for testing the alignment of axes

Industry

CPC
G01B11/27

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/27for testing the alignment of axes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for positioning center of V-type notch of wafer,...
- Patent number 12,183,616
- Issue date Dec 31, 2024
- XI'AN ESWIN MATERIAL TECHNOLOGY CO., LTD.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser device and laser beam detector for detecting light of a laser...
- Patent number 12,174,019
- Issue date Dec 24, 2024
- Spectra Precision (Kaiserslautern) GmbH
- Lars Schumacher
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,146,734
- Issue date Nov 19, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus that measures position information of measure...
- Patent number 12,148,181
- Issue date Nov 19, 2024
- Canon Kabushiki Kaisha
- Satoru Jimbo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for use in wafer processing
- Patent number 12,148,640
- Issue date Nov 19, 2024
- Infineon Technologies AG
- Thomas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Actively select lenses for camera focus processes
- Patent number 12,140,417
- Issue date Nov 12, 2024
- Aptiv Technologies AG
- Morgan Daniel Murphy
- G02 - OPTICS
Information Patent Grant
Metrology measurement method and apparatus
- Patent number 12,140,875
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Ilse Van Weperen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Tool and method for measuring parallelism and coaxiality of rotatin...
- Patent number 12,140,418
- Issue date Nov 12, 2024
- CHINA AUTOMOTIVE TECHNOLOGY AND RESEARCH CENTER CO., LTD
- Yongqiang Wu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for centering an optical element in an optical system for an...
- Patent number 12,135,436
- Issue date Nov 5, 2024
- Olympus Winter & IBE GmbH
- Uwe Schoeler
- G02 - OPTICS
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,135,204
- Issue date Nov 5, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for inspecting injection-molded parts, in particu...
- Patent number 12,122,082
- Issue date Oct 22, 2024
- HEKUMA GMBH
- Jakob Kammerloher
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Support structure for vehicle ADAS calibration and wheel alignment...
- Patent number 12,123,707
- Issue date Oct 22, 2024
- Hunter Engineering Company
- Brian M. Cejka
- G01 - MEASURING TESTING
Information Patent Grant
Combiner alignment detector
- Patent number 12,123,705
- Issue date Oct 22, 2024
- Rockwell Collins, Inc.
- Eric P. Stratton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for simulating a second axle on a three-wheel vehicle and re...
- Patent number 12,123,706
- Issue date Oct 22, 2024
- Sean R. Pantin
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for aligning substrates
- Patent number 12,106,993
- Issue date Oct 1, 2024
- EV Group E. Thallner GmbH
- Jozsef Krol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for aligning a vehicle service system relative to a vehicle
- Patent number 12,104,895
- Issue date Oct 1, 2024
- NEXION S.P.A.
- Giulio Corghi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device feature specific edge placement error (EPE)
- Patent number 12,092,966
- Issue date Sep 17, 2024
- KLA Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatial coordinate tracking of wind turbine assembly components usi...
- Patent number 12,090,714
- Issue date Sep 17, 2024
- TPI COMPOSITES, INC.
- Amir Salimi
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measurement device
- Patent number 12,085,383
- Issue date Sep 10, 2024
- AUROS TECHNOLOGY, INC.
- Gyu Nam Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-based levelling system
- Patent number 12,078,483
- Issue date Sep 3, 2024
- Leica Geosystems AG
- Markus Hammerer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Template, workpiece, and alignment method
- Patent number 12,078,922
- Issue date Sep 3, 2024
- Kioxia Corporation
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement apparatus, measurement method, lithography apparatus an...
- Patent number 12,072,175
- Issue date Aug 27, 2024
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position monitoring of a gasket between tunnel segments
- Patent number 12,066,103
- Issue date Aug 20, 2024
- FNV IP B.V.
- Arnoud Marc Jongsma
- G01 - MEASURING TESTING
Information Patent Grant
Optical-based validation of parallelism between internal facets
- Patent number 12,061,080
- Issue date Aug 13, 2024
- LUMUS LTD.
- Jonathan Gelberg
- G01 - MEASURING TESTING
Information Patent Grant
Detection method, detection apparatus, lithography apparatus, and a...
- Patent number 12,061,079
- Issue date Aug 13, 2024
- Canon Kabushiki Kaisha
- Masaharu Kajitani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic wheel alignment detection system and method for a vehicle
- Patent number 12,061,081
- Issue date Aug 13, 2024
- GM Global Technology Operations LLC
- Akilesh Rajavenkatanarayanan
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Methods and systems for validating parallelism between internal facets
- Patent number 12,055,385
- Issue date Aug 6, 2024
- LUMUS LTD.
- Jonathan Gelberg
- G01 - MEASURING TESTING
Information Patent Grant
Positional error compensation in assembly of discrete components by...
- Patent number 12,046,504
- Issue date Jul 23, 2024
- KULICKE & SOFFA NETHERLANDS B.V.
- Matthew R. Semler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging overlay with mutually coherent oblique illumination
- Patent number 12,032,300
- Issue date Jul 9, 2024
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION DEVICE FOR VEHICLES
- Publication number 20240426345
- Publication date Dec 26, 2024
- DENSO CORPORATION
- Yoshihiro KIDA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
UPGRADED ABUTMENT BENCH
- Publication number 20240399441
- Publication date Dec 5, 2024
- Car Bench S.P.A.
- Lorenzo Federico Michael MANFREDI
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
TOOL CENTER POINT CALIBRATION DEVICE AND METHOD
- Publication number 20240401933
- Publication date Dec 5, 2024
- CAPTRON Electronic GmbH
- Roland Aubauer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SPATIAL COORDINATE TRACKING OF WIND TURBINE ASSEMBLY COMPONENTS USI...
- Publication number 20240399682
- Publication date Dec 5, 2024
- TPI Composites, Inc.
- Amir Salimi
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE
- Publication number 20240385074
- Publication date Nov 21, 2024
- OLYMPUS CORPORATION
- Yosuke SATO
- G01 - MEASURING TESTING
Information Patent Application
FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS
- Publication number 20240377190
- Publication date Nov 14, 2024
- Samsung Electronics Co., Ltd.
- Jun Yeob KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...
- Publication number 20240369695
- Publication date Nov 7, 2024
- SHANDONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Wenhong LI
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240369353
- Publication date Nov 7, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...
- Publication number 20240369347
- Publication date Nov 7, 2024
- Canon Kabushiki Kaisha
- Wataru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
SHAFT ALIGNMENT SYSTEM INCLUDING A MEASURING UNIT EMITTING A LASER...
- Publication number 20240344825
- Publication date Oct 17, 2024
- Aktiebolaget SKF
- Sylvain Georges Henri HUMBERT
- G01 - MEASURING TESTING
Information Patent Application
STANDARD-LIGHT GENERATOR FOR STRAIGHTNESS MEASUREMENT, METHOD OF PR...
- Publication number 20240337856
- Publication date Oct 10, 2024
- ADTEC ENGINEERING CO., LTD.
- Yoneta TANAKA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING OVERLAY WITH MUTUALLY COHERENT OBLIQUE ILLUMINATION
- Publication number 20240329543
- Publication date Oct 3, 2024
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR ASSESSING QUALITY OF A TRANSVERSAL SEALING OF A FOOD P...
- Publication number 20240317444
- Publication date Sep 26, 2024
- Tetra Laval Holdings & Finance S.A.
- Fabrizio FENU
- G01 - MEASURING TESTING
Information Patent Application
Automatic Light Alignment
- Publication number 20240317132
- Publication date Sep 26, 2024
- Apple Inc.
- Christopher P. Child
- B60 - VEHICLES IN GENERAL
Information Patent Application
Laser Plumb/Pitch Pipe Alignment Device
- Publication number 20240310166
- Publication date Sep 19, 2024
- Michael V. Goffredo
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE MEASUREMENT DEVICE AND CALIBRATION METHOD
- Publication number 20240312264
- Publication date Sep 19, 2024
- Autel Intelligent Technology Corp., Ltd.
- Zihao ZHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ELEMENT FOR USE IN METROLOGY SYSTEMS
- Publication number 20240302164
- Publication date Sep 12, 2024
- ASML NETHERLANDS B.V.
- Tzu-Yi YANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND METHOD OF MANUFACTURING OPTICAL MODULE
- Publication number 20240305059
- Publication date Sep 12, 2024
- MITSUBISHI ELECTRIC CORPORATION
- Daisuke MORITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240296547
- Publication date Sep 5, 2024
- AUROS Technology, Inc.
- Ji Hoon KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNMENT APPARATUS
- Publication number 20240287746
- Publication date Aug 29, 2024
- Tee-Am, L.L.C.
- Kenneth Merritt
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20240280383
- Publication date Aug 22, 2024
- TOKYO ELECTRON LIMITED
- Hikaru FUJIWARA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FIREARM LASER SIGHT ALIGNMENT ASSEMBLY
- Publication number 20240280348
- Publication date Aug 22, 2024
- CROSMAN CORPORATION
- John A. Kowalczyk
- G01 - MEASURING TESTING
Information Patent Application
SCANNING OVERLAY METROLOGY WITH HIGH SIGNAL TO NOISE RATIO
- Publication number 20240280914
- Publication date Aug 22, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
INTENSITY IMBALANCE CALIBRATION ON AN OVERFILLED BIDIRECTIONAL MARK
- Publication number 20240263941
- Publication date Aug 8, 2024
- ASML NETHERLANDS B.V.
- Rui CHENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240263940
- Publication date Aug 8, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Positioning Center of V-Type Notch of Wafer,...
- Publication number 20240266198
- Publication date Aug 8, 2024
- Xi'an ESWIN Material Technology Co., Ltd.
- Leilei WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS
- Publication number 20240255281
- Publication date Aug 1, 2024
- LUMUS LTD.
- Jonathan GELBERG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY MEASUREMENT METHOD AND APPARATUS
- Publication number 20240255279
- Publication date Aug 1, 2024
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-TRANSMITTANCE DEVICE AND USE METHOD
- Publication number 20240255280
- Publication date Aug 1, 2024
- ZHONGJIAN WUZHOU ENGINEERING EQUIPMENT CO., LTD
- Huaijun Ji
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

for testing the alignment of axes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for positioning center of V-type notch of wafer,...

Laser device and laser beam detector for detecting light of a laser...

Apparatus and method for determining three-dimensional shape of object

Measurement apparatus that measures position information of measure...

Method and apparatus for use in wafer processing

Actively select lenses for camera focus processes

Metrology measurement method and apparatus

Tool and method for measuring parallelism and coaxiality of rotatin...

Method for centering an optical element in an optical system for an...

Apparatus and method for determining three-dimensional shape of object

Method and device for inspecting injection-molded parts, in particu...

Support structure for vehicle ADAS calibration and wheel alignment...

Combiner alignment detector

System for simulating a second axle on a three-wheel vehicle and re...

Optical metrology utilizing short-wave infrared wavelengths

Method and device for aligning substrates

Method for aligning a vehicle service system relative to a vehicle

Device feature specific edge placement error (EPE)

Spatial coordinate tracking of wind turbine assembly components usi...

Overlay measurement device

Laser-based levelling system

Template, workpiece, and alignment method

Measurement apparatus, measurement method, lithography apparatus an...

Position monitoring of a gasket between tunnel segments

Optical-based validation of parallelism between internal facets

Detection method, detection apparatus, lithography apparatus, and a...

Automatic wheel alignment detection system and method for a vehicle

Methods and systems for validating parallelism between internal facets

Positional error compensation in assembly of discrete components by...

Imaging overlay with mutually coherent oblique illumination

Patents Applicationslast 30 patents

DETECTION DEVICE FOR VEHICLES

UPGRADED ABUTMENT BENCH

TOOL CENTER POINT CALIBRATION DEVICE AND METHOD

SPATIAL COORDINATE TRACKING OF WIND TURBINE ASSEMBLY COMPONENTS USI...

ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE

FOCUS OPTIMIZATION FOR WAFER WHICH HAS MULTI-PEAK FOCUS

METHOD OF PERCEIVING POSITION AND POSE OF HYDRAULIC SUPPORT GROUP B...

OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS

MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...

SHAFT ALIGNMENT SYSTEM INCLUDING A MEASURING UNIT EMITTING A LASER...

STANDARD-LIGHT GENERATOR FOR STRAIGHTNESS MEASUREMENT, METHOD OF PR...

IMAGING OVERLAY WITH MUTUALLY COHERENT OBLIQUE ILLUMINATION

A METHOD FOR ASSESSING QUALITY OF A TRANSVERSAL SEALING OF A FOOD P...

Automatic Light Alignment

Laser Plumb/Pitch Pipe Alignment Device

VEHICLE MEASUREMENT DEVICE AND CALIBRATION METHOD

OPTICAL ELEMENT FOR USE IN METROLOGY SYSTEMS

OPTICAL MODULE AND METHOD OF MANUFACTURING OPTICAL MODULE

INSPECTION APPARATUS AND INSPECTION METHOD

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

ALIGNMENT APPARATUS

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

FIREARM LASER SIGHT ALIGNMENT ASSEMBLY

SCANNING OVERLAY METROLOGY WITH HIGH SIGNAL TO NOISE RATIO

INTENSITY IMBALANCE CALIBRATION ON AN OVERFILLED BIDIRECTIONAL MARK

METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS

Method and System for Positioning Center of V-Type Notch of Wafer,...

OPTICAL-BASED VALIDATION OF PARALLELISM BETWEEN INTERNAL FACETS

METROLOGY MEASUREMENT METHOD AND APPARATUS

LIGHT-TRANSMITTANCE DEVICE AND USE METHOD