Membership
Tour
Register
Log in
Handlers or transport devices
Follow
Industry
CPC
G01R31/2867
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2867
Handlers or transport devices
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Chip tray positioning device
Patent number
11,970,342
Issue date
Apr 30, 2024
CHROMA ATE INC.
Chien-Ming Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic component test handler having flying scan function
Patent number
11,965,926
Issue date
Apr 23, 2024
ATECO INC.
Taek Seon Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Temperature control and method for devices under test and image sen...
Patent number
11,932,498
Issue date
Mar 19, 2024
CHROMA ATE INC.
Chin-Yi Ouyang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,933,839
Issue date
Mar 19, 2024
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Elevator unit for transferring tray and test handler including same
Patent number
11,892,500
Issue date
Feb 6, 2024
Semes Co., Ltd.
Jin Ho Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,885,846
Issue date
Jan 30, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Active thermal interposer device
Patent number
11,846,669
Issue date
Dec 19, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
System level test device for memory
Patent number
11,802,905
Issue date
Oct 31, 2023
ATECO INC.
Taek Seon Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component test handler having hand teaching function and...
Patent number
11,802,906
Issue date
Oct 31, 2023
ATECO INC.
Taek Seon Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
Patent number
11,802,904
Issue date
Oct 31, 2023
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Grant
Stacker of electronic component test handler, and electronic compon...
Patent number
11,802,907
Issue date
Oct 31, 2023
ATECO INC.
Taek Seon Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system including active thermal interposer device
Patent number
11,774,492
Issue date
Oct 3, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
DUT placement and handling for active thermal interposer device
Patent number
11,754,620
Issue date
Sep 12, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,742,055
Issue date
Aug 29, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Grant
Inspection apparatus, control method, and storage medium
Patent number
11,719,744
Issue date
Aug 8, 2023
Tokyo Electron Limited
Hiroyuki Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
Patent number
11,719,743
Issue date
Aug 8, 2023
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Information
Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
Patent number
11,639,957
Issue date
May 2, 2023
Northrop Grumman Systems Corporation
Kelsey McCusker
G01 - MEASURING TESTING
Information
Patent Grant
Sensor test apparatus
Patent number
11,614,350
Issue date
Mar 28, 2023
Advantest Corporation
Kazunari Suga
G01 - MEASURING TESTING
Information
Patent Grant
Active thermal interposer device
Patent number
11,609,266
Issue date
Mar 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for testing semiconductor devices
Patent number
11,594,435
Issue date
Feb 28, 2023
Testmetrix, Inc.
Christian O. Cojocneanu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test handler having multiple testing sectors
Patent number
11,592,477
Issue date
Feb 28, 2023
ASMPT SINGAPORE PTE. LTD.
Chi Wah Cheng
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,587,640
Issue date
Feb 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Testing holders for chip unit and die package
Patent number
11,579,190
Issue date
Feb 14, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Grant
Testing system including active thermal interposer device
Patent number
11,567,119
Issue date
Jan 31, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,543,450
Issue date
Jan 3, 2023
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Test board having semiconductor devices mounted as devices under te...
Patent number
11,536,766
Issue date
Dec 27, 2022
Samsung Electronics Co., Ltd.
Joosung Yun
G01 - MEASURING TESTING
Information
Patent Grant
Kit-less pick and place handler system for thermal testing
Patent number
11,474,147
Issue date
Oct 18, 2022
Boston Semi Equipment LLC
Larry Stuckey
G01 - MEASURING TESTING
Information
Patent Grant
Testing system
Patent number
11,454,664
Issue date
Sep 27, 2022
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Kit-less pick and place handler system for thermal testing
Patent number
11,442,101
Issue date
Sep 13, 2022
Boston Semi Equipment LLC
Larry Stuckey
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing semiconductor devices
Patent number
11,408,913
Issue date
Aug 9, 2022
Texas Instruments Incorporated
Dale Lee Anderson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST BOARD FOR SEMICONDUCTOR DEVICES
Publication number
20240094283
Publication date
Mar 21, 2024
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
Publication number
20240027519
Publication date
Jan 25, 2024
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20240003967
Publication date
Jan 4, 2024
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
Publication number
20230417826
Publication date
Dec 28, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...
Publication number
20230341462
Publication date
Oct 26, 2023
Advantest Corporation
Akihisa Suda
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR...
Publication number
20230314502
Publication date
Oct 5, 2023
INFINEON TECHNOLOGIES AG
Nee Wan KHOO
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...
Publication number
20230266380
Publication date
Aug 24, 2023
Advantest Corporation
Matthias WERNER
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...
Publication number
20230251305
Publication date
Aug 10, 2023
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230197185
Publication date
Jun 22, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
MODULAR AND ADJUSTABLE THERMAL LOAD TEST VEHICLE
Publication number
20230152369
Publication date
May 18, 2023
Microsoft Technology Licensing, LLC
Dennis TRIEU
G01 - MEASURING TESTING
Information
Patent Application
PICKER DEVICE
Publication number
20230152368
Publication date
May 18, 2023
Intekplus Co., Ltd.
Byeong Gwon JOO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20230129112
Publication date
Apr 27, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230124392
Publication date
Apr 20, 2023
TOKYO ELECTRON LIMITED
Kentaro KONISHI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
Publication number
20230122944
Publication date
Apr 20, 2023
SK HYNIX INC.
Gyung Jin KIM
G01 - MEASURING TESTING
Information
Patent Application
Temperature control system, temperature control method and image se...
Publication number
20230098042
Publication date
Mar 30, 2023
CHROMA ATE INC.
Chin-Yi OUYANG
G01 - MEASURING TESTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230062440
Publication date
Mar 2, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME
Publication number
20230010924
Publication date
Jan 12, 2023
SEMES CO., LTD.
Jin Ho KANG
B66 - HOISTING LIFTING HAULING
Information
Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
Publication number
20230003791
Publication date
Jan 5, 2023
Northrop Grumman Systems Corporation
KELSEY McCUSKER
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM INCLUDING ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20220326299
Publication date
Oct 13, 2022
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE
Publication number
20220283221
Publication date
Sep 8, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20220284982
Publication date
Sep 8, 2022
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEM LEVEL TEST DEVICE FOR MEMORY
Publication number
20220236320
Publication date
Jul 28, 2022
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
MECHANICAL ARM AND MECHANICAL ARM ASSEMBLY, TEST SYSTEM AND METHOD,...
Publication number
20220236321
Publication date
Jul 28, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC
Yu YU
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
INSPECTION APPARATUS, CONTROL METHOD, AND STORAGE MEDIUM
Publication number
20220229105
Publication date
Jul 21, 2022
TOKYO ELECTRON LIMITED
Hiroyuki NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
STACKER OF ELECTRONIC COMPONENT TEST HANDLER, AND ELECTRONIC COMPON...
Publication number
20220187360
Publication date
Jun 16, 2022
ATECO INC.
Taek Seon LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20220178991
Publication date
Jun 9, 2022
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
TESTING EQUIPMENT, ITS COMPONENT CARRYING DEVICE AND TESTING METHOD...
Publication number
20220178990
Publication date
Jun 9, 2022
GLOBAL UNICHIP CORPORATION
Chih-Chieh LIAO
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT TEST HANDLER HAVING HAND TEACHING FUNCTION AND...
Publication number
20220155363
Publication date
May 19, 2022
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT TEST HANDLER HAVING FLYING SCAN FUNCTION
Publication number
20220146569
Publication date
May 12, 2022
ATECO INC.
Taek Seon LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR OVER-THE-AIR TESTING
Publication number
20220128623
Publication date
Apr 28, 2022
Powertech Technology Inc.
Fu-Hsiang CHANG
G01 - MEASURING TESTING