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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
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H01J2237/3174
Etching microareas
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and structures for semiconductor device testing
Patent number
11,982,709
Issue date
May 14, 2024
Yangtze Memory Technologies Co., Ltd.
Lin Qi
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device, analysis method, and storage medium
Patent number
11,977,009
Issue date
May 7, 2024
Honda Motor Co., Ltd.
Atsushi Sakurai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for performing sample lift-out for highly react...
Patent number
11,972,923
Issue date
Apr 30, 2024
FEI Company
Christopher Thompson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission charged particle microscope with an electron energy lo...
Patent number
11,955,310
Issue date
Apr 9, 2024
FEI Company
Peter Christiaan Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for preparing a microscopic sample from a volume...
Patent number
11,935,723
Issue date
Mar 19, 2024
Carl Zeiss Microscopy GmbH
Fabian Perez Willard
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
Patent number
11,923,168
Issue date
Mar 5, 2024
FIBICS INCORPORATED
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of preparing and analyzing thin films
Patent number
11,894,216
Issue date
Feb 6, 2024
Yangtze Memory Technologies Co., Ltd.
Jing Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Textured surfaces for breast implants
Patent number
11,890,179
Issue date
Feb 6, 2024
Establishment Labs S.A.
Ardeshir Bayat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reduced charging by low negative voltage in FIB systems
Patent number
11,887,810
Issue date
Jan 30, 2024
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring a sample and microscope implementing the method
Patent number
11,848,172
Issue date
Dec 19, 2023
Carl Zeiss SMT GmbH
Dmitry Klochkov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Depositive shielding for fiducial protection from redeposition
Patent number
11,817,395
Issue date
Nov 14, 2023
FEI Company
Sean Morgan-Jones
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method of material deposition
Patent number
11,798,804
Issue date
Oct 24, 2023
FEI Company
Brian Roberts Routh
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Writing data generating method, multi charged particle beam writing...
Patent number
11,774,860
Issue date
Oct 3, 2023
NuFlare Technology, Inc.
Kenichi Yasui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protective shutter for charged particle microscope
Patent number
11,749,496
Issue date
Sep 5, 2023
FEI Company
Philip Brundage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Liquid metal ion source and focused ion beam apparatus
Patent number
11,749,493
Issue date
Sep 5, 2023
Hitachi High-Tech Science Corporation
Yoshihiro Koyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, device and system for the treatment of biological cryogenic...
Patent number
11,735,404
Issue date
Aug 22, 2023
FEI Company
Alex De Marco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,726,050
Issue date
Aug 15, 2023
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
Patent number
11,728,126
Issue date
Aug 15, 2023
Applied Materials Israel Ltd.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Material recovery systems for optical components
Patent number
11,715,622
Issue date
Aug 1, 2023
KLA Corporation
Gildardo Delgado
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanned angled etching apparatus and techniques providing separate...
Patent number
11,715,621
Issue date
Aug 1, 2023
Applied Materials, Inc.
Peter F. Kurunczi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam apparatus and composite beam apparatus
Patent number
11,682,536
Issue date
Jun 20, 2023
Hitachi High-Tech Science Corporation
Koji Nagahara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modulation of rolling k vectors of angled gratings
Patent number
11,670,482
Issue date
Jun 6, 2023
Applied Materials, Inc.
Joseph C. Olson
G02 - OPTICS
Information
Patent Grant
High power wafer cooling
Patent number
11,670,483
Issue date
Jun 6, 2023
Axcelis Technologies, Inc.
Joseph Ferrara
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method of atomic layer etching of oxide
Patent number
11,658,037
Issue date
May 23, 2023
Tokyo Electron Limited
Sonam D. Sherpa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for processing a substrate
Patent number
11,651,966
Issue date
May 16, 2023
Applied Materials, Inc.
Kartik Ramaswamy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,640,897
Issue date
May 2, 2023
Hitachi High-Technologies Corporation
Ryo Hirano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of preparing integrated circuits for backside pro...
Patent number
11,605,525
Issue date
Mar 14, 2023
FEI Company
James Vickers
G01 - MEASURING TESTING
Information
Patent Grant
Substrate processing system, switching timing creation support devi...
Patent number
11,587,763
Issue date
Feb 21, 2023
Tokyo Electron Limited
Takeshi Akimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion milling apparatus and sample holder
Patent number
11,562,886
Issue date
Jan 24, 2023
Jeol Ltd.
Shogo Kataoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging method and imaging system
Patent number
11,532,454
Issue date
Dec 20, 2022
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
Publication number
20240136150
Publication date
Apr 25, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
Publication number
20240120175
Publication date
Apr 11, 2024
CARL ZEISS MICROSCOPY GMBH
Lorenz Lechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USIN...
Publication number
20240105419
Publication date
Mar 28, 2024
Intel Corporation
Shida TAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...
Publication number
20240105421
Publication date
Mar 28, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
Publication number
20240071720
Publication date
Feb 29, 2024
FEI Company
Jamie Dee Gravell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Focused Ion Beam Apparatus
Publication number
20240071718
Publication date
Feb 29, 2024
JEOL Ltd.
Yusuke Kagaya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Application Management For Charged Particle Microscope Devices
Publication number
20240071717
Publication date
Feb 29, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR IMAGING AND PROCESSING A SAMPLE USING A FOCUSED PARTICLE...
Publication number
20240062989
Publication date
Feb 22, 2024
Carl Zeiss SMT GMBH
Daniel Schwarz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20240055220
Publication date
Feb 15, 2024
Hitachi High-Tech Corporation
Yuka II
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING
Publication number
20240038486
Publication date
Feb 1, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Yu-Ching Chiu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING
Publication number
20230375616
Publication date
Nov 23, 2023
Yangtze Memory Technologies Co., Ltd.
Lin QI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
Publication number
20230377834
Publication date
Nov 23, 2023
FEI Company
Michal HROUZEK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20230358696
Publication date
Nov 9, 2023
Fibics Incorporated
Michael William PHANEUF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS
Publication number
20230343545
Publication date
Oct 26, 2023
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
Publication number
20230343546
Publication date
Oct 26, 2023
CARL ZEISS MICROSCOPY GMBH
Michele Nicoletti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
END POINT DETERMINATION BY MEANS OF CONTRAST GAS
Publication number
20230341766
Publication date
Oct 26, 2023
Carl Zeiss SMT GMBH
Daniel Rhinow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNED ANGLED ETCHING APPARATUS AND TECHNIQUES PROVIDING SEPARATE...
Publication number
20230335375
Publication date
Oct 19, 2023
Applied Materials, Inc.
Peter F. Kurunczi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
Publication number
20230335370
Publication date
Oct 19, 2023
APPLIED MATERIALS ISRAEL LTD.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for analyzing three-dimensional features
Publication number
20230317410
Publication date
Oct 5, 2023
FEI Company
Bingxing Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
Publication number
20230307209
Publication date
Sep 28, 2023
FEI Company
Zoltán Orémus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOCUSED ION BEAM SYSTEM
Publication number
20230307205
Publication date
Sep 28, 2023
V Technology Co., LTD.
Michinobu MIZUMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
Publication number
20230298855
Publication date
Sep 21, 2023
DELMIC IP B.V.
Andries Pieter Johan EFFTING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FAILURE ANALYSIS FOR DEFECT LOCATIONS
Publication number
20230273101
Publication date
Aug 31, 2023
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
Publication number
20230273136
Publication date
Aug 31, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
John Lindsay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
Publication number
20230266214
Publication date
Aug 24, 2023
Wisconsin Alumni Research Foundation
Joshua COON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
Publication number
20230268156
Publication date
Aug 24, 2023
Hitachi High-Tech Corporation
Naoki SAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Preparing TEM Sample
Publication number
20230268159
Publication date
Aug 24, 2023
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sample Cartridge Holding Apparatus
Publication number
20230238208
Publication date
Jul 27, 2023
JEOL Ltd.
Norimasa Sakuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
Publication number
20230228695
Publication date
Jul 20, 2023
The Regents of the University of California
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Focused Ion Beam System and Method of Correcting Deviation of Field...
Publication number
20230230801
Publication date
Jul 20, 2023
JEOL Ltd.
Yuichiro Ohori
H01 - BASIC ELECTRIC ELEMENTS