for measuring gain factor thereof

Industry

CPC
G01R31/2614

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2614for measuring gain factor thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
IGBT module reliability evaluation method and device based on bondi...
- Patent number 11,378,613
- Issue date Jul 5, 2022
- WUHAN UNIVERSITY
- Yigang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slide screw tuners with offset tuning probes and method
- Patent number 10,686,239
- Issue date Jun 16, 2020
- Christos Tsironis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Slide screw tuners with offset tuning probes and method
- Patent number 10,637,122
- Issue date Apr 28, 2020
- Christos Tsironis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Hybrid harmonic tuner
- Patent number 10,345,370
- Issue date Jul 9, 2019
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated split signal hybrid harmonic tuner
- Patent number 10,187,228
- Issue date Jan 22, 2019
- Christos Tsironis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hybrid harmonic impedance tuner
- Patent number 10,177,429
- Issue date Jan 8, 2019
- Christos Tsironis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for determining a deterioration of power semiconductor modul...
- Patent number 10,168,381
- Issue date Jan 1, 2019
- Siemens Aktiengesellschaft
- Jimmy-Alexander Butron-Ccoa
- G01 - MEASURING TESTING
Information Patent Grant
Insulated gate bipolar transistor failure mode detection and protec...
- Patent number 9,726,712
- Issue date Aug 8, 2017
- General Electric Company
- Tao Wu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test circuit for bipolar junction transistor
- Patent number 8,922,238
- Issue date Dec 30, 2014
- HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- Yi-Xin Tu
- G01 - MEASURING TESTING
Information Patent Grant
Bipolar transistor circuit capable of high precision measurement of...
- Patent number 5,625,295
- Issue date Apr 29, 1997
- NEC Corporation
- Masakazu Kurisu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic transistor checker
- Patent number 5,414,373
- Issue date May 9, 1995
- Tandy Corporation
- Paul T. Schreiber
- G01 - MEASURING TESTING
Information Patent Grant
Automatic transistor checker
- Patent number 5,355,082
- Issue date Oct 11, 1994
- Tandy Corporation
- Paul T. Schreiber
- G01 - MEASURING TESTING
Information Patent Grant
In-circuit transistor beta test and method
- Patent number 4,801,878
- Issue date Jan 31, 1989
- Hewlett-Packard Company
- Ronald J. Peiffer
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with monitor pattern, and a method of monitori...
- Patent number 4,364,010
- Issue date Dec 14, 1982
- Fujitsu Limited
- Kiyoto Watari
- G01 - MEASURING TESTING
Information Patent Grant
3832633
- Patent number 3,832,633
- Issue date Aug 27, 1974
- G01 - MEASURING TESTING
Information Patent Grant
3707677
- Patent number 3,707,677
- Issue date Dec 26, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3666573
- Patent number 3,666,573
- Issue date May 30, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3622883
- Patent number 3,622,883
- Issue date Nov 23, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3594640
- Patent number 3,594,640
- Issue date Jul 20, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3538438
- Patent number 3,538,438
- Issue date Nov 3, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3430152
- Patent number 3,430,152
- Issue date Feb 25, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3370233
- Patent number 3,370,233
- Issue date Feb 20, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3287643
- Patent number 3,287,643
- Issue date Nov 22, 1966
- G01 - MEASURING TESTING
Information Patent Grant
3179888
- Patent number 3,179,888
- Issue date Apr 20, 1965
- G01 - MEASURING TESTING
Information Patent Grant
3153759
- Patent number 3,153,759
- Issue date Oct 20, 1964
- G01 - MEASURING TESTING
Information Patent Grant
3056924
- Patent number 3,056,924
- Issue date Oct 2, 1962
- G01 - MEASURING TESTING
Information Patent Grant
3026479
- Patent number 3,026,479
- Issue date Mar 20, 1962
- G01 - MEASURING TESTING
Information Patent Grant
3025468
- Patent number 3,025,468
- Issue date Mar 13, 1962
- G01 - MEASURING TESTING
Information Patent Grant
2946008
- Patent number 2,946,008
- Issue date Jul 19, 1960
- G01 - MEASURING TESTING
Information Patent Grant
2899642
- Patent number 2,899,642
- Issue date Aug 11, 1959
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSULATED GATE BIPOLAR TRANSISTOR FAILURE MODE DETECTION AND PROTEC...
- Publication number 20140368232
- Publication date Dec 18, 2014
- GENERAL ELECTRIC COMPANY
- Tao Wu
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR BIPOLAR JUNCTION TRANSISTOR
- Publication number 20120319720
- Publication date Dec 20, 2012
- HON HAI Precision Industry CO., LTD.
- YI-XIN TU
- G01 - MEASURING TESTING

for measuring gain factor thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

IGBT module reliability evaluation method and device based on bondi...

Slide screw tuners with offset tuning probes and method

Slide screw tuners with offset tuning probes and method

Hybrid harmonic tuner

Integrated split signal hybrid harmonic tuner

Hybrid harmonic impedance tuner

Method for determining a deterioration of power semiconductor modul...

Insulated gate bipolar transistor failure mode detection and protec...

Test circuit for bipolar junction transistor

Bipolar transistor circuit capable of high precision measurement of...

Automatic transistor checker

Automatic transistor checker

In-circuit transistor beta test and method

Semiconductor device with monitor pattern, and a method of monitori...

3832633

3707677

3666573

3622883

3594640

3538438

3430152

3370233

3287643

3179888

3153759

3056924

3026479

3025468

2946008

2899642

Patents Applicationslast 30 patents

INSULATED GATE BIPOLAR TRANSISTOR FAILURE MODE DETECTION AND PROTEC...

TEST CIRCUIT FOR BIPOLAR JUNCTION TRANSISTOR