for testing charge coupled devices

Industry

CPC
G01R31/2641

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2641for testing charge coupled devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,215,526
- Issue date Jan 4, 2022
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Katsuji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing an image sensor and motor vehicle
- Patent number 9,681,124
- Issue date Jun 13, 2017
- Robert Bosch GmbH
- Frank Moesle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Circuit for continuously measuring discontinuous metal insulator tr...
- Patent number 8,207,750
- Issue date Jun 26, 2012
- Electronics and Telecommunications Research Institute
- Hyun-Tak Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical device inspecting apparatus
- Patent number 8,159,659
- Issue date Apr 17, 2012
- Japan Electronic Materials Corp.
- Shigemi Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Integrated light conditioning devices on a probe card for testing i...
- Patent number 7,868,630
- Issue date Jan 11, 2011
- Micron Technology, Inc.
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing CMOS image sensor
- Patent number 7,251,576
- Issue date Jul 31, 2007
- Advanced Semiconductor Engineering, Inc.
- Heng-Lung Su
- G01 - MEASURING TESTING
Information Patent Grant
Charge collection control circuit for use with charge-coupled photo...
- Patent number 5,268,567
- Issue date Dec 7, 1993
- X-ray Scanner Corporation
- James O. Bowlby
- G01 - MEASURING TESTING
Information Patent Grant
Non-linear photosite response in CCD imagers
- Patent number 5,055,667
- Issue date Oct 8, 1991
- Loral Fairchild Corporation
- Michel Sayag
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a charge-coupled device
- Patent number 4,942,357
- Issue date Jul 17, 1990
- Eastman Kodak Company
- Win-Chyi Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DEVICE INSPECTING APPARATUS
- Publication number 20120194211
- Publication date Aug 2, 2012
- Shigemi Osawa
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR CONTINUOUSLY MEASURING DISCONTINUOUS METAL INSULATOR TR...
- Publication number 20100182034
- Publication date Jul 22, 2010
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Hyun-Tak Kim
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE INSPECTING APPARATUS
- Publication number 20100053601
- Publication date Mar 4, 2010
- Shigemi Osawa
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED LIGHT CONDITIONING DEVICES ON A PROBE CARD FOR TESTING I...
- Publication number 20090002001
- Publication date Jan 1, 2009
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY
- Publication number 20080290890
- Publication date Nov 27, 2008
- HON HAI Precision Industry CO., LTD.
- CHI-JEN CHEN
- G01 - MEASURING TESTING
Information Patent Application
Light shaping apparatus
- Publication number 20080149853
- Publication date Jun 26, 2008
- Micron Technology, Inc.
- David E. Hebert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image sensor test apparatus
- Publication number 20070159532
- Publication date Jul 12, 2007
- Advantest Corporation
- Toshiyuki Kiyokawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Imaging test socket, system, and method of testing an image sensor...
- Publication number 20060284631
- Publication date Dec 21, 2006
- Steven L. Hamren
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing CMOS image sensor
- Publication number 20060036391
- Publication date Feb 16, 2006
- Heng-Lung Su
- G01 - MEASURING TESTING

for testing charge coupled devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Method and device for testing an image sensor and motor vehicle

Circuit for continuously measuring discontinuous metal insulator tr...

Optical device inspecting apparatus

Integrated light conditioning devices on a probe card for testing i...

System and method for testing CMOS image sensor

Charge collection control circuit for use with charge-coupled photo...

Non-linear photosite response in CCD imagers

Method of testing a charge-coupled device

Patents Applicationslast 30 patents

OPTICAL DEVICE INSPECTING APPARATUS

CIRCUIT FOR CONTINUOUSLY MEASURING DISCONTINUOUS METAL INSULATOR TR...

OPTICAL DEVICE INSPECTING APPARATUS

INTEGRATED LIGHT CONDITIONING DEVICES ON A PROBE CARD FOR TESTING I...

TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY

Light shaping apparatus

Image sensor test apparatus

Imaging test socket, system, and method of testing an image sensor...

System and method for testing CMOS image sensor