for measuring noise

Industry

CPC
G01R31/2616

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2616for measuring noise

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Noise parameter determination of scalable devices
- Patent number 11,747,384
- Issue date Sep 5, 2023
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurement system
- Patent number 10,852,343
- Issue date Dec 1, 2020
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Noise parameter measurement system
- Patent number 9,541,592
- Issue date Jan 10, 2017
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit evaluation method and electric circuit
- Patent number 9,470,735
- Issue date Oct 18, 2016
- Rohm Co., Ltd.
- Noriaki Hiraga
- G01 - MEASURING TESTING
Information Patent Grant
Using a shared local oscillator to make low-noise vector measurements
- Patent number 9,188,617
- Issue date Nov 17, 2015
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Grant
Method for asynchronous impulse response measurement between separa...
- Patent number 9,170,290
- Issue date Oct 27, 2015
- Audyssey Laboratories, Inc.
- Jeffrey Clark
- G01 - MEASURING TESTING
Information Patent Grant
Threshold voltage based power transistor operation
- Patent number 8,760,215
- Issue date Jun 24, 2014
- Delphi Technologies, Inc.
- Scott B. Kesler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
- Publication number 20220357390
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Ming HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Noise Parameter Determination of Scalable Devices
- Publication number 20210263091
- Publication date Aug 26, 2021
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Application
Noise Measurement System
- Publication number 20200209303
- Publication date Jul 2, 2020
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Application
Electric Circuit Evaluation Method and Electric Circuit
- Publication number 20140368213
- Publication date Dec 18, 2014
- Noriaki HIRAGA
- G01 - MEASURING TESTING
Information Patent Application
Using a Shared Local Oscillator to Make Low-noise Vector Measurements
- Publication number 20140306720
- Publication date Oct 16, 2014
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Application
BURST NOISE IN LINE TEST
- Publication number 20140253169
- Publication date Sep 11, 2014
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Application
THRESHOLD VOLTAGE BASED POWER TRANSISTOR OPERATION
- Publication number 20130015889
- Publication date Jan 17, 2013
- Delphi Technologies, Inc.
- SCOTT B. KESLER
- G01 - MEASURING TESTING

for measuring noise

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Noise parameter determination of scalable devices

Noise measurement system

Noise parameter measurement system

Electric circuit evaluation method and electric circuit

Using a shared local oscillator to make low-noise vector measurements

Method for asynchronous impulse response measurement between separa...

Threshold voltage based power transistor operation

Patents Applicationslast 30 patents

ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE

Noise Parameter Determination of Scalable Devices

Noise Measurement System

Electric Circuit Evaluation Method and Electric Circuit

Using a Shared Local Oscillator to Make Low-noise Vector Measurements

BURST NOISE IN LINE TEST

THRESHOLD VOLTAGE BASED POWER TRANSISTOR OPERATION