Aspects not specifically covered by any group under G01B

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

G01B2210/00Aspects not specifically covered by any group under G01B

G01B2210/10Wheel alignment G01B2210/12Method or fixture for calibrating the wheel aligner G01B2210/14One or more cameras or other optical devices capable of acquiring a two-dimensional image G01B2210/143One or more cameras on each side of a vehicle in the main embodiment G01B2210/146Two or more cameras imaging the same area G01B2210/16Active or passive device attached to the chassis of a vehicle G01B2210/18Specially developed for using with motorbikes or other two-wheeled vehicles G01B2210/20Vehicle in a state of translatory motion G01B2210/22Wheels in a state of motion supported on rollers, rotating platform or other structure substantially capable of only one degree of rotational freedom G01B2210/24Specially developed for using with trucks or other heavy-duty vehicles G01B2210/26Algorithms, instructions, databases, computerized methods and graphical user interfaces employed by a user in conjunction with the wheel aligner G01B2210/28Beam projector and related sensors, camera, inclinometer or other active sensing or projecting device G01B2210/283Beam projectors and related sensors G01B2210/286Projecting a light pattern on the wheel or vehicle body G01B2210/30Reference markings, reflector, scale or other passive device G01B2210/303fixed to the ground or to the measuring station G01B2210/306Mirror, prism or other reflector G01B2210/40Caliper-like sensors G01B2210/42with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side G01B2210/44with detectors on both sides of the object to be measured G01B2210/46with one or more detectors on a single side of the object to be measured and with a transmitter on the other side G01B2210/48for measurement of a wafer G01B2210/50Using chromatic effects to achieve wavelength-dependent depth resolution G01B2210/52Combining or merging partially overlapping images to an overall image G01B2210/54Revolving an optical measuring instrument around a body G01B2210/56Measuring geometric parameters of semiconductor structures G01B2210/58Wireless transmission of information between a sensor or probe and a control or evaluation unit G01B2210/60Unique sensor identification G01B2210/62Support for workpiece air film or bearing with positive or negative pressure G01B2210/64Interconnection or interfacing through or under capping or via rear of substrate in microsensors G01B2210/66Rock or ground anchors having deformation measuring means