Membership
Tour
Register
Log in
Focused ion beam
Follow
Industry
CPC
H01J2237/31749
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
Current Industry
H01J2237/31749
Focused ion beam
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for performing sample lift-out for highly react...
Patent number
11,972,923
Issue date
Apr 30, 2024
FEI Company
Christopher Thompson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission charged particle microscope with an electron energy lo...
Patent number
11,955,310
Issue date
Apr 9, 2024
FEI Company
Peter Christiaan Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for preparing a microscopic sample from a volume...
Patent number
11,935,723
Issue date
Mar 19, 2024
Carl Zeiss Microscopy GmbH
Fabian Perez Willard
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
Patent number
11,923,168
Issue date
Mar 5, 2024
FIBICS INCORPORATED
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reduced charging by low negative voltage in FIB systems
Patent number
11,887,810
Issue date
Jan 30, 2024
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of material deposition
Patent number
11,798,804
Issue date
Oct 24, 2023
FEI Company
Brian Roberts Routh
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Protective shutter for charged particle microscope
Patent number
11,749,496
Issue date
Sep 5, 2023
FEI Company
Philip Brundage
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Liquid metal ion source and focused ion beam apparatus
Patent number
11,749,493
Issue date
Sep 5, 2023
Hitachi High-Tech Science Corporation
Yoshihiro Koyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, device and system for the treatment of biological cryogenic...
Patent number
11,735,404
Issue date
Aug 22, 2023
FEI Company
Alex De Marco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,726,050
Issue date
Aug 15, 2023
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
Patent number
11,728,126
Issue date
Aug 15, 2023
Applied Materials Israel Ltd.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam apparatus and composite beam apparatus
Patent number
11,682,536
Issue date
Jun 20, 2023
Hitachi High-Tech Science Corporation
Koji Nagahara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High power wafer cooling
Patent number
11,670,483
Issue date
Jun 6, 2023
Axcelis Technologies, Inc.
Joseph Ferrara
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Charged particle beam device
Patent number
11,640,897
Issue date
May 2, 2023
Hitachi High-Technologies Corporation
Ryo Hirano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of preparing integrated circuits for backside pro...
Patent number
11,605,525
Issue date
Mar 14, 2023
FEI Company
James Vickers
G01 - MEASURING TESTING
Information
Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
Patent number
11,501,951
Issue date
Nov 15, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus
Patent number
11,482,398
Issue date
Oct 25, 2022
Hitachi High-Tech Science Corporation
Haruyuki Ishii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,476,078
Issue date
Oct 18, 2022
Hitachi High-Tech Science Corporation
Masahiro Kiyohara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of sample preparation using dual ion beam trenching
Patent number
11,476,120
Issue date
Oct 18, 2022
Intel Corporation
Purushotham Kaushik Muthur Srinath
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
Patent number
11,462,383
Issue date
Oct 4, 2022
Fibics Incorporated
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Milling a multi-layered object
Patent number
11,440,151
Issue date
Sep 13, 2022
Yehuda Zur
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,366,074
Issue date
Jun 21, 2022
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,361,936
Issue date
Jun 14, 2022
Hitachi High-Tech Science Corporation
Ayana Muraki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for changing the spatial orientation of a micro-sample in a...
Patent number
11,355,310
Issue date
Jun 7, 2022
Carl Zeiss Microscopy GmbH
Holger Doemer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low keV ion beam image restoration by machine learning for object l...
Patent number
11,355,305
Issue date
Jun 7, 2022
FEI Company
Remco Johannes Petrus Geurts
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
Patent number
11,313,042
Issue date
Apr 26, 2022
FEI Company
Thomas G. Miller
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for preparing a TEM sample
Patent number
11,315,755
Issue date
Apr 26, 2022
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and sample processing observation m...
Patent number
11,282,672
Issue date
Mar 22, 2022
Hitachi High-Tech Science Corporation
Hidekazu Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Holes tilt angle measurement using FIB diagonal cut
Patent number
11,280,749
Issue date
Mar 22, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus, and control method for focused ion beam...
Patent number
11,257,655
Issue date
Feb 22, 2022
Hitachi High-Tech Science Corporation
Yasuhiko Sugiyama
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
Publication number
20240136150
Publication date
Apr 25, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
Publication number
20240120175
Publication date
Apr 11, 2024
CARL ZEISS MICROSCOPY GMBH
Lorenz Lechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USIN...
Publication number
20240105419
Publication date
Mar 28, 2024
Intel Corporation
Shida TAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...
Publication number
20240105421
Publication date
Mar 28, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
Publication number
20240071720
Publication date
Feb 29, 2024
FEI Company
Jamie Dee Gravell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Focused Ion Beam Apparatus
Publication number
20240071718
Publication date
Feb 29, 2024
JEOL Ltd.
Yusuke Kagaya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20240055220
Publication date
Feb 15, 2024
Hitachi High-Tech Corporation
Yuka II
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING
Publication number
20240038486
Publication date
Feb 1, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Yu-Ching Chiu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING
Publication number
20230375616
Publication date
Nov 23, 2023
Yangtze Memory Technologies Co., Ltd.
Lin QI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20230358696
Publication date
Nov 9, 2023
Fibics Incorporated
Michael William PHANEUF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS
Publication number
20230343545
Publication date
Oct 26, 2023
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
Publication number
20230343546
Publication date
Oct 26, 2023
CARL ZEISS MICROSCOPY GMBH
Michele Nicoletti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
Publication number
20230335370
Publication date
Oct 19, 2023
APPLIED MATERIALS ISRAEL LTD.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for analyzing three-dimensional features
Publication number
20230317410
Publication date
Oct 5, 2023
FEI Company
Bingxing Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOCUSED ION BEAM SYSTEM
Publication number
20230307205
Publication date
Sep 28, 2023
V Technology Co., LTD.
Michinobu MIZUMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
Publication number
20230298855
Publication date
Sep 21, 2023
DELMIC IP B.V.
Andries Pieter Johan EFFTING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FAILURE ANALYSIS FOR DEFECT LOCATIONS
Publication number
20230273101
Publication date
Aug 31, 2023
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
Publication number
20230268156
Publication date
Aug 24, 2023
Hitachi High-Tech Corporation
Naoki SAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Preparing TEM Sample
Publication number
20230268159
Publication date
Aug 24, 2023
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sample Cartridge Holding Apparatus
Publication number
20230238208
Publication date
Jul 27, 2023
JEOL Ltd.
Norimasa Sakuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
Publication number
20230228695
Publication date
Jul 20, 2023
The Regents of the University of California
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Focused Ion Beam System and Method of Correcting Deviation of Field...
Publication number
20230230801
Publication date
Jul 20, 2023
JEOL Ltd.
Yuichiro Ohori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
Publication number
20230215690
Publication date
Jul 6, 2023
FEI Company
Christopher THOMPSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR REDUCING ICE CONTAMINATION OF A SAMPLE, FOCUSED ION BEAM...
Publication number
20230215681
Publication date
Jul 6, 2023
Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
Sebastian TACKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
Publication number
20230215683
Publication date
Jul 6, 2023
FEI Company
Adam STOKES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and Method for Milling Sample
Publication number
20230197401
Publication date
Jun 22, 2023
JEOL Ltd.
Munehiro Kozuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method Of Imaging And Milling A Sample
Publication number
20230162945
Publication date
May 25, 2023
FEI Company
Jaroslav Velcovský
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor Analysis System
Publication number
20230063192
Publication date
Mar 2, 2023
Hitachi High-Tech Corporation
Yudai KUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYZING A SIDEWALL OF HOLE MILLED IN A SAMPLE TO DETERMINE THICKN...
Publication number
20230057148
Publication date
Feb 23, 2023
APPLIED MATERIALS ISRAEL LTD.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
Publication number
20230044598
Publication date
Feb 9, 2023
Fibics Incorporated
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING