Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof

Industry

CPC
H01J2237/208

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/208Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 11,972,923
- Issue date Apr 30, 2024
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,133,149
- Issue date Sep 28, 2021
- Hitachi High-Tech Science Corporation
- Toshihiro Mochizuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing thin film sample piece and charged particle bea...
- Patent number 11,094,503
- Issue date Aug 17, 2021
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manipulating a sample in an evacuated chamber of a charge...
- Patent number 11,017,980
- Issue date May 25, 2021
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,825,651
- Issue date Nov 3, 2020
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for large-scale high throughput quantitative c...
- Patent number 10,804,073
- Issue date Oct 13, 2020
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Haizhou Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe with solid beveled tip and method for using same for specimen...
- Patent number 10,801,926
- Issue date Oct 13, 2020
- EXpressLO LLC
- Lucille A. Giannuzzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,692,688
- Issue date Jun 23, 2020
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,629,411
- Issue date Apr 21, 2020
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Specimen preparation and inspection in a dual-beam charged particle...
- Patent number 10,629,409
- Issue date Apr 21, 2020
- FEI Company
- Frantisek Vaske
- G01 - MEASURING TESTING
Information Patent Grant
Through process flow intra-chip and inter-chip electrical analysis...
- Patent number 10,539,589
- Issue date Jan 21, 2020
- FEI EFA, Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle instruments
- Patent number 10,475,620
- Issue date Nov 12, 2019
- NANOSCOPE SERVICES LIMITED
- Lloyd Peto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,340,119
- Issue date Jul 2, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,236,159
- Issue date Mar 19, 2019
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detaching probe from TEM sample during sample preparation
- Patent number 10,053,768
- Issue date Aug 21, 2018
- FEI Company
- Corey Senowitz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Alignment and registration targets for charged particle beam substr...
- Patent number 10,026,589
- Issue date Jul 17, 2018
- Kevin M. Monahan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preparation of specimen arrays on an EM grid
- Patent number 9,952,128
- Issue date Apr 24, 2018
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated lamellae extraction station
- Patent number 9,821,486
- Issue date Nov 21, 2017
- FEI Company
- Kelly Bruland
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Grant
Preparation of sample for charged-particle microscopy
- Patent number 9,772,265
- Issue date Sep 26, 2017
- FEI Company
- Hervé-William Rémigy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit probe for charged particle beam system
- Patent number 9,709,600
- Issue date Jul 18, 2017
- FEI Company
- Paul Johannes L. Barends
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 9,711,325
- Issue date Jul 18, 2017
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multidimensional structural access
- Patent number 9,696,372
- Issue date Jul 4, 2017
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-nano tools with changeable tips for micro-NANO manipulation
- Patent number 9,649,763
- Issue date May 16, 2017
- Yu Sun
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,620,333
- Issue date Apr 11, 2017
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number RE46350
- Issue date Mar 28, 2017
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
Information Patent Grant
Preparation of specimen arrays on an EM grid
- Patent number 9,594,008
- Issue date Mar 14, 2017
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,581,526
- Issue date Feb 28, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device and specimen preparation method u...
- Patent number 9,449,786
- Issue date Sep 20, 2016
- Hitachi High-Technologies Corporation
- Miki Tsuchiya
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method of reconstructing electrical probes
- Patent number 9,435,828
- Issue date Sep 6, 2016
- GLOBALFOUNDRIES Inc.
- David R. Goulet
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and sample preparation method
- Patent number 9,362,088
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Takahiro Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20240055220
- Publication date Feb 15, 2024
- Hitachi High-Tech Corporation
- Yuka II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
- Publication number 20230298855
- Publication date Sep 21, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
- Publication number 20230268156
- Publication date Aug 24, 2023
- Hitachi High-Tech Corporation
- Naoki SAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20230215690
- Publication date Jul 6, 2023
- FEI Company
- Christopher THOMPSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTAINER AND SUBSTRATE TREATING SYSTEM
- Publication number 20220384160
- Publication date Dec 1, 2022
- SEMES CO., LTD.
- Chung Woo LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Lamella, Analysis System and Method for Analyz...
- Publication number 20220367144
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Atsushi SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE DETACHING APPARATUS
- Publication number 20220336195
- Publication date Oct 20, 2022
- Shinko Electric Industries Co., Ltd.
- Shinji NAKAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GENERATOR, FAN COIL UNIT AND AIR CONDITIONING SYSTEM
- Publication number 20220333804
- Publication date Oct 20, 2022
- Carrier Corporation
- Huanan Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING THE 3D STRUCTURE OF BIOMOLECULES
- Publication number 20210364525
- Publication date Nov 25, 2021
- Martin Andersson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SUBSTRATE SUPPORT STAGE, PLASMA PROCESSING SYSTEM, AND METHOD OF MO...
- Publication number 20210319988
- Publication date Oct 14, 2021
- TOKYO ELECTRON LIMITED
- Kazuki MOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...
- Publication number 20200294760
- Publication date Sep 17, 2020
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Haizhou WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...
- Publication number 20200266031
- Publication date Aug 20, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20190272975
- Publication date Sep 5, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170178858
- Publication date Jun 22, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION OF SPECIMEN ARRAYS ON AN EM GRID
- Publication number 20170025250
- Publication date Jan 26, 2017
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Application
Stage Apparatus and Charged Particle Radiation Apparatus Equipped w...
- Publication number 20160284506
- Publication date Sep 29, 2016
- Hitachi High-Technologies Corporation
- Hironori OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION OF SAMPLE FOR CHARGED-PARTICLE MICROSCOPY
- Publication number 20160245732
- Publication date Aug 25, 2016
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PREPARATION METHOD
- Publication number 20150137003
- Publication date May 21, 2015
- United Microelectronics Corp.
- Kaeng-Nan Liew
- G01 - MEASURING TESTING
Information Patent Application
Preparation of Specimen Arrays on an EM Grid
- Publication number 20150090899
- Publication date Apr 2, 2015
- Bridget Carragher
- G01 - MEASURING TESTING
Information Patent Application
Method of Reconstructing Electrical Probes
- Publication number 20140347038
- Publication date Nov 27, 2014
- International Business Machines Corporation
- David R. Goulet
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatuses for Specimen Lift-Out and Circuit Edit Usin...
- Publication number 20140338076
- Publication date Nov 13, 2014
- NaugaNeedles, LLC
- Mehdi M. Yazdanpanah
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY
- Publication number 20140312226
- Publication date Oct 23, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
MICRO-NANO TOOLS WITH CHANGEABLE TIPS FOR MICRO-NANO MANIPULATION
- Publication number 20140284950
- Publication date Sep 25, 2014
- Yu Sun
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20140116873
- Publication date May 1, 2014
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20130341505
- Publication date Dec 26, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130284923
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Microscope Providing Depth-Resolved Imagery
- Publication number 20130228683
- Publication date Sep 5, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatuses of Using Metal Needle Arrays for Specimen L...
- Publication number 20130199034
- Publication date Aug 8, 2013
- Mehdi M. Yazdanpanah
- G01 - MEASURING TESTING

Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for performing sample lift-out for highly react...

Focused ion beam apparatus

Method of preparing thin film sample piece and charged particle bea...

Method of manipulating a sample in an evacuated chamber of a charge...

Automated TEM sample preparation

Apparatus and method for large-scale high throughput quantitative c...

Probe with solid beveled tip and method for using same for specimen...

Charged particle beam apparatus

Charged particle beam apparatus

Specimen preparation and inspection in a dual-beam charged particle...

Through process flow intra-chip and inter-chip electrical analysis...

Charged particle instruments

Automated TEM sample preparation

Charged particle beam apparatus

Detaching probe from TEM sample during sample preparation

Alignment and registration targets for charged particle beam substr...

Preparation of specimen arrays on an EM grid

Integrated lamellae extraction station

Preparation of sample for charged-particle microscopy

Circuit probe for charged particle beam system

Charged-particle microscope providing depth-resolved imagery

Multidimensional structural access

Micro-nano tools with changeable tips for micro-NANO manipulation

Charged particle beam apparatus

Method for stem sample inspection in a charged particle beam instru...

Preparation of specimen arrays on an EM grid

Method for S/TEM sample analysis

Charged particle radiation device and specimen preparation method u...

Method of reconstructing electrical probes

Charged particle beam device and sample preparation method

Patents Applicationslast 30 patents

Charged Particle Beam Device

SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...

METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...

Tweezers, Conveyance Device, and Method for Conveying Sample Piece

SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...

CONTAINER AND SUBSTRATE TREATING SYSTEM

Method for Producing Lamella, Analysis System and Method for Analyz...

SUBSTRATE DETACHING APPARATUS

ION GENERATOR, FAN COIL UNIT AND AIR CONDITIONING SYSTEM

METHOD FOR ANALYZING THE 3D STRUCTURE OF BIOMOLECULES

SUBSTRATE SUPPORT STAGE, PLASMA PROCESSING SYSTEM, AND METHOD OF MO...

APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...

METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...

AUTOMATED TEM SAMPLE PREPARATION

CHARGED PARTICLE BEAM APPARATUS

PREPARATION OF SPECIMEN ARRAYS ON AN EM GRID

Stage Apparatus and Charged Particle Radiation Apparatus Equipped w...

PREPARATION OF SAMPLE FOR CHARGED-PARTICLE MICROSCOPY

SPECIMEN PREPARATION METHOD

Preparation of Specimen Arrays on an EM Grid

Method of Reconstructing Electrical Probes

Methods and Apparatuses for Specimen Lift-Out and Circuit Edit Usin...

CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY

MICRO-NANO TOOLS WITH CHANGEABLE TIPS FOR MICRO-NANO MANIPULATION

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

METHOD FOR S/TEM SAMPLE ANALYSIS

SCANNING ELECTRON MICROSCOPE

Charged-Particle Microscope Providing Depth-Resolved Imagery

Methods and Apparatuses of Using Metal Needle Arrays for Specimen L...