Environmental or reliability tests

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CPC
G01R31/003

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/003Environmental or reliability tests

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for testing service life in simulated environment
- Patent number 12,153,077
- Issue date Nov 26, 2024
- SHENZHEN HONGDU TESTING EQUIPMENT CO., LTD.
- Shuiyuan Xu
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring an electrical power transmission system and a...
- Patent number 12,146,924
- Issue date Nov 19, 2024
- SUPERGRID INSTITUTE
- Martin Molby Henriksen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-dimensional analysis method for tripping risk of whole transm...
- Patent number 12,135,346
- Issue date Nov 5, 2024
- State Grid Zhejiang Electric Power Co., Ltd. Taizhou Power Supply Company
- Jiandong Si
- G01 - MEASURING TESTING
Information Patent Grant
Calculating energy loss during an outage
- Patent number 12,066,472
- Issue date Aug 20, 2024
- SparkCognition, Inc.
- Sahil Maheswari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,007,451
- Issue date Jun 11, 2024
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement and temperature calibration methods and tem...
- Patent number 12,007,289
- Issue date Jun 11, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ShihChieh Lin
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for testing electric car components
- Patent number 11,953,557
- Issue date Apr 9, 2024
- PROVENTIA OY
- Harri Kervinen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device characterization systems and methods
- Patent number 11,940,478
- Issue date Mar 26, 2024
- Duke University
- Aaron D. Franklin
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in resilient integrated circuit for processors
- Patent number 11,921,157
- Issue date Mar 5, 2024
- International Business Machines Corporation
- Andreas H. A. Arp
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,828,802
- Issue date Nov 28, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,808,806
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Environment forming apparatus, program, and method for controlling...
- Patent number 11,762,003
- Issue date Sep 19, 2023
- ESPEC Corp.
- Keiyu Hagi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature test apparatus and temperature test method
- Patent number 11,754,609
- Issue date Sep 12, 2023
- Anritsu Corporation
- Takeshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Environment forming apparatus, program, and method for controlling...
- Patent number 11,693,040
- Issue date Jul 4, 2023
- ESPEC Corp.
- Keiyu Hagi
- G01 - MEASURING TESTING
Information Patent Grant
In-situ monitoring method and apparatus for power electronic device...
- Patent number 11,630,144
- Issue date Apr 18, 2023
- WUHAN UNIVERSITY
- Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Experimental device and method for tripping properties of high-volt...
- Patent number 11,609,257
- Issue date Mar 21, 2023
- NANJING TECH UNIVERSITY
- Fei You
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems configured to test a device under test and methods of...
- Patent number 11,598,789
- Issue date Mar 7, 2023
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for online correction of junction temperatures of...
- Patent number 11,579,644
- Issue date Feb 14, 2023
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Burn-in chamber
- Patent number 11,519,950
- Issue date Dec 6, 2022
- Accton Technology Corporation
- Hsu-Cheng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for prediction of the residual lifetime of an electrical...
- Patent number 11,520,324
- Issue date Dec 6, 2022
- ABB Schweiz AG
- Paul Szasz
- G07 - CHECKING-DEVICES
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,506,712
- Issue date Nov 22, 2022
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Substrate testing apparatus
- Patent number 11,467,205
- Issue date Oct 11, 2022
- Samsung Electronics Co., Ltd.
- Kyoonwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for continuous tester operation during long soak time testing
- Patent number 11,448,688
- Issue date Sep 20, 2022
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test device for adapter
- Patent number 11,415,638
- Issue date Aug 16, 2022
- Guangdong Oppo Mobile Telecommunications Corp., Ltd.
- Chen Tian
- G01 - MEASURING TESTING
Information Patent Grant
Millimeter wave material test system
- Patent number 11,385,272
- Issue date Jul 12, 2022
- Tektronix, Inc.
- Alexander Krauska
- G01 - MEASURING TESTING
Information Patent Grant
High-pressure burn-in test apparatus
- Patent number 11,385,275
- Issue date Jul 12, 2022
- Yi-Ming Hung
- G01 - MEASURING TESTING
Information Patent Grant
Method and assessment unit for determining the remaining service li...
- Patent number 11,346,893
- Issue date May 31, 2022
- ZIEHL-ABEGG SE
- Marco Schnell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spare part system for maintaining availability of spare parts for a...
- Publication number 20240385259
- Publication date Nov 21, 2024
- NEXANS
- Roberto GASPARI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240302451
- Publication date Sep 12, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...
- Publication number 20240219427
- Publication date Jul 4, 2024
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING A SEMICONDUCTOR TEMPERATURE OF A...
- Publication number 20240094065
- Publication date Mar 21, 2024
- ZF Friedrichshafen AG
- Michael Meiler
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE NOISE FILTERING
- Publication number 20240077526
- Publication date Mar 7, 2024
- Oura Health Oy
- Mika Petteri Kangas
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20240044980
- Publication date Feb 8, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR MONITORING AN ELECTRICAL POWER TRANSMISSION SYSTEM AND...
- Publication number 20230341473
- Publication date Oct 26, 2023
- SUPERGRID INSTITUTE
- Martin Molby HENRIKSEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE WITH DETACHABLE OPTICAL PORT, AND TEST METHOD OF AOC...
- Publication number 20230266375
- Publication date Aug 24, 2023
- Wuhan HGGenuine Optics Tech Co.,Ltd.
- Kun SHU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DIMENSIONAL ANALYSIS METHOD FOR TRIPPING RISK OF WHOLE TRANSM...
- Publication number 20230243883
- Publication date Aug 3, 2023
- STATE GRID ZHEJIANG ELECTRIC POWER CO., LTD. TAIZHOU POWER SUPPLY COMPANY
- Jiandong Si
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20230079002
- Publication date Mar 16, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...
- Publication number 20230029364
- Publication date Jan 26, 2023
- WUHAN UNIVERSITY
- Sheng LIU
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENT FORMING APPARATUS, PROGRAM, AND METHOD FOR CONTROLLING...
- Publication number 20220365124
- Publication date Nov 17, 2022
- ESPEC CORP.
- Keiyu HAGI
- G01 - MEASURING TESTING
Information Patent Application
EXPERIMENTAL DEVICE AND METHOD FOR TRIPPING PROPERTIES OF HIGH-VOLT...
- Publication number 20220291272
- Publication date Sep 15, 2022
- NANJING TECH UNIVERSITY
- Fei You
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS CONFIGURED TO TEST A DEVICE UNDER TEST AND METHODS OF...
- Publication number 20220236303
- Publication date Jul 28, 2022
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TESTING SERVICE LIFE IN SIMULATED ENVIRONMENT
- Publication number 20220178984
- Publication date Jun 9, 2022
- SHENZHEN HONGDU TESTING EQUIPMENT CO., LTD.
- Shuiyuan XU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20220178983
- Publication date Jun 9, 2022
- DUKE UNIVERSITY
- Aaron D. Franklin
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE TESTING APPARATUS
- Publication number 20220107355
- Publication date Apr 7, 2022
- Samsung Electronics Co., Ltd.
- Kyoonwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20220082636
- Publication date Mar 17, 2022
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURN-IN RESILIENT INTEGRATED CIRCUIT FOR PROCESSORS
- Publication number 20210396808
- Publication date Dec 23, 2021
- International Business Machines Corporation
- Andreas H.A. Arp
- G01 - MEASURING TESTING
Information Patent Application
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
- Publication number 20210373072
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PRESSURE BURN-IN TEST APPARATUS
- Publication number 20210356506
- Publication date Nov 18, 2021
- Yi-Ming Hung
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTINUOUS TESTER OPERATION DURING LONG SOAK TIME TESTING
- Publication number 20210341531
- Publication date Nov 4, 2021
- CELERINT, LLC.
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE TEST APPARATUS AND TEMPERATURE TEST METHOD
- Publication number 20210293869
- Publication date Sep 23, 2021
- Anritsu Corporation
- Takeshi KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR TESTING ELECTRIC CAR COMPONENTS
- Publication number 20210223321
- Publication date Jul 22, 2021
- PROVENTIA OY
- Harri KERVINEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT CIRCUIT INDICATOR APPARATUS, SYSTEM, AND METHOD
- Publication number 20210172991
- Publication date Jun 10, 2021
- 3M Innovative Properties Company
- Ernesto M. Rodriguez
- G01 - MEASURING TESTING
Information Patent Application
Test Method and Test Device for Adapter
- Publication number 20210033681
- Publication date Feb 4, 2021
- GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Chen TIAN
- G01 - MEASURING TESTING
Information Patent Application
Calibration of Digital Isolators
- Publication number 20210033662
- Publication date Feb 4, 2021
- Silicon Laboratories Inc.
- Mohammad Al-Shyoukh
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING

Environmental or reliability tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for testing electronic devices

Device for testing service life in simulated environment

Modular wireless communication device testing system

Method for monitoring an electrical power transmission system and a...

Multi-dimensional analysis method for tripping risk of whole transm...

Calculating energy loss during an outage

Method and system for thermal control of devices in an electronics...

Temperature measurement and temperature calibration methods and tem...

Arrangement for testing electric car components

Electronic device characterization systems and methods

Burn-in resilient integrated circuit for processors

Apparatus for testing electronic devices

Modular wireless communication device testing system

Allocation of test resources to perform a test of memory components

Environment forming apparatus, program, and method for controlling...

Temperature test apparatus and temperature test method

Environment forming apparatus, program, and method for controlling...

In-situ monitoring method and apparatus for power electronic device...

Experimental device and method for tripping properties of high-volt...

Probe systems configured to test a device under test and methods of...

Method and system for online correction of junction temperatures of...

Burn-in chamber

Apparatus for prediction of the residual lifetime of an electrical...

Modular wireless communication device testing system

Substrate testing apparatus

Method for continuous tester operation during long soak time testing

Test method and test device for adapter

Millimeter wave material test system

High-pressure burn-in test apparatus

Method and assessment unit for determining the remaining service li...

Patents Applicationslast 30 patents

Spare part system for maintaining availability of spare parts for a...

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD AND DEVICE FOR DETERMINING A SEMICONDUCTOR TEMPERATURE OF A...

HARDWARE NOISE FILTERING

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

A METHOD FOR MONITORING AN ELECTRICAL POWER TRANSMISSION SYSTEM AND...

OPTICAL MODULE WITH DETACHABLE OPTICAL PORT, AND TEST METHOD OF AOC...

MULTI-DIMENSIONAL ANALYSIS METHOD FOR TRIPPING RISK OF WHOLE TRANSM...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE...

ENVIRONMENT FORMING APPARATUS, PROGRAM, AND METHOD FOR CONTROLLING...

EXPERIMENTAL DEVICE AND METHOD FOR TRIPPING PROPERTIES OF HIGH-VOLT...

PROBE SYSTEMS CONFIGURED TO TEST A DEVICE UNDER TEST AND METHODS OF...

DEVICE FOR TESTING SERVICE LIFE IN SIMULATED ENVIRONMENT

ELECTRONIC DEVICE CHARACTERIZATION SYSTEMS AND METHODS

APPARATUS FOR TESTING ELECTRONIC DEVICES

SUBSTRATE TESTING APPARATUS

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

BURN-IN RESILIENT INTEGRATED CIRCUIT FOR PROCESSORS

ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS

HIGH-PRESSURE BURN-IN TEST APPARATUS

METHOD FOR CONTINUOUS TESTER OPERATION DURING LONG SOAK TIME TESTING

TEMPERATURE TEST APPARATUS AND TEMPERATURE TEST METHOD

ARRANGEMENT FOR TESTING ELECTRIC CAR COMPONENTS

FAULT CIRCUIT INDICATOR APPARATUS, SYSTEM, AND METHOD

Test Method and Test Device for Adapter

Calibration of Digital Isolators

APPARATUS FOR TESTING ELECTRONIC DEVICES