Membership
Tour
Register
Log in
Details of optical elements
Follow
Industry
CPC
G03F7/7015
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G03
Photography
G03F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES
G03F7/00
Photomechanical
Current Industry
G03F7/7015
Details of optical elements
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Metrology system and method for determining a characteristic of one...
Patent number
12,366,811
Issue date
Jul 22, 2025
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
Information
Patent Grant
Field facet system and lithography apparatus
Patent number
12,353,137
Issue date
Jul 8, 2025
Carl Zeiss SMT GmbH
Arno Schmittner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Device and method for regulating and controlling incident angle of...
Patent number
12,346,030
Issue date
Jul 1, 2025
Tsinghua University
Leijie Wang
G01 - MEASURING TESTING
Information
Patent Grant
Facet assembly for a facet mirror
Patent number
12,339,587
Issue date
Jun 24, 2025
Carl Zeiss SMT GmbH
Joachim Hartjes
G02 - OPTICS
Information
Patent Grant
High force low voltage piezoelectric micromirror actuator
Patent number
12,339,588
Issue date
Jun 24, 2025
ASML Netherlands B.V.
Luc Roger Simonne Haspeslagh
G02 - OPTICS
Information
Patent Grant
Configuring optical layers in imprint lithography processes
Patent number
12,332,572
Issue date
Jun 17, 2025
Magic Leap, Inc.
Vikramjit Singh
G02 - OPTICS
Information
Patent Grant
Optical component
Patent number
12,326,663
Issue date
Jun 10, 2025
Carl Zeiss SMT GmbH
Valentin Jonatan Bolsinger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for generating EUV radiation
Patent number
12,321,099
Issue date
Jun 3, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Sheng-Min Wang
G02 - OPTICS
Information
Patent Grant
Optical element, EUV lithography system, and method for forming nan...
Patent number
12,306,539
Issue date
May 20, 2025
Carl Zeiss SMT GmbH
Anastasia Gonchar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Transmissive diffusor
Patent number
12,271,008
Issue date
Apr 8, 2025
ASML Netherlands B.V.
Andrey Nikipelov
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Micromirror arrays
Patent number
12,259,546
Issue date
Mar 25, 2025
ASML Netherlands B.V.
Alexandre Halbach
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of forming photoresist pattern and projection exposure appar...
Patent number
12,253,804
Issue date
Mar 18, 2025
CHANGXIN MEMORY TECHNOLOGIES, INC.
Kanyu Cao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Dual diffraction order spin-on-glass phase-grating beam-splitter ba...
Patent number
12,204,249
Issue date
Jan 21, 2025
Steven R. J. Brueck
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Assembly, in particular in a microlithographic projection exposure...
Patent number
12,105,434
Issue date
Oct 1, 2024
Carl Zeiss SMT GmbH
Stefan Troeger
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of manufacturing a membrane assembly
Patent number
12,072,620
Issue date
Aug 27, 2024
ASML Netherlands B.V.
Pieter-Jan Van Zwol
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Protective coating for nonlinear optical crystal
Patent number
12,072,606
Issue date
Aug 27, 2024
KLA Corporation
John Fielden
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for collimating broadband radiation
Patent number
12,050,409
Issue date
Jul 30, 2024
ASML Netherlands B.V.
Yongfeng Ni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Configuring optical layers in imprint lithography processes
Patent number
12,044,976
Issue date
Jul 23, 2024
Magic Leap, Inc.
Vikramjit Singh
G02 - OPTICS
Information
Patent Grant
Metrology system and method for determining a characteristic of one...
Patent number
12,007,700
Issue date
Jun 11, 2024
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods that utilize angled photolithography for manufa...
Patent number
11,994,802
Issue date
May 28, 2024
Waymo LLC
James Dunphy
G02 - OPTICS
Information
Patent Grant
Diffraction based overlay metrology tool and method of diffraction...
Patent number
11,953,450
Issue date
Apr 9, 2024
ASML Netherlands B.V.
Arie Jeffrey Den Boef
G01 - MEASURING TESTING
Information
Patent Grant
Long sweep length DUV microlithographic beam scanning acousto-optic...
Patent number
11,947,241
Issue date
Apr 2, 2024
Mycronic AB
Andrzej Karawajczyk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical diffraction component
Patent number
11,947,265
Issue date
Apr 2, 2024
Carl Zeiss SMT GmbH
Heiko Feldmann
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology apparatus
Patent number
11,940,739
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Nitesh Pandey
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of fabricating reticle
Patent number
11,940,737
Issue date
Mar 26, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Hsueh-Yi Chung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light source apparatus, optical apparatus, exposure apparatus, devi...
Patent number
11,934,104
Issue date
Mar 19, 2024
Nikon Corporation
Hideki Komatsuda
G02 - OPTICS
Information
Patent Grant
Optical component and clamp used in lithographic apparatus
Patent number
11,892,779
Issue date
Feb 6, 2024
ASML Holding N.V.
Victor Antonio Perez-Falcon
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for nanoscale data recording
Patent number
11,886,123
Issue date
Jan 30, 2024
Franklin Mark Schellenberg
G11 - INFORMATION STORAGE
Information
Patent Grant
Assembly including a non-linear element and a method of use thereof
Patent number
11,886,096
Issue date
Jan 30, 2024
ASML Netherlands B.V.
Vitaliy Prosyentsov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
High uniformity telecentric illuminator
Patent number
11,868,049
Issue date
Jan 9, 2024
Innovations In Optics, Inc.
Thomas J. Brukilacchio
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
HOLDING DEVICE FOR AN OPTICAL COMPONENT HAVING AN OPTICAL SURFACE W...
Publication number
20250208524
Publication date
Jun 26, 2025
Carl Zeiss SMT GMBH
Eva Linda MATHIEU
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
ILLUMINATION SYSTEM, RADIATION SOURCE APPARATUS, METHOD FOR ILLUMIN...
Publication number
20250199413
Publication date
Jun 19, 2025
Carl Zeiss SMT GMBH
Stig BIELING
G02 - OPTICS
Information
Patent Application
PRESSURE-CONTROLLED SPECTRAL FEATURE ADJUSTER
Publication number
20250202184
Publication date
Jun 19, 2025
CYMER, LLC
Eric Anders Mason
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Diffraction-Based Illumination Sampling
Publication number
20250198836
Publication date
Jun 19, 2025
KLA Corporation
Florian Melsheimer
G02 - OPTICS
Information
Patent Application
MIRROR FOR A PROJECTION EXPOSURE APPARATUS
Publication number
20250138228
Publication date
May 1, 2025
Carl Zeiss SMT GMBH
Valentin Jonatan Bolsinger
G02 - OPTICS
Information
Patent Application
DEVICE FOR REPLICATING A MASTER HOLOGRAPHIC OPTICAL ELEMENT WITH VA...
Publication number
20250130506
Publication date
Apr 24, 2025
Carl Zeiss Jena GmbH
Markus GIEHL
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EUV COLLECTOR FOR AN EUV PROJECTION EXPOSURE APPARATUS
Publication number
20250126698
Publication date
Apr 17, 2025
Carl Zeiss SMT GMBH
Silvi HAENDEL
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LITHOGRAPHY SYSTEM WITH NON-INVASIVE MONITORING AND METHODS
Publication number
20250116938
Publication date
Apr 10, 2025
Taiwan Semiconductor Manufacturing Co., Ltd.
Chi YANG
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
TEMPERATURE MEASUREMENT OF OPTICAL ELEMENTS IN AN OPTICAL APPARATUS
Publication number
20250085172
Publication date
Mar 13, 2025
ASML Netherland B.V.
Koen Martin Willem Jan BOS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING THE ILLUMINATION PUPIL IN A SCANNER TAKING INT...
Publication number
20250044705
Publication date
Feb 6, 2025
Carl Zeiss SMT GMBH
Robert BUSCHLINGER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ILLUMINATION OPTICAL UNIT FOR PROJECTION LITHOGRAPHY
Publication number
20250044702
Publication date
Feb 6, 2025
Carl Zeiss SMT GMBH
Michael Patra
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SEMICONDUCTOR PROCESS APPARATUS
Publication number
20250028257
Publication date
Jan 23, 2025
Samsung Electronics Co., Ltd.
Kyoungwhan Oh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ILLUMINATION OPTICAL SYSTEM, EXPOSURE APPARATUS, IRRADIATION METHOD...
Publication number
20240402610
Publication date
Dec 5, 2024
Ushio Denki Kabushiki Kaisha
Osamu OSAWA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF MANUFACTURING A MEMBRANE ASSEMBLY
Publication number
20240369920
Publication date
Nov 7, 2024
ASML NETHERLANDS B.V.
Pieter-Jan VAN ZWOL
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SYSTEMS AND METHODS FOR FORMING TOPOLOGICAL LATTICES OF PLASMONIC M...
Publication number
20240353758
Publication date
Oct 24, 2024
University of Pittsburgh of the Commonwealth System of Higher Education
Hrvoje Petek
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXPOSURE DEVICE
Publication number
20240345486
Publication date
Oct 17, 2024
Nikon Corporation
Masaki KATO
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING...
Publication number
20240337952
Publication date
Oct 10, 2024
KLA Corporation
Itay Gdor
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
CONFIGURING OPTICAL LAYERS IN IMPRINT LITHOGRAPHY PROCESSES
Publication number
20240329540
Publication date
Oct 3, 2024
Magic Leap, Inc.
Vikramjit Singh
G02 - OPTICS
Information
Patent Application
Optical Device and Method of Manufacture
Publication number
20240319590
Publication date
Sep 26, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Yu-Hung Lin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...
Publication number
20240319620
Publication date
Sep 26, 2024
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G01 - MEASURING TESTING
Information
Patent Application
FAST UNIFORMITY DRIFT CORRECTION
Publication number
20240319608
Publication date
Sep 26, 2024
ASML Holding N.V.
Roberto B. WIENER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR DEPOSITING A COVER LAYER, EUV LITHOGRAPHY SYSTEM AND OPT...
Publication number
20240302756
Publication date
Sep 12, 2024
Carl Zeiss SMT GMBH
Dirk EHM
G02 - OPTICS
Information
Patent Application
METHOD FOR DETERMINING A POSITION OF A MIRROR
Publication number
20240255319
Publication date
Aug 1, 2024
Carl Zeiss SMT GMBH
Michael Patra
G01 - MEASURING TESTING
Information
Patent Application
PATTERN EXPOSURE APPARATUS, DEVICE MANUFACTURING METHOD, AND EXPOSU...
Publication number
20240248409
Publication date
Jul 25, 2024
Nikon Corporation
Masaki KATO
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR NANOSCALE DATA RECORDING
Publication number
20240248407
Publication date
Jul 25, 2024
Franklin Mark Schellenberg
B82 - NANO-TECHNOLOGY
Information
Patent Application
EXTREME ULTRAVIOLET LIGHT GENERATION CHAMBER DEVICE AND ELECTRONIC...
Publication number
20240241448
Publication date
Jul 18, 2024
Gigaphoton Inc.
Atsushi UEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE MEASUREMENT OF OPTICAL ELEMENTS IN AN OPTICAL APPARATUS
Publication number
20240201029
Publication date
Jun 20, 2024
ASML Netherland B.V.
Koen Martin Willem Jan BOS
G01 - MEASURING TESTING
Information
Patent Application
Metrology Apparatus
Publication number
20240184218
Publication date
Jun 6, 2024
ASML NETHERLANDS B.V.
Nitesh PANDEY
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LIGHT SOURCE APPARATUS, OPTICAL APPARATUS, EXPOSURE APPARATUS, DEVI...
Publication number
20240176248
Publication date
May 30, 2024
Nikon Corporation
Hideki KOMATSUDA
G02 - OPTICS
Information
Patent Application
LASER SYSTEM
Publication number
20240170905
Publication date
May 23, 2024
ASML NETHERLANDS B.V.
Herman Philip GODFRIED
H01 - BASIC ELECTRIC ELEMENTS