for measuring noise

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CPC
G01R31/2626

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2626for measuring noise

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Patents Grantslast 30 patents

Information Patent Grant
Direct current measurement of 1/f transistor noise
- Patent number 11,796,588
- Issue date Oct 24, 2023
- Texas Instruments Incorporated
- Yuguo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems to test semiconductor devices based on dynamica...
- Patent number 11,754,616
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chin-Hao Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Noise parameter determination of scalable devices
- Patent number 11,747,384
- Issue date Sep 5, 2023
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method, estimation method, evaluation apparatus, and com...
- Patent number 11,506,701
- Issue date Nov 22, 2022
- Fuji Electric Co., Ltd.
- Miwako Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Direct current measurement of 1/f transistor noise
- Patent number 11,249,130
- Issue date Feb 15, 2022
- Texas Instruments Incorporated
- Yuguo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method, estimation method, evaluation apparatus, and com...
- Patent number 11,143,691
- Issue date Oct 12, 2021
- Fuji Electric Co., Ltd.
- Hiroki Katsumata
- G01 - MEASURING TESTING
Information Patent Grant
Direct measurement test structures for measuring static random acce...
- Patent number 11,029,355
- Issue date Jun 8, 2021
- The Boeing Company
- Mark Yao
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of inspecting a semiconductor device
- Patent number 10,006,958
- Issue date Jun 26, 2018
- ABLIC INC.
- Kaoru Sakaguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Noise temperature extraction procedure for characterization of on-w...
- Patent number 9,500,688
- Issue date Nov 22, 2016
- The United States of America, as represented by the Secretary of the Navy
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Grant
Using a shared local oscillator to make low-noise vector measurements
- Patent number 9,188,617
- Issue date Nov 17, 2015
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Grant
Method for asynchronous impulse response measurement between separa...
- Patent number 9,170,290
- Issue date Oct 27, 2015
- Audyssey Laboratories, Inc.
- Jeffrey Clark
- G01 - MEASURING TESTING
Information Patent Grant
Variable impedance device
- Patent number 8,963,559
- Issue date Feb 24, 2015
- STMicroelectronics (Crolles 2) SAS
- Thomas Quemerais
- G01 - MEASURING TESTING
Information Patent Grant
Noise parameter measurement system and method
- Patent number 8,786,293
- Issue date Jul 22, 2014
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Method of extracting a time constant from complex random telegraph...
- Patent number 8,155,905
- Issue date Apr 10, 2012
- Hitachi, Ltd.
- Hiroshi Miki
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects in integrated circuits
- Patent number 6,043,662
- Issue date Mar 28, 2000
- Glenn Baldwin Alers
- G01 - MEASURING TESTING
Information Patent Grant
Detecting breakdown in dielectric layers
- Patent number 5,804,975
- Issue date Sep 8, 1998
- Lucent Technologies Inc.
- Glenn Baldwin Alers
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring FET noise parameters
- Patent number 4,908,570
- Issue date Mar 13, 1990
- Hughes Aircraft Company
- Madhu S. Gupta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE
- Publication number 20240377451
- Publication date Nov 14, 2024
- DENSO CORPORATION
- RYUKI TOMOHIRO
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CH...
- Publication number 20240243735
- Publication date Jul 18, 2024
- Intel NDTM US LLC
- Andreas KERBER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES
- Publication number 20230375611
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chin-Hao Chang
- G11 - INFORMATION STORAGE
Information Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
- Publication number 20220082608
- Publication date Mar 17, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Yuguo WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES
- Publication number 20210373068
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Chin-Hao Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Noise Parameter Determination of Scalable Devices
- Publication number 20210263091
- Publication date Aug 26, 2021
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Application
DIRECT MEASUREMENT TEST STRUCTURES FOR MEASURING STATIC RANDOM ACCE...
- Publication number 20200319243
- Publication date Oct 8, 2020
- The Boeing Company
- Mark Yao
- G11 - INFORMATION STORAGE
Information Patent Application
EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...
- Publication number 20200217884
- Publication date Jul 9, 2020
- Fuji Electric Co., Ltd.
- Miwako FUJITA
- G01 - MEASURING TESTING
Information Patent Application
RANDOM NUMBER GENERATION
- Publication number 20190272152
- Publication date Sep 5, 2019
- LIVERPOOL JOHN MOORES UNIVERSITY
- Zhigang JI
- G01 - MEASURING TESTING
Information Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
- Publication number 20190204375
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Yuguo WANG
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...
- Publication number 20190170807
- Publication date Jun 6, 2019
- Fuji Electric Co., Ltd.
- Hiroki KATSUMATA
- G01 - MEASURING TESTING
Information Patent Application
Using a Shared Local Oscillator to Make Low-noise Vector Measurements
- Publication number 20140306720
- Publication date Oct 16, 2014
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Application
Noise Temperature Extraction Procedure for Characterization of On-W...
- Publication number 20140081586
- Publication date Mar 20, 2014
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Application
Variable Impedance Device
- Publication number 20130099797
- Publication date Apr 25, 2013
- STMicroelectronics S.A.
- Thomas Quemerais
- G01 - MEASURING TESTING
Information Patent Application
Method of Extracting A Time Constant From Complex Random Telegraph...
- Publication number 20110022339
- Publication date Jan 27, 2011
- Hitachi, Ltd.
- Hiroshi MIKI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device and Testing Method Thereof, and Resistance Mea...
- Publication number 20070139034
- Publication date Jun 21, 2007
- Kabushiki Kaisha Toshiba
- Shuichi Takada
- G01 - MEASURING TESTING

for measuring noise

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Direct current measurement of 1/f transistor noise

Methods and systems to test semiconductor devices based on dynamica...

Noise parameter determination of scalable devices

Evaluation method, estimation method, evaluation apparatus, and com...

Direct current measurement of 1/f transistor noise

Evaluation method, estimation method, evaluation apparatus, and com...

Direct measurement test structures for measuring static random acce...

Non-contact method to monitor and quantify effective work function...

Semiconductor device and method of inspecting a semiconductor device

Noise temperature extraction procedure for characterization of on-w...

Using a shared local oscillator to make low-noise vector measurements

Method for asynchronous impulse response measurement between separa...

Variable impedance device

Noise parameter measurement system and method

Method of extracting a time constant from complex random telegraph...

Detecting defects in integrated circuits

Detecting breakdown in dielectric layers

Method of measuring FET noise parameters

Patents Applicationslast 30 patents

INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE

IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CH...

SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES

DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE

SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES

Noise Parameter Determination of Scalable Devices

DIRECT MEASUREMENT TEST STRUCTURES FOR MEASURING STATIC RANDOM ACCE...

EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...

RANDOM NUMBER GENERATION

DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE

EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...

Using a Shared Local Oscillator to Make Low-noise Vector Measurements

Noise Temperature Extraction Procedure for Characterization of On-W...

Variable Impedance Device

Method of Extracting A Time Constant From Complex Random Telegraph...

Semiconductor Device and Testing Method Thereof, and Resistance Mea...