for delay tests

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G01R31/318328

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318328for delay tests

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Delay measurement system and measurement method
- Patent number 12,169,222
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shang Hsien Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrating machine learning delay estimation in FPGA-based emulati...
- Patent number 12,140,628
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Silicon test structures for separate measurement of NMOS and PMOS t...
- Patent number 12,044,732
- Issue date Jul 23, 2024
- NVIDIA Corporation
- Prashant Singh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device test method and test device
- Patent number 11,994,558
- Issue date May 28, 2024
- Realtek Semiconductor Corp.
- Han-Yun Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Fan-out buffer with skew control function, operating method thereof...
- Patent number 11,921,158
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Byung-Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for isolating interfaces while testing semiconductor dev...
- Patent number 11,867,744
- Issue date Jan 9, 2024
- NVIDIA Corporation
- Animesh Khare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning delay estimation for emulation systems
- Patent number 11,860,227
- Issue date Jan 2, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal toggling detection and correction circuit
- Patent number 11,686,769
- Issue date Jun 27, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Grant
Side-channel signature based PCB authentication using JTAG architec...
- Patent number 11,480,614
- Issue date Oct 25, 2022
- University of Florida Research Foundation, Inc.
- Swarup Bhunia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SDD ATPG using fault rules files, SDF and node slack for testing an...
- Patent number 11,461,520
- Issue date Oct 4, 2022
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for providing an inference associated with delays...
- Patent number 11,249,135
- Issue date Feb 15, 2022
- HCL Technologies Limited
- Manickam Muthiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of the dispersion of an electronic component
- Patent number 11,249,133
- Issue date Feb 15, 2022
- STMicroelectronics (Crolles 2) SAS
- Yann Carminati
- G05 - CONTROLLING REGULATING
Information Patent Grant
Software defined LFSR for LOC delay testing low-power test compression
- Patent number 11,156,662
- Issue date Oct 26, 2021
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, semiconductor system, and control method of s...
- Patent number 10,884,035
- Issue date Jan 5, 2021
- Renesas Electronics Corporation
- Kazuki Fukuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating channel delay skew of automatic test equipment
- Patent number 10,866,282
- Issue date Dec 15, 2020
- MONTAGE TECHNOLOGY CO., LTD.
- Yong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement circuits for logic paths
- Patent number 10,734,999
- Issue date Aug 4, 2020
- GLOBALFOUNDRIES Inc.
- Kenta Yamada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Precise transmission medium delay measurement
- Patent number 10,698,030
- Issue date Jun 30, 2020
- Amazon Technologies, Inc.
- Carlos Guillermo Parodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 10,509,073
- Issue date Dec 17, 2019
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, semiconductor system, and control method of s...
- Patent number 10,481,185
- Issue date Nov 19, 2019
- Renesas Electronics Corporation
- Kazuki Fukuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing optimizations in circuit designs using opposite clock edge t...
- Patent number 10,416,232
- Issue date Sep 17, 2019
- Xilinx, Inc.
- Guenter Stenz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Precise transmission medium delay measurement
- Patent number 10,302,699
- Issue date May 28, 2019
- Amazon Technologies, Inc.
- Carlos Guillermo Parodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In line critical path delay measurement for accurate timing indicat...
- Patent number 9,882,564
- Issue date Jan 30, 2018
- PLSense Ltd.
- Uzi Zangi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 9,720,040
- Issue date Aug 1, 2017
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurements circuitry and method for generating an oscillating out...
- Patent number 9,651,620
- Issue date May 16, 2017
- ARM Limited
- Ramesh Manohar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Chip authentication using scan chains
- Patent number 9,506,983
- Issue date Nov 29, 2016
- International Business Machines Corporation
- Franco Motika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip authentication using scan chains
- Patent number 9,069,989
- Issue date Jun 30, 2015
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting small delay defects
- Patent number 8,566,766
- Issue date Oct 22, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic test pattern generation for small delay defect
- Patent number 8,527,232
- Issue date Sep 3, 2013
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Delay fault diagnosis program
- Patent number 8,392,776
- Issue date Mar 5, 2013
- Hitachi, Ltd.
- Daisuke Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating test patterns for use in at-spe...
- Patent number 8,359,565
- Issue date Jan 22, 2013
- International Business Machines Corporation
- Chandramouli Visweswariah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA...
- Publication number 20240302432
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Hobin SONG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...
- Publication number 20240094290
- Publication date Mar 21, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20230258721
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- SHANG HSIEN YANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT
- Publication number 20230213580
- Publication date Jul 6, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE TEST METHOD AND TEST DEVICE
- Publication number 20230132675
- Publication date May 4, 2023
- Realtek Semiconductor Corp.
- Han-Yun Tsai
- G11 - INFORMATION STORAGE
Information Patent Application
SILICON TEST STRUCTURES FOR SEPARATE MEASUREMENT OF NMOS AND PMOS T...
- Publication number 20230104105
- Publication date Apr 6, 2023
- NVIDIA Corporation
- Prashant Singh
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS
- Publication number 20220187367
- Publication date Jun 16, 2022
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...
- Publication number 20220120804
- Publication date Apr 21, 2022
- NVIDIA Corporation
- Animesh KHARE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...
- Publication number 20210132147
- Publication date May 6, 2021
- Realtek Semiconductor Corp.
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING AN INFERENCE ASSOCIATED WITH DELAYS...
- Publication number 20210116502
- Publication date Apr 22, 2021
- HCL Technologies Limited
- Manickam MUTHIAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF THE DISPERSION OF AN ELECTRONIC COMPONENT
- Publication number 20200233032
- Publication date Jul 23, 2020
- STMicroelectronics (Crolles 2) SAS
- Yann CARMINATI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...
- Publication number 20200041547
- Publication date Feb 6, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuki FUKUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALIBRATING CHANNEL DELAY SKEW OF AUTOMATIC TEST EQUIPMENT
- Publication number 20200018795
- Publication date Jan 16, 2020
- MONTAGE TECHNOLOGY CO., LTD.
- Yong WANG
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION
- Publication number 20190339328
- Publication date Nov 7, 2019
- TSINGHUA UNIVERSITY
- Dong XIANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...
- Publication number 20180095115
- Publication date Apr 5, 2018
- RENESAS ELECTRONICS CORPORATION
- Kazuki FUKUOKA
- G01 - MEASURING TESTING
Information Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
- Publication number 20180045780
- Publication date Feb 15, 2018
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS CIRCUITRY AND METHOD FOR GENERATING AN OSCILLATING OUT...
- Publication number 20160124045
- Publication date May 5, 2016
- ARM Limited
- Ramesh MANOHAR
- G01 - MEASURING TESTING
Information Patent Application
CHIP AUTHENTICATION USING SCAN CHAINS
- Publication number 20130198873
- Publication date Aug 1, 2013
- International Business Machines Corporation
- FRANCO MOTIKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...
- Publication number 20120191401
- Publication date Jul 26, 2012
- International Business Machines Corporation
- CHANDRAMOULI VISWESWARIAH
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting Small Delay Defects
- Publication number 20120112763
- Publication date May 10, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Application
Hold Transition Fault Model and Test Generation Method
- Publication number 20110055650
- Publication date Mar 3, 2011
- International Business Machines Corporation
- Vikram Iyengar
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...
- Publication number 20100287432
- Publication date Nov 11, 2010
- Chandramouli Visweswariah
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Test Pattern Generation For Small Delay Defect
- Publication number 20100274518
- Publication date Oct 28, 2010
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
DELAY FAULT DIAGNOSIS PROGRAM
- Publication number 20100269003
- Publication date Oct 21, 2010
- Hitachi, Ltd.
- Daisuke ITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GENERATING A RESTRICTED INLINE RESISTIVE FAULT PATTERN AN...
- Publication number 20100153056
- Publication date Jun 17, 2010
- LSI Corporation
- Jeff S. Brown
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR GENERATING TEST PATTERNS FOR SMALL DELAY DEFECTS
- Publication number 20100153795
- Publication date Jun 17, 2010
- LSI Corporation
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20090113261
- Publication date Apr 30, 2009
- Japan Science and Technology Agency
- Seiji Kajihara
- G01 - MEASURING TESTING
Information Patent Application
TROUBLESHOOTING TEMPORAL BEHAVIOR IN "COMBINATIONAL" CIRCUITS
- Publication number 20080294415
- Publication date Nov 27, 2008
- Palo Alto Research Center Incorporated
- Johan de Kleer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Increasing Path Coverage in Transition Test Generation
- Publication number 20080250279
- Publication date Oct 9, 2008
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Application
Performing Temporal Checking
- Publication number 20080195339
- Publication date Aug 14, 2008
- Parag Birmiwal
- G01 - MEASURING TESTING

for delay tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Delay measurement system and measurement method

Integrating machine learning delay estimation in FPGA-based emulati...

Silicon test structures for separate measurement of NMOS and PMOS t...

Electronic device test method and test device

Fan-out buffer with skew control function, operating method thereof...

Techniques for isolating interfaces while testing semiconductor dev...

Machine learning delay estimation for emulation systems

Signal toggling detection and correction circuit

Side-channel signature based PCB authentication using JTAG architec...

SDD ATPG using fault rules files, SDF and node slack for testing an...

System and method for providing an inference associated with delays...

Determination of the dispersion of an electronic component

Software defined LFSR for LOC delay testing low-power test compression

Semiconductor device, semiconductor system, and control method of s...

Method for calibrating channel delay skew of automatic test equipment

Measurement circuits for logic paths

Precise transmission medium delay measurement

Timing-aware test generation and fault simulation

Semiconductor device, semiconductor system, and control method of s...

Timing optimizations in circuit designs using opposite clock edge t...

Precise transmission medium delay measurement

In line critical path delay measurement for accurate timing indicat...

Timing-aware test generation and fault simulation

Measurements circuitry and method for generating an oscillating out...

Chip authentication using scan chains

Chip authentication using scan chains

Method for detecting small delay defects

Diagnostic test pattern generation for small delay defect

Delay fault diagnosis program

Method and apparatus for generating test patterns for use in at-spe...

Patents Applicationslast 30 patents

BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA...

Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...

DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT

ELECTRONIC DEVICE TEST METHOD AND TEST DEVICE

SILICON TEST STRUCTURES FOR SEPARATE MEASUREMENT OF NMOS AND PMOS T...

MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS

TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...

TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...

SYSTEM AND METHOD FOR PROVIDING AN INFERENCE ASSOCIATED WITH DELAYS...

DETERMINATION OF THE DISPERSION OF AN ELECTRONIC COMPONENT

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...

METHOD FOR CALIBRATING CHANNEL DELAY SKEW OF AUTOMATIC TEST EQUIPMENT

SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...

TIMING-AWARE TEST GENERATION AND FAULT SIMULATION

MEASUREMENTS CIRCUITRY AND METHOD FOR GENERATING AN OSCILLATING OUT...

CHIP AUTHENTICATION USING SCAN CHAINS

METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...

Method for Detecting Small Delay Defects

Hold Transition Fault Model and Test Generation Method

METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...

Diagnostic Test Pattern Generation For Small Delay Defect

DELAY FAULT DIAGNOSIS PROGRAM

METHOD OF GENERATING A RESTRICTED INLINE RESISTIVE FAULT PATTERN AN...

METHOD FOR GENERATING TEST PATTERNS FOR SMALL DELAY DEFECTS

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

TROUBLESHOOTING TEMPORAL BEHAVIOR IN "COMBINATIONAL" CIRCUITS

Method of Increasing Path Coverage in Transition Test Generation

Performing Temporal Checking