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G01J3/4531

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/4531Devices without moving parts

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Patents Grantslast 30 patents

Information Patent Grant
Fabry-perot fourier transform spectrometer
- Patent number 12,174,070
- Issue date Dec 24, 2024
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
- Patent number 11,885,677
- Issue date Jan 30, 2024
- Massachusetts Institute of Technology
- Derek Kita
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic assembly of miniature reflective cyclical spatial hetero...
- Patent number 11,802,796
- Issue date Oct 31, 2023
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for dual comb spectroscopy
- Patent number 11,686,622
- Issue date Jun 27, 2023
- The Regents of The University of Colorado, A Body Corporate
- Gregory B. Rieker
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device for interferometric spectroscopy
- Patent number 11,530,952
- Issue date Dec 20, 2022
- SPECTROVE INC.
- Kasra Khazeni
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal fourier transform imaging spectrometer
- Patent number 11,490,037
- Issue date Nov 1, 2022
- Palo Alto Research Center Incorporated
- Alex Hegyi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fabry-Perot Fourier transform spectrometer
- Patent number 11,415,460
- Issue date Aug 16, 2022
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Grant
Spectral measurement device and spectral measurement method
- Patent number 11,402,270
- Issue date Aug 2, 2022
- National University Corporation Kagawa University
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Polarization measurement with interference patterns of high spatial...
- Patent number 11,248,955
- Issue date Feb 15, 2022
- Industrial Cooperation Foundation Chonbuk National University
- Daesuk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic assembly of reflective spatial heterodyne spectrometer
- Patent number 11,237,056
- Issue date Feb 1, 2022
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Grant
High-throughput compact static-Fourier-transform spectrometer
- Patent number 11,215,504
- Issue date Jan 4, 2022
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Jiangquan Mai
- G01 - MEASURING TESTING
Information Patent Grant
Noise suppression in spectrometers
- Patent number 11,204,275
- Issue date Dec 21, 2021
- Keit Limited
- James Paul Sobol
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide spectrometer to carry out the integrated interferogram sc...
- Patent number 11,105,680
- Issue date Aug 31, 2021
- MICOS ENGINEERING GMBH
- Benedict Joseph Guldimann
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized waveguide imaging spectrometer
- Patent number 11,067,442
- Issue date Jul 20, 2021
- MICOS ENGINEERING GMBH
- Mohammadreza Madi
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device and method
- Patent number 11,054,304
- Issue date Jul 6, 2021
- Sony Corporation
- Ken Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Exit-pupil expander used distribute light over a liquid-crystal var...
- Patent number 10,983,338
- Issue date Apr 20, 2021
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal fourier transform imaging spectrometer
- Patent number 10,958,855
- Issue date Mar 23, 2021
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution integrated-optics-based spectrometer
- Patent number 10,914,634
- Issue date Feb 9, 2021
- Academisch Medisch Centrum
- Bakiye Imran Avci
- G01 - MEASURING TESTING
Information Patent Grant
Spatial heterodyne spectrometer
- Patent number 10,908,023
- Issue date Feb 2, 2021
- LightMachinery Inc.
- John H. Hunter
- G01 - MEASURING TESTING
Information Patent Grant
Integrated polarization interferometer and snapshot specro-polarime...
- Patent number 10,890,487
- Issue date Jan 12, 2021
- INDUSTRIAL COOPERATION FONDATION CHONBUK NATIONAL UNIVERSITY
- Dae Suk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-transform interferometer using meta surface
- Patent number 10,877,349
- Issue date Dec 29, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang Park
- G02 - OPTICS
Information Patent Grant
Apparatus, systems, and methods for on-chip spectroscopy using opti...
- Patent number 10,852,190
- Issue date Dec 1, 2020
- Massachusetts Institute of Technology
- Juejun Hu
- G01 - MEASURING TESTING
Information Patent Grant
Common path interferometers spectrometer with a focusing input
- Patent number 10,845,244
- Issue date Nov 24, 2020
- Keit Limited
- Timothy John Stephens
- G01 - MEASURING TESTING
Information Patent Grant
Photo-thermal interferometer
- Patent number 10,768,088
- Issue date Sep 8, 2020
- Volumen d.o.o.
- Luka Drinovec
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal fourier transform imaging spectrometer
- Patent number 10,760,967
- Issue date Sep 1, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference device
- Patent number 10,760,971
- Issue date Sep 1, 2020
- National University of Singapore
- Sascha Pierre Heussler
- G01 - MEASURING TESTING
Information Patent Grant
Fabry-Perot Fourier transform spectrometer
- Patent number 10,739,197
- Issue date Aug 11, 2020
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for talbot spectrometers
- Patent number 10,732,044
- Issue date Aug 4, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform multi-channel spectral imager
- Patent number 10,677,650
- Issue date Jun 9, 2020
- Office National D'Etudes et de Recherches Aerospatiales
- Nicolas Guerineau
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transforming uniformly or non-uniformly sa...
- Patent number 10,663,346
- Issue date May 26, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTONIC INTEGRATED CIRCUIT
- Publication number 20230400354
- Publication date Dec 14, 2023
- ROCKLEY PHOTONICS LIMITED
- Richard GROTE
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY
- Publication number 20230375408
- Publication date Nov 23, 2023
- Spectrove Inc.
- Kasra Khazeni
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
- Publication number 20230349764
- Publication date Nov 2, 2023
- The Regents of the University of Colorado, a Body Corporate
- Gregory B. Rieker
- G01 - MEASURING TESTING
Information Patent Application
FABRY-PEROT FOURIER TRANSFORM SPECTROMETER
- Publication number 20230221180
- Publication date Jul 13, 2023
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
- Publication number 20230076993
- Publication date Mar 9, 2023
- SI-WARE SYSTEMS
- Botros George Iskander Shenouda
- G01 - MEASURING TESTING
Information Patent Application
HIGH-THROUGHPUT COMPACT STATIC-FOURIER-TRANSFORM SPECTROMETER
- Publication number 20210310864
- Publication date Oct 7, 2021
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Jiangquan Mai
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL MEASUREMENT DEVICE AND SPECTRAL MEASUREMENT METHOD
- Publication number 20210310869
- Publication date Oct 7, 2021
- National University Corporation Kagawa University
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY
- Publication number 20210223106
- Publication date Jul 22, 2021
- Spectrove Inc.
- Kasra Khazeni
- G01 - MEASURING TESTING
Information Patent Application
FABRY-PEROT FOURIER TRANSFORM SPECTROMETER
- Publication number 20210190588
- Publication date Jun 24, 2021
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Application
Optical Interference Device
- Publication number 20210123809
- Publication date Apr 29, 2021
- National University of Singapore
- Sascha Pierre Heussler
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
- Publication number 20210080324
- Publication date Mar 18, 2021
- The Regents of the University of Colorado, a Body Corporate
- Gregory B. Rieker
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL HETERODYNE SPECTROMETER
- Publication number 20210003450
- Publication date Jan 7, 2021
- LightMachinery Inc.
- John H. Hunter
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER
- Publication number 20200378831
- Publication date Dec 3, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE SPECTROMETER TO CARRY OUT THE INTEGRATED INTERFEROGRAM SC...
- Publication number 20200278248
- Publication date Sep 3, 2020
- MICOS ENGINEERING GMBH
- Joseph Benedict GULDIMANN
- G01 - MEASURING TESTING
Information Patent Application
Noise Suppression in Spectrometers
- Publication number 20200191650
- Publication date Jun 18, 2020
- Keit Limited
- James Paul Sobol
- G01 - MEASURING TESTING
Information Patent Application
FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE
- Publication number 20200110323
- Publication date Apr 9, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang PARK
- G02 - OPTICS
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20200103281
- Publication date Apr 2, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200049557
- Publication date Feb 13, 2020
- INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY
- Daesuk KIM
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION INTEGRATED-OPTICS-BASED SPECTROMETER
- Publication number 20200025616
- Publication date Jan 23, 2020
- IXA AMC Office / Academic Medical Center
- Bakiye Imran AVCI
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
- Publication number 20190331529
- Publication date Oct 31, 2019
- Massachusetts Institute of Technology
- Juejun Hu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20190323892
- Publication date Oct 24, 2019
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER
- Publication number 20190313036
- Publication date Oct 10, 2019
- Palo Alto Research Center Incorporated
- ALEX HEGYI
- G02 - OPTICS
Information Patent Application
MINIATURIZED WAVEGUIDE IMAGING SPECTROMETER
- Publication number 20190219445
- Publication date Jul 18, 2019
- MICOS ENGINEERING GMBH
- Mohammadreza MADI
- G01 - MEASURING TESTING
Information Patent Application
Compact Interferometer Spectrometer
- Publication number 20190178715
- Publication date Jun 13, 2019
- Keit Limited
- Timothy John Stephens
- G01 - MEASURING TESTING
Information Patent Application
FOURIER TRANSFORM MULTI-CHANNEL SPECTRAL IMAGER
- Publication number 20190170576
- Publication date Jun 6, 2019
- OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Nicolas GUERINEAU
- G01 - MEASURING TESTING
Information Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
- Publication number 20190041267
- Publication date Feb 7, 2019
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
- Publication number 20180274981
- Publication date Sep 27, 2018
- Massachusetts Institute of Technology
- Juejun Hu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR, SENSOR ARRANGEMENT AND METHOD FOR SENSING
- Publication number 20180274979
- Publication date Sep 27, 2018
- Nanyang Technological University
- Yaowen Yang
- G01 - MEASURING TESTING
Information Patent Application
FABRY-PEROT FOURIER TRANSFORM SPECTROMETER
- Publication number 20180080824
- Publication date Mar 22, 2018
- University of Hawaii
- Paul Lucey
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...
- Publication number 20170227399
- Publication date Aug 10, 2017
- Juejun Hu
- G02 - OPTICS

Devices without moving parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fabry-perot fourier transform spectrometer

High-performance on-chip spectrometers and spectrum analyzers

Monolithic assembly of miniature reflective cyclical spatial hetero...

Systems and methods for dual comb spectroscopy

MEMS device for interferometric spectroscopy

Liquid crystal fourier transform imaging spectrometer

Fabry-Perot Fourier transform spectrometer

Spectral measurement device and spectral measurement method

Polarization measurement with interference patterns of high spatial...

Monolithic assembly of reflective spatial heterodyne spectrometer

High-throughput compact static-Fourier-transform spectrometer

Noise suppression in spectrometers

Waveguide spectrometer to carry out the integrated interferogram sc...

Miniaturized waveguide imaging spectrometer

Imaging device and method

Exit-pupil expander used distribute light over a liquid-crystal var...

Liquid crystal fourier transform imaging spectrometer

High-resolution integrated-optics-based spectrometer

Spatial heterodyne spectrometer

Integrated polarization interferometer and snapshot specro-polarime...

Fourier-transform interferometer using meta surface

Apparatus, systems, and methods for on-chip spectroscopy using opti...

Common path interferometers spectrometer with a focusing input

Photo-thermal interferometer

Liquid crystal fourier transform imaging spectrometer

Optical interference device

Fabry-Perot Fourier transform spectrometer

Apparatus, systems, and methods for talbot spectrometers

Fourier transform multi-channel spectral imager

Method and apparatus for transforming uniformly or non-uniformly sa...

Patents Applicationslast 30 patents

PHOTONIC INTEGRATED CIRCUIT

MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY

SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY

FABRY-PEROT FOURIER TRANSFORM SPECTROMETER

HANDHELD OPTICAL SPECTROSCOPY SCANNER

HIGH-THROUGHPUT COMPACT STATIC-FOURIER-TRANSFORM SPECTROMETER

SPECTRAL MEASUREMENT DEVICE AND SPECTRAL MEASUREMENT METHOD

MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY

FABRY-PEROT FOURIER TRANSFORM SPECTROMETER

Optical Interference Device

SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY

SPATIAL HETERODYNE SPECTROMETER

LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER

WAVEGUIDE SPECTROMETER TO CARRY OUT THE INTEGRATED INTERFEROGRAM SC...

Noise Suppression in Spectrometers

FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE

APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS

INSPECTION APPARATUS AND INSPECTION METHOD

HIGH-RESOLUTION INTEGRATED-OPTICS-BASED SPECTROMETER

Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...

APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS

LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER

MINIATURIZED WAVEGUIDE IMAGING SPECTROMETER

Compact Interferometer Spectrometer

FOURIER TRANSFORM MULTI-CHANNEL SPECTRAL IMAGER

Computationally-Assisted Multi-Heterodyne Spectroscopy

Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...

OPTICAL SENSOR, SENSOR ARRANGEMENT AND METHOD FOR SENSING

FABRY-PEROT FOURIER TRANSFORM SPECTROMETER

Apparatus, Systems, and Methods for On-Chip Spectroscopy Using Opti...