Method and Device

TIME DELAY ESTIMATION APPARATUS AND TIME DELAY ESTIMATION METHOD TH...

METHOD FOR CHARACTERIZING THE OPERATION OF A DIGITAL ELECTRONIC CIR...

TESTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND TESTING ME...

SEMICONDUCTOR CIRCUIT APPARATUS AND ELECTRONIC APPARATUS

INPUT/OUTPUT DELAY TESTING FOR DEVICES UTILIZING ON-CHIP DELAY GENE...

Method and Device for Controlling the Latency of Electronic Circuits

INTEGRATED CIRCUIT WITH DEGRADATION MONITORING

SEMICONDUCTOR INTEGRATED CIRCUIT

POWER AND TIMING OPTIMIZATION FOR AN INTEGRATED CIRCUIT BY VOLTAGE...