for testing printed circuit boards

Industry

CPC
G01R1/07328

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07328for testing printed circuit boards

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe card
- Patent number 12,332,278
- Issue date Jun 17, 2025
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 12,313,655
- Issue date May 27, 2025
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and circuit board inspection apparatus including the...
- Patent number 12,055,579
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Fixture
- Patent number 11,885,831
- Issue date Jan 30, 2024
- Beijing BOE Chatani Electro Co., Ltd.
- Yingqiu Yang
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board for semiconductor test
- Patent number 11,852,679
- Issue date Dec 26, 2023
- MPI Corporation
- Shih-Ching Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe card testing device
- Patent number 11,808,787
- Issue date Nov 7, 2023
- Unimicron Technology Corp.
- Tzyy-Jang Tseng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board
- Patent number 11,754,617
- Issue date Sep 12, 2023
- TANAZAWA HAKKOSHA CO., LTD.
- Keiichiro Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe assembly with two spaced probes for high frequency circuit bo...
- Patent number 11,674,979
- Issue date Jun 13, 2023
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Grant
Force deflection and resistance testing system and method of use
- Patent number 11,668,731
- Issue date Jun 6, 2023
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus
- Patent number 11,536,765
- Issue date Dec 27, 2022
- MPI CORPORATION
- Kang-Yen Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe and inspecting socket including the same
- Patent number 11,360,118
- Issue date Jun 14, 2022
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Force deflection and resistance testing system and method of use
- Patent number 11,313,880
- Issue date Apr 26, 2022
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
Test adapter
- Patent number 11,289,843
- Issue date Mar 29, 2022
- Samsung Electronics Co., Ltd.
- Yumei Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and fence-like probe thereof
- Patent number 11,226,354
- Issue date Jan 18, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,204,368
- Issue date Dec 21, 2021
- Yokowo Co., Ltd.
- Masaki Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
High accuracy electrical test interconnection device and method for...
- Patent number 11,067,601
- Issue date Jul 20, 2021
- Donald DeMille
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and method for testing a printed circuit board
- Patent number 11,061,065
- Issue date Jul 13, 2021
- Xcerra Corp.
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,035,885
- Issue date Jun 15, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe socket
- Patent number 10,884,047
- Issue date Jan 5, 2021
- LEENO INDUSTRIAL INC.
- Jae-hwan Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment (ATE) contactor adaptor
- Patent number 10,866,275
- Issue date Dec 15, 2020
- Texas Instruments Incorporated
- Raymond Joseph Ochotorena
- G01 - MEASURING TESTING
Information Patent Grant
System and device for automatic signal measurement
- Patent number 10,775,428
- Issue date Sep 15, 2020
- DFI Inc.
- Chia-yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card and contact inspection device
- Patent number 10,775,411
- Issue date Sep 15, 2020
- KABUSHIKI KAISHA NIHON MICRONICS
- Tetsuya Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Force deflection and resistance testing system and method of use
- Patent number 10,705,120
- Issue date Jul 7, 2020
- Modus Test, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial electrical interconnect
- Patent number 10,693,266
- Issue date Jun 23, 2020
- Raytheon Company
- Chad Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 10,656,179
- Issue date May 19, 2020
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Kelvin connection with positional accuracy
- Patent number 10,613,116
- Issue date Apr 7, 2020
- Melexis Technologies NV
- Milen Petrov Cheshmedjiev
- G01 - MEASURING TESTING
Information Patent Grant
Wide range compensation of low frequency response passive probe
- Patent number 10,585,118
- Issue date Mar 10, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTABLE SUPPORTING DEVICE
- Publication number 20250044347
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Yi-Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE SUBSTRATE AND TESTING JIG
- Publication number 20250048545
- Publication date Feb 6, 2025
- YOKOWO CO., LTD
- Chikara Miura
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...
- Publication number 20250020693
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF E...
- Publication number 20240361353
- Publication date Oct 31, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTION INSPECTION JIG AND METHOD FOR MANUFACTURING PRINTED WIRI...
- Publication number 20240069068
- Publication date Feb 29, 2024
- IBIDEN CO., LTD.
- Takayuki MORI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230266365
- Publication date Aug 24, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG AND CIRCUIT BOARD INSPECTION APPARATUS INCLUDING THE...
- Publication number 20230127957
- Publication date Apr 27, 2023
- NIDEC-READ CORPORATION
- Kohei TSUMURA
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...
- Publication number 20230120201
- Publication date Apr 20, 2023
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
PROBE INSTALLATION CIRCUIT BOARD AND PROBE DEVICE FOR PROBE CARD
- Publication number 20220349919
- Publication date Nov 3, 2022
- MPI Corporation
- YU-SHAN HU
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR TEST
- Publication number 20220334178
- Publication date Oct 20, 2022
- MPI Corporation
- SHIH-CHING CHEN
- G01 - MEASURING TESTING
Information Patent Application
FORCE DEFLECTION AND RESISTANCE TESTING SYSTEM AND METHOD OF USE
- Publication number 20220221489
- Publication date Jul 14, 2022
- Modus Test, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Application
FIXTURE
- Publication number 20220137096
- Publication date May 5, 2022
- BEIJING BOE CHATANI ELECTRONICS CO., LTD.
- Yingqiu YANG
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD
- Publication number 20220091178
- Publication date Mar 24, 2022
- TANAZAWA HAKKOSHA CO., LTD.
- Keiichiro YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD TESTING DEVICE
- Publication number 20220065897
- Publication date Mar 3, 2022
- Unimicron Technology Corp.
- Tzyy-Jang Tseng
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20220018876
- Publication date Jan 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
TEST ADAPTER
- Publication number 20210305743
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- Yumei WANG
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20210270869
- Publication date Sep 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20210132116
- Publication date May 6, 2021
- Princo Corp.
- Pei-liang CHIU
- G01 - MEASURING TESTING
Information Patent Application
Contact Probe and Inspecting Socket Including the Same
- Publication number 20210072284
- Publication date Mar 11, 2021
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS
- Publication number 20200400740
- Publication date Dec 24, 2020
- MPI Corporation
- Kang-Yen Fu
- G01 - MEASURING TESTING
Information Patent Application
FORCE DEFLECTION AND RESISTANCE TESTING SYSTEM AND METHOD OF USE
- Publication number 20200319231
- Publication date Oct 8, 2020
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20200300889
- Publication date Sep 24, 2020
- YOKOWO CO., LTD
- Masaki NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST APPARATUS HAVING ADJUSTABLE CONTACT PRESSURE
- Publication number 20200124664
- Publication date Apr 23, 2020
- KES SYSTEMS & SERVICE (1993) PTE, LTD.
- Hock Soon Sim
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT (ATE) CONTACTOR ADAPTOR
- Publication number 20200088787
- Publication date Mar 19, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Raymond Joseph Ochotorena
- G01 - MEASURING TESTING

for testing printed circuit boards

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe card

Testing head having improved frequency properties

Inspection jig and circuit board inspection apparatus including the...

Testing head having improved frequency properties

Fixture

Circuit board for semiconductor test

Probe card testing device

Testing head having improved frequency properties

Printed circuit board

Probe assembly with two spaced probes for high frequency circuit bo...

Force deflection and resistance testing system and method of use

Testing head having improved frequency properties

Probing apparatus

Contact probe and inspecting socket including the same

Force deflection and resistance testing system and method of use

Test adapter

Probe card device and fence-like probe thereof

Inspection device

High accuracy electrical test interconnection device and method for...

Testing device and method for testing a printed circuit board

Testing head having improved frequency properties

Probe socket

Automatic test equipment (ATE) contactor adaptor

System and device for automatic signal measurement

Probe card and contact inspection device

Force deflection and resistance testing system and method of use

Coaxial electrical interconnect

Contact terminal, inspection jig, and inspection device

Kelvin connection with positional accuracy

Wide range compensation of low frequency response passive probe

Patents Applicationslast 30 patents

ADJUSTABLE SUPPORTING DEVICE

FLEXIBLE SUBSTRATE AND TESTING JIG

PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF...

CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF E...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CONDUCTION INSPECTION JIG AND METHOD FOR MANUFACTURING PRINTED WIRI...

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

PROBE CARD

INSPECTION JIG AND CIRCUIT BOARD INSPECTION APPARATUS INCLUDING THE...

PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...

PROBE INSTALLATION CIRCUIT BOARD AND PROBE DEVICE FOR PROBE CARD

CIRCUIT BOARD FOR SEMICONDUCTOR TEST

FORCE DEFLECTION AND RESISTANCE TESTING SYSTEM AND METHOD OF USE

FIXTURE

PRINTED CIRCUIT BOARD

PROBE CARD TESTING DEVICE

PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

TEST ADAPTER

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

PROBE CARD DEVICE

Contact Probe and Inspecting Socket Including the Same

PROBING APPARATUS

FORCE DEFLECTION AND RESISTANCE TESTING SYSTEM AND METHOD OF USE

INSPECTION DEVICE

ELECTRICAL TEST APPARATUS HAVING ADJUSTABLE CONTACT PRESSURE

AUTOMATIC TEST EQUIPMENT (ATE) CONTACTOR ADAPTOR