for testing the alignment of axes

Industry

CPC
G01B11/27

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/27for testing the alignment of axes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical assembly for parallelism measurement, optical apparatus inc...
- Patent number 12,366,444
- Issue date Jul 22, 2025
- Samsung Electronics Co., Ltd.
- G01 - MEASURING TESTING
Information Patent Grant
Eccentricity measurement method and eccentricity measurement device
- Patent number 12,345,594
- Issue date Jul 1, 2025
- Olympus Corporation
- Yosuke Sato
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical axis and pupil center detection apparatus
- Patent number 12,339,116
- Issue date Jun 24, 2025
- MLOptic Corp.
- Wei Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for aligning imaging devices
- Patent number 12,339,514
- Issue date Jun 24, 2025
- Sensors Unlimited, Inc.
- Michael W. Delamere
- G01 - MEASURING TESTING
Information Patent Grant
Downlight laser jig
- Patent number 12,339,115
- Issue date Jun 24, 2025
- Rosendin Electric, Inc.
- Steven Lee Rose
- G01 - MEASURING TESTING
Information Patent Grant
Surface position detection device, exposure apparatus, substrate-pr...
- Patent number 12,334,404
- Issue date Jun 17, 2025
- Nikon Corporation
- Satoshi Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe pad with built-in interconnect structure
- Patent number 12,327,770
- Issue date Jun 10, 2025
- International Business Machines Corporation
- Ashim Dutta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle sensor calibration target alignment system
- Patent number 12,325,385
- Issue date Jun 10, 2025
- Richard L. Jackson
- B60 - VEHICLES IN GENERAL
Information Patent Grant
High resolution optical displacement measurement
- Patent number 12,320,632
- Issue date Jun 3, 2025
- Richard Kirby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wheel image acquisition assembly, wheel positioning apparatus, and...
- Patent number 12,309,481
- Issue date May 20, 2025
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Dengguo Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment for ultra-high coplanarity of two planes
- Patent number 12,298,123
- Issue date May 13, 2025
- Meta Platforms Technologies, LLC
- Peter Topalian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging tool for vibration and/or misalignment analysis
- Patent number 12,293,501
- Issue date May 6, 2025
- Fluke Corporation
- Michael D. Stuart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometric lens aligner and method
- Patent number 12,292,274
- Issue date May 6, 2025
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
System and method for verifying ADAS calibration target selection
- Patent number 12,287,190
- Issue date Apr 29, 2025
- Hunter Engineering Company
- Timothy A. Strege
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for checking the alignment of a motor vehicle...
- Patent number 12,281,891
- Issue date Apr 22, 2025
- Ford Global Technologies, LLC
- Marcel Ponier
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Beam guide and positioning device for positioning a scraper mirror,...
- Patent number 12,282,258
- Issue date Apr 22, 2025
- TRUMPF Lasersystems for Semiconductor Manufacturing GmbH
- William Bettridge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Camera calibration tool
- Patent number 12,278,945
- Issue date Apr 15, 2025
- Deere & Company
- Nicholas C. Baltz
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Non-contact vehicle orientation and alignment sensor and method
- Patent number 12,270,639
- Issue date Apr 8, 2025
- BPG Sales and Technology Investments, LLC
- Frank J. Bretl
- G01 - MEASURING TESTING
Information Patent Grant
Target unit of machine vision system, target assembly and machine v...
- Patent number 12,264,910
- Issue date Apr 1, 2025
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Wenhui Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring system, measuring device, and measuring method
- Patent number 12,264,947
- Issue date Apr 1, 2025
- Tokyo Electron Limited
- Takayuki Hatanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for aligning calibration device with vehicle based on wheel...
- Patent number 12,259,233
- Issue date Mar 25, 2025
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Yixiong Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Relative mode transmission loss measurement of a connectorized fibe...
- Patent number 12,247,830
- Issue date Mar 11, 2025
- Corning Research & Development Corporation
- David Matthew Berg
- G02 - OPTICS
Information Patent Grant
Device and method for the measurement of inclination and angular st...
- Patent number 12,241,733
- Issue date Mar 4, 2025
- Ecole Polytechnique
- Simone Cialdi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of operating overlay measuring
- Patent number 12,242,246
- Issue date Mar 4, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien-Hsien Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning overlay metrology with high signal to noise ratio
- Patent number 12,235,588
- Issue date Feb 25, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle wheels alignment system using image acquisition sensor and...
- Patent number 12,236,641
- Issue date Feb 25, 2025
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Wenhui Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle sensor calibration target alignment system
- Patent number 12,227,150
- Issue date Feb 18, 2025
- Richard L. Jackson
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Light-transmittance device and use method
- Patent number 12,222,200
- Issue date Feb 11, 2025
- ZHONGJIAN WUZHOU ENGINEERING EQUIPMENT CO., LTD
- Huaijun Ji
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for measurement of misregistration and ameliora...
- Patent number 12,222,199
- Issue date Feb 11, 2025
- KLA Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Grant
Instance segmentation imaging system
- Patent number 12,214,809
- Issue date Feb 4, 2025
- ISEE, Inc.
- Jonah Philion
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
MATERIAL FOR POSITIONAL ERROR COMPENSATION IN ASSEMBLY OF DISCRETE...
- Publication number 20250233002
- Publication date Jul 17, 2025
- KULICKE & SOFFA NETHERLANDS B.V.
- Matthew R. Semler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER BONDING OVERLAY MEASUREMENT SYSTEM
- Publication number 20250233022
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Ilseok SON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD, AND SYSTEM FOR FINE TUNING OF CAPTURE DEVICES
- Publication number 20250208491
- Publication date Jun 26, 2025
- Musco Corporation
- Logan J. Bogatzke
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION MODULE AND ASSOCIATED METHODS AND METROLOGY APPARATUS
- Publication number 20250208522
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR DETERMINING WHEEL ALIGNMENT
- Publication number 20250196923
- Publication date Jun 19, 2025
- VOLVO TRUCK CORPORATION
- Boopathy Mani
- G07 - CHECKING-DEVICES
Information Patent Application
MEASURING CONTRAST AND CRITICAL DIMENSION USING AN ALIGNMENT SENSOR
- Publication number 20250199418
- Publication date Jun 19, 2025
- ASML NETHERLANDS B.V.
- Edouard André Marie Louis DURIAU
- G01 - MEASURING TESTING
Information Patent Application
Wheel Alignment Equipment User Interface For Selection Of Heavy Dut...
- Publication number 20250189305
- Publication date Jun 12, 2025
- Hunter Engineering Company
- John Boncek
- G01 - MEASURING TESTING
Information Patent Application
System and Method For Identification of Spatial Locations For Vehic...
- Publication number 20250180349
- Publication date Jun 5, 2025
- Hunter Engineering Company
- Brian M. CEJKA
- G01 - MEASURING TESTING
Information Patent Application
FOUR-WHEEL ALIGNMENT MEASURING DEVICE AND FOUR-WHEEL ALIGNMENT APPA...
- Publication number 20250172386
- Publication date May 29, 2025
- SHENZHEN SMARTSAFE TECH CO.,LTD.
- Wei ZHAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...
- Publication number 20250172385
- Publication date May 29, 2025
- China University of Mining and Technology
- Xinqiu FANG
- G01 - MEASURING TESTING
Information Patent Application
FOUR-WHEEL ALIGNER
- Publication number 20250172387
- Publication date May 29, 2025
- SHENZHEN SMARTSAFE TECH CO.,LTD.
- Wei ZHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE
- Publication number 20250147437
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Armand Eugene Albert KOOLEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASURING MACHINE AND PROCESS FOR POSITIONING A WORKPIECE IN THE ME...
- Publication number 20250146811
- Publication date May 8, 2025
- CARL MAHR HOLDING GMBH
- Nelli BEHRENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM
- Publication number 20250123096
- Publication date Apr 17, 2025
- KLA Corporation
- Amiram Hazzot
- G01 - MEASURING TESTING
Information Patent Application
SIGHTING DEVICE AND MEASUREMENT DEVICE
- Publication number 20250123099
- Publication date Apr 17, 2025
- Omron Corporation
- Hisashi OZAWA
- G01 - MEASURING TESTING
Information Patent Application
TIP CALIBRATION IN AN ADDITIVE MANUFACTURING SYSTEM
- Publication number 20250100226
- Publication date Mar 27, 2025
- Stratasys, Inc.
- Michael Bosveld
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Semiconductor Manufacturing Tool Alignment Device And Method
- Publication number 20250096025
- Publication date Mar 20, 2025
- DIODES INCORPORATED
- Bartosz Kielban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAMERA MONITOR SYSTEM UTILIZING TRAILER ANGLE DETECTION BASED UPON...
- Publication number 20250083602
- Publication date Mar 13, 2025
- Stoneridge, Inc.
- Liang Ma
- B60 - VEHICLES IN GENERAL
Information Patent Application
GENERATING AN ALIGNMENT SIGNAL WITHOUT DEDICATED ALIGNMENT STRUCTURES
- Publication number 20250060680
- Publication date Feb 20, 2025
- ASML NETHERLANDS B.V.
- Aabid PATEL
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PARALLELISM
- Publication number 20250052559
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Minhwan Seo
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ALIGNMENT TARGETS
- Publication number 20250052565
- Publication date Feb 13, 2025
- Illumina, Inc.
- Shamsul Abedin
- G01 - MEASURING TESTING
Information Patent Application
GOLF LAUNCH MONITOR AND TARGET ALIGNMENT METHOD OF GOLF LAUNCH MONITOR
- Publication number 20250044080
- Publication date Feb 6, 2025
- VIEWORKS CO., LTD.
- Joonggeun KIM
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Method of Electrode Assembly
- Publication number 20250046892
- Publication date Feb 6, 2025
- LG ENERGY SOLUTION, LTD.
- Tai Joon Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TARGET ASYMMETRY MEASUREMENT FOR SUBSTRATE ALIGNMENT IN LITHOGRAPHY...
- Publication number 20250036031
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Aniruddha Ramakrishna SONDE
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS THAT MEASURES POSITION INFORMATION OF MEASURE...
- Publication number 20250029276
- Publication date Jan 23, 2025
- Canon Kabushiki Kaisha
- Satoru JIMBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250027766
- Publication date Jan 23, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE AND METHOD
- Publication number 20250031294
- Publication date Jan 23, 2025
- ASML NETHERLANDS B.V.
- Roger Anton Marie TIMMERMANS
- G01 - MEASURING TESTING
Information Patent Application
MISALIGNMENT MEASUREMENT SYSTEM, WELDED STEEL PIPE MANUFACTURING FA...
- Publication number 20250014171
- Publication date Jan 9, 2025
- JFE STEEL CORPORATION
- Yusuke TSUKAMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION DEVICE FOR VEHICLES
- Publication number 20240426345
- Publication date Dec 26, 2024
- DENSO CORPORATION
- Yoshihiro KIDA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

for testing the alignment of axes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical assembly for parallelism measurement, optical apparatus inc...

Eccentricity measurement method and eccentricity measurement device

Non-contact optical axis and pupil center detection apparatus

Systems and methods for aligning imaging devices

Downlight laser jig

Surface position detection device, exposure apparatus, substrate-pr...

Probe pad with built-in interconnect structure

Vehicle sensor calibration target alignment system

High resolution optical displacement measurement

Wheel image acquisition assembly, wheel positioning apparatus, and...

Optical alignment for ultra-high coplanarity of two planes

Imaging tool for vibration and/or misalignment analysis

Interferometric lens aligner and method

System and method for verifying ADAS calibration target selection

Method and apparatus for checking the alignment of a motor vehicle...

Beam guide and positioning device for positioning a scraper mirror,...

Camera calibration tool

Non-contact vehicle orientation and alignment sensor and method

Target unit of machine vision system, target assembly and machine v...

Measuring system, measuring device, and measuring method

Method for aligning calibration device with vehicle based on wheel...

Relative mode transmission loss measurement of a connectorized fibe...

Device and method for the measurement of inclination and angular st...

Method and system of operating overlay measuring

Scanning overlay metrology with high signal to noise ratio

Vehicle wheels alignment system using image acquisition sensor and...

Vehicle sensor calibration target alignment system

Light-transmittance device and use method

Systems and methods for measurement of misregistration and ameliora...

Instance segmentation imaging system

Patents Applicationslast 30 patents

MATERIAL FOR POSITIONAL ERROR COMPENSATION IN ASSEMBLY OF DISCRETE...

WAFER BONDING OVERLAY MEASUREMENT SYSTEM

APPARATUS, METHOD, AND SYSTEM FOR FINE TUNING OF CAPTURE DEVICES

ILLUMINATION MODULE AND ASSOCIATED METHODS AND METROLOGY APPARATUS

ARRANGEMENT FOR DETERMINING WHEEL ALIGNMENT

MEASURING CONTRAST AND CRITICAL DIMENSION USING AN ALIGNMENT SENSOR

Wheel Alignment Equipment User Interface For Selection Of Heavy Dut...

System and Method For Identification of Spatial Locations For Vehic...

FOUR-WHEEL ALIGNMENT MEASURING DEVICE AND FOUR-WHEEL ALIGNMENT APPA...

OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...

FOUR-WHEEL ALIGNER

METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE

MEASURING MACHINE AND PROCESS FOR POSITIONING A WORKPIECE IN THE ME...

MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM

SIGHTING DEVICE AND MEASUREMENT DEVICE

TIP CALIBRATION IN AN ADDITIVE MANUFACTURING SYSTEM

Semiconductor Manufacturing Tool Alignment Device And Method

CAMERA MONITOR SYSTEM UTILIZING TRAILER ANGLE DETECTION BASED UPON...

GENERATING AN ALIGNMENT SIGNAL WITHOUT DEDICATED ALIGNMENT STRUCTURES

MEASURING PARALLELISM

OPTICAL ALIGNMENT TARGETS

GOLF LAUNCH MONITOR AND TARGET ALIGNMENT METHOD OF GOLF LAUNCH MONITOR

Manufacturing Method of Electrode Assembly

TARGET ASYMMETRY MEASUREMENT FOR SUBSTRATE ALIGNMENT IN LITHOGRAPHY...

MEASUREMENT APPARATUS THAT MEASURES POSITION INFORMATION OF MEASURE...

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

APERTURE AND METHOD

MISALIGNMENT MEASUREMENT SYSTEM, WELDED STEEL PIPE MANUFACTURING FA...

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

DETECTION DEVICE FOR VEHICLES