Field emission

Industry

CPC
H01J2237/06341

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/06341Field emission

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Emitter, electron gun in which same is used, electronic device in w...
- Patent number 11,984,294
- Issue date May 14, 2024
- National Institute for Materials Science
- Jie Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanically-stable electron source
- Patent number 11,749,492
- Issue date Sep 5, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitter and method of fabricating same
- Patent number 11,688,579
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing microrods for electron emitters, and associated...
- Patent number 11,651,924
- Issue date May 16, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitter and method of fabricating same
- Patent number 11,201,032
- Issue date Dec 14, 2021
- ASML Netherlands B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode field-emission electron gun, adjustment method for col...
- Patent number 11,031,208
- Issue date Jun 8, 2021
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitter and method of fabricating same
- Patent number 10,784,071
- Issue date Sep 22, 2020
- ASML Netherlands B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for producing an electron beam
- Patent number 10,727,022
- Issue date Jul 28, 2020
- Ariel Scientific Innovations Ltd.
- Moshe Einat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal protective layer for electron emitters with a diffusion barrier
- Patent number 10,714,294
- Issue date Jul 14, 2020
- KLA-Tencor Corporation
- Frances Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for providing a clean environment in an electron-...
- Patent number 10,692,692
- Issue date Jun 23, 2020
- KLA-Tencor Corporation
- William G. Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,614,994
- Issue date Apr 7, 2020
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 10,522,319
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance inspection scanning electron microscope device and...
- Patent number 10,504,684
- Issue date Dec 10, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage feedthrough assembly, time-resolved transmission elect...
- Patent number 10,366,861
- Issue date Jul 30, 2019
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Julian Hirscht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,297,416
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Toshihide Agemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of operating same
- Patent number 10,224,176
- Issue date Mar 5, 2019
- Jeol Ltd.
- Takashi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope electron gun for facilitating position adjustme...
- Patent number 10,128,077
- Issue date Nov 13, 2018
- Korea Research Institute of Standards and Science
- Bok Lae Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing electron source
- Patent number 10,074,506
- Issue date Sep 11, 2018
- Hitachi High-Technologies Corporation
- Takashi Ichimura
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Electron microscope and method of operating the same
- Patent number 9,772,976
- Issue date Sep 26, 2017
- Jeol Ltd.
- Takashi Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Array of carbon nanotube micro-tip structures
- Patent number 9,734,976
- Issue date Aug 15, 2017
- Tsinghua University
- Yang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal field emitter tip, electron beam device including a thermal...
- Patent number 9,697,983
- Issue date Jul 4, 2017
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-electron column having an electron emitter improving the dens...
- Patent number 9,673,016
- Issue date Jun 6, 2017
- Industry-University Cooperation Foundation Sunmoon University
- Ho Seob Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter for an electron beam, electron beam device and method for p...
- Patent number 9,633,815
- Issue date Apr 25, 2017
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, charged particle gun, and charged particle beam appar...
- Patent number 9,570,268
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticle-templated lithographic patterning of nanoscale electro...
- Patent number 9,548,180
- Issue date Jan 17, 2017
- Elwha LLC
- Max N. Mankin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon nanotube based micro-tip structure and method for making the...
- Patent number 9,437,391
- Issue date Sep 6, 2016
- Tsinghua University
- Yang Wei
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Device and method for electron emission and device including such a...
- Patent number 9,263,229
- Issue date Feb 16, 2016
- Centre National de la Recherche Scientifique (Cnrs)
- Arnaud Arbouet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,208,995
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240379318
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER, ELECTRON GUN IN WHICH SAME IS USED, ELECTRONIC DEVICE IN W...
- Publication number 20240079198
- Publication date Mar 7, 2024
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Jie TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Method of Manufacturing the Same, And Electron Bea...
- Publication number 20230317401
- Publication date Oct 5, 2023
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE BASED ON FIELD EMISSION AND PRODUCTION PROCESS FOR...
- Publication number 20230005695
- Publication date Jan 5, 2023
- Centre National de la Recherche Scientifique
- Alain DEGIOVANNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE HAVING A DEFLECTION UNIT
- Publication number 20220367142
- Publication date Nov 17, 2022
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MECHANICALLY-STABLE ELECTRON SOURCE
- Publication number 20220293387
- Publication date Sep 15, 2022
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EMITTER AND METHOD OF FABRICATING SAME
- Publication number 20220189725
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Juying DOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EMITTER AND METHOD OF FABRICATING SAME
- Publication number 20210142975
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL PROTECTIVE LAYER FOR ELECTRON EMITTERS WITH A DIFFUSION BARRIER
- Publication number 20190362927
- Publication date Nov 28, 2019
- KLA-Tencor Corporation
- Frances Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20190279837
- Publication date Sep 12, 2019
- Hitachi High-Technologies Corporation
- Takashi ONISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cold Cathode Field-Emission Electron Gun, Cold Cathode Field-Emissi...
- Publication number 20190096626
- Publication date Mar 28, 2019
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE ELECTRON GUN FOR FACILITATING POSITION ADJUSTME...
- Publication number 20180218874
- Publication date Aug 2, 2018
- Korea Research Institute of Standards and Science
- Bok Lae CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Operating Same
- Publication number 20180130635
- Publication date May 10, 2018
- JEOL Ltd.
- Takashi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20170309437
- Publication date Oct 26, 2017
- Hitachi High-Technologies Corporation
- Toshihide AGEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...
- Publication number 20160104597
- Publication date Apr 14, 2016
- Hitachi High-Technologies Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR EMITTING ELECTRONS AND DEVICE COMPRISING SUCH...
- Publication number 20150008323
- Publication date Jan 8, 2015
- Arnaud Arbouet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE
- Publication number 20140197725
- Publication date Jul 17, 2014
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20140077684
- Publication date Mar 20, 2014
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron Microscope and Method of Adjusting the Same
- Publication number 20130327938
- Publication date Dec 12, 2013
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Method of Operating the Same
- Publication number 20130332116
- Publication date Dec 12, 2013
- Takashi Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE EMISSION GUN AND CHARGED PARTICLE RAY APPARATUS
- Publication number 20130264496
- Publication date Oct 10, 2013
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN EMITTING UNDER HIGH VOLTAGE, IN PARTICULAR FOR ELECTRO...
- Publication number 20130234025
- Publication date Sep 12, 2013
- Centre National De La Recherche Scientifique (CNRS)
- Marc Monthioux
- B82 - NANO-TECHNOLOGY
Information Patent Application
CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...
- Publication number 20130224429
- Publication date Aug 29, 2013
- HON HAI Precision Industry CO., LTD.
- YANG WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Determination of Emission Parameters from Field Emission Sources
- Publication number 20130187058
- Publication date Jul 25, 2013
- FEI Company
- Lynwood W. Swanson
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM RADIATION APPARATUS
- Publication number 20130140977
- Publication date Jun 6, 2013
- Hitachi High-Technologies Corporation
- Shunichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT HIGH-VOLTAGE ELECTRON GUN
- Publication number 20130134324
- Publication date May 30, 2013
- KLA-Tencor Corporation
- Alan D. BRODIE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
FABRICATION OF SUPER ION - ELECTRON SOURCE AND NANOPROBE BY LOCAL E...
- Publication number 20130122774
- Publication date May 16, 2013
- Moh'd Rezeq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130087703
- Publication date Apr 11, 2013
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM IRRADIATION DEVICE AND METHOD FOR SUPPRESSING ION BEAM DIV...
- Publication number 20120085918
- Publication date Apr 12, 2012
- KYOTO UNIVERSITY
- Dan Nicolaescu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN
- Publication number 20120062094
- Publication date Mar 15, 2012
- Mikio Ichihashi
- H01 - BASIC ELECTRIC ELEMENTS

Field emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Emitter, electron gun in which same is used, electronic device in w...

Mechanically-stable electron source

Electron emitter and method of fabricating same

Method of producing microrods for electron emitters, and associated...

Electron emitter and method of fabricating same

Cold cathode field-emission electron gun, adjustment method for col...

Electron emitter and method of fabricating same

Methods and devices for producing an electron beam

Metal protective layer for electron emitters with a diffusion barrier

System and method for providing a clean environment in an electron-...

Electron microscope

Field emission electron source, method for manufacturing same, and...

Electron beam apparatus

High performance inspection scanning electron microscope device and...

Gun lens design in a charged particle microscope

High voltage feedthrough assembly, time-resolved transmission elect...

Scanning electron microscope

Electron microscope and method of operating same

Electron microscope electron gun for facilitating position adjustme...

Method for manufacturing electron source

Electron microscope and method of operating the same

Array of carbon nanotube micro-tip structures

Thermal field emitter tip, electron beam device including a thermal...

Micro-electron column having an electron emitter improving the dens...

Emitter for an electron beam, electron beam device and method for p...

Electron gun, charged particle gun, and charged particle beam appar...

Nanoparticle-templated lithographic patterning of nanoscale electro...

Carbon nanotube based micro-tip structure and method for making the...

Device and method for electron emission and device including such a...

Charged particle beam apparatus

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

EMITTER, ELECTRON GUN IN WHICH SAME IS USED, ELECTRONIC DEVICE IN W...

Electron Source, Method of Manufacturing the Same, And Electron Bea...

ELECTRON SOURCE BASED ON FIELD EMISSION AND PRODUCTION PROCESS FOR...

PARTICLE BEAM DEVICE HAVING A DEFLECTION UNIT

MECHANICALLY-STABLE ELECTRON SOURCE

ELECTRON EMITTER AND METHOD OF FABRICATING SAME

ELECTRON EMITTER AND METHOD OF FABRICATING SAME

METAL PROTECTIVE LAYER FOR ELECTRON EMITTERS WITH A DIFFUSION BARRIER

Electron Microscope

Cold Cathode Field-Emission Electron Gun, Cold Cathode Field-Emissi...

ELECTRON MICROSCOPE ELECTRON GUN FOR FACILITATING POSITION ADJUSTME...

Electron Microscope and Method of Operating Same

Scanning Electron Microscope

ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...

DEVICE AND METHOD FOR EMITTING ELECTRONS AND DEVICE COMPRISING SUCH...

ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE

PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME

Electron Microscope and Method of Adjusting the Same

Electron Microscope and Method of Operating the Same

CHARGED PARTICLE EMISSION GUN AND CHARGED PARTICLE RAY APPARATUS

ELECTRON GUN EMITTING UNDER HIGH VOLTAGE, IN PARTICULAR FOR ELECTRO...

CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...

Determination of Emission Parameters from Field Emission Sources

CHARGED PARTICLE BEAM RADIATION APPARATUS

COMPACT HIGH-VOLTAGE ELECTRON GUN

FABRICATION OF SUPER ION - ELECTRON SOURCE AND NANOPROBE BY LOCAL E...

ELECTRON MICROSCOPE

ION BEAM IRRADIATION DEVICE AND METHOD FOR SUPPRESSING ION BEAM DIV...

ELECTRON GUN