3666573

Information

• Patent Grant
• 3666573

• References
• Source

• Patent Number

  3,666,573

• Date Filed

  Not available

• Date Issued

  Tuesday, May 30, 1972
  52 years ago

• CPC

  • H01L21/00 - Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • G01R31/2614 - for measuring gain factor thereof
  • H01L21/78 - with subsequent division of the substrate into plural individual devices
  • H01L22/20 - Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
  • H01L29/00 - Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier
  • Y10S148/085 - Isolated-integrated
  • Y10S148/162 - Testing steps

• US Classifications

  • 438 - Semiconductor device manufacturing: process
  • 148 - Metal treatment
  • 257 - Active solid-state devices