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Features relating to contacting the IC under test
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G01R31/2886
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2886
Features relating to contacting the IC under test
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Patents Grants
last 30 patents
Information
Patent Grant
Spring contact and test socket with same
Patent number
11,982,688
Issue date
May 14, 2024
Hicon Co., Ltd.
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
11,977,099
Issue date
May 7, 2024
HITACHI HIGH-TECH CORPORATION
Tomohisa Ohtaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
11,977,098
Issue date
May 7, 2024
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Chip socket, testing fixture and chip testing method thereof
Patent number
11,959,939
Issue date
Apr 16, 2024
NANYA TECHNOLOGY CORPORATION
Shih-Ting Lin
G11 - INFORMATION STORAGE
Information
Patent Grant
Addressable test chip test system
Patent number
11,959,964
Issue date
Apr 16, 2024
SEMITRONIX CORPORATION
Jiabai Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Ceramic, probe guiding member, probe card, and socket for package i...
Patent number
11,940,466
Issue date
Mar 26, 2024
FERROTEC MATERIAL TECHNOLOGIES CORPORATION
Wataru Yamagishi
G01 - MEASURING TESTING
Information
Patent Grant
Probe test card and method of manufacturing the same
Patent number
11,933,818
Issue date
Mar 19, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device, semiconductor testing device, and semiconduct...
Patent number
11,927,622
Issue date
Mar 12, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Masashi Tokunaga
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method for testing of PIC with an upturned mirror
Patent number
11,921,156
Issue date
Mar 5, 2024
Lucas Soldano
G01 - MEASURING TESTING
Information
Patent Grant
Contact assembly array and testing system having contact assembly a...
Patent number
11,906,576
Issue date
Feb 20, 2024
Johnstech International Corporation
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Grant
Probe system for QFP integrated circuit device test tooling
Patent number
11,906,550
Issue date
Feb 20, 2024
Essai, Inc.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Grant
Wafer-level test method for optoelectronic chips
Patent number
11,906,579
Issue date
Feb 20, 2024
JENOPTIK GmbH
Tobias Gnausch
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and test apparatus and method thereof
Patent number
11,887,901
Issue date
Jan 30, 2024
Silicon Works Co., Ltd.
Jae Won Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test kit for testing a device under test
Patent number
11,879,934
Issue date
Jan 23, 2024
Mediatek Inc.
Jing-Hui Zhuang
G01 - MEASURING TESTING
Information
Patent Grant
Contact assembly and kelvin testing system having contact assembly
Patent number
11,867,752
Issue date
Jan 9, 2024
Johnstech International Corporation
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,860,221
Issue date
Jan 2, 2024
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuits and semiconductor test methods
Patent number
11,860,217
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
ChihCheng Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit test structure and method of using
Patent number
11,828,790
Issue date
Nov 28, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Ching-Fang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test apparatus and jumper thereof
Patent number
11,828,789
Issue date
Nov 28, 2023
Star Technologies, Inc.
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and a method for measuring a device current of a device u...
Patent number
11,821,944
Issue date
Nov 21, 2023
Infineon Technologies AG
Josef-Paul Schaffer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
Patent number
11,815,548
Issue date
Nov 14, 2023
Tektronix, Inc.
Charles W. Case
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
Patent number
11,809,552
Issue date
Nov 7, 2023
Power Fingerprinting Inc.
Carlos R. Aguayo Gonzalez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Relay pogo charged device model tester using electrostatic discharg...
Patent number
11,782,083
Issue date
Oct 10, 2023
Wei Huang
G01 - MEASURING TESTING
Information
Patent Grant
Temperature control system including contactor assembly
Patent number
11,774,486
Issue date
Oct 3, 2023
DELTA DESIGN INC.
Jerry Ihor Tustaniwskyj
G01 - MEASURING TESTING
Information
Patent Grant
Inspection jig and inspection apparatus
Patent number
11,768,226
Issue date
Sep 26, 2023
Nidec-Read Corporation
Kohei Tsumura
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for wafer-level testing
Patent number
11,754,621
Issue date
Sep 12, 2023
Taiwan Semiconductor Manufacturing Company Ltd.
Jun He
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for monitoring health of probing u-bump clu...
Patent number
11,740,282
Issue date
Aug 29, 2023
Intel Corporation
Jagat Shakya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing semiconductor dies and test structure
Patent number
11,726,138
Issue date
Aug 15, 2023
NANYA TECHNOLOGY CORPORATION
Tse Yu Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Test device
Patent number
11,726,111
Issue date
Aug 15, 2023
LEENO INDUSTRIAL INC.
Changhyun Song
G01 - MEASURING TESTING
Information
Patent Grant
Storage medium, EMI calculation method, and EMI calculation apparatus
Patent number
11,719,733
Issue date
Aug 8, 2023
Fujitsu Limited
Shohei Yamane
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...
Publication number
20240133945
Publication date
Apr 25, 2024
Mohanraj Prabhugoud
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20240103068
Publication date
Mar 28, 2024
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST SOCKET WITH CONDUCTIVE COMPRESSION CONTACTS FOR INTEGRATED CIR...
Publication number
20240094245
Publication date
Mar 21, 2024
Ironwood Electronics, Inc.
Ilavarasan M. Palaniappa
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT TEST STRUCTURE AND METHOD OF USING
Publication number
20240094282
Publication date
Mar 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Ching-Fang CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MANAGING PHOTONIC INTEGRATED CIRCUIT OPTICAL COUPLING
Publication number
20240077532
Publication date
Mar 7, 2024
CIENA CORPORATION
Jérôme Leclerc-Perron
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...
Publication number
20240077519
Publication date
Mar 7, 2024
MPI CORPORATION
Yang-Hung Cheng
G01 - MEASURING TESTING
Information
Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
Publication number
20240069094
Publication date
Feb 29, 2024
Tektronix, Inc.
Charles W. Case
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Test Equipment and Method of Performing Current and V...
Publication number
20240053400
Publication date
Feb 15, 2024
JCET STATS ChipPAC Korea Limited
YongJu Lee
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING
Publication number
20240044972
Publication date
Feb 8, 2024
Dish Network L.L.C.
Mansoor Ahmed
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICES AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
Publication number
20230366910
Publication date
Nov 16, 2023
NANYA TECHNOLOGY CORPORATION
Wu-Der YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
Publication number
20230366925
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing company Ltd.
JUN HE
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD SUBSTRATE, SUBSTRATE STRUCTURE AND METHOD OF FABRICATING...
Publication number
20230358786
Publication date
Nov 9, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Wei-Yu Chen
G01 - MEASURING TESTING
Information
Patent Application
WAFER AND PROBER
Publication number
20230324455
Publication date
Oct 12, 2023
KIOXIA Corporation
Tatsuro HITOMI
G01 - MEASURING TESTING
Information
Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
Publication number
20230324458
Publication date
Oct 12, 2023
Semitronix Corporation
Jiabai CHENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ALIGNING CONTACT PINS IN AN INTEGRATED CIRCUIT TESTING A...
Publication number
20230314501
Publication date
Oct 5, 2023
JF MICROTECHNOLOGY SDN. BHD.
Wei Kuong FOONG
G01 - MEASURING TESTING
Information
Patent Application
PROBE STRUCTURE
Publication number
20230314475
Publication date
Oct 5, 2023
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...
Publication number
20230296666
Publication date
Sep 21, 2023
Advantest Corporation
Yuya Yamada
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Application
SUBSTRATE TESTING WITH THREE-DIMENSIONAL SCANNING
Publication number
20230288472
Publication date
Sep 14, 2023
Mellanox Technologies, Ltd.
Barak Freedman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST STRUCTURE AND TEST METHOD
Publication number
20230266376
Publication date
Aug 24, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Zhongqin ZHU
G01 - MEASURING TESTING
Information
Patent Application
SOCKET AND INSPECTION SOCKET
Publication number
20230251308
Publication date
Aug 10, 2023
ENPLAS CORPORATION
Hiroyuki ICHIKAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
Publication number
20230251306
Publication date
Aug 10, 2023
Taiwan Semiconductor Manufacturing company Ltd.
JUN HE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING SEMICONDUCTOR DIES AND TEST STRUCTURE
Publication number
20230194596
Publication date
Jun 22, 2023
NANYA TECHNOLOGY CORPORATION
Tse Yu CHENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A REDISTRIBUTION LAYER, REDISTRIBUTION LAYE...
Publication number
20230187389
Publication date
Jun 15, 2023
STMicroelectronics S.r.l
Samuele SCIARRILLO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HOUSING WITH VERTICAL BACKSTOP
Publication number
20230184826
Publication date
Jun 15, 2023
Johnstech International Corporation
Melissa Hasskamp
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
Publication number
20230168277
Publication date
Jun 1, 2023
AEHR TEST SYSTEMS
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD AND PROBE CARD COMPRISING SAME
Publication number
20230152350
Publication date
May 18, 2023
POINT ENGINEERING CO., LTD.
Bum Mo AHN
G01 - MEASURING TESTING
Information
Patent Application
CHIP-ON-FILM TEST BOARD
Publication number
20230152370
Publication date
May 18, 2023
LX Semicon Co., Ltd.
Min Suk KIM
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTRONIC TEST INTERFACE SUBSTRATES, DEVICES, AND METHODS OF...
Publication number
20230140814
Publication date
May 4, 2023
Raymond Won Bae
G01 - MEASURING TESTING
Information
Patent Application
PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...
Publication number
20230120201
Publication date
Apr 20, 2023
Alan Howard
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND JUMPER THEREOF
Publication number
20230123340
Publication date
Apr 20, 2023
STAR TECHNOLOGIES, INC.
CHOON LEONG LOU
G01 - MEASURING TESTING