for testing thyristors

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CPC
G01R31/263

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/263for testing thyristors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Selective micro device transfer to receiver substrate
- Patent number 12,199,058
- Issue date Jan 14, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING
Information Patent Grant
Array substrate, display panel, and method of testing array substrate
- Patent number 12,175,898
- Issue date Dec 24, 2024
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probe module for inspecting display panel, panel inspection apparat...
- Patent number 12,175,942
- Issue date Dec 24, 2024
- LX Semicon Co., Ltd.
- Ho Min Lim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Phase distortion measurement
- Patent number 12,158,491
- Issue date Dec 3, 2024
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,154,932
- Issue date Nov 26, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,148,786
- Issue date Nov 19, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamp manufacturing process
- Patent number 12,111,366
- Issue date Oct 8, 2024
- LLINK TECHNOLOGIES, L.L.C.
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of inspecting display device and method of manufacturing dis...
- Patent number 12,087,645
- Issue date Sep 10, 2024
- Samsung Display Co., Ltd.
- Seung Kyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting failure of antiparallel thyristor, and power co...
- Patent number 12,078,670
- Issue date Sep 3, 2024
- Tokyo Electron Limited
- Takashi Ogino
- G01 - MEASURING TESTING
Information Patent Grant
Managing photonic integrated circuit optical coupling
- Patent number 12,078,674
- Issue date Sep 3, 2024
- Ciena Corporation
- Jérôme Leclerc-Perron
- G01 - MEASURING TESTING
Information Patent Grant
Selective transfer of micro devices
- Patent number 12,075,565
- Issue date Aug 27, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Two-step charge-based capacitor measurement
- Patent number 12,066,475
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing apparatus for optical devices
- Patent number 12,025,650
- Issue date Jul 2, 2024
- Lumentum Operations LLC
- Albert Yuen
- G01 - MEASURING TESTING
Information Patent Grant
Laser diode testing system and laser diode testing method
- Patent number 12,015,239
- Issue date Jun 18, 2024
- CHROMA ATE INC.
- Sheng-Hung Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Motor vehicle control unit with redundant power supply, and corresp...
- Patent number 12,003,099
- Issue date Jun 4, 2024
- Conti Temic microelectronic GmbH
- Ingo Scheier
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Display device and method of driving display device
- Patent number 11,984,053
- Issue date May 14, 2024
- SHARP KABUSHIKI KAISHA
- Hirohisa Yamada
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for monitoring a protective device that includes a series ci...
- Patent number 11,982,703
- Issue date May 14, 2024
- Siemens Energy Global GmbH & Co. KG
- Nils Stahlhut
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection of the varactor diodes in varactor metasurface a...
- Patent number 11,978,958
- Issue date May 7, 2024
- KYMETA CORPORATION
- Hussein Esfahlani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Injection device and inspection and repairing method
- Patent number 11,971,444
- Issue date Apr 30, 2024
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery diode fault monitoring
- Patent number 11,953,540
- Issue date Apr 9, 2024
- WISK AERO LLC
- Geoffrey Alan Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus, image capturing apparatus, image capturing...
- Patent number 11,953,541
- Issue date Apr 9, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method for railroad smart flasher lamps
- Patent number 11,943,852
- Issue date Mar 26, 2024
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS
Information Patent Grant
Circuit failure detection for diode arrays
- Patent number 11,927,644
- Issue date Mar 12, 2024
- ams AG
- Rahim Akbari-Dilmaghai
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit arrangement to determine a level of an excess bias...
- Patent number 11,921,150
- Issue date Mar 5, 2024
- ams International AG
- Nenad Lilic
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical detection system and laser light providing module without u...
- Patent number 11,906,571
- Issue date Feb 20, 2024
- MPI CORPORATION
- Chien-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LAMP MANUFACTURING PROCESS
- Publication number 20250020733
- Publication date Jan 16, 2025
- Llink Technologies, L.L.C
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIGHT-EMITTING ELEMENT DRIVING DEVICE
- Publication number 20250024573
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Keisuke Miura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE
- Publication number 20250015030
- Publication date Jan 9, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS
- Publication number 20250012849
- Publication date Jan 9, 2025
- ams-OSRAM International GmbH
- Siegfried Herrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE
- Publication number 20250004036
- Publication date Jan 2, 2025
- Sharp Display Technology Corporation
- Masahiro MITANI
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...
- Publication number 20250004037
- Publication date Jan 2, 2025
- TRUMPF Photonic Components GmbH
- Sven Bader
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...
- Publication number 20240426883
- Publication date Dec 26, 2024
- SANECHIPS TECHNOLOGY CO., LTD.
- Niuyi SUN
- G01 - MEASURING TESTING
Information Patent Application
VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...
- Publication number 20240429106
- Publication date Dec 26, 2024
- ORBOTECH LTD.
- Arie Glazer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical Testing for Panel Characterization and Defect Screening
- Publication number 20240402237
- Publication date Dec 5, 2024
- Apple Inc.
- Xuebei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20240381531
- Publication date Nov 14, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD
- Publication number 20240377452
- Publication date Nov 14, 2024
- AUO Corporation
- Wen-Chiuan SU
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20240361370
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE
- Publication number 20240361375
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Katsuhiro NAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...
- Publication number 20240353485
- Publication date Oct 24, 2024
- ams-OSRAM International GmbH
- Stefan Kerscher
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES WITH INTEGRATED TEST STRUCTURES
- Publication number 20240321651
- Publication date Sep 26, 2024
- Woflspeed, Inc.
- Rahul R. Potera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROLUMINESCENCE INSPECTION APPARATUS
- Publication number 20240255563
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Sungyong MIN
- G01 - MEASURING TESTING
Information Patent Application
BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMO...
- Publication number 20240255564
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Sangsu Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE
- Publication number 20240230749
- Publication date Jul 11, 2024
- CARUX TECHNOLOGY PTE. LTD.
- Chao-Chin Sung
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC MODULE
- Publication number 20240234659
- Publication date Jul 11, 2024
- ams-OSRAM Asia Pacific Pte. Ltd.
- Harald ETSCHMAIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS
- Publication number 20240237172
- Publication date Jul 11, 2024
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS
Information Patent Application
SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...
- Publication number 20240210463
- Publication date Jun 27, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE
- Publication number 20240201244
- Publication date Jun 20, 2024
- Nikkiso Co., Ltd.
- Kenta URA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE
- Publication number 20240168080
- Publication date May 23, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Fault Diagnosis Apparatus and Method
- Publication number 20240163995
- Publication date May 16, 2024
- DIODES INCORPORATED
- Dongjie Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE
- Publication number 20240153417
- Publication date May 9, 2024
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
- Publication number 20240142495
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Kosuke FUJII
- G01 - MEASURING TESTING

for testing thyristors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Selective micro device transfer to receiver substrate

Method for testing light-emitting devices

Intelligent wafer-level testing of photonic devices

Array substrate, display panel, and method of testing array substrate

Probe module for inspecting display panel, panel inspection apparat...

Phase distortion measurement

Electronic detection interface and electronic detection module usin...

Electronic detection interface and electronic detection module usin...

Test apparatus, test method, and computer-readable storage medium

Light emitting device including base and base cap

Lamp manufacturing process

Method of inspecting display device and method of manufacturing dis...

Method of detecting failure of antiparallel thyristor, and power co...

Managing photonic integrated circuit optical coupling

Selective transfer of micro devices

Power leakage testing

Two-step charge-based capacitor measurement

Testing apparatus for optical devices

Laser diode testing system and laser diode testing method

Motor vehicle control unit with redundant power supply, and corresp...

Display device and method of driving display device

Method for monitoring a protective device that includes a series ci...

Optical inspection of the varactor diodes in varactor metasurface a...

Injection device and inspection and repairing method

Battery diode fault monitoring

Semiconductor apparatus, image capturing apparatus, image capturing...

System and method for railroad smart flasher lamps

Circuit failure detection for diode arrays

Electric circuit arrangement to determine a level of an excess bias...

Optical detection system and laser light providing module without u...

Patents Applicationslast 30 patents

LAMP MANUFACTURING PROCESS

LIGHT-EMITTING ELEMENT DRIVING DEVICE

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS

DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE

METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...

CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...

VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...

Electrical Testing for Panel Characterization and Defect Screening

SELECTIVE TRANSFER OF MICRO DEVICES

PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD

MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...

Two-Step Charge-Based Capacitor Measurement

ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...

SEMICONDUCTOR DEVICES WITH INTEGRATED TEST STRUCTURES

ELECTROLUMINESCENCE INSPECTION APPARATUS

BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMO...

ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE

OPTOELECTRONIC MODULE

SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS

SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...

LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE

INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE

Fault Diagnosis Apparatus and Method

ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE

TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...