for measuring roughness or irregularity of surfaces

Industry

CPC
G01B11/30

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/30for measuring roughness or irregularity of surfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring wafer profile
- Patent number 12,188,761
- Issue date Jan 7, 2025
- Shin-Etsu Handotai Co., Ltd.
- Masato Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System with substrate carrier deterioration detection and repair
- Patent number 12,162,134
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ortho-image creation system, ortho-image creation method, survey ma...
- Patent number 12,165,349
- Issue date Dec 10, 2024
- MR Support Inc.
- Shigeo Kusaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compact intraoral 3D scanner
- Patent number 12,156,785
- Issue date Dec 3, 2024
- Align Technology, Inc.
- Yossef Atiya
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Surface abnormality detection device and system
- Patent number 12,154,258
- Issue date Nov 26, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle with road surface condition detector
- Patent number 12,146,735
- Issue date Nov 19, 2024
- Honda Motor Co., Ltd.
- Ryosuke Yamazaki
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for measuring a surface topography of an object
- Patent number 12,146,740
- Issue date Nov 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Daniel Bublitz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-acoustic tomography defect testing system and method
- Patent number 12,146,861
- Issue date Nov 19, 2024
- Seurat Technologies, Inc.
- Francis L. Leard
- G01 - MEASURING TESTING
Information Patent Grant
Megasonic clean with cavity property monitoring
- Patent number 12,128,456
- Issue date Oct 29, 2024
- Applied Materials, Inc.
- Banqiu Wu
- B08 - CLEANING
Information Patent Grant
Phase unwrapping using segmentation
- Patent number 12,130,129
- Issue date Oct 29, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting texture of geometric element, geometric shape...
- Patent number 12,117,288
- Issue date Oct 15, 2024
- H.P.B. OPTOELECTRONICS CO., LTD.
- Hsuan-Yueh Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement device and interferometric method for d...
- Patent number 12,104,896
- Issue date Oct 1, 2024
- Polytec GmbH
- Henrik Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Interometric optical system
- Patent number 12,104,897
- Issue date Oct 1, 2024
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Surface roughness and emissivity determination
- Patent number 12,098,914
- Issue date Sep 24, 2024
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Grant
Control system for the quality of processing pipes made of thermopl...
- Patent number 12,094,103
- Issue date Sep 17, 2024
- SICA S.p.A.
- Lorenzo Spagna
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Web edge metrology
- Patent number 12,080,869
- Issue date Sep 3, 2024
- Applied Materials, Inc.
- David Masayuki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flatness roller, system for measuring flatness and line for associa...
- Patent number 12,076,769
- Issue date Sep 3, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sylvain Magne
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Measuring apparatus and method of wafer geometry
- Patent number 12,072,176
- Issue date Aug 27, 2024
- Nanjing ZhongAn Semiconductor Equipment Ltd
- An Andrew Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Image projection apparatus
- Patent number 12,071,065
- Issue date Aug 27, 2024
- MAXELL, LTD.
- Yasuhiko Kunii
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Surface topography measurement systems
- Patent number 12,075,148
- Issue date Aug 27, 2024
- GelSight, Inc.
- Janos Rohaly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection robot having adjustable resolution
- Patent number 12,061,484
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System, method, and apparatus for inspecting a surface
- Patent number 12,061,483
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 12,038,389
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting outliers and anomalies for OCD metrology machine learning
- Patent number 12,038,271
- Issue date Jul 16, 2024
- Nova Ltd.
- Eitan A. Rothstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...
- Publication number 20250003741
- Publication date Jan 2, 2025
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Yunfeng GE
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION APPARATUS
- Publication number 20240426758
- Publication date Dec 26, 2024
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...
- Publication number 20240418504
- Publication date Dec 19, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...
- Publication number 20240410689
- Publication date Dec 12, 2024
- Chengdu University of Technology
- Wenli ZHONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
- Publication number 20240401936
- Publication date Dec 5, 2024
- GELSIGHT, INC.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Application
RETROGRAPHIC SENSORS
- Publication number 20240384983
- Publication date Nov 21, 2024
- GELSIGHT, INC.
- Edward H. Adelson
- G01 - MEASURING TESTING
Information Patent Application
WEB EDGE METROLOGY
- Publication number 20240387792
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROJECTION APPARATUS
- Publication number 20240383396
- Publication date Nov 21, 2024
- Maxell, Ltd.
- Yasuhiko KUNII
- B60 - VEHICLES IN GENERAL
Information Patent Application
Three-Wavelengths Interferometric Measuring Device And Method
- Publication number 20240377183
- Publication date Nov 14, 2024
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD
- Publication number 20240369354
- Publication date Nov 7, 2024
- Interface Technology (ChengDu) Co., Ltd.
- LING-KUEI HUNG
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...
- Publication number 20240367701
- Publication date Nov 7, 2024
- MATE GmbH
- Daniel Ludwig MIHALIC
- B61 - RAILWAYS
Information Patent Application
OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...
- Publication number 20240361120
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoaki KATO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE IDENTIFICATION SENSOR USING REFLECTED LIGHT AND MACHINE LEA...
- Publication number 20240361122
- Publication date Oct 31, 2024
- Useful Sensors Inc.
- James Muyao Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE
- Publication number 20240345580
- Publication date Oct 17, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET
- Publication number 20240337482
- Publication date Oct 10, 2024
- Suyash Singh
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, METHOD FOR S...
- Publication number 20240328779
- Publication date Oct 3, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
- Publication number 20240318954
- Publication date Sep 26, 2024
- GELSIGHT, INC.
- Janos ROHALY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20240316775
- Publication date Sep 26, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
WAFER INSPECTION APPARATUS AND METHOD
- Publication number 20240319109
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin Chou
- G01 - MEASURING TESTING
Information Patent Application
CONSTRUCTION SURFACE FLATNESS DETECTOR
- Publication number 20240295396
- Publication date Sep 5, 2024
- CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT
- Ou ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Optical Metrology System and Methods for the Measurement of Optical...
- Publication number 20240288266
- Publication date Aug 29, 2024
- MBRYONICS Ltd
- Niamh Fitzgerald
- G01 - MEASURING TESTING
Information Patent Application
LENS DRIVING DEVICE, CAMERA MODULE, AND PORTABLE DEVICE
- Publication number 20240255729
- Publication date Aug 1, 2024
- LG Innotek Co., Ltd.
- TAE JIN JUNG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
RETROGRAPHIC SENSING
- Publication number 20240247930
- Publication date Jul 25, 2024
- GELSIGHT, INC.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240230547
- Publication date Jul 11, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING FLATNESS OF SUBSTRATE
- Publication number 20240230323
- Publication date Jul 11, 2024
- Darwin Precisions Corporation
- Chin-Wang HSU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES
- Publication number 20240191986
- Publication date Jun 13, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
- Publication number 20240183655
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Alexander VON FINCK
- G01 - MEASURING TESTING

for measuring roughness or irregularity of surfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring wafer profile

Device and method for inspecting reflective surfaces

Device and method for imaging and interferometry measurements

System with substrate carrier deterioration detection and repair

Ortho-image creation system, ortho-image creation method, survey ma...

System, apparatus and method for improved location identification w...

Compact intraoral 3D scanner

Surface abnormality detection device and system

Vehicle with road surface condition detector

Method and system for measuring a surface topography of an object

Photo-acoustic tomography defect testing system and method

Megasonic clean with cavity property monitoring

Phase unwrapping using segmentation

Method for detecting texture of geometric element, geometric shape...

Interferometric measurement device and interferometric method for d...

Interometric optical system

Surface roughness and emissivity determination

Control system for the quality of processing pipes made of thermopl...

System and method for evaluating a status of a material in metallur...

Web edge metrology

Flatness roller, system for measuring flatness and line for associa...

Measuring apparatus and method of wafer geometry

Image projection apparatus

Surface topography measurement systems

Inspection robot having adjustable resolution

System, method, and apparatus for inspecting a surface

Wafer surface defect inspection method and apparatus thereof

Method for evaluating defect in monoclinic gallium oxide

Wafer inspection apparatus and method

Detecting outliers and anomalies for OCD metrology machine learning

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...

IDENTIFICATION APPARATUS

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...

METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...

SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE

RETROGRAPHIC SENSORS

WEB EDGE METROLOGY

IMAGE PROJECTION APPARATUS

Three-Wavelengths Interferometric Measuring Device And Method

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...

SURFACE IDENTIFICATION SENSOR USING REFLECTED LIGHT AND MACHINE LEA...

SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE

A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, METHOD FOR S...

SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

WAFER INSPECTION APPARATUS AND METHOD

CONSTRUCTION SURFACE FLATNESS DETECTOR

Optical Metrology System and Methods for the Measurement of Optical...

LENS DRIVING DEVICE, CAMERA MODULE, AND PORTABLE DEVICE

RETROGRAPHIC SENSING

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

METHOD OF INSPECTING FLATNESS OF SUBSTRATE

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...