having a throughhole enabling the optical element to fulfil an additional optical function

Industry

CPC
G01J1/0455

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

Current Industry

G01J1/0455having a throughhole enabling the optical element to fulfil an additional optical function

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatuses for aligning and diagnosing a laser beam
- Patent number 11,079,564
- Issue date Aug 3, 2021
- Cymer, LLC
- Donald Harrison Barnhart
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection system with light sampling
- Patent number 11,067,433
- Issue date Jul 20, 2021
- Bio-Rad Laboratories, Inc.
- Denis Pristinski
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for wavefront analysis
- Patent number 10,746,606
- Issue date Aug 18, 2020
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Peter Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Ambient-light-sensing hole structure package and method of manufact...
- Patent number 10,746,595
- Issue date Aug 18, 2020
- INTERFACE TECHNOLOGY (CHENGDU) CO., LTD.
- Chun-Hung Chen
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical detection system with light sampling
- Patent number 10,281,320
- Issue date May 7, 2019
- Bio-Rad Laboratories, Inc.
- Denis Pristinski
- G01 - MEASURING TESTING
Information Patent Grant
Random light collector device
- Patent number 10,113,905
- Issue date Oct 30, 2018
- ADVA Optical Networking SE
- Patrick Berthoud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mobile terminal
- Patent number 9,392,706
- Issue date Jul 12, 2016
- LG Electronics Inc.
- Inseok Yoo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Temperature measuring device and temperature measuring method
- Patent number 8,340,468
- Issue date Dec 25, 2012
- Toyota Jidosha Kabushiki Kaisha
- Yuichi Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser energy measuring unit and laser machining apparatus
- Patent number 7,929,127
- Issue date Apr 19, 2011
- Hitachi Via Mechanics
- Fumio Watanabe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measurement of EUV intensity
- Patent number 7,916,274
- Issue date Mar 29, 2011
- Nikon Corporation
- Michael Sogard
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring device, light source device, optical scanning device, an...
- Patent number 7,687,762
- Issue date Mar 30, 2010
- Ricoh Company, Limited
- Naoto Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Area X-ray or UV camera system for high-intensity beams
- Patent number 7,672,430
- Issue date Mar 2, 2010
- Lawrence Livermore National Security, LLC
- Henry N. Chapman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Error reduction for image capturing device
- Patent number 7,439,491
- Issue date Oct 21, 2008
- Microvision, Inc.
- Jianhua Xu
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for regulating the light emitted by a...
- Patent number 7,348,530
- Issue date Mar 25, 2008
- Avago Technologies ECBU IP Pte Ltd
- Felix Tak Meng Cheang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Optical measuring device
- Patent number 7,283,222
- Issue date Oct 16, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Motor control for flux-reduced braking
- Patent number 7,135,833
- Issue date Nov 14, 2006
- Rockwell Automation Technologies, Inc.
- Robert J. DeLange
- G01 - MEASURING TESTING
Information Patent Grant
Hemispherical detector
- Patent number 6,534,768
- Issue date Mar 18, 2003
- Euro-Oeltique, S.A.
- Emil W. Ciurczak
- G01 - MEASURING TESTING
Information Patent Grant
Sensor assembly with dual reflectors to offset sensor
- Patent number 6,196,690
- Issue date Mar 6, 2001
- McDonnell Douglas Corporation
- James Bertram Blackmon
- G02 - OPTICS
Information Patent Grant
Sensor assembly with dual reflectors to offset sensor
- Patent number 5,980,049
- Issue date Nov 9, 1999
- McDonnell Douglas Corporation
- James Bertram Blackmon
- G02 - OPTICS
Information Patent Grant
Sensor assembly with dual reflectors to offset sensor
- Patent number 5,896,237
- Issue date Apr 20, 1999
- McDonnell Douglas Corporation
- James Bertram Blackmon
- G02 - OPTICS
Information Patent Grant
Luminous flux measuring apparatus using an integrating hemisphere o...
- Patent number 5,430,540
- Issue date Jul 4, 1995
- Matsushita Electric Industrial Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Mirror apparatus for increasing light absorption efficiency of an o...
- Patent number 5,281,804
- Issue date Jan 25, 1994
- Fujitsu Ltd.
- Masataka Shirasaki
- G02 - OPTICS
Information Patent Grant
Fiber optic photoluminescence sensor
- Patent number 5,141,312
- Issue date Aug 25, 1992
- The United States of America as represented by the Secretary of the Navy
- Richard B. Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Photometer
- Patent number 4,708,477
- Issue date Nov 24, 1987
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Yabusaki Kenji
- G01 - MEASURING TESTING
Information Patent Grant
Light collector for optical contaminant and flaw detector
- Patent number 4,601,576
- Issue date Jul 22, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Dual collector optical flaw detector
- Patent number 4,597,665
- Issue date Jul 1, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Spatial scanning means for a photometer
- Patent number 4,279,507
- Issue date Jul 21, 1981
- Kollmorgen Corporation
- Thomas H. Bulpitt
- G02 - OPTICS
Information Patent Grant
3813172
- Patent number 3,813,172
- Issue date May 28, 1974
- G01 - MEASURING TESTING
Information Patent Grant
3804527
- Patent number 3,804,527
- Issue date Apr 16, 1974
- G02 - OPTICS
Information Patent Grant
3799680
- Patent number 3,799,680
- Issue date Mar 26, 1974
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR ALIGNING AND DIAGNOSING A LASER BEAM
- Publication number 20210333501
- Publication date Oct 28, 2021
- CYMER, LLC
- Donald Harrison Barnhart
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR WAVEFRONT ANALYSIS
- Publication number 20190285480
- Publication date Sep 19, 2019
- Fraunhofer-Gesellschaft zur foerderung der Angewandten Forschung e.V.
- Peter HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
AMBIENT-LIGHT-SENSING HOLE STRUCTURE PACKAGE AND METHOD OF MANUFACT...
- Publication number 20190285467
- Publication date Sep 19, 2019
- Interface Technology (ChengDu) Co., Ltd.
- Chun-Hung CHEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL DETECTION SYSTEM WITH LIGHT SAMPLING
- Publication number 20190257687
- Publication date Aug 22, 2019
- Bio-Rad Laboratories, Inc.
- Denis Pristinski
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION SYSTEM WITH LIGHT SAMPLING
- Publication number 20170184448
- Publication date Jun 29, 2017
- Bio-Rad Laboratories, Inc.
- Denis Pristinski
- G01 - MEASURING TESTING
Information Patent Application
Random Light Collector Device
- Publication number 20170167913
- Publication date Jun 15, 2017
- ADVA Optical Networking SE
- Patrick Berthoud
- G01 - MEASURING TESTING
Information Patent Application
MOBILE TERMINAL
- Publication number 20130242479
- Publication date Sep 19, 2013
- Inseok YOO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD
- Publication number 20100098321
- Publication date Apr 22, 2010
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Yuichi Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Area x-ray or UV camera system for high-intensity beams
- Publication number 20090116619
- Publication date May 7, 2009
- Henry N. Chapman
- G01 - MEASURING TESTING
Information Patent Application
MONITORING DEVICE, LIGHT SOURCE DEVICE, OPTICAL SCANNING DEVICE, AN...
- Publication number 20090065685
- Publication date Mar 12, 2009
- Naoto Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Laser energy measuring unit and laser machining apparatus
- Publication number 20080239300
- Publication date Oct 2, 2008
- Fumio Watanabe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Measurement of EUV intensity
- Publication number 20080151221
- Publication date Jun 26, 2008
- NIKON CORPORATION
- Michael Sogard
- G01 - MEASURING TESTING
Information Patent Application
ERROR REDUCTION FOR IMAGE CAPTURING DEVICE
- Publication number 20080001060
- Publication date Jan 3, 2008
- Microvision, Inc.
- Jianhua Xu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20070242264
- Publication date Oct 18, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Motor control for flux-reduced braking
- Publication number 20060113929
- Publication date Jun 1, 2006
- Rockwell Automation Technologies, Inc.
- Robert J. DeLange
- G02 - OPTICS
Information Patent Application
System, method and apparatus for regulating the light emitted by a...
- Publication number 20060071146
- Publication date Apr 6, 2006
- Felix Tak Meng Cheang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Optical beam detection device and optical beam detection system usi...
- Publication number 20050237511
- Publication date Oct 27, 2005
- Koichi Takahashi
- G02 - OPTICS
Information Patent Application
Hemispherical detector
- Publication number 20030102433
- Publication date Jun 5, 2003
- Emil W. Ciurczak
- G01 - MEASURING TESTING
Information Patent Application
Wide angle viewing device
- Publication number 20030010920
- Publication date Jan 16, 2003
- Purdue Research Foundations
- Yudaya Sivathanu
- G01 - MEASURING TESTING

having a throughhole enabling the optical element to fulfil an additional optical function

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatuses for aligning and diagnosing a laser beam

Optical detection system with light sampling

Arrangement and method for wavefront analysis

Ambient-light-sensing hole structure package and method of manufact...

Optical detection system with light sampling

Random light collector device

Mobile terminal

Temperature measuring device and temperature measuring method

Laser energy measuring unit and laser machining apparatus

Measurement of EUV intensity

Monitoring device, light source device, optical scanning device, an...

Area X-ray or UV camera system for high-intensity beams

Error reduction for image capturing device

System, method and apparatus for regulating the light emitted by a...

Optical measuring device

Motor control for flux-reduced braking

Hemispherical detector

Sensor assembly with dual reflectors to offset sensor

Sensor assembly with dual reflectors to offset sensor

Sensor assembly with dual reflectors to offset sensor

Luminous flux measuring apparatus using an integrating hemisphere o...

Mirror apparatus for increasing light absorption efficiency of an o...

Fiber optic photoluminescence sensor

Photometer

Light collector for optical contaminant and flaw detector

Dual collector optical flaw detector

Spatial scanning means for a photometer

3813172

3804527

3799680

Patents Applicationslast 30 patents

METHODS AND APPARATUSES FOR ALIGNING AND DIAGNOSING A LASER BEAM

ARRANGEMENT AND METHOD FOR WAVEFRONT ANALYSIS

AMBIENT-LIGHT-SENSING HOLE STRUCTURE PACKAGE AND METHOD OF MANUFACT...

OPTICAL DETECTION SYSTEM WITH LIGHT SAMPLING

OPTICAL DETECTION SYSTEM WITH LIGHT SAMPLING

Random Light Collector Device

MOBILE TERMINAL

TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD

Area x-ray or UV camera system for high-intensity beams

MONITORING DEVICE, LIGHT SOURCE DEVICE, OPTICAL SCANNING DEVICE, AN...

Laser energy measuring unit and laser machining apparatus

Measurement of EUV intensity

ERROR REDUCTION FOR IMAGE CAPTURING DEVICE

OPTICAL MEASURING DEVICE

Motor control for flux-reduced braking

System, method and apparatus for regulating the light emitted by a...

Optical beam detection device and optical beam detection system usi...

Hemispherical detector

Wide angle viewing device