Electrostatic ion traps

Industry

CPC
H01J49/4245

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/4245Electrostatic ion traps

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic ion trap
- Patent number 12,119,215
- Issue date Oct 15, 2024
- NINGBO UNIVERSITY
- Fu-Xing Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for pulsed mode charge detection mass spectrom...
- Patent number 12,112,936
- Issue date Oct 8, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inception electrostatic linear ion trap
- Patent number 12,057,306
- Issue date Aug 6, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometry utilizing harmonic oscillation a...
- Patent number 12,051,579
- Issue date Jul 30, 2024
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap
- Patent number 11,990,329
- Issue date May 21, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap with charge...
- Patent number 11,862,448
- Issue date Jan 2, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,842,892
- Issue date Dec 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,817,301
- Issue date Nov 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplex charge detection mass spectrometry
- Patent number 11,791,146
- Issue date Oct 17, 2023
- The Regents of the University of California
- Evan R. Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection into an electrostatic linear ion trap using Zeno pulsing
- Patent number 11,764,052
- Issue date Sep 19, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 11,742,192
- Issue date Aug 29, 2023
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for separat...
- Patent number 11,646,191
- Issue date May 9, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometer including gain drift compensation
- Patent number 11,594,405
- Issue date Feb 28, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for simultaneously analyzing multiple ions wit...
- Patent number 11,562,896
- Issue date Jan 24, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrum calculation processing device, spectrum calculation proces...
- Patent number 11,527,393
- Issue date Dec 13, 2022
- Shimadzu Corporation
- Hideharu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,361,952
- Issue date Jun 14, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 11,328,920
- Issue date May 10, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,328,922
- Issue date May 10, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and method for improving mass and...
- Patent number 11,264,229
- Issue date Mar 1, 2022
- Guennadi Lebedev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic linear ion trap design for charge detection mass spec...
- Patent number 11,232,941
- Issue date Jan 25, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 11,227,759
- Issue date Jan 18, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for capturing ions in an electrostatic linear...
- Patent number 11,227,758
- Issue date Jan 18, 2022
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection into multi-pass mass spectrometers
- Patent number 11,205,568
- Issue date Dec 21, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for calibrating or resetting a charge detector
- Patent number 11,177,122
- Issue date Nov 16, 2021
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature charged particle trap with elongated trapping region for...
- Patent number 11,158,496
- Issue date Oct 26, 2021
- The University of North Carolina at Chapel Hill
- J. Michael Ramsey
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20240412967
- Publication date Dec 12, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION OF ANALYTICAL INSTRUMENT
- Publication number 20240393301
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Kyle Fort
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
- Publication number 20240387159
- Publication date Nov 21, 2024
- Thermo Finnigan LLC
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDITIONAL OPERATIONS IN QUANTUM OBJECT CONFINEMENT APPARATUS USIN...
- Publication number 20240355613
- Publication date Oct 24, 2024
- Quantinuum LLC
- Christopher E. LANGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL ISOLATION OF DEVICES OPERATING AT CRYOGENIC TEMPERATURES
- Publication number 20240355573
- Publication date Oct 24, 2024
- IonQ, Inc.
- Ismail Volkan INLEK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC ION TRAP
- Publication number 20240347334
- Publication date Oct 17, 2024
- NINGBO UNIVERSITY
- Fu-Xing Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240290605
- Publication date Aug 29, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Injecting Ions into an Electrostatic Linear...
- Publication number 20240274429
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...
- Publication number 20240242958
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nested Electrostatic Linear Ion Traps and Methods of Operating the...
- Publication number 20240194472
- Publication date Jun 13, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240136167
- Publication date Apr 25, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SUPER MASS SPECTROMETRY
- Publication number 20230298875
- Publication date Sep 21, 2023
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...
- Publication number 20230245879
- Publication date Aug 3, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Reducing the Amplitude of an Oscillating Elec...
- Publication number 20230230828
- Publication date Jul 20, 2023
- Alpine Quantum Technologies GmbH
- Gerard Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHAR...
- Publication number 20230187198
- Publication date Jun 15, 2023
- WATERS TECHNOLOGIES CORPORATION
- Joseph A. Jarrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT, INCLUDING AN ELECROSTATIC LINEAR ION TRAP WITH CHARGE D...
- Publication number 20230154736
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...
- Publication number 20230154741
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-DOMAIN ANALYSIS OF SIGNALS FOR CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20230046906
- Publication date Feb 16, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20220344145
- Publication date Oct 27, 2022
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP
- Publication number 20220319828
- Publication date Oct 6, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CROSSTALK COMPENSATION
- Publication number 20220301841
- Publication date Sep 22, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
- Publication number 20220246414
- Publication date Aug 4, 2022
- Thermo Finnigan LLC
- Michael W. SENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
- Publication number 20220238320
- Publication date Jul 28, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION INJECTION TO AN ELECTROSTATIC TRAP
- Publication number 20220238321
- Publication date Jul 28, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail BELOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20220122831
- Publication date Apr 21, 2022
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inception Electrostatic Linear Ion Trap
- Publication number 20220068624
- Publication date Mar 3, 2022
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLEX CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20220059332
- Publication date Feb 24, 2022
- The Regents of the University of California
- Evan R. Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Injection into an Electrostatic Linear Ion Trap Using Zeno Pulsing
- Publication number 20220051887
- Publication date Feb 17, 2022
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS

Electrostatic ion traps

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion trap array for high throughput charge detection mass spectrometry

Time of flight mass analyser with spatial focussing

Electrostatic ion trap

Apparatus and method for pulsed mode charge detection mass spectrom...

Inception electrostatic linear ion trap

Charge detection mass spectrometry utilizing harmonic oscillation a...

Ion trap

Mass analyzer with 3D electrostatic field

Instrument, including an electrostatic linear ion trap with charge...

Ion injection to an electrostatic trap

Accelerator for multi-pass mass spectrometers

Method and device for crosstalk compensation

Multiplex charge detection mass spectrometry

Ion injection into an electrostatic linear ion trap using Zeno pulsing

Electrostatic trap mass spectrometer with improved ion injection

Instrument, including an electrostatic linear ion trap, for separat...

Multi-reflecting time of flight mass analyser

Charge detection mass spectrometer including gain drift compensation

Apparatus and method for simultaneously analyzing multiple ions wit...

Spectrum calculation processing device, spectrum calculation proces...

Method and device for crosstalk compensation

Time of flight mass analyser with spatial focussing

Ion injection to an electrostatic trap

Time-of-flight mass spectrometer and method for improving mass and...

Electrostatic linear ion trap design for charge detection mass spec...

Ion trap array for high throughput charge detection mass spectrometry

Apparatus and method for capturing ions in an electrostatic linear...

Ion injection into multi-pass mass spectrometers

Apparatus and method for calibrating or resetting a charge detector

Miniature charged particle trap with elongated trapping region for...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

CALIBRATION OF ANALYTICAL INSTRUMENT

CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...

CONDITIONAL OPERATIONS IN QUANTUM OBJECT CONFINEMENT APPARATUS USIN...

ELECTRICAL ISOLATION OF DEVICES OPERATING AT CRYOGENIC TEMPERATURES

ELECTROSTATIC ION TRAP

MASS SPECTROMETER AND METHOD

Methods and Systems for Injecting Ions into an Electrostatic Linear...

Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...

Nested Electrostatic Linear Ion Traps and Methods of Operating the...

MASS SPECTROMETER AND METHOD

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

SYSTEMS AND METHODS FOR SUPER MASS SPECTROMETRY

INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...

Method and System for Reducing the Amplitude of an Oscillating Elec...

METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHAR...

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

INSTRUMENT, INCLUDING AN ELECROSTATIC LINEAR ION TRAP WITH CHARGE D...

INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...

TIME-DOMAIN ANALYSIS OF SIGNALS FOR CHARGE DETECTION MASS SPECTROMETRY

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

ION TRAP

METHOD AND DEVICE FOR CROSSTALK COMPENSATION

CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...

TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING

ION INJECTION TO AN ELECTROSTATIC TRAP

ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY

Inception Electrostatic Linear Ion Trap

MULTIPLEX CHARGE DETECTION MASS SPECTROMETRY

Ion Injection into an Electrostatic Linear Ion Trap Using Zeno Pulsing