for measuring roughness or irregularity of surfaces

Industry

CPC
G01B11/30

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/30for measuring roughness or irregularity of surfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for characterising the roughness profile of a tis...
- Patent number 12,264,911
- Issue date Apr 1, 2025
- UNIVERSIDAD CARLOS III DE MADRID
- Roberto Fernández Fernández
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 12,259,320
- Issue date Mar 25, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yosuke Asai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting a defect in a specimen
- Patent number 12,253,472
- Issue date Mar 18, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Richard Paul Good
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting flatness of substrate
- Patent number 12,247,831
- Issue date Mar 11, 2025
- DARWIN PRECISIONS CORPORATION
- Chin-Wang Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining reasonable sampling interval with...
- Patent number 12,235,098
- Issue date Feb 25, 2025
- China University of Geosciences (Wuhan)
- Yunfeng Ge
- G01 - MEASURING TESTING
Information Patent Grant
Identification apparatus
- Patent number 12,228,517
- Issue date Feb 18, 2025
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Grant
Laser device and method of using the same
- Patent number 12,224,547
- Issue date Feb 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Hua Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring surface parameter of copper foil, method for s...
- Patent number 12,222,201
- Issue date Feb 11, 2025
- Mitsui Mining & Smelting Co., Ltd.
- Hiroaki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Rotatable inspection device for defect detection
- Patent number 12,209,858
- Issue date Jan 28, 2025
- SENSIMA INSPECTION SÅRL
- Marc Lany
- G01 - MEASURING TESTING
Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and program
- Patent number 12,198,419
- Issue date Jan 14, 2025
- Mitutoyo Corporation
- Takanori Asamizu
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring wafer profile
- Patent number 12,188,761
- Issue date Jan 7, 2025
- Shin-Etsu Handotai Co., Ltd.
- Masato Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System with substrate carrier deterioration detection and repair
- Patent number 12,162,134
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ortho-image creation system, ortho-image creation method, survey ma...
- Patent number 12,165,349
- Issue date Dec 10, 2024
- MR Support Inc.
- Shigeo Kusaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compact intraoral 3D scanner
- Patent number 12,156,785
- Issue date Dec 3, 2024
- Align Technology, Inc.
- Yossef Atiya
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Surface abnormality detection device and system
- Patent number 12,154,258
- Issue date Nov 26, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle with road surface condition detector
- Patent number 12,146,735
- Issue date Nov 19, 2024
- Honda Motor Co., Ltd.
- Ryosuke Yamazaki
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for measuring a surface topography of an object
- Patent number 12,146,740
- Issue date Nov 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Daniel Bublitz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-acoustic tomography defect testing system and method
- Patent number 12,146,861
- Issue date Nov 19, 2024
- Seurat Technologies, Inc.
- Francis L. Leard
- G01 - MEASURING TESTING
Information Patent Grant
Megasonic clean with cavity property monitoring
- Patent number 12,128,456
- Issue date Oct 29, 2024
- Applied Materials, Inc.
- Banqiu Wu
- B08 - CLEANING
Information Patent Grant
Phase unwrapping using segmentation
- Patent number 12,130,129
- Issue date Oct 29, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting texture of geometric element, geometric shape...
- Patent number 12,117,288
- Issue date Oct 15, 2024
- H.P.B. OPTOELECTRONICS CO., LTD.
- Hsuan-Yueh Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement device and interferometric method for d...
- Patent number 12,104,896
- Issue date Oct 1, 2024
- Polytec GmbH
- Henrik Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Interometric optical system
- Patent number 12,104,897
- Issue date Oct 1, 2024
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Surface roughness and emissivity determination
- Patent number 12,098,914
- Issue date Sep 24, 2024
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Grant
Control system for the quality of processing pipes made of thermopl...
- Patent number 12,094,103
- Issue date Sep 17, 2024
- SICA S.p.A.
- Lorenzo Spagna
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS
- Publication number 20250116512
- Publication date Apr 10, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbühler
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR
- Publication number 20250100161
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Ti WANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...
- Publication number 20250093152
- Publication date Mar 20, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING COMPACTION LAYER DEPTH DURING AGR...
- Publication number 20250089598
- Publication date Mar 20, 2025
- CNH INDUSTRIAL AMERICA LLC
- Brittany Schroeder
- G01 - MEASURING TESTING
Information Patent Application
INTRAORAL 3D SCANNER WITH HIGH GAIN FACTOR
- Publication number 20250090286
- Publication date Mar 20, 2025
- Align Technology, Inc.
- Yossef ATIYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...
- Publication number 20250076037
- Publication date Mar 6, 2025
- KDESIGN GMBH
- Richard ZIMMERMANN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
ORTHO-IMAGE CREATION SYSTEM, ORTHO-IMAGE CREATION METHOD, SURVEY MA...
- Publication number 20250054173
- Publication date Feb 13, 2025
- MR Support Inc.
- Shigeo Kusaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining Fracture Roughness from a Core
- Publication number 20250052644
- Publication date Feb 13, 2025
- Saudi Arabian Oil Company
- Mohammed M. Al-Fahmi
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS MEASURING SYSTEM, METHOD AND APPARATUS
- Publication number 20250044081
- Publication date Feb 6, 2025
- Hamar Laser Instruments, Inc.
- Carlos Araujo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20250033212
- Publication date Jan 30, 2025
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20250035434
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- AKIRA HASHIYA
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL
- Publication number 20250035435
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Hiroki GOTO
- G01 - MEASURING TESTING
Information Patent Application
DETECTING OUTLIERS AND ANOMALIES FOR OCD METROLOGY MACHINE LEARNING
- Publication number 20250027767
- Publication date Jan 23, 2025
- NOVA LTD
- EITAN A. ROTHSTEIN
- G01 - MEASURING TESTING
Information Patent Application
ROLLED PRODUCT WINDING SYSTEM AND METHOD
- Publication number 20250026606
- Publication date Jan 23, 2025
- SMS GROUP S.P.A.
- Francesco CAUDURO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER USING SAME
- Publication number 20250020445
- Publication date Jan 16, 2025
- Korea Research Institute of Standards and Science
- Chan Yong HWANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...
- Publication number 20250003741
- Publication date Jan 2, 2025
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Yunfeng GE
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION APPARATUS
- Publication number 20240426758
- Publication date Dec 26, 2024
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...
- Publication number 20240418504
- Publication date Dec 19, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...
- Publication number 20240410689
- Publication date Dec 12, 2024
- Chengdu University of Technology
- Wenli ZHONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
- Publication number 20240401936
- Publication date Dec 5, 2024
- GELSIGHT, INC.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Application
RETROGRAPHIC SENSORS
- Publication number 20240384983
- Publication date Nov 21, 2024
- GELSIGHT, INC.
- Edward H. Adelson
- G01 - MEASURING TESTING
Information Patent Application
WEB EDGE METROLOGY
- Publication number 20240387792
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROJECTION APPARATUS
- Publication number 20240383396
- Publication date Nov 21, 2024
- Maxell, Ltd.
- Yasuhiko KUNII
- B60 - VEHICLES IN GENERAL
Information Patent Application
Three-Wavelengths Interferometric Measuring Device And Method
- Publication number 20240377183
- Publication date Nov 14, 2024
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION
- Publication number 20240369355
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaki NAKAMORI
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD
- Publication number 20240369354
- Publication date Nov 7, 2024
- Interface Technology (ChengDu) Co., Ltd.
- LING-KUEI HUNG
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...
- Publication number 20240367701
- Publication date Nov 7, 2024
- MATE GmbH
- Daniel Ludwig MIHALIC
- B61 - RAILWAYS

for measuring roughness or irregularity of surfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for characterising the roughness profile of a tis...

Imaging device

System and method for detecting a defect in a specimen

Method of inspecting flatness of substrate

Method and device for determining reasonable sampling interval with...

Identification apparatus

Laser device and method of using the same

Method for measuring surface parameter of copper foil, method for s...

Rotatable inspection device for defect detection

Compact snapshot dual-mode interferometric system

Measurement system and program

Method for measuring wafer profile

Device and method for inspecting reflective surfaces

Device and method for imaging and interferometry measurements

System with substrate carrier deterioration detection and repair

Ortho-image creation system, ortho-image creation method, survey ma...

System, apparatus and method for improved location identification w...

Compact intraoral 3D scanner

Surface abnormality detection device and system

Vehicle with road surface condition detector

Method and system for measuring a surface topography of an object

Photo-acoustic tomography defect testing system and method

Megasonic clean with cavity property monitoring

Phase unwrapping using segmentation

Method for detecting texture of geometric element, geometric shape...

Interferometric measurement device and interferometric method for d...

Interometric optical system

Surface roughness and emissivity determination

Control system for the quality of processing pipes made of thermopl...

System and method for evaluating a status of a material in metallur...

Patents Applicationslast 30 patents

TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS

SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR

OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...

SYSTEM AND METHOD FOR DETERMINING COMPACTION LAYER DEPTH DURING AGR...

INTRAORAL 3D SCANNER WITH HIGH GAIN FACTOR

METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...

TOPOGRAPHICAL INSPECTION

ORTHO-IMAGE CREATION SYSTEM, ORTHO-IMAGE CREATION METHOD, SURVEY MA...

Determining Fracture Roughness from a Core

FLATNESS MEASURING SYSTEM, METHOD AND APPARATUS

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MACHINE TOOL

DETECTING OUTLIERS AND ANOMALIES FOR OCD METROLOGY MACHINE LEARNING

ROLLED PRODUCT WINDING SYSTEM AND METHOD

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

WAFER INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER USING SAME

METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...

IDENTIFICATION APPARATUS

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...

METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS...

SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE

RETROGRAPHIC SENSORS

WEB EDGE METROLOGY

IMAGE PROJECTION APPARATUS

Three-Wavelengths Interferometric Measuring Device And Method

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...