TREA

for testing individual semiconductor components within integrated circuits

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Industry

  • CPC
  • G01R31/275
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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/275for testing individual semiconductor components within integrated circuits
Industries