for measuring roughness or irregularity of surfaces

Industry

CPC
G01B11/30

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/30for measuring roughness or irregularity of surfaces

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
- Patent number 12,358,141
- Issue date Jul 15, 2025
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Pattern measurement system, pattern measurement method, and program...
- Patent number 12,347,074
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshimasa Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,347,087
- Issue date Jul 1, 2025
- NEC Corporation
- Nana Jumonji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,345,521
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Jin Yong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a material property of an object
- Patent number 12,332,045
- Issue date Jun 17, 2025
- M-XR LIMITED
- Elliott Paul Edward Round
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluid tactile sensors
- Patent number 12,332,046
- Issue date Jun 17, 2025
- GelSight, Inc.
- Janos Rohaly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for inspecting a surface with artifical intellige...
- Patent number 12,320,759
- Issue date Jun 3, 2025
- Virtek Vision International Inc.
- Ahmed Elhossini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-coherence interferometer with surface power compensation
- Patent number 12,305,981
- Issue date May 20, 2025
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Optical system using enhanced static fringe capture
- Patent number 12,305,976
- Issue date May 20, 2025
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating agricultural field surface profil...
- Patent number 12,298,443
- Issue date May 13, 2025
- Surya Saket Dasika
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Flatness measuring system, method and apparatus
- Patent number 12,276,495
- Issue date Apr 15, 2025
- Hamar Laser Instruments, Inc.
- Carlos Araujo
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus, processing device, optical inspection...
- Patent number 12,276,616
- Issue date Apr 15, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for characterising the roughness profile of a tis...
- Patent number 12,264,911
- Issue date Apr 1, 2025
- UNIVERSIDAD CARLOS III DE MADRID
- Roberto Fernández Fernández
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 12,259,320
- Issue date Mar 25, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yosuke Asai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting a defect in a specimen
- Patent number 12,253,472
- Issue date Mar 18, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Richard Paul Good
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting flatness of substrate
- Patent number 12,247,831
- Issue date Mar 11, 2025
- DARWIN PRECISIONS CORPORATION
- Chin-Wang Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining reasonable sampling interval with...
- Patent number 12,235,098
- Issue date Feb 25, 2025
- China University of Geosciences (Wuhan)
- Yunfeng Ge
- G01 - MEASURING TESTING
Information Patent Grant
Identification apparatus
- Patent number 12,228,517
- Issue date Feb 18, 2025
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Grant
Laser device and method of using the same
- Patent number 12,224,547
- Issue date Feb 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Hua Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring surface parameter of copper foil, method for s...
- Patent number 12,222,201
- Issue date Feb 11, 2025
- Mitsui Mining & Smelting Co., Ltd.
- Hiroaki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Rotatable inspection device for defect detection
- Patent number 12,209,858
- Issue date Jan 28, 2025
- SENSIMA INSPECTION SÅRL
- Marc Lany
- G01 - MEASURING TESTING
Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and program
- Patent number 12,198,419
- Issue date Jan 14, 2025
- Mitutoyo Corporation
- Takanori Asamizu
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring wafer profile
- Patent number 12,188,761
- Issue date Jan 7, 2025
- Shin-Etsu Handotai Co., Ltd.
- Masato Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ortho-image creation system, ortho-image creation method, survey ma...
- Patent number 12,165,349
- Issue date Dec 10, 2024
- MR Support Inc.
- Shigeo Kusaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System with substrate carrier deterioration detection and repair
- Patent number 12,162,134
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compact intraoral 3D scanner
- Patent number 12,156,785
- Issue date Dec 3, 2024
- Align Technology, Inc.
- Yossef Atiya
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
Coating Thickness Measuring Device and Coating Device Including the...
- Publication number 20250231020
- Publication date Jul 17, 2025
- LG CHEM, LTD.
- Do-Hyun Lee
- G01 - MEASURING TESTING
Information Patent Application
GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...
- Publication number 20250234468
- Publication date Jul 17, 2025
- DAI NIPPON PRINTING CO., LTD.
- Makoto NANAUMI
- B32 - LAYERED PRODUCTS
Information Patent Application
METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...
- Publication number 20250231019
- Publication date Jul 17, 2025
- MITUTOYO CORPORATION
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing and inspecting a factory joint during inst...
- Publication number 20250217961
- Publication date Jul 3, 2025
- NEXANS
- Espen DOEDENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Multi-Surface Profile Estimation via Optica...
- Publication number 20250207906
- Publication date Jun 26, 2025
- Mitsubishi Electric Research Laboratories, Inc.
- Joshua Rapp
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ROUGHNESS CALCULATION DEVICE
- Publication number 20250207913
- Publication date Jun 26, 2025
- Sumitomo Heavy Industries, Ltd.
- Yoshitaka IGARASHI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TOPOGRAPHY MEASUREMENT SYSTEMS
- Publication number 20250203192
- Publication date Jun 19, 2025
- GELSIGHT, INC.
- Janos Rohaly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF AND DEVICE FOR IDENTIFYING ROAD DISTRESS ON A ROAD BASED...
- Publication number 20250191380
- Publication date Jun 12, 2025
- FNV IP B.V.
- Marcus NEPVEAUX
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...
- Publication number 20250182267
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Jaemin Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES FOR DIFFERENT SUPP...
- Publication number 20250164241
- Publication date May 22, 2025
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
- Publication number 20250164238
- Publication date May 22, 2025
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ANALYSING THE SURFACE QUALITY OF A SUBSTRAT...
- Publication number 20250164239
- Publication date May 22, 2025
- IMAGINE OPTIC
- Xavier Levecq
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES
- Publication number 20250164240
- Publication date May 22, 2025
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE FOR HIGH-FREQUENCY DEVICE, AND METHOD FOR PRODUCING SAME
- Publication number 20250154646
- Publication date May 15, 2025
- Shin-Etsu Handotai Co., Ltd.
- Toshiki MATSUBARA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
LASER DEVICE AND METHOD OF USING THE SAME
- Publication number 20250149844
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hua HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNEVENNESS MEASURING DEVICE FOR SHEET-SHAPED MATERIAL, AND UNEVENNE...
- Publication number 20250139755
- Publication date May 1, 2025
- TORAY INDUSTRIES, INC.
- Shota Oishi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20250137777
- Publication date May 1, 2025
- Fuji Electric Co., Ltd.
- Shunya HAYASHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS
- Publication number 20250116512
- Publication date Apr 10, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbühler
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR
- Publication number 20250100161
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Ti WANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...
- Publication number 20250093152
- Publication date Mar 20, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING COMPACTION LAYER DEPTH DURING AGR...
- Publication number 20250089598
- Publication date Mar 20, 2025
- CNH INDUSTRIAL AMERICA LLC
- Brittany Schroeder
- G01 - MEASURING TESTING
Information Patent Application
INTRAORAL 3D SCANNER WITH HIGH GAIN FACTOR
- Publication number 20250090286
- Publication date Mar 20, 2025
- Align Technology, Inc.
- Yossef ATIYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...
- Publication number 20250076037
- Publication date Mar 6, 2025
- KDESIGN GMBH
- Richard ZIMMERMANN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
ORTHO-IMAGE CREATION SYSTEM, ORTHO-IMAGE CREATION METHOD, SURVEY MA...
- Publication number 20250054173
- Publication date Feb 13, 2025
- MR Support Inc.
- Shigeo Kusaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining Fracture Roughness from a Core
- Publication number 20250052644
- Publication date Feb 13, 2025
- Saudi Arabian Oil Company
- Mohammed M. Al-Fahmi
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS MEASURING SYSTEM, METHOD AND APPARATUS
- Publication number 20250044081
- Publication date Feb 6, 2025
- Hamar Laser Instruments, Inc.
- Carlos Araujo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20250033212
- Publication date Jan 30, 2025
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20250035434
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- AKIRA HASHIYA
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL
- Publication number 20250035435
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Hiroki GOTO
- G01 - MEASURING TESTING

for measuring roughness or irregularity of surfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, methods, and apparatus for providing interactive inspectio...

Pattern measurement system, pattern measurement method, and program...

Deterioration diagnosis device, deterioration diagnosis method, and...

Optical measurement apparatus, measuring method using the same, and...

Method for determining a material property of an object

Fluid tactile sensors

Method and system for inspecting a surface with artifical intellige...

Low-coherence interferometer with surface power compensation

Optical system using enhanced static fringe capture

System and method for calibrating agricultural field surface profil...

Flatness measuring system, method and apparatus

Optical inspection apparatus, processing device, optical inspection...

Device and method for characterising the roughness profile of a tis...

Imaging device

System and method for detecting a defect in a specimen

Method of inspecting flatness of substrate

Method and device for determining reasonable sampling interval with...

Identification apparatus

Laser device and method of using the same

Method for measuring surface parameter of copper foil, method for s...

Rotatable inspection device for defect detection

Compact snapshot dual-mode interferometric system

Measurement system and program

Method for measuring wafer profile

Device and method for inspecting reflective surfaces

Device and method for imaging and interferometry measurements

Ortho-image creation system, ortho-image creation method, survey ma...

System with substrate carrier deterioration detection and repair

System, apparatus and method for improved location identification w...

Compact intraoral 3D scanner

Patents Applicationslast 30 patents

Coating Thickness Measuring Device and Coating Device Including the...

GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...

METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...

Method for manufacturing and inspecting a factory joint during inst...

Systems and Methods for Multi-Surface Profile Estimation via Optica...

SURFACE ROUGHNESS CALCULATION DEVICE

SURFACE TOPOGRAPHY MEASUREMENT SYSTEMS

METHOD OF AND DEVICE FOR IDENTIFYING ROAD DISTRESS ON A ROAD BASED...

SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...

ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES FOR DIFFERENT SUPP...

SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

SYSTEMS AND METHODS FOR ANALYSING THE SURFACE QUALITY OF A SUBSTRAT...

FLATNESS ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES

SUBSTRATE FOR HIGH-FREQUENCY DEVICE, AND METHOD FOR PRODUCING SAME

LASER DEVICE AND METHOD OF USING THE SAME

UNEVENNESS MEASURING DEVICE FOR SHEET-SHAPED MATERIAL, AND UNEVENNE...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS

SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR

OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...

SYSTEM AND METHOD FOR DETERMINING COMPACTION LAYER DEPTH DURING AGR...

INTRAORAL 3D SCANNER WITH HIGH GAIN FACTOR

METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...

TOPOGRAPHICAL INSPECTION

ORTHO-IMAGE CREATION SYSTEM, ORTHO-IMAGE CREATION METHOD, SURVEY MA...

Determining Fracture Roughness from a Core

FLATNESS MEASURING SYSTEM, METHOD AND APPARATUS

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MACHINE TOOL