Handlers or transport devices

Industry

CPC
G01R31/2867

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2867Handlers or transport devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Picker device
- Patent number 12,085,608
- Issue date Sep 10, 2024
- Intekplus Co., Ltd.
- Byeong Gwon Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 12,025,654
- Issue date Jul 2, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical arm and mechanical arm assembly, test system and method,...
- Patent number 12,007,433
- Issue date Jun 11, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
- Patent number 11,982,706
- Issue date May 14, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
Chip tray positioning device
- Patent number 11,970,342
- Issue date Apr 30, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component test handler having flying scan function
- Patent number 11,965,926
- Issue date Apr 23, 2024
- ATECO INC.
- Taek Seon Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,933,839
- Issue date Mar 19, 2024
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Elevator unit for transferring tray and test handler including same
- Patent number 11,892,500
- Issue date Feb 6, 2024
- Semes Co., Ltd.
- Jin Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,885,846
- Issue date Jan 30, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
System level test device for memory
- Patent number 11,802,905
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component test handler having hand teaching function and...
- Patent number 11,802,906
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 11,802,904
- Issue date Oct 31, 2023
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Stacker of electronic component test handler, and electronic compon...
- Patent number 11,802,907
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system including active thermal interposer device
- Patent number 11,774,492
- Issue date Oct 3, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
DUT placement and handling for active thermal interposer device
- Patent number 11,754,620
- Issue date Sep 12, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,742,055
- Issue date Aug 29, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Grant
Inspection apparatus, control method, and storage medium
- Patent number 11,719,744
- Issue date Aug 8, 2023
- Tokyo Electron Limited
- Hiroyuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
- Patent number 11,719,743
- Issue date Aug 8, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
- Patent number 11,639,957
- Issue date May 2, 2023
- Northrop Grumman Systems Corporation
- Kelsey McCusker
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test apparatus
- Patent number 11,614,350
- Issue date Mar 28, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,609,266
- Issue date Mar 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for testing semiconductor devices
- Patent number 11,594,435
- Issue date Feb 28, 2023
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test handler having multiple testing sectors
- Patent number 11,592,477
- Issue date Feb 28, 2023
- ASMPT SINGAPORE PTE. LTD.
- Chi Wah Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,587,640
- Issue date Feb 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Testing holders for chip unit and die package
- Patent number 11,579,190
- Issue date Feb 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mill-Jer Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
- Publication number 20240402240
- Publication date Dec 5, 2024
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20240353477
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...
- Publication number 20240312848
- Publication date Sep 19, 2024
- MITSUI CHEMICALS TOHCELLO, INC.
- Eiji Hayashishita
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20240264223
- Publication date Aug 8, 2024
- PAMTEK Co., Ltd.
- Jae Woong KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES
- Publication number 20240201249
- Publication date Jun 20, 2024
- Bouchaib Hraimel
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD FOR SEMICONDUCTOR DEVICES
- Publication number 20240094283
- Publication date Mar 21, 2024
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
- Publication number 20240027519
- Publication date Jan 25, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20230417826
- Publication date Dec 28, 2023
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...
- Publication number 20230341462
- Publication date Oct 26, 2023
- Advantest Corporation
- Akihisa Suda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR...
- Publication number 20230314502
- Publication date Oct 5, 2023
- INFINEON TECHNOLOGIES AG
- Nee Wan KHOO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...
- Publication number 20230266380
- Publication date Aug 24, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...
- Publication number 20230251305
- Publication date Aug 10, 2023
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat TAN
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230197185
- Publication date Jun 22, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
MODULAR AND ADJUSTABLE THERMAL LOAD TEST VEHICLE
- Publication number 20230152369
- Publication date May 18, 2023
- Microsoft Technology Licensing, LLC
- Dennis TRIEU
- G01 - MEASURING TESTING
Information Patent Application
PICKER DEVICE
- Publication number 20230152368
- Publication date May 18, 2023
- Intekplus Co., Ltd.
- Byeong Gwon JOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20230129112
- Publication date Apr 27, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230124392
- Publication date Apr 20, 2023
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
- Publication number 20230122944
- Publication date Apr 20, 2023
- SK HYNIX INC.
- Gyung Jin KIM
- G01 - MEASURING TESTING
Information Patent Application
Temperature control system, temperature control method and image se...
- Publication number 20230098042
- Publication date Mar 30, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230062440
- Publication date Mar 2, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME
- Publication number 20230010924
- Publication date Jan 12, 2023
- SEMES CO., LTD.
- Jin Ho KANG
- B66 - HOISTING LIFTING HAULING
Information Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003791
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- KELSEY McCUSKER
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM INCLUDING ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20220326299
- Publication date Oct 13, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE
- Publication number 20220283221
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20220284982
- Publication date Sep 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM LEVEL TEST DEVICE FOR MEMORY
- Publication number 20220236320
- Publication date Jul 28, 2022
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING

Handlers or transport devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic device testing apparatus and electronic device testing m...

Electronic device pick-and-place system and electronic device testi...

Picker device

Workpiece positioning mechanism and workpiece inspection apparatus

Electronic component testing apparatus, sockets, and replacement pa...

Mechanical arm and mechanical arm assembly, test system and method,...

Apparatus, transfer method, chamber and frame for semiconductor bur...

Chip tray positioning device

Electronic component test handler having flying scan function

Temperature control and method for devices under test and image sen...

Inspection apparatus and inspection method

Elevator unit for transferring tray and test handler including same

System and method of testing a semiconductor device

Active thermal interposer device

System level test device for memory

Electronic component test handler having hand teaching function and...

Electronic component testing apparatus, sockets, and replacement pa...

Stacker of electronic component test handler, and electronic compon...

Test system including active thermal interposer device

DUT placement and handling for active thermal interposer device

Carrier based high volume system level testing of devices with pop...

Inspection apparatus, control method, and storage medium

Method and apparatus for conducting burn-in testing of semiconducto...

Planar ring radiation barrier for cryogenic wafer test system

Sensor test apparatus

Active thermal interposer device

Apparatus and methods for testing semiconductor devices

Test handler having multiple testing sectors

Carrier based high volume system level testing of devices with pop...

Testing holders for chip unit and die package

Patents Applicationslast 30 patents

TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...

WAFER TEST SYSTEM AND METHODS

WORK PRESS ASSEMBLY FOR TEST HANDLER

ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE

INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME

SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

TEST BOARD FOR SEMICONDUCTOR DEVICES

ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...

ACTIVE THERMAL INTERPOSER DEVICE

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...

APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR...

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...

APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

MODULAR AND ADJUSTABLE THERMAL LOAD TEST VEHICLE

PICKER DEVICE

ACTIVE THERMAL INTERPOSER DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE

Temperature control system, temperature control method and image se...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME

RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM

TEST SYSTEM INCLUDING ACTIVE THERMAL INTERPOSER DEVICE

TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

SYSTEM LEVEL TEST DEVICE FOR MEMORY