Devices of compact or symmetric construction

Industry

CPC
G01J3/4532

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/4532Devices of compact or symmetric construction

Industries

Patents Grantslast 30 patents

Information Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
- Patent number 11,885,677
- Issue date Jan 30, 2024
- Massachusetts Institute of Technology
- Derek Kita
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micro-electromechanical system (MEMS) interferometer for FT-MIR spe...
- Patent number 11,774,289
- Issue date Oct 3, 2023
- Saudi Arabian Oil Company
- Dwight W. Swett
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-transform infrared (FT-IR) spectroscopy using a mobile device
- Patent number 11,660,027
- Issue date May 30, 2023
- Google LLC
- Christopher David Workman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanoelectromechanical interferometer for visible to infrared wavele...
- Patent number 11,549,848
- Issue date Jan 10, 2023
- Danmarks Tekniske Universitet
- Marcus Albrechtsen
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized Fourier-transform Raman spectrometer systems and methods
- Patent number 11,313,725
- Issue date Apr 26, 2022
- Massachusetts Institute of Technology
- Tian Gu
- G01 - MEASURING TESTING
Information Patent Grant
Optical arrangement for the compensation of incorrect alignments of...
- Patent number 11,248,956
- Issue date Feb 15, 2022
- Mettler-Toledo GmbH
- Frank Killich
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic assembly of reflective spatial heterodyne spectrometer
- Patent number 11,237,056
- Issue date Feb 1, 2022
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and application thereof
- Patent number 11,231,271
- Issue date Jan 25, 2022
- Technology Innovation Momentum Fund (Israel) Limited Partnership
- Haim Suchowski
- G01 - MEASURING TESTING
Information Patent Grant
Optical module having high-accuracy spectral analysis
- Patent number 11,209,260
- Issue date Dec 28, 2021
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,187,579
- Issue date Nov 30, 2021
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Housing system for Michelson interferometer
- Patent number 11,162,775
- Issue date Nov 2, 2021
- Agency for Defense Development
- Jongmin Lee
- G01 - MEASURING TESTING
Information Patent Grant
Self-referenced spectrometer
- Patent number 11,085,825
- Issue date Aug 10, 2021
- Si-Ware Systems
- Mostafa Medhat
- G01 - MEASURING TESTING
Information Patent Grant
Devices and systems for improved collection efficiency and resoluti...
- Patent number 11,035,806
- Issue date Jun 15, 2021
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Integrated polarization interferometer and snapshot specro-polarime...
- Patent number 10,890,487
- Issue date Jan 12, 2021
- INDUSTRIAL COOPERATION FONDATION CHONBUK NATIONAL UNIVERSITY
- Dae Suk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-transform interferometer using meta surface
- Patent number 10,877,349
- Issue date Dec 29, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang Park
- G02 - OPTICS
Information Patent Grant
Common path interferometers spectrometer with a focusing input
- Patent number 10,845,244
- Issue date Nov 24, 2020
- Keit Limited
- Timothy John Stephens
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform spectrophotometer
- Patent number 10,837,829
- Issue date Nov 17, 2020
- Shimadzu Corporation
- Tadafusa Kamikake
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for talbot spectrometers
- Patent number 10,732,044
- Issue date Aug 4, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized Fourier-transform Raman spectrometer systems and methods
- Patent number 10,718,668
- Issue date Jul 21, 2020
- Massachusetts Institute of Technology
- Tian Gu
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-transform interferometer using meta surface
- Patent number 10,627,695
- Issue date Apr 21, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang Park
- G01 - MEASURING TESTING
Information Patent Grant
Compact wavelength meter and laser output measurement device
- Patent number 10,578,494
- Issue date Mar 3, 2020
- Lockheed Martin Coherent Technologies, Inc.
- Bruce Gregory Tiemann
- G01 - MEASURING TESTING
Information Patent Grant
Sagnac fourier spectrometer (SAFOS)
- Patent number 10,571,442
- Issue date Feb 25, 2020
- Matthias Lenzner
- G01 - MEASURING TESTING
Information Patent Grant
Position detection method and optical module
- Patent number 10,557,755
- Issue date Feb 11, 2020
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus, systems, and methods for Talbot spectrometers
- Patent number 10,533,895
- Issue date Jan 14, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Grant
Spatially resolved gas detection
- Patent number 10,473,526
- Issue date Nov 12, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert Visser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPACT HOLOGRAPHIC SLM SPECTROMETER
- Publication number 20240077356
- Publication date Mar 7, 2024
- ORTA DOGU TEKNIK UNIVERSITESI
- Emre YUCE
- G01 - MEASURING TESTING
Information Patent Application
Blood-Solute Calculation with a Mobile Device Using Non-Invasive Sp...
- Publication number 20230263436
- Publication date Aug 24, 2023
- Google LLC
- Christopher David Workman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICRO-ELECTROMECHANICAL SYSTEM (MEMS) INTERFEROMETER FOR FT-MIR SPE...
- Publication number 20230136082
- Publication date May 4, 2023
- Saudi Arabian Oil Company
- Dwight W. Swett
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20230003504
- Publication date Jan 5, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
NANOELECTROMECHANICAL INTERFEROMETER FOR VISIBLE TO INFRARED WAVELE...
- Publication number 20220349751
- Publication date Nov 3, 2022
- Danmarks Tekniske Universitet
- Marcus Albrechtsen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE
- Publication number 20210278274
- Publication date Sep 9, 2021
- HAMAMATSU PHOTONICS K. K.
- Tomofumi SUZUKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL ARRANGEMENT FOR THE COMPENSATION OF INCORRECT ALIGNMENTS OF...
- Publication number 20210278276
- Publication date Sep 9, 2021
- Mettler-Toledo GmbH
- Frank KILLICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETER SYSTEM AND APPLICATION THEREOF
- Publication number 20210199419
- Publication date Jul 1, 2021
- Technology Innovation Momentum Fund (Israel) Limited Partnership
- Haim SUCHOWSKI
- G01 - MEASURING TESTING
Information Patent Application
MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS
- Publication number 20210025756
- Publication date Jan 28, 2021
- Massachusetts Institute of Technology
- Tian GU
- G01 - MEASURING TESTING
Information Patent Application
Fourier-Transform Infrared (FT-IR) Spectroscopy Using a Mobile Device
- Publication number 20200390372
- Publication date Dec 17, 2020
- Google LLC
- Christopher David Workman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...
- Publication number 20200200691
- Publication date Jun 25, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G02 - OPTICS
Information Patent Application
FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE
- Publication number 20200110323
- Publication date Apr 9, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang PARK
- G02 - OPTICS
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20200103281
- Publication date Apr 2, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20190323892
- Publication date Oct 24, 2019
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
Compact Interferometer Spectrometer
- Publication number 20190178715
- Publication date Jun 13, 2019
- Keit Limited
- Timothy John Stephens
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTION DEVICE INCLUDING INTERFERENCE ELEMENT
- Publication number 20180356212
- Publication date Dec 13, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- KENJI NARUMI
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY RESOLVED GAS DETECTION
- Publication number 20180283949
- Publication date Oct 4, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH AN OSCILLATING REFLECTOR PROVIDED BY AN OUTER S...
- Publication number 20170343415
- Publication date Nov 30, 2017
- FREIE UNIVERSITAET BERLIN
- Bjoern SUESS
- G02 - OPTICS
Information Patent Application
SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROME...
- Publication number 20160231172
- Publication date Aug 11, 2016
- SI-WARE SYSTEMS
- Mostafa Medhat
- G02 - OPTICS
Information Patent Application
METHOD FOR MANUFACTURING OPTICAL INTERFEROMETER
- Publication number 20160202037
- Publication date Jul 14, 2016
- Hamamatsu Photonics K.K.
- Tomofumi SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTRAL IMAGING
- Publication number 20150285686
- Publication date Oct 8, 2015
- APPLIED SPECTRAL IMAGING LTD.
- Nir Katzir
- G02 - OPTICS
Information Patent Application
COMPLEX-FISH (FOURIER-TRANSFORM, INTEGRATED-OPTIC SPATIAL HETERODYN...
- Publication number 20140375999
- Publication date Dec 25, 2014
- Katsunari OKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPY ASSEMBLY
- Publication number 20140192363
- Publication date Jul 10, 2014
- Tobias Kippenberg
- G02 - OPTICS
Information Patent Application
INTERFEROMETER AND SPECTROMETER INCLUDING SAME
- Publication number 20140152993
- Publication date Jun 5, 2014
- Konica Minolta, Inc.
- Yusuke Hirao
- G01 - MEASURING TESTING
Information Patent Application
Self Calibration for mirror positioning in Optical MEMS Interferome...
- Publication number 20140139839
- Publication date May 22, 2014
- SI-WARE SYSTEMS
- Mostafa Medhat
- G02 - OPTICS
Information Patent Application
INTERFEROMETERY ON A PLANAR SUBSTRATE
- Publication number 20140125983
- Publication date May 8, 2014
- TORNADO MEDICAL SYSTEMS, INC.
- Arthur Nitkowski
- G01 - MEASURING TESTING
Information Patent Application
MICRO-SPECTRAL SENSOR
- Publication number 20130120754
- Publication date May 16, 2013
- Michael Wilson
- G01 - MEASURING TESTING
Information Patent Application
STATIC FOURIER SPECTROMETER
- Publication number 20130107270
- Publication date May 2, 2013
- Alexander Anatolyevich Stroganov
- G01 - MEASURING TESTING

Devices of compact or symmetric construction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High-performance on-chip spectrometers and spectrum analyzers

Mirror unit and optical module

Micro-electromechanical system (MEMS) interferometer for FT-MIR spe...

Fourier-transform infrared (FT-IR) spectroscopy using a mobile device

Optical module

Optical device

Mirror unit and optical module

Mirror unit and optical module

Nanoelectromechanical interferometer for visible to infrared wavele...

Miniaturized Fourier-transform Raman spectrometer systems and methods

Optical arrangement for the compensation of incorrect alignments of...

Monolithic assembly of reflective spatial heterodyne spectrometer

Interferometer system and application thereof

Optical module having high-accuracy spectral analysis

Optical device

Housing system for Michelson interferometer

Self-referenced spectrometer

Devices and systems for improved collection efficiency and resoluti...

Integrated polarization interferometer and snapshot specro-polarime...

Fourier-transform interferometer using meta surface

Common path interferometers spectrometer with a focusing input

Fourier transform spectrophotometer

Apparatus, systems, and methods for talbot spectrometers

Miniaturized Fourier-transform Raman spectrometer systems and methods

Fourier-transform interferometer using meta surface

Compact wavelength meter and laser output measurement device

Sagnac fourier spectrometer (SAFOS)

Position detection method and optical module

Apparatus, systems, and methods for Talbot spectrometers

Spatially resolved gas detection

Patents Applicationslast 30 patents

MIRROR UNIT AND OPTICAL MODULE

COMPACT HOLOGRAPHIC SLM SPECTROMETER

Blood-Solute Calculation with a Mobile Device Using Non-Invasive Sp...

OPTICAL DEVICE

MICRO-ELECTROMECHANICAL SYSTEM (MEMS) INTERFEROMETER FOR FT-MIR SPE...

MIRROR UNIT AND OPTICAL MODULE

NANOELECTROMECHANICAL INTERFEROMETER FOR VISIBLE TO INFRARED WAVELE...

OPTICAL MODULE

OPTICAL ARRANGEMENT FOR THE COMPENSATION OF INCORRECT ALIGNMENTS OF...

INTERFEROMETER SYSTEM AND APPLICATION THEREOF

MINIATURIZED FOURIER-TRANSFORM RAMAN SPECTROMETER SYSTEMS AND METHODS

Fourier-Transform Infrared (FT-IR) Spectroscopy Using a Mobile Device

DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...

FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE

APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS

APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS

Compact Interferometer Spectrometer

PHOTODETECTION DEVICE INCLUDING INTERFERENCE ELEMENT

SPATIALLY RESOLVED GAS DETECTION

INTERFEROMETER WITH AN OSCILLATING REFLECTOR PROVIDED BY AN OUTER S...

SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROME...

METHOD FOR MANUFACTURING OPTICAL INTERFEROMETER

METHOD AND SYSTEM FOR SPECTRAL IMAGING

COMPLEX-FISH (FOURIER-TRANSFORM, INTEGRATED-OPTIC SPATIAL HETERODYN...

SPECTROSCOPY ASSEMBLY

INTERFEROMETER AND SPECTROMETER INCLUDING SAME

Self Calibration for mirror positioning in Optical MEMS Interferome...

INTERFEROMETERY ON A PLANAR SUBSTRATE

MICRO-SPECTRAL SENSOR

STATIC FOURIER SPECTROMETER