TREA

for measurement of a wafer

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Industry

  • CPC
  • G01B2210/48
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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2210/00Aspects not specifically covered by any group under G01B

Current Industry

G01B2210/48for measurement of a wafer
Industries