Echelle gratings

Industry

CPC
G01J3/1809

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/1809Echelle gratings

Industries

Patents Grantslast 30 patents

Information Patent Grant
Light source modules for noise mitigation
- Patent number 12,111,210
- Issue date Oct 8, 2024
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectrometers and instruments including them
- Patent number 11,692,873
- Issue date Jul 4, 2023
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer
- Patent number 11,639,874
- Issue date May 2, 2023
- PerkinElmer Health Sciences, Inc.
- David M. Aikens
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction grating design
- Patent number 11,506,535
- Issue date Nov 22, 2022
- Apple Inc.
- Yongming Tu
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometers and instruments including them
- Patent number 11,221,254
- Issue date Jan 11, 2022
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement
- Patent number 11,204,277
- Issue date Dec 21, 2021
- Analytik Jena GmbH
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Compact freeform echelle spectrometer
- Patent number 11,169,024
- Issue date Nov 9, 2021
- University of Rochester
- Jannick Rolland-Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectrometers and instruments including them
- Patent number 11,092,485
- Issue date Aug 17, 2021
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Grant
Compact two-dimensional spectrometer
- Patent number 11,009,397
- Issue date May 18, 2021
- Rigaku Analytical Devices, Inc.
- David Steven Mercuro
- G01 - MEASURING TESTING
Information Patent Grant
Wavemeter system using a set of optical chips
- Patent number 10,900,838
- Issue date Jan 26, 2021
- Honeywell International Inc.
- Hugh Podmore
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometers with retro-reflective surfaces and related instruments
- Patent number 10,866,139
- Issue date Dec 15, 2020
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G02 - OPTICS
Information Patent Grant
Spectrometers and instruments including them
- Patent number 10,809,124
- Issue date Oct 20, 2020
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement
- Patent number 10,746,598
- Issue date Aug 18, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement, method for producing a two-dimensional sp...
- Patent number 10,718,666
- Issue date Jul 21, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Echelle grating demux/mux in SiN
- Patent number 10,663,659
- Issue date May 26, 2020
- II-VI Delaware Inc.
- Daniel Mahgerefteh
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with two-dimensional spectrum
- Patent number 10,488,254
- Issue date Nov 26, 2019
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Echelle grating demux/mux in SiN
- Patent number 10,317,621
- Issue date Jun 11, 2019
- Finisar Corporation
- Daniel Mahgerefteh
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic calibration method for echelle spectrometer in laser-induce...
- Patent number 10,309,831
- Issue date Jun 4, 2019
- Huazhong University of Science and Technology
- Xiangyou Li
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer for generating a two dimensional spectrum
- Patent number 10,288,481
- Issue date May 14, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- James Peter Robert Day
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectrometer with reflective grating
- Patent number 10,184,833
- Issue date Jan 22, 2019
- European Space Agency
- Matteo Taccola
- G02 - OPTICS
Information Patent Grant
Field lens corrected three mirror anastigmat spectrograph
- Patent number 10,024,716
- Issue date Jul 17, 2018
- Burt J. Beardsley
- G02 - OPTICS
Information Patent Grant
Tunable ultra-compact fresnel zone plate spectrometer
- Patent number 9,784,617
- Issue date Oct 10, 2017
- United States of America, as Represented by the Secretary of the Navy
- Joanna N. Ptasinski
- G02 - OPTICS
Information Patent Grant
Field lens corrected three mirror anastigmat spectrograph
- Patent number 9,677,932
- Issue date Jun 13, 2017
- Burt J. Beardsley
- G02 - OPTICS
Information Patent Grant
Apparatus, method and system for spectrometry with a displaceable w...
- Patent number 9,500,827
- Issue date Nov 22, 2016
- Intel Corporation
- David N. Hutchison
- G02 - OPTICS
Information Patent Grant
Active spectral control during spectrum synthesis
- Patent number 9,207,119
- Issue date Dec 8, 2015
- Cymer, LLC
- Rostislav Rokitski
- G01 - MEASURING TESTING
Information Patent Grant
High resolution MEMS-based Hadamard spectroscopy
- Patent number 8,922,769
- Issue date Dec 30, 2014
- Thermo Scientific Portable Analytical Instruments Inc.
- Malcolm C. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement
- Patent number 8,873,048
- Issue date Oct 28, 2014
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Echelle grating multi-order imaging spectrometer utilizing a catadi...
- Patent number 8,736,836
- Issue date May 27, 2014
- Lawrence Livermore National Security, LLC
- Michael P. Chrisp
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer arrangement using internal predispersion
- Patent number 8,681,329
- Issue date Mar 25, 2014
- Leibniz—Institut für Analytische Wissenschaften—ISAS—e.V.
- Helmut Becker-Roβ
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-high density diffraction grating
- Patent number 8,331,027
- Issue date Dec 11, 2012
- The Regents of the University of California
- Howard A. Padmore
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SPECTROMETER
- Publication number 20240044707
- Publication date Feb 8, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Lutz Frommberger
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A SPECTRAL PEAK
- Publication number 20230194344
- Publication date Jun 22, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ning Ning Pan
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND METHOD FOR SHAPING A LIGHT SPECTRUM
- Publication number 20230160746
- Publication date May 25, 2023
- HERIOT-WATT UNIVERSITY
- Marius RUTKAUSKAS
- G01 - MEASURING TESTING
Information Patent Application
MULTIPULSE-INDUCED SPECTROSCOPY METHOD AND DEVICE BASED ON FEMTOSEC...
- Publication number 20230093899
- Publication date Mar 30, 2023
- Chongqing Institute of East China Normal University
- Heping ZENG
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OPTICAL SPECTRA
- Publication number 20230018735
- Publication date Jan 19, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ayrat MURTAZIN
- G01 - MEASURING TESTING
Information Patent Application
Light Source Modules for Noise Mitigation
- Publication number 20230011177
- Publication date Jan 12, 2023
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Application
Peak Determination in Two-Dimensional Optical Spectra
- Publication number 20220252454
- Publication date Aug 11, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen Schlueter
- G01 - MEASURING TESTING
Information Patent Application
Echelle Spectrometer
- Publication number 20220221340
- Publication date Jul 14, 2022
- PerkinElmer Health Sciences, Inc.
- David M. Aikens
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SPECTROMETERS AND INSTRUMENTS INCLUDING THEM
- Publication number 20210381890
- Publication date Dec 9, 2021
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Application
COMPACT FREEFORM ECHELLE SPECTROMETER
- Publication number 20210131869
- Publication date May 6, 2021
- University of Rochester
- Jannick Rolland-Thompson
- G01 - MEASURING TESTING
Information Patent Application
Spectrometers and Instruments Including Them
- Publication number 20200408595
- Publication date Dec 31, 2020
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20200370957
- Publication date Nov 26, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Application
PLASMA EMISSION MONITORING SYSTEM WITH CROSS-DISPERSION GRATING
- Publication number 20200340858
- Publication date Oct 29, 2020
- Applied Materials, Inc.
- Philip Allan Kraus
- G02 - OPTICS
Information Patent Application
COMPACT TWO-DIMENSIONAL SPECTROMETER
- Publication number 20200124476
- Publication date Apr 23, 2020
- Rigaku Analytical Devices, Inc.
- David Steven Mercuro
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETERS WITH RETRO-REFLECTIVE SURFACES AND RELATED INSTRUMENTS
- Publication number 20200049558
- Publication date Feb 13, 2020
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G02 - OPTICS
Information Patent Application
COMPACT SPECTROMETERS AND INSTRUMENTS INCLUDING THEM
- Publication number 20200049554
- Publication date Feb 13, 2020
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G02 - OPTICS
Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20190368933
- Publication date Dec 5, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
ECHELLE GRATING DEMUX/MUX IN SIN
- Publication number 20190346623
- Publication date Nov 14, 2019
- Finisar Corporation
- Daniel Mahgerefteh
- G02 - OPTICS
Information Patent Application
Spectrometers and Instruments Including Them
- Publication number 20190339123
- Publication date Nov 7, 2019
- PerkinElmer Heath Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...
- Publication number 20190186992
- Publication date Jun 20, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER WITH TWO-DIMENSIONAL SPECTRUM
- Publication number 20190025121
- Publication date Jan 24, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC CALIBRATION METHOD FOR ECHELLE SPECTROMETER IN LASER-INDUCE...
- Publication number 20190003887
- Publication date Jan 3, 2019
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Xiangyou LI
- G01 - MEASURING TESTING
Information Patent Application
ECHELLE GRATING DEMUX/MUX IN SIN
- Publication number 20180217330
- Publication date Aug 2, 2018
- Finisar Corporation
- Daniel Mahgerefteh
- G02 - OPTICS
Information Patent Application
IMAGING SPECTROMETER WITH REFLECTIVE GRATING
- Publication number 20180094977
- Publication date Apr 5, 2018
- EUROPEAN SPACE AGENCY
- Matteo Taccola
- G02 - OPTICS
Information Patent Application
CURVED DIFFRACTION GRATING, SPECTROMETER AND MANUFACTURING METHOD O...
- Publication number 20170299788
- Publication date Oct 19, 2017
- ACADEMIA SINICA
- Pei-Kuen WEI
- G02 - OPTICS
Information Patent Application
FIELD LENS CORRECTED THREE MIRROR ANASTIGMAT SPECTROGRAPH
- Publication number 20170268927
- Publication date Sep 21, 2017
- Burt J. Beardsley
- G02 - OPTICS
Information Patent Application
FIELD LENS CORRECTED THREE MIRROR ANASTIGMAT SPECTROGRAPH
- Publication number 20170115163
- Publication date Apr 27, 2017
- Burt J. Beardsley
- G02 - OPTICS
Information Patent Application
APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE W...
- Publication number 20150377705
- Publication date Dec 31, 2015
- David N. Hutchison
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR GRAPHENE PHOTODETECTORS
- Publication number 20150372159
- Publication date Dec 24, 2015
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- DIRK ENGLUND
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION MEMS-BASED HADAMARD SPECTROSCOPY
- Publication number 20140268139
- Publication date Sep 18, 2014
- Malcolm C. Smith
- G01 - MEASURING TESTING

Echelle gratings

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Light source modules for noise mitigation

Compact spectrometers and instruments including them

Echelle spectrometer

Diffraction grating design

Spectrometers and instruments including them

Spectrometer arrangement

Compact freeform echelle spectrometer

Compact spectrometers and instruments including them

Compact two-dimensional spectrometer

Wavemeter system using a set of optical chips

Spectrometers with retro-reflective surfaces and related instruments

Spectrometers and instruments including them

Spectrometer arrangement

Spectrometer arrangement, method for producing a two-dimensional sp...

Echelle grating demux/mux in SiN

Spectrometer with two-dimensional spectrum

Echelle grating demux/mux in SiN

Dynamic calibration method for echelle spectrometer in laser-induce...

Spectrometer for generating a two dimensional spectrum

Imaging spectrometer with reflective grating

Field lens corrected three mirror anastigmat spectrograph

Tunable ultra-compact fresnel zone plate spectrometer

Field lens corrected three mirror anastigmat spectrograph

Apparatus, method and system for spectrometry with a displaceable w...

Active spectral control during spectrum synthesis

High resolution MEMS-based Hadamard spectroscopy

Spectrometer arrangement

Echelle grating multi-order imaging spectrometer utilizing a catadi...

Echelle spectrometer arrangement using internal predispersion

Ultra-high density diffraction grating

Patents Applicationslast 30 patents

OPTICAL SPECTROMETER

METHOD OF ANALYZING A SPECTRAL PEAK

A SYSTEM AND METHOD FOR SHAPING A LIGHT SPECTRUM

MULTIPULSE-INDUCED SPECTROSCOPY METHOD AND DEVICE BASED ON FEMTOSEC...

PROCESSING OPTICAL SPECTRA

Light Source Modules for Noise Mitigation

Peak Determination in Two-Dimensional Optical Spectra

Echelle Spectrometer

COMPACT SPECTROMETERS AND INSTRUMENTS INCLUDING THEM

COMPACT FREEFORM ECHELLE SPECTROMETER

Spectrometers and Instruments Including Them

SPECTROMETER ARRANGEMENT

PLASMA EMISSION MONITORING SYSTEM WITH CROSS-DISPERSION GRATING

COMPACT TWO-DIMENSIONAL SPECTROMETER

SPECTROMETERS WITH RETRO-REFLECTIVE SURFACES AND RELATED INSTRUMENTS

COMPACT SPECTROMETERS AND INSTRUMENTS INCLUDING THEM

SPECTROMETER ARRANGEMENT

ECHELLE GRATING DEMUX/MUX IN SIN

Spectrometers and Instruments Including Them

SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...

SPECTROMETER WITH TWO-DIMENSIONAL SPECTRUM

DYNAMIC CALIBRATION METHOD FOR ECHELLE SPECTROMETER IN LASER-INDUCE...

ECHELLE GRATING DEMUX/MUX IN SIN

IMAGING SPECTROMETER WITH REFLECTIVE GRATING

CURVED DIFFRACTION GRATING, SPECTROMETER AND MANUFACTURING METHOD O...

FIELD LENS CORRECTED THREE MIRROR ANASTIGMAT SPECTROGRAPH

FIELD LENS CORRECTED THREE MIRROR ANASTIGMAT SPECTROGRAPH

APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE W...

SYSTEMS AND METHODS FOR GRAPHENE PHOTODETECTORS

HIGH RESOLUTION MEMS-BASED HADAMARD SPECTROSCOPY