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G01B11/06
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00
Measuring arrangements characterised by the use of optical means
Current Industry
G01B11/06
for measuring thickness
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Mobile device for measuring amount of snowfall and method of contro...
Patent number
11,982,786
Issue date
May 14, 2024
NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for augmentation of sensor systems and imaging...
Patent number
11,982,775
Issue date
May 14, 2024
Intrinsic Innovation LLC
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Overheight and wide load detection system and method thereof
Patent number
11,977,160
Issue date
May 7, 2024
Zahid F. Mian
G08 - SIGNALLING
Information
Patent Grant
Method and microscope for determining the thickness of a cover slip...
Patent number
11,971,531
Issue date
Apr 30, 2024
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement system, temperature measurement method, and...
Patent number
11,972,921
Issue date
Apr 30, 2024
Tokyo Electron Limited
Takeshi Kobayashi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and THz measuring device for measuring a measurement object...
Patent number
11,971,350
Issue date
Apr 30, 2024
1NOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
Ralph Klose
G01 - MEASURING TESTING
Information
Patent Grant
Endpoint detection system for enhanced spectral data collection
Patent number
11,965,798
Issue date
Apr 23, 2024
Applied Materials, Inc.
Pengyu Han
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring film thickness distribution of wafer with thin...
Patent number
11,965,730
Issue date
Apr 23, 2024
Shin-Etsu Handotai Co., Ltd.
Susumu Kuwabara
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent piping inspection machine
Patent number
11,965,728
Issue date
Apr 23, 2024
Saudi Arabian Oil Company
Mazin M. Fathi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Height measuring device and beam irradiation device
Patent number
11,959,735
Issue date
Apr 16, 2024
Hitachi High-Technologies Corporation
Naoya Nakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Estimating gemstone weight in mounted settings
Patent number
11,959,796
Issue date
Apr 16, 2024
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle wheel assembly position measurement method and apparatus th...
Patent number
11,953,315
Issue date
Apr 9, 2024
Mazda Motor Corporation
Taiga Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Automated non-contact thickness inspection and projection system us...
Patent number
11,953,309
Issue date
Apr 9, 2024
Lockheed Martin Corporation
Shane Whitaker
G01 - MEASURING TESTING
Information
Patent Grant
Film thickness measuring apparatus and film thickness measuring met...
Patent number
11,939,665
Issue date
Mar 26, 2024
Tokyo Electron Limted
Masato Shinada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Appearance inspection device and defect inspection method
Patent number
11,936,985
Issue date
Mar 19, 2024
Omron Corporation
Shingo Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Multiple reflectometry for measuring etch parameters
Patent number
11,927,543
Issue date
Mar 12, 2024
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Method for creating wafer shape data
Patent number
11,928,178
Issue date
Mar 12, 2024
Shin-Etsu Handotai Co., Ltd.
Masato Ohnishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Three-dimensional measurement apparatus and three-dimensional measu...
Patent number
11,930,600
Issue date
Mar 12, 2024
CKD Corporation
Takayuki Shinyama
G01 - MEASURING TESTING
Information
Patent Grant
Tubing dimensional measurement system
Patent number
11,920,914
Issue date
Mar 5, 2024
Corning Incorporated
Jerry Lee Hepburn
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Apparatus for controlling the printing on cable
Patent number
11,915,069
Issue date
Feb 27, 2024
Encore Wire Corporation
William T. Bigbee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical metrology tool equipped with modulated illumination sources
Patent number
11,913,874
Issue date
Feb 27, 2024
KLA Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive method for measuring thickness of three-layered rei...
Patent number
11,913,773
Issue date
Feb 27, 2024
LG Chem, Ltd.
Sung-Hyun Yun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser absorptivity measurement device
Patent number
11,913,830
Issue date
Feb 27, 2024
National Technology & Engineering Solutions of Sandia, LLC
Daniel Tung
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive gap metrology
Patent number
11,913,772
Issue date
Feb 27, 2024
Intel Corporation
Jianyong Mo
G01 - MEASURING TESTING
Information
Patent Grant
MEMS optical microphone
Patent number
11,917,366
Issue date
Feb 27, 2024
AAC Acoustic Technologies (Shenzhen) Co., Ltd.
Taimoor Ali
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Polishing apparatus and polishing method
Patent number
11,911,867
Issue date
Feb 27, 2024
Ebara Corporation
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Grant
Systems for determining at least one condition proximate the system
Patent number
11,906,282
Issue date
Feb 20, 2024
Baker Hughes Holdings LLC
Anusha Chilukuri
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method and system for non-destructive metrology of thin layers
Patent number
11,906,451
Issue date
Feb 20, 2024
Nova Ltd.
Wei Ti Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-situ metrology and process control
Patent number
11,908,718
Issue date
Feb 20, 2024
Applied Materials, Inc.
Ramesh Krishnamurthy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for measuring thickness and refractive index of m...
Patent number
11,906,281
Issue date
Feb 20, 2024
Korea Research Institute of Standards and Science
Young-Sik Ghim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NON-DESTRUCTIVE ESTIMATION OF COATING LAYER THICKNESS BASED ON SWEE...
Publication number
20240151515
Publication date
May 9, 2024
TATA CONSULTANCY SERVICES LIMITED
ABHIJEET GOREY
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
Publication number
20240142495
Publication date
May 2, 2024
Sumitomo Electric Industries, Ltd.
Kosuke FUJII
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THE AUTOMATED VALIDATION OF A SEMI-ANECHOIC C...
Publication number
20240142507
Publication date
May 2, 2024
Phillip C. MILLER
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE FOR DETERMINING A DISTRIBUTION OF A HEAT TRANSFER...
Publication number
20240142222
Publication date
May 2, 2024
Deutsches Zentrum für Luft- und Raumfahrt e.V.
Austin Franke
F24 - HEATING RANGES VENTILATING
Information
Patent Application
DICHROIC MIRROR AND SHORTPASS FILTER FOR IN-SITU REFLECTOMETRY
Publication number
20240141551
Publication date
May 2, 2024
Applied Materials, Inc.
Khokan C. PAUL
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
IN-SITU REFLECTOMETRY FOR REAL-TIME PROCESS CONTROL
Publication number
20240142223
Publication date
May 2, 2024
Applied Materials, Inc.
Khokan C. PAUL
G01 - MEASURING TESTING
Information
Patent Application
HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
Publication number
20240133674
Publication date
Apr 25, 2024
THE FIRST AFFILIATED HOSPITAL OF JINAN UNIVERSITY (GUANGZHOU OVERSEAS CHINESE
Shuixing Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method And Device For Measuring Height Of Pouch Cup Portion Accommo...
Publication number
20240133677
Publication date
Apr 25, 2024
LG ENERGY SOLUTION, LTD.
Daehyung Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
Publication number
20240125589
Publication date
Apr 18, 2024
Hamamatsu Photonics K.K.
Kenichi OHTSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT
Publication number
20240128102
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
SUNGHO JANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONCRETE SURFACE MAPPING ROBOTS, SYSTEMS, AND METHODS FOR PROCESSIN...
Publication number
20240118715
Publication date
Apr 11, 2024
HUSQVARNA AB
Andreas Jönsson
B24 - GRINDING POLISHING
Information
Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
Publication number
20240118072
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Sungho Jang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE COMPUTER ASSISTED DETERMINATION OF PHYSICAL PROPERTI...
Publication number
20240118075
Publication date
Apr 11, 2024
UNIVERSITAT KONSTANZ
Gabriel MICARD
G01 - MEASURING TESTING
Information
Patent Application
PREDICTIVE BIOMASS MAP GENERATION AND CONTROL
Publication number
20240107943
Publication date
Apr 4, 2024
Deere & Company
Nathan R. VANDIKE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF DETECTING ABNORMALITY IN MEASURING OF FILM THICKNESS OF W...
Publication number
20240102791
Publication date
Mar 28, 2024
EBARA CORPORATION
Akira Nakamura
B24 - GRINDING POLISHING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...
Publication number
20240093983
Publication date
Mar 21, 2024
PaneraTech, Inc.
Yakup Bayram
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED WAFER BOW MEASUREMENTS
Publication number
20240094144
Publication date
Mar 21, 2024
LAM RESEARCH CORPORATION
Rajan Arora
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING AND PUNCHING A DIFFUSION LAYER...
Publication number
20240091971
Publication date
Mar 21, 2024
Hyundai Motor Company
Pil Young Lee
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Mesh Integrity Check
Publication number
20240085171
Publication date
Mar 14, 2024
Carl Zeiss SMT GMBH
David Laemmle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
Publication number
20240078450
Publication date
Mar 7, 2024
NOVA LTD
EITAN ROTHSTEIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR MEASURING DEGREE OF...
Publication number
20240079221
Publication date
Mar 7, 2024
SEMES CO., LTD.
Chul Ho WON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Simultaneous Multi-Surface Non-Contact Optical Profiler
Publication number
20240077381
Publication date
Mar 7, 2024
Opto-Alignment Technology, Inc.
Rognvald P. Garden
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING THIN FILM AND DEVICE FOR ANALYZING THIN FILM
Publication number
20240077303
Publication date
Mar 7, 2024
SAMSUNG DISPLAY CO., LTD.
GIHYUN LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL METHOD, CONTROL APPARATUS, TRAINING METHOD, AND TRAINING AP...
Publication number
20240066657
Publication date
Feb 29, 2024
KCTECH CO., LTD.
Ji Hoon SON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR MEASURING DEGREE OF...
Publication number
20240071736
Publication date
Feb 29, 2024
SEMES CO., LTD.
Chul Ho WON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
Publication number
20240068800
Publication date
Feb 29, 2024
SAMSUNG DISPLAY CO., LTD.
Sang Heon YE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR MEASURING THICKNESS OF SEALING PORTION OF SECONDARY B...
Publication number
20240060767
Publication date
Feb 22, 2024
SK On Co., Ltd.
Young Rae OH
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Liquid Dispense and Coverage Control
Publication number
20240042472
Publication date
Feb 8, 2024
TOKYO ELECTRON LIMITED
Mirko VUKOVIC
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
GAME TOKEN MANAGEMENT SYSTEM
Publication number
20240046759
Publication date
Feb 8, 2024
ANGEL GROUP CO., LTD.
Yasushi SHIGETA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Film Thickness Measurement Device and Method
Publication number
20240044637
Publication date
Feb 8, 2024
Yurina Tanaka
G06 - COMPUTING CALCULATING COUNTING