for testing thyristors

Industry

CPC
G01R31/263

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/263for testing thyristors

Industries

Patents Grantslast 30 patents

Information Patent Grant
Battery diode fault monitoring
- Patent number 12,313,668
- Issue date May 27, 2025
- WISK AERO LLC
- Geoffrey Alan Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enclosure detection for reliable optical failsafe
- Patent number 12,306,126
- Issue date May 20, 2025
- Apple Inc.
- Michael K. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Color-agnostic pixel repair sites
- Patent number 12,300,150
- Issue date May 13, 2025
- X Display Company Technology Limited
- Nikhil Jain
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Fault diagnosis apparatus and method
- Patent number 12,295,080
- Issue date May 6, 2025
- Diodes Incorporated
- Dongjie Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting light-emitting diode
- Patent number 12,265,116
- Issue date Apr 1, 2025
- Century Technology (Shenzhen) Corporation Limited
- Kuang-Hua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Diode test module for monitoring leakage current and its method the...
- Patent number 12,248,019
- Issue date Mar 11, 2025
- Amazing Microelectronic Corp.
- Chih-Ting Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring an ideal diode
- Patent number 12,228,604
- Issue date Feb 18, 2025
- Continental Automotive Technologies GmbH
- Sebastien Bernard
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting light-emitting diode dies
- Patent number 12,203,971
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for automatically monitored signalling of a vehicle state an...
- Patent number 12,202,497
- Issue date Jan 21, 2025
- Valeo Schalter und Sensoren GmbH
- Sascha Staude
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,203,988
- Issue date Jan 21, 2025
- Leoni-Bordnetz Systeme GmbH
- Wolfgang Koch
- G01 - MEASURING TESTING
Information Patent Grant
Selective micro device transfer to receiver substrate
- Patent number 12,199,058
- Issue date Jan 14, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING
Information Patent Grant
Array substrate, display panel, and method of testing array substrate
- Patent number 12,175,898
- Issue date Dec 24, 2024
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probe module for inspecting display panel, panel inspection apparat...
- Patent number 12,175,942
- Issue date Dec 24, 2024
- LX Semicon Co., Ltd.
- Ho Min Lim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Phase distortion measurement
- Patent number 12,158,491
- Issue date Dec 3, 2024
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,154,932
- Issue date Nov 26, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,148,786
- Issue date Nov 19, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamp manufacturing process
- Patent number 12,111,366
- Issue date Oct 8, 2024
- LLINK TECHNOLOGIES, L.L.C.
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of inspecting display device and method of manufacturing dis...
- Patent number 12,087,645
- Issue date Sep 10, 2024
- Samsung Display Co., Ltd.
- Seung Kyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting failure of antiparallel thyristor, and power co...
- Patent number 12,078,670
- Issue date Sep 3, 2024
- Tokyo Electron Limited
- Takashi Ogino
- G01 - MEASURING TESTING
Information Patent Grant
Managing photonic integrated circuit optical coupling
- Patent number 12,078,674
- Issue date Sep 3, 2024
- Ciena Corporation
- Jérôme Leclerc-Perron
- G01 - MEASURING TESTING
Information Patent Grant
Selective transfer of micro devices
- Patent number 12,075,565
- Issue date Aug 27, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Two-step charge-based capacitor measurement
- Patent number 12,066,475
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing apparatus for optical devices
- Patent number 12,025,650
- Issue date Jul 2, 2024
- Lumentum Operations LLC
- Albert Yuen
- G01 - MEASURING TESTING
Information Patent Grant
Laser diode testing system and laser diode testing method
- Patent number 12,015,239
- Issue date Jun 18, 2024
- CHROMA ATE INC.
- Sheng-Hung Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20250176105
- Publication date May 29, 2025
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER DEVICE CHARACTERIZATION ON THE WAFER USING AUTOMATED PARAMETR...
- Publication number 20250147095
- Publication date May 8, 2025
- KEITHLEY INSTRUMENTS, LLC
- Alexander N. Pronin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST
- Publication number 20250147086
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- MAO-HSUAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL INSPECTION DEVICE EVALUATING LIGHT DETECTION CHARACTE...
- Publication number 20250138077
- Publication date May 1, 2025
- SAMSUNG DISPLAY CO., LTD.
- Chul KIM
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
METHOD FOR INSPECTING LIGHT EMITTING DIODE PACKAGE
- Publication number 20250130271
- Publication date Apr 24, 2025
- Taiwan-Asia Semiconductor Corporation
- Chih-Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELA...
- Publication number 20250123330
- Publication date Apr 17, 2025
- CreeLED, Inc.
- Christopher P. Hussell
- G01 - MEASURING TESTING
Information Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
- Publication number 20250123320
- Publication date Apr 17, 2025
- InZiv Ltd.
- David Judah Lewis
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR LED TEST SYSTEM
- Publication number 20250123319
- Publication date Apr 17, 2025
- Teradyne, Inc.
- Frank Brian Parrish
- G01 - MEASURING TESTING
Information Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
- Publication number 20250102559
- Publication date Mar 27, 2025
- ASTI GLOBAL INC., TAIWAN
- CHIEN-SHOU LIAO
- G01 - MEASURING TESTING
Information Patent Application
PULSED LASER MICRO LED INSPECTION
- Publication number 20250102558
- Publication date Mar 27, 2025
- ORBOTECH LTD.
- Arie Glazer
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Calibrating a Wireless Harness Automated Me...
- Publication number 20250093388
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET
- Publication number 20250052805
- Publication date Feb 13, 2025
- Continental Automotive Technologies GmbH
- Erwin Kessler
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Electro-optical device via arrangement
- Publication number 20250028112
- Publication date Jan 23, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Giovanni Delrosso
- G01 - MEASURING TESTING
Information Patent Application
LAMP MANUFACTURING PROCESS
- Publication number 20250020733
- Publication date Jan 16, 2025
- Llink Technologies, L.L.C
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIGHT-EMITTING ELEMENT DRIVING DEVICE
- Publication number 20250024573
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Keisuke Miura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE
- Publication number 20250015030
- Publication date Jan 9, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS
- Publication number 20250012849
- Publication date Jan 9, 2025
- ams-OSRAM International GmbH
- Siegfried Herrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE
- Publication number 20250004036
- Publication date Jan 2, 2025
- Sharp Display Technology Corporation
- Masahiro MITANI
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...
- Publication number 20250004037
- Publication date Jan 2, 2025
- TRUMPF Photonic Components GmbH
- Sven Bader
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...
- Publication number 20240429106
- Publication date Dec 26, 2024
- ORBOTECH LTD.
- Arie Glazer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...
- Publication number 20240426883
- Publication date Dec 26, 2024
- SANECHIPS TECHNOLOGY CO., LTD.
- Niuyi SUN
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing for Panel Characterization and Defect Screening
- Publication number 20240402237
- Publication date Dec 5, 2024
- Apple Inc.
- Xuebei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20240381531
- Publication date Nov 14, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD
- Publication number 20240377452
- Publication date Nov 14, 2024
- AUO Corporation
- Wen-Chiuan SU
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20240361370
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE
- Publication number 20240361375
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Katsuhiro NAKAMOTO
- G01 - MEASURING TESTING

for testing thyristors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Battery diode fault monitoring

Enclosure detection for reliable optical failsafe

Color-agnostic pixel repair sites

Fault diagnosis apparatus and method

Device and method for detecting light-emitting diode

Diode test module for monitoring leakage current and its method the...

Monitoring an ideal diode

System and method of measuring capacitance of device-under-test

Apparatus and method for inspecting light-emitting diode dies

System for automatically monitored signalling of a vehicle state an...

System and method for identifying non-switching semiconductor switches

Selective micro device transfer to receiver substrate

Method for testing light-emitting devices

Intelligent wafer-level testing of photonic devices

Array substrate, display panel, and method of testing array substrate

Probe module for inspecting display panel, panel inspection apparat...

Phase distortion measurement

Electronic detection interface and electronic detection module usin...

Electronic detection interface and electronic detection module usin...

Test apparatus, test method, and computer-readable storage medium

Light emitting device including base and base cap

Lamp manufacturing process

Method of inspecting display device and method of manufacturing dis...

Method of detecting failure of antiparallel thyristor, and power co...

Managing photonic integrated circuit optical coupling

Selective transfer of micro devices

Power leakage testing

Two-step charge-based capacitor measurement

Testing apparatus for optical devices

Laser diode testing system and laser diode testing method

Patents Applicationslast 30 patents

SELECTIVE TRANSFER OF MICRO DEVICES

POWER DEVICE CHARACTERIZATION ON THE WAFER USING AUTOMATED PARAMETR...

SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST

DISPLAY PANEL INSPECTION DEVICE EVALUATING LIGHT DETECTION CHARACTE...

METHOD FOR INSPECTING LIGHT EMITTING DIODE PACKAGE

DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELA...

APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...

PROBE HEAD FOR LED TEST SYSTEM

CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...

PULSED LASER MICRO LED INSPECTION

Systems and Methods for Calibrating a Wireless Harness Automated Me...

METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET

Electro-optical device via arrangement

LAMP MANUFACTURING PROCESS

LIGHT-EMITTING ELEMENT DRIVING DEVICE

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS

DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE

METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...

VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...

CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...

Electrical Testing for Panel Characterization and Defect Screening

SELECTIVE TRANSFER OF MICRO DEVICES

PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD

MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...

Two-Step Charge-Based Capacitor Measurement

ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE