Environmental-, stress-, or burn-in tests

Industry

CPC
G01R31/2817

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2817Environmental-, stress-, or burn-in tests

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting semiconductor
- Patent number 12,025,652
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Mi-Sol Youn
- G01 - MEASURING TESTING
Information Patent Grant
Carrier mechanism and processing equipment including the carrier me...
- Patent number 11,988,705
- Issue date May 21, 2024
- HON. PRECISION, INC.
- Tzu-Wei Li
- G01 - MEASURING TESTING
Information Patent Grant
Burn in board test device and system
- Patent number 11,959,959
- Issue date Apr 16, 2024
- Samsung Electronics Co., Ltd.
- Seong Seob Shin
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-corrected control data for verifying of structural inte...
- Patent number 11,946,891
- Issue date Apr 2, 2024
- 3M Innovative Properties Company
- David H. Redinger
- G05 - CONTROLLING REGULATING
Information Patent Grant
Electrical connection test for unpopulated printed circuit boards
- Patent number 11,940,481
- Issue date Mar 26, 2024
- Dyconex AG
- Daniel Luchsinger
- G01 - MEASURING TESTING
Information Patent Grant
Digital twins (DT) for circuit board reliability prediction
- Patent number 11,874,320
- Issue date Jan 16, 2024
- Rockwell Collins, Inc.
- Yehia F. Khalil
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,808,803
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Making determination of inductance-change immune to changes in envi...
- Patent number 11,796,577
- Issue date Oct 24, 2023
- Ningbo Aura Semiconductor Co., Limited
- Augusto Manuel Marques
- G01 - MEASURING TESTING
Information Patent Grant
Busbar adapter and test stand
- Patent number 11,769,974
- Issue date Sep 26, 2023
- ZT GROUP INT'L, INC.
- Ryan Signer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for identifying latent reliability defects in sem...
- Patent number 11,754,625
- Issue date Sep 12, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Solder joint damage-prevention mode for a computing device
- Patent number 11,740,953
- Issue date Aug 29, 2023
- Google LLC
- Luke Manuel Brantingham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible sideband support systems and methods
- Patent number 11,733,290
- Issue date Aug 22, 2023
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 11,650,244
- Issue date May 16, 2023
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable anchor for printed circuit board environmental sensor
- Patent number 11,644,500
- Issue date May 9, 2023
- Cisco Technology, Inc.
- Mohammed Ghouse
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-angle sample holder with integrated micromanipulator
- Patent number 11,604,212
- Issue date Mar 14, 2023
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit burn-in board management system with effective b...
- Patent number 11,579,186
- Issue date Feb 14, 2023
- NANYA TECHNOLOGY CORPORATION
- Cheng-Sung Lai
- G01 - MEASURING TESTING
Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,493,550
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Grant
Determining the remaining usability of a semiconductor module in no...
- Patent number 11,480,607
- Issue date Oct 25, 2022
- Siemens Aktiengesellschaft
- Gunnar Dietz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for estimating degradation of a wire-bonded power semi-condu...
- Patent number 11,474,146
- Issue date Oct 18, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method relating to electrochemical migration
- Patent number 11,470,727
- Issue date Oct 11, 2022
- Jaguar Land Rover Limited
- Thomas Liedtke
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optimizing design and performance for printed circuit boards
- Patent number 11,425,821
- Issue date Aug 23, 2022
- Cisco Technology, Inc.
- Amendra Koul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip testing device and chip testing system for testing memory chips
- Patent number 11,366,155
- Issue date Jun 21, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistor aging monitor circuit for increased stress-based aging c...
- Patent number 11,349,458
- Issue date May 31, 2022
- Microsoft Technology Licensing, LLC
- Amlan Ghosh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for simultaneously testing a plurality of remot...
- Patent number 11,262,397
- Issue date Mar 1, 2022
- Contec, LLC
- Rajeev Tiwari
- G01 - MEASURING TESTING
Information Patent Grant
Test module including temperature controller, test handler includin...
- Patent number 11,255,899
- Issue date Feb 22, 2022
- Samsung Electronics Co., Ltd.
- Kiryong Woo
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable anchor for printed circuit board environmental sensor
- Patent number 11,255,897
- Issue date Feb 22, 2022
- Cisco Technology, Inc.
- Mohammed Ghouse
- G01 - MEASURING TESTING
Information Patent Grant
Gate driver with VGTH and VCESAT measurement capability for the sta...
- Patent number 11,239,839
- Issue date Feb 1, 2022
- Texas Instruments Incorporated
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Grant
Via integrity and board level reliability testing
- Patent number 11,081,406
- Issue date Aug 3, 2021
- Texas Instruments Incorporated
- Jaimal Mallory Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for electrical circuit monitoring
- Patent number 11,073,548
- Issue date Jul 27, 2021
- MAGNALYTIX, LLC
- Mark Taylor McMeen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for burning in electronic components
- Patent number 11,067,621
- Issue date Jul 20, 2021
- 3D Plus
- Mohamed Boussadia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
- Publication number 20240210465
- Publication date Jun 27, 2024
- ROBERT BOSCH GmbH
- Andreas Schmidtlein
- G01 - MEASURING TESTING
Information Patent Application
Flexible Sideband Support Systems and Methods
- Publication number 20230400505
- Publication date Dec 14, 2023
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
- Publication number 20230280392
- Publication date Sep 7, 2023
- Alan Paul Aronoff
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL TWINS (DT) FOR CIRCUIT BOARD RELIABILITY PREDICTION
- Publication number 20230204653
- Publication date Jun 29, 2023
- Yehia F. Khalil
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR
- Publication number 20230048997
- Publication date Feb 16, 2023
- Samsung Electronics Co., Ltd.
- Mi-Sol YOUN
- G01 - MEASURING TESTING
Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20230046331
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT BURN-IN BOARD MANAGEMENT SYSTEM
- Publication number 20220404415
- Publication date Dec 22, 2022
- NANYA TECHNOLOGY CORPORATION
- Cheng-Sung LAI
- G01 - MEASURING TESTING
Information Patent Application
HOT E-TEST FOR UNPOPULATED PRINTED CIRCUIT BOARDS
- Publication number 20220283218
- Publication date Sep 8, 2022
- DYCONEX AG
- Daniel Luchsinger
- G01 - MEASURING TESTING
Information Patent Application
Carrier Mechanism and Processing Equipment Having the Same
- Publication number 20220252659
- Publication date Aug 11, 2022
- HON. PRECISION, INC.
- Tzu-Wei Li
- G01 - MEASURING TESTING
Information Patent Application
MAKING DETERMINATION OF INDUCTANCE-CHANGE IMMUNE TO CHANGES IN ENVI...
- Publication number 20220074979
- Publication date Mar 10, 2022
- Ningbo Aura Semiconductor Co., Limited
- Augusto Manuel Marques
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE REMAINING USABILITY OF A SEMICONDUCTOR MODULE IN NO...
- Publication number 20220043050
- Publication date Feb 10, 2022
- SIEMENS AKTIENGESELLSCHAFT
- GUNNAR DIETZ
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ADJUSTABLE ANCHOR FOR PRINTED CIRCUIT BOARD ENVIRONMENTAL SENSOR
- Publication number 20220018891
- Publication date Jan 20, 2022
- Cisco Technology, Inc.
- Mohammed Ghouse
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
- Publication number 20210389364
- Publication date Dec 16, 2021
- Alan Paul Aronoff
- G01 - MEASURING TESTING
Information Patent Application
BURN IN BOARD TEST DEVICE AND SYSTEM
- Publication number 20210373070
- Publication date Dec 2, 2021
- Samsung Electronics Co., Ltd.
- Seong Seob SHIN
- G01 - MEASURING TESTING
Information Patent Application
Flexible Sideband Support Systems and Methods
- Publication number 20210302491
- Publication date Sep 30, 2021
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD RELATING TO ELECTROCHEMICAL MIGRATION
- Publication number 20210289636
- Publication date Sep 16, 2021
- Jaguar Land Rover Limited
- Thomas LIEDTKE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...
- Publication number 20210239757
- Publication date Aug 5, 2021
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20210181249
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND CHIP TESTING SYSTEM
- Publication number 20210132140
- Publication date May 6, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUSLY TESTING A PLURALITY OF REMOT...
- Publication number 20210088577
- Publication date Mar 25, 2021
- CONTEC, LLC
- Rajeev Tiwari
- G01 - MEASURING TESTING
Information Patent Application
TEST MODULE, TEST HANDLER, AND METHOD OF TESTING SEMICONDUCTOR DEVI...
- Publication number 20210063473
- Publication date Mar 4, 2021
- Samsung Electronics Co., Ltd.
- Kiryong WOO
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZING DESIGN AND PERFORMANCE FOR PRINTED CIRCUIT BOARDS
- Publication number 20210059055
- Publication date Feb 25, 2021
- Cisco Technology, Inc.
- Amendra Koul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ESTIMATING DEGRADATION
- Publication number 20200408830
- Publication date Dec 31, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
GATE DRIVER WITH VGTH AND VCESAT MEASUREMENT CAPABILITY FOR THE STA...
- Publication number 20200412360
- Publication date Dec 31, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Xiong Li
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING
- Publication number 20200264226
- Publication date Aug 20, 2020
- Kyzen Corporation
- Mark Taylor McMeen
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE ANCHOR FOR PRINTED CIRCUIT BOARD ENVIRONMENTAL SENSOR
- Publication number 20200103457
- Publication date Apr 2, 2020
- Cisco Technology, Inc.
- Mohammed Ghouse
- G01 - MEASURING TESTING
Information Patent Application
FACILITATING RELIABLE CIRCUIT BOARD PRESS-FIT CONNECTOR ASSEMBLY FA...
- Publication number 20200057102
- Publication date Feb 20, 2020
- International Business Machines Corporation
- Stephen M. HUGO
- G01 - MEASURING TESTING
Information Patent Application
FAILURE PREDICTION DEVICE AND CIRCUIT BOARD USING THE SAME
- Publication number 20200049758
- Publication date Feb 13, 2020
- Mitsubishi Electric Corporation
- Nobuaki ANDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONTROLLING HEALTH OF MULTI-DIE POWER MODULE AND MULTI-D...
- Publication number 20200021235
- Publication date Jan 16, 2020
- Mitsubishi Electric Corporation
- Jeffrey EWANCHUK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR BURNING IN ELECTRONIC COMPONENTS
- Publication number 20200003826
- Publication date Jan 2, 2020
- 3D PLUS
- Mohamed BOUSSADIA
- G01 - MEASURING TESTING

Environmental-, stress-, or burn-in tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for inspecting semiconductor

Carrier mechanism and processing equipment including the carrier me...

Burn in board test device and system

Temperature-corrected control data for verifying of structural inte...

Electrical connection test for unpopulated printed circuit boards

Digital twins (DT) for circuit board reliability prediction

Standalone thermal chamber for a temperature control component

Making determination of inductance-change immune to changes in envi...

Busbar adapter and test stand

System and method for identifying latent reliability defects in sem...

Solder joint damage-prevention mode for a computing device

Flexible sideband support systems and methods

Monitoring semiconductor reliability and predicting device failure...

Adjustable anchor for printed circuit board environmental sensor

Multi-angle sample holder with integrated micromanipulator

Integrated circuit burn-in board management system with effective b...

Standalone thermal chamber for a temperature control component

Determining the remaining usability of a semiconductor module in no...

Method for estimating degradation of a wire-bonded power semi-condu...

Apparatus and method relating to electrochemical migration

Optimizing design and performance for printed circuit boards

Chip testing device and chip testing system for testing memory chips

Transistor aging monitor circuit for increased stress-based aging c...

Systems and methods for simultaneously testing a plurality of remot...

Test module including temperature controller, test handler includin...

Adjustable anchor for printed circuit board environmental sensor

Gate driver with VGTH and VCESAT measurement capability for the sta...

Via integrity and board level reliability testing

System and method for electrical circuit monitoring

Apparatus for burning in electronic components

Patents Applicationslast 30 patents

METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS

Flexible Sideband Support Systems and Methods

Monitoring Semiconductor Reliability and Predicting Device Failure...

DIGITAL TWINS (DT) FOR CIRCUIT BOARD RELIABILITY PREDICTION

APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

INTEGRATED CIRCUIT BURN-IN BOARD MANAGEMENT SYSTEM

HOT E-TEST FOR UNPOPULATED PRINTED CIRCUIT BOARDS

Carrier Mechanism and Processing Equipment Having the Same

MAKING DETERMINATION OF INDUCTANCE-CHANGE IMMUNE TO CHANGES IN ENVI...

DETERMINING THE REMAINING USABILITY OF A SEMICONDUCTOR MODULE IN NO...

ADJUSTABLE ANCHOR FOR PRINTED CIRCUIT BOARD ENVIRONMENTAL SENSOR

Monitoring Semiconductor Reliability and Predicting Device Failure...

BURN IN BOARD TEST DEVICE AND SYSTEM

Flexible Sideband Support Systems and Methods

APPARATUS AND METHOD RELATING TO ELECTROCHEMICAL MIGRATION

SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

CHIP TESTING DEVICE AND CHIP TESTING SYSTEM

SYSTEMS AND METHODS FOR SIMULTANEOUSLY TESTING A PLURALITY OF REMOT...

TEST MODULE, TEST HANDLER, AND METHOD OF TESTING SEMICONDUCTOR DEVI...

OPTIMIZING DESIGN AND PERFORMANCE FOR PRINTED CIRCUIT BOARDS

METHOD FOR ESTIMATING DEGRADATION

GATE DRIVER WITH VGTH AND VCESAT MEASUREMENT CAPABILITY FOR THE STA...

SYSTEM AND METHOD FOR ELECTRICAL CIRCUIT MONITORING

ADJUSTABLE ANCHOR FOR PRINTED CIRCUIT BOARD ENVIRONMENTAL SENSOR

FACILITATING RELIABLE CIRCUIT BOARD PRESS-FIT CONNECTOR ASSEMBLY FA...

FAILURE PREDICTION DEVICE AND CIRCUIT BOARD USING THE SAME

METHOD FOR CONTROLLING HEALTH OF MULTI-DIE POWER MODULE AND MULTI-D...

APPARATUS FOR BURNING IN ELECTRONIC COMPONENTS