for measuring contours or curvatures

Industry

CPC
G01B15/04

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B15/00Measuring arrangements characterised by the use of wave or particle radiation

Current Industry

G01B15/04for measuring contours or curvatures

Industries

Patents Grantslast 30 patents

Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scatterometry with high harmonic generation (HHG) sources
- Patent number 12,174,009
- Issue date Dec 24, 2024
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Evgeny Frumker
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced cross sectional features measurement methodology
- Patent number 12,123,708
- Issue date Oct 22, 2024
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component imaging systems, apparatus, and methods
- Patent number 12,111,148
- Issue date Oct 8, 2024
- General Electric Company
- Andrew Frank Ferro
- G01 - MEASURING TESTING
Information Patent Grant
Design-assisted large field of view metrology
- Patent number 12,085,385
- Issue date Sep 10, 2024
- KLA Corporation
- Stefan Eyring
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 12,083,390
- Issue date Sep 10, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,064,911
- Issue date Aug 20, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,055,386
- Issue date Aug 6, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring surface
- Patent number 11,994,381
- Issue date May 28, 2024
- Senfit Oy
- Pekka Jakkula
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for combining x-ray metrology data sets to impr...
- Patent number 11,990,380
- Issue date May 21, 2024
- KLA Corporation
- Christopher Liman
- G01 - MEASURING TESTING
Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology in machine learning to characterize features
- Patent number 11,921,433
- Issue date Mar 5, 2024
- Lam Research Corporation
- Ye Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recording medium, shape calculation method, and shape calculation d...
- Patent number 11,913,778
- Issue date Feb 27, 2024
- Kioxia Corporation
- Kazuki Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Surface profile detection apparatus of burden in blast furnace and...
- Patent number 11,891,672
- Issue date Feb 6, 2024
- WADECO CO., LTD.
- Hayae Kayano
- C21 - METALLURGY OF IRON
Information Patent Grant
Edge extraction method and edge extraction device
- Patent number 11,879,718
- Issue date Jan 23, 2024
- Nippon Telegraph and Telephone Corporation
- Teruo Jo
- G01 - MEASURING TESTING
Information Patent Grant
Multi-energy x-ray system and method for golf ball inspection
- Patent number 11,874,106
- Issue date Jan 16, 2024
- Acushnet Company
- Paul Furze
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Measurement system and method for measuring a measurement object, i...
- Patent number 11,874,105
- Issue date Jan 16, 2024
- INOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining soil clod size or residue coverag...
- Patent number 11,864,484
- Issue date Jan 9, 2024
- CNH Industrial Canada, Ltd.
- Trevor Stanhope
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
System and methods for three dimensional modeling of an object usin...
- Patent number 11,860,262
- Issue date Jan 2, 2024
- VAYYAR IMAGING LTD.
- Raviv Melamed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Material analysis method
- Patent number 11,859,965
- Issue date Jan 2, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring method, shape measuring device, and program
- Patent number 11,835,334
- Issue date Dec 5, 2023
- Kioxia Corporation
- Kazuki Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for inspecting integrated circuits based on X-rays
- Patent number 11,815,349
- Issue date Nov 14, 2023
- Bruker Nano, Inc.
- Brennan Lovelace Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and computer program
- Patent number 11,802,763
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 11,712,604
- Issue date Aug 1, 2023
- Topgolf Callaway Brands Corp.
- David M. Melanson
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape evaluation device, pattern shape evaluation system, a...
- Patent number 11,713,963
- Issue date Aug 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- G01 - MEASURING TESTING
Information Patent Grant
Cathodoluminescence focal scans to characterize 3D NAND CH profile
- Patent number 11,713,964
- Issue date Aug 1, 2023
- Applied Materials Israel Ltd.
- David Goldovsky
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring the levelness of a multi-wing agri...
- Patent number 11,665,991
- Issue date Jun 6, 2023
- CNH Industrial America LLC
- Trevor Stanhope
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Measuring device, measuring method, and semiconductor storage device
- Patent number 11,646,211
- Issue date May 9, 2023
- Kioxia Corporation
- Hiroyuki Tanizaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing a semiconductor device
- Patent number 11,626,306
- Issue date Apr 11, 2023
- SK hynix Inc.
- Jin Hee Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-energy x-ray system and method for golf ball inspection
- Patent number 11,543,241
- Issue date Jan 3, 2023
- Acushnet Company
- Paul Furze
- A63 - SPORTS GAMES AMUSEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY
- Publication number 20250003742
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20240424351
- Publication date Dec 26, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT DEVICE,...
- Publication number 20240310167
- Publication date Sep 19, 2024
- KIOXIA Corporation
- Kazuki HAGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING DEVICE AND IMAGING METHOD
- Publication number 20240280361
- Publication date Aug 22, 2024
- Integral Geometry Science Inc.
- Kenjiro KIMURA
- G01 - MEASURING TESTING
Information Patent Application
COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME
- Publication number 20240255274
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Changi Jeon
- G01 - MEASURING TESTING
Information Patent Application
CONTOUR LINE ANALYSIS APPARATUS, PROCESSING DIMENSION EXTRACTION SY...
- Publication number 20240200938
- Publication date Jun 20, 2024
- Hitachi High-Tech Corporation
- Naoto TAKANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A CONTOUR OF AN OBJECT
- Publication number 20240191987
- Publication date Jun 13, 2024
- Aptiv Technologies AG
- Mateusz SNIEGUCKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
- Publication number 20240103149
- Publication date Mar 28, 2024
- Vayyar Imaging Ltd.
- Raviv MELAMED
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...
- Publication number 20240062401
- Publication date Feb 22, 2024
- Omron Corporation
- Takako ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20230372781
- Publication date Nov 23, 2023
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230324317
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
CATHODOLUMINESCENCE FOCAL SCANS TO CHARACTERIZE 3D NAND CH PROFILE
- Publication number 20230221112
- Publication date Jul 13, 2023
- APPLIED MATERIALS ISRAEL LTD.
- David Goldovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Tomographic Microscopy Imaging
- Publication number 20230215687
- Publication date Jul 6, 2023
- FEI Company
- Andreas Voigt
- G01 - MEASURING TESTING
Information Patent Application
Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...
- Publication number 20230194253
- Publication date Jun 22, 2023
- Hitachi High-Tech Corporation
- Ryugo KAGETANI
- G01 - MEASURING TESTING
Information Patent Application
RADIO FREQUENCY IDENTIFICATION BASED THREE-DIMENSIONAL METROLOGY
- Publication number 20230175842
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Olawunmi Akinlemibola
- G01 - MEASURING TESTING
Information Patent Application
DESIGN-ASSISTED LARGE FIELD OF VIEW METROLOGY
- Publication number 20230108539
- Publication date Apr 6, 2023
- Stefan Eyring
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ESTIMATING OBSTACLE SHAPE AND METHOD THEREOF
- Publication number 20230025940
- Publication date Jan 26, 2023
- Hyundai Motor Company
- Dong Hun Yang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20230024986
- Publication date Jan 26, 2023
- KIOXIA Corporation
- Takaki HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING METHOD, SHAPE MEASURING DEVICE, AND PROGRAM
- Publication number 20230015673
- Publication date Jan 19, 2023
- KIOXIA Corporation
- Kazuki HAGIHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE GEOMETRICAL DIMENSIONS OF...
- Publication number 20230014682
- Publication date Jan 19, 2023
- SNAP-ON EQUIPMENT SRL A UNICO SOCIO
- Paolo SOTGIU
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD OF ENHANCING CONTRAST WHILE IMAGING HIGH ASPECT RATIO STRUCT...
- Publication number 20220392810
- Publication date Dec 8, 2022
- Applied Materials, Inc.
- Geetika BAJAJ
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMPONENT IMAGING SYSTEMS, APPARATUS, AND METHODS
- Publication number 20220373325
- Publication date Nov 24, 2022
- GENERAL ELECTRIC COMPANY
- Andrew Frank Ferro
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS METHOD
- Publication number 20220357152
- Publication date Nov 10, 2022
- GLOBALWAFERS CO., LTD.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING A SEMICONDUCTOR DEVICE
- Publication number 20220277975
- Publication date Sep 1, 2022
- SK HYNIX INC.
- Jin Hee HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND
- Publication number 20220268576
- Publication date Aug 25, 2022
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING

for measuring contours or curvatures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Pattern measurement device and pattern measurement method

Scatterometry with high harmonic generation (HHG) sources

Enhanced cross sectional features measurement methodology

Component imaging systems, apparatus, and methods

Design-assisted large field of view metrology

Method and system for utilizing radio-opaque fillers in multiple la...

Method and device for measuring a tubular strand

Method and device for measuring a tubular strand

Apparatus for and method of measuring surface

Methods and systems for combining x-ray metrology data sets to impr...

System and method to adjust a kinetics model of surface reactions d...

Optical metrology in machine learning to characterize features

Recording medium, shape calculation method, and shape calculation d...

Surface profile detection apparatus of burden in blast furnace and...

Edge extraction method and edge extraction device

Multi-energy x-ray system and method for golf ball inspection

Measurement system and method for measuring a measurement object, i...

System and method for determining soil clod size or residue coverag...

System and methods for three dimensional modeling of an object usin...

Material analysis method

Shape measuring method, shape measuring device, and program

Methods and systems for inspecting integrated circuits based on X-rays

Pattern measurement device and computer program

Method and system for utilizing radio-opaque fillers in multiple la...

Pattern shape evaluation device, pattern shape evaluation system, a...

Cathodoluminescence focal scans to characterize 3D NAND CH profile

System and method for monitoring the levelness of a multi-wing agri...

Measuring device, measuring method, and semiconductor storage device

Method for analyzing a semiconductor device

Multi-energy x-ray system and method for golf ball inspection

Patents Applicationslast 30 patents

ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT DEVICE,...

IMAGING DEVICE AND IMAGING METHOD

COMPLEX SENSING DEVICE AND SENSING METHOD INCLUDING THE SAME

CONTOUR LINE ANALYSIS APPARATUS, PROCESSING DIMENSION EXTRACTION SY...

METHOD FOR DETERMINING A CONTOUR OF AN OBJECT

SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...

Pattern Measurement Device

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

INSPECTION DEVICE AND INSPECTION METHOD

CATHODOLUMINESCENCE FOCAL SCANS TO CHARACTERIZE 3D NAND CH PROFILE

Methods And Systems For Tomographic Microscopy Imaging

Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...

RADIO FREQUENCY IDENTIFICATION BASED THREE-DIMENSIONAL METROLOGY

DESIGN-ASSISTED LARGE FIELD OF VIEW METROLOGY

APPARATUS FOR ESTIMATING OBSTACLE SHAPE AND METHOD THEREOF

MEASUREMENT DEVICE AND MEASUREMENT METHOD

SHAPE MEASURING METHOD, SHAPE MEASURING DEVICE, AND PROGRAM

METHOD AND APPARATUS FOR DETERMINING THE GEOMETRICAL DIMENSIONS OF...

METHOD OF ENHANCING CONTRAST WHILE IMAGING HIGH ASPECT RATIO STRUCT...

COMPONENT IMAGING SYSTEMS, APPARATUS, AND METHODS

MATERIAL ANALYSIS METHOD

METHOD FOR ANALYZING A SEMICONDUCTOR DEVICE

METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND