Functionalization

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G01Q70/18

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

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G01Q70/18Functionalization

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,592,463
- Issue date Feb 28, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe manufacturing method and probe
- Patent number 10,900,905
- Issue date Jan 26, 2021
- Horiba, Ltd.
- Masayuki Nishi
- G01 - MEASURING TESTING
Information Patent Grant
Conical nano-carbon material functionalized needle tip and preparat...
- Patent number 10,823,758
- Issue date Nov 3, 2020
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Metallic device for scanning probe microscopy and method for manufa...
- Patent number 10,605,827
- Issue date Mar 31, 2020
- UNIVERSIDADE FEDERAL DE MENAS GERAIS-UFMG
- Thiago De Lourenço E Vasconcelos
- G01 - MEASURING TESTING
Information Patent Grant
Sequential tip systems and methods for positionally controlled chem...
- Patent number 10,067,160
- Issue date Sep 4, 2018
- CBN Nano Technologies, Inc.
- Ralph C. Merkle
- G01 - MEASURING TESTING
Information Patent Grant
Chemical reagents for attaching affinity molecules on surfaces
- Patent number 9,981,997
- Issue date May 29, 2018
- Arizona Board of Regents on behalf of Arizona State University
- Peiming Zhang
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Consensus-based multi-piezoelectric microcantilever sensor
- Patent number 9,761,787
- Issue date Sep 12, 2017
- The Board of Trustees of the University of Alabama
- Ehsan Omidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tip structure of platinum-platinum silicide-silicon composite field...
- Patent number 9,255,944
- Issue date Feb 9, 2016
- National Applied Research Laboratories
- Chun-Ting Lin
- G01 - MEASURING TESTING
Information Patent Grant
Mechanosynthetic tools for a atomic-scale fabrication
- Patent number 9,244,097
- Issue date Jan 26, 2016
- Robert A. Freitas
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High throughout reproducible cantilever functionalization
- Patent number 8,898,810
- Issue date Nov 25, 2014
- UT-Battelle, LLC
- Barbara R. Evans
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High throughput reproducible cantilever functionalization
- Patent number 8,635,711
- Issue date Jan 21, 2014
- UT-Battelle, LLC
- Barbara R. Evans
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for analyzing nucleobases on a single molecular basis
- Patent number 8,124,417
- Issue date Feb 28, 2012
- Japan Science and Technology Agency
- Yoshio Umezawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring device with daisy type cantilever wheel
- Patent number 7,694,347
- Issue date Apr 6, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,615,739
- Issue date Nov 10, 2009
- The United States of America as represented by the United States Department o...
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticles functionalized probes and methods for preparing such...
- Patent number 7,528,947
- Issue date May 5, 2009
- Yissum Research Development Company of the Hebrew University of Jerusalem
- Uri Banin
- G01 - MEASURING TESTING
Information Patent Grant
Spin microscope based on optically detected magnetic resonance
- Patent number 7,305,869
- Issue date Dec 11, 2007
- U.S. Department of Energy
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Use of arrays of atomic force microscope/scanning tunneling microsc...
- Patent number 7,302,832
- Issue date Dec 4, 2007
- Intel Corporation
- Andrew Berlin
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,655,196
- Issue date Dec 2, 2003
- Hokkaido University
- Koichi Mukasa
- G01 - MEASURING TESTING
Information Patent Grant
Microcantilever sensor
- Patent number 6,523,392
- Issue date Feb 25, 2003
- Arizona Board of Regents
- Timothy L. Porter
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer-scale microscopy probes
- Patent number 6,159,742
- Issue date Dec 12, 2000
- President and Fellows of Harvard College
- Charles M. Lieber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for a scanning tunneling microscope and method of manufacturi...
- Patent number 5,548,117
- Issue date Aug 20, 1996
- Matsushita Electric Industrial Co., Ltd.
- Tohru Nakagawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing a probe for a scanning tunneling microscope
- Patent number 5,348,638
- Issue date Sep 20, 1994
- Matsushita Electric Industrial Co., Ltd.
- Tohru Nakagawa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
- Publication number 20230204625
- Publication date Jun 29, 2023
- NEXT-TIP, S.L.
- Belén SANZ SANZ
- G01 - MEASURING TESTING
Information Patent Application
PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD
- Publication number 20220050125
- Publication date Feb 17, 2022
- SHOWA DENKO K.K.
- Tsuyoshi KATO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...
- Publication number 20210318352
- Publication date Oct 14, 2021
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Lidia MARTINEZ ORELLANA
- G01 - MEASURING TESTING
Information Patent Application
PROBE MANUFACTURING METHOD AND PROBE
- Publication number 20190170651
- Publication date Jun 6, 2019
- KYOTO UNIVERSITY
- Masayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFA...
- Publication number 20180372777
- Publication date Dec 27, 2018
- Universidade Federal De Minas Gerais-UFMG
- Thiago DE LOURENÇO E VASCONCELOS
- G01 - MEASURING TESTING
Information Patent Application
Sequential Tip Systems and Methods for Positionally Controlled Chem...
- Publication number 20180136254
- Publication date May 17, 2018
- Ralph C. Merkle
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL REAGENTS FOR ATTACHING AFFINITY MOLECULES ON SURFACES
- Publication number 20160280723
- Publication date Sep 29, 2016
- Arizona Board of Regents on behalf of Arizona State University
- Peiming Zhang
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
HIGH THROUGHOUT REPRODUCIBLE CANTILEVER FUNCTIONALIZATION
- Publication number 20140123348
- Publication date May 1, 2014
- UT-Battelle, LLC
- Barbara R. Evans
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR ADSORPTION OF NANO-STRUCTURE AND ADSORPTION MATTER USING...
- Publication number 20100270265
- Publication date Oct 28, 2010
- Seung-Hun Hong
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing nucleobases on a single molecular basis
- Publication number 20090155917
- Publication date Jun 18, 2009
- Yoshio Umezawa
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL
- Publication number 20090138994
- Publication date May 28, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE
- Publication number 20080173812
- Publication date Jul 24, 2008
- Gennady P. Berman
- G01 - MEASURING TESTING
Information Patent Application
Method For Adhering Nanostructures to End of Probe of Microscope an...
- Publication number 20080093550
- Publication date Apr 24, 2008
- Seoul National University Industry Foundation
- Seung-Hun Hong
- G01 - MEASURING TESTING
Information Patent Application
NANOWIRE SCANNING PROBE MICROSCOPY PROBE FOR MOLECULAR RECOGNITION...
- Publication number 20080061231
- Publication date Mar 13, 2008
- Danielle R. Chamberlin
- G01 - MEASURING TESTING
Information Patent Application
Probe
- Publication number 20070114400
- Publication date May 24, 2007
- National Institute of Information and Communications Technology, Incorporated
- Akiro Otomo
- G01 - MEASURING TESTING
Information Patent Application
Nanoparticles functionalized probes and methods for preparing such...
- Publication number 20070035724
- Publication date Feb 15, 2007
- YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM
- Uri Banin
- G01 - MEASURING TESTING
Information Patent Application
Synthesis of nanocodes, and imaging using scanning probe microscopy
- Publication number 20060100787
- Publication date May 11, 2006
- Intel Corporation
- Andrew A. Berlin
- G01 - MEASURING TESTING
Information Patent Application
Device and method of use for detection and characterization of micr...
- Publication number 20050239193
- Publication date Oct 27, 2005
- BioForce Nanosciences, Inc.
- Eric R. Henderson
- G01 - MEASURING TESTING
Information Patent Application
Use of arrays of atomic force microscope/scanning tunneling microsc...
- Publication number 20050138996
- Publication date Jun 30, 2005
- Intel Corporation
- Andrew Berlin
- G01 - MEASURING TESTING
Information Patent Application
Polymer micro-cantilevers and their methods of manufacture
- Publication number 20040208788
- Publication date Oct 21, 2004
- Jonathan S. Colton
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
MICROCANTILEVER SENSOR
- Publication number 20030010097
- Publication date Jan 16, 2003
- Timothy L. Porter
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope
- Publication number 20030010099
- Publication date Jan 16, 2003
- HOKKAIDO UNIVERSITY
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY

Functionalization

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for mechanosynthesis

Probe manufacturing method and probe

Conical nano-carbon material functionalized needle tip and preparat...

Metallic device for scanning probe microscopy and method for manufa...

Sequential tip systems and methods for positionally controlled chem...

Chemical reagents for attaching affinity molecules on surfaces

Consensus-based multi-piezoelectric microcantilever sensor

Tip structure of platinum-platinum silicide-silicon composite field...

Mechanosynthetic tools for a atomic-scale fabrication

High throughout reproducible cantilever functionalization

High throughput reproducible cantilever functionalization

Method for analyzing nucleobases on a single molecular basis

Measuring device with daisy type cantilever wheel

Spin microscope based on optically detected magnetic resonance

Nanoparticles functionalized probes and methods for preparing such...

Spin microscope based on optically detected magnetic resonance

Use of arrays of atomic force microscope/scanning tunneling microsc...

Scanning probe microscope

Microcantilever sensor

Nanometer-scale microscopy probes

Probe for a scanning tunneling microscope and method of manufacturi...

Method of manufacturing a probe for a scanning tunneling microscope

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE (SPM) TIP

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...

PROBE MANUFACTURING METHOD AND PROBE

METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFA...

Sequential Tip Systems and Methods for Positionally Controlled Chem...

CHEMICAL REAGENTS FOR ATTACHING AFFINITY MOLECULES ON SURFACES

HIGH THROUGHOUT REPRODUCIBLE CANTILEVER FUNCTIONALIZATION

METHOD FOR ADSORPTION OF NANO-STRUCTURE AND ADSORPTION MATTER USING...

Method for analyzing nucleobases on a single molecular basis

MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL

SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE

Method For Adhering Nanostructures to End of Probe of Microscope an...

NANOWIRE SCANNING PROBE MICROSCOPY PROBE FOR MOLECULAR RECOGNITION...

Probe

Nanoparticles functionalized probes and methods for preparing such...

Synthesis of nanocodes, and imaging using scanning probe microscopy

Device and method of use for detection and characterization of micr...

Use of arrays of atomic force microscope/scanning tunneling microsc...

Polymer micro-cantilevers and their methods of manufacture

MICROCANTILEVER SENSOR

Scanning probe microscope