Eliminating deleterious effects due to thermal effects or electric or magnetic fields

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CPC
H01J37/07

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/07Eliminating deleterious effects due to thermal effects or electric or magnetic fields

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Laminate, electron source and electronic device containing laminate...
- Patent number 12,237,141
- Issue date Feb 25, 2025
- National Institute for Materials Science
- Katsumi Nagaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron microscope
- Patent number 12,217,928
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron beam applicator, and method for controlling...
- Patent number 12,198,889
- Issue date Jan 14, 2025
- Photo electron Soul Inc.
- Atsushi Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric coated plasmonic photoemitter
- Patent number 12,183,535
- Issue date Dec 31, 2024
- Board of Trustees of Michigan State University
- Peng Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray cathode focusing element
- Patent number 12,183,536
- Issue date Dec 31, 2024
- GE Precision Healthcare LLC
- Kevin Kruse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and imaging method
- Patent number 12,183,542
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroki Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Joint electron-optical columns for flood-charging and image-forming...
- Patent number 12,165,838
- Issue date Dec 10, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam gun control systems and methods
- Patent number 12,145,006
- Issue date Nov 19, 2024
- Varian Medical Systems, Inc.
- Mark Everett Trail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter and device provided with same
- Patent number 12,125,663
- Issue date Oct 22, 2024
- DENKA COMPANY LIMITED
- Daisuke Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathode mechanism of electron emission source, and method for manuf...
- Patent number 12,106,928
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Ryoei Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron beam applicator, emission axis verification...
- Patent number 12,080,507
- Issue date Sep 3, 2024
- Photo electron Soul Inc.
- Hokuto Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode kit, electron gun, and electron beam applicator
- Patent number 12,033,827
- Issue date Jul 9, 2024
- Photo electron Soul Inc.
- Haruka Shikano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source and charged particle beam device
- Patent number 11,990,311
- Issue date May 21, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro Fukuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation generation apparatus and radiation generation method
- Patent number 11,990,310
- Issue date May 21, 2024
- MITSUBISHI HEAVY INDUSTRIES MACHINERY SYSTEMS, LTD.
- Nobuyuki Shigeoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and charged particle beam device equipped with electro...
- Patent number 11,978,609
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Kaneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting sealed body, light emitting unit, and light source d...
- Patent number 11,972,931
- Issue date Apr 30, 2024
- Hamamatsu Photonics K.K.
- Akio Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electron source and charged particle beam device
- Patent number 11,929,230
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conical heat shield for electron emitting cathode
- Patent number 11,901,154
- Issue date Feb 13, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for controlling electron beam ap...
- Patent number 11,894,211
- Issue date Feb 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Erina Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filament-less electron source
- Patent number 11,887,805
- Issue date Jan 30, 2024
- FEI Company
- John Stiller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput multi-electron beam system
- Patent number 11,869,743
- Issue date Jan 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron gun component, electron beam applicator, and...
- Patent number 11,842,879
- Issue date Dec 12, 2023
- Photo electron Soul Inc.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold-field-emitter electron gun with self-cleaning extractor using...
- Patent number 11,830,699
- Issue date Nov 28, 2023
- KLA Corporation
- Luca Grella
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam source for optical device fabrication using a segmented io...
- Patent number 11,810,755
- Issue date Nov 7, 2023
- Applied Materials, Inc.
- Ludovic Godet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extended lifetime dual indirectly-heated cathode ion source
- Patent number 11,798,775
- Issue date Oct 24, 2023
- Axcelis Technologies, Inc.
- Wilhelm Platow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 11,784,022
- Issue date Oct 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanically-stable electron source
- Patent number 11,749,492
- Issue date Sep 5, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam writing apparatus and cathode life span prediction me...
- Patent number 11,749,491
- Issue date Sep 5, 2023
- NuFlare Technology, Inc.
- Satoshi Nakahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE ELECTRON BEAM INSPECTION METHOD FOR SEMICONDUCTOR PROCESSES...
- Publication number 20250054721
- Publication date Feb 13, 2025
- ALES TECH INC.
- Wei-Tse Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERA...
- Publication number 20250022676
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...
- Publication number 20240412938
- Publication date Dec 12, 2024
- ATTOLIGHT AG
- Nicolas Tappy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...
- Publication number 20240412939
- Publication date Dec 12, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
- Publication number 20240395499
- Publication date Nov 28, 2024
- RINKEN
- Takahiro SHIMOJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMINATE, ELECTRON SOURCE AND ELECTRONIC DEVICE CONTAINING LAMINATE...
- Publication number 20240395494
- Publication date Nov 28, 2024
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Katsumi NAGAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240379318
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure for Particle Acceleration And Charged Particle Beam Appar...
- Publication number 20240242918
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- RYO SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING SEALED BODY, LIGHT EMITTING UNIT, AND LIGHT SOURCE D...
- Publication number 20240242941
- Publication date Jul 18, 2024
- HAMAMATSU PHOTONICS K. K.
- Akio Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Electron Gun, Electron Beam Applying Device, and Irradiation Positi...
- Publication number 20240222062
- Publication date Jul 4, 2024
- Photo electron Soul, Inc.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun and Charged Particle Beam Apparatus
- Publication number 20240212966
- Publication date Jun 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoya IGARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...
- Publication number 20240212967
- Publication date Jun 27, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...
- Publication number 20240212971
- Publication date Jun 27, 2024
- National Institute for Materials Science
- Han ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20240161997
- Publication date May 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER AND DEVICE PROVIDED WITH SAME
- Publication number 20240153730
- Publication date May 9, 2024
- Denka Company Limited
- Daisuke ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SETTING GAP BETWEEN CATHODE AND FILAMENT
- Publication number 20240038490
- Publication date Feb 1, 2024
- Axcelis Technologies, Inc.
- Steven T. Drummond
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...
- Publication number 20240038481
- Publication date Feb 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230402246
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Creating Multiple Electron Beams with a Photocathode Film
- Publication number 20230395349
- Publication date Dec 7, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, PLASMA SOURCE AND SWITCH DEVICE
- Publication number 20230377828
- Publication date Nov 23, 2023
- Kabushiki Kaisha Toshiba
- Hisao MIYAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20230352262
- Publication date Nov 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN CATHODE TECHNOLOGY
- Publication number 20230330751
- Publication date Oct 19, 2023
- Freemelt AB
- Ulric LJUNGBLAD
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Electron Source, Method of Manufacturing the Same, And Electron Bea...
- Publication number 20230317401
- Publication date Oct 5, 2023
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20230298847
- Publication date Sep 21, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20230253178
- Publication date Aug 10, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source and Charged Particle Beam Device
- Publication number 20230238205
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...
- Publication number 20230230794
- Publication date Jul 20, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...
- Publication number 20230207249
- Publication date Jun 29, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY CATHODE FOCUSING ELEMENT
- Publication number 20230197396
- Publication date Jun 22, 2023
- GE Precision Healthcare LLC
- Kevin Kruse
- H01 - BASIC ELECTRIC ELEMENTS

Eliminating deleterious effects due to thermal effects or electric or magnetic fields

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Laminate, electron source and electronic device containing laminate...

Electron gun and electron microscope

Electron gun, electron beam applicator, and method for controlling...

Dielectric coated plasmonic photoemitter

X-ray cathode focusing element

Transmission electron microscope and imaging method

Joint electron-optical columns for flood-charging and image-forming...

Method and apparatus for Schottky TFE inspection

Electron gun and electron beam application apparatus

Particle beam gun control systems and methods

Emitter and device provided with same

Cathode mechanism of electron emission source, and method for manuf...

Electron gun, electron beam applicator, emission axis verification...

Photocathode kit, electron gun, and electron beam applicator

Charged particle source and charged particle beam device

Radiation generation apparatus and radiation generation method

Electron gun and charged particle beam device equipped with electro...

Light emitting sealed body, light emitting unit, and light source d...

Electron source and charged particle beam device

Conical heat shield for electron emitting cathode

Electron beam apparatus and method for controlling electron beam ap...

Filament-less electron source

High throughput multi-electron beam system

Electron gun, electron gun component, electron beam applicator, and...

Cold-field-emitter electron gun with self-cleaning extractor using...

Ion beam source for optical device fabrication using a segmented io...

Extended lifetime dual indirectly-heated cathode ion source

Electron beam apparatus

Mechanically-stable electron source

Electron beam writing apparatus and cathode life span prediction me...

Patents Applicationslast 30 patents

IN-LINE ELECTRON BEAM INSPECTION METHOD FOR SEMICONDUCTOR PROCESSES...

ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERA...

SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...

ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

LAMINATE, ELECTRON SOURCE AND ELECTRONIC DEVICE CONTAINING LAMINATE...

CHARGED PARTICLE BEAM DEVICE

Structure for Particle Acceleration And Charged Particle Beam Appar...

LIGHT EMITTING SEALED BODY, LIGHT EMITTING UNIT, AND LIGHT SOURCE D...

Electron Gun, Electron Beam Applying Device, and Irradiation Positi...

Charged Particle Gun and Charged Particle Beam Apparatus

ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...

ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...

ELECTRON BEAM APPLICATION DEVICE

EMITTER AND DEVICE PROVIDED WITH SAME

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

METHOD FOR SETTING GAP BETWEEN CATHODE AND FILAMENT

IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

Creating Multiple Electron Beams with a Photocathode Film

ELECTRON SOURCE, PLASMA SOURCE AND SWITCH DEVICE

ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE

ELECTRON GUN CATHODE TECHNOLOGY

Electron Source, Method of Manufacturing the Same, And Electron Bea...

ELECTRON GUN AND ELECTRON MICROSCOPE

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

Charged Particle Source and Charged Particle Beam Device

ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...

ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...

X-RAY CATHODE FOCUSING ELEMENT